{"id":"https://openalex.org/W903753112","doi":"https://doi.org/10.5821/dissertation-2117-95273","title":"Variability-aware architectures based on hardware redundancy for nanoscale reliable computation","display_name":"Variability-aware architectures based on hardware redundancy for nanoscale reliable computation","publication_year":2013,"publication_date":"2013-12-16","ids":{"openalex":"https://openalex.org/W903753112","doi":"https://doi.org/10.5821/dissertation-2117-95273","mag":"903753112"},"language":"en","primary_location":{"id":"doi:10.5821/dissertation-2117-95273","is_oa":true,"landing_page_url":"https://doi.org/10.5821/dissertation-2117-95273","pdf_url":"https://upcommons.upc.edu/bitstream/2117/95273/1/TNAC1de1.pdf","source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Universitat Polit\u00e8cnica de Catalunya","raw_type":"dissertation"},"type":"dissertation","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://upcommons.upc.edu/bitstream/2117/95273/1/TNAC1de1.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054114703","display_name":"Nivard Aymerich Capdevila","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Aymerich Capdevila, Nivard","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5054114703"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7833830118179321},{"id":"https://openalex.org/keywords/von-neumann-architecture","display_name":"Von Neumann architecture","score":0.6211268901824951},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5632679462432861},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5429657697677612},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.4861440360546112},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4788244068622589},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.44214436411857605},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4280272126197815},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34547826647758484},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.26985257863998413},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.25024837255477905},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22250938415527344},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1859343945980072},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.09265941381454468}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7833830118179321},{"id":"https://openalex.org/C80469333","wikidata":"https://www.wikidata.org/wiki/Q189088","display_name":"Von Neumann architecture","level":2,"score":0.6211268901824951},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5632679462432861},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5429657697677612},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.4861440360546112},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4788244068622589},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.44214436411857605},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4280272126197815},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34547826647758484},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.26985257863998413},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.25024837255477905},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22250938415527344},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1859343945980072},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.09265941381454468},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.5821/dissertation-2117-95273","is_oa":true,"landing_page_url":"https://doi.org/10.5821/dissertation-2117-95273","pdf_url":"https://upcommons.upc.edu/bitstream/2117/95273/1/TNAC1de1.pdf","source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Universitat Polit\u00e8cnica de Catalunya","raw_type":"dissertation"},{"id":"pmh:oai:upcommons.upc.edu:2117/95273","is_oa":true,"landing_page_url":"https://hdl.handle.net/10803/134963","pdf_url":"https://www.tdx.cat/bitstream/10803/134963/1/TNAC1de1.pdf","source":{"id":"https://openalex.org/S4377196262","display_name":"UPCommons institutional repository (Universitat Polit\u00e8cnica de Catalunya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I9617848","host_organization_name":"Universitat Polit\u00e8cnica de Catalunya","host_organization_lineage":["https://openalex.org/I9617848"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"TDX (Tesis Doctorals en Xarxa)","raw_type":"Doctoral thesis"},{"id":"pmh:oai:www.tdx.cat:10803/134963","is_oa":true,"landing_page_url":"http://hdl.handle.net/10803/134963","pdf_url":"http://hdl.handle.net/10803/134963","source":{"id":"https://openalex.org/S4306401111","display_name":"Tesis Doctorals en Xarxa (Consorci de Serveis Universitaris de Catalunya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210090028","host_organization_name":"Consorci de Serveis Universitaris de Catalunya","host_organization_lineage":["https://openalex.org/I4210090028"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"TDX (Tesis Doctorals en Xarxa)","raw_type":"info:eu-repo/semantics/doctoralThesis"}],"best_oa_location":{"id":"doi:10.5821/dissertation-2117-95273","is_oa":true,"landing_page_url":"https://doi.org/10.5821/dissertation-2117-95273","pdf_url":"https://upcommons.upc.edu/bitstream/2117/95273/1/TNAC1de1.pdf","source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Universitat Polit\u00e8cnica de Catalunya","raw_type":"dissertation"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W903753112.pdf"},"referenced_works_count":92,"referenced_works":["https://openalex.org/W67767776","https://openalex.org/W118296737","https://openalex.org/W1531053051","https://openalex.org/W1554576613","https://openalex.org/W1564257043","https://openalex.org/W1604968081","https://openalex.org/W1609370892","https://openalex.org/W1662824729","https://openalex.org/W1864324243","https://openalex.org/W1970296212","https://openalex.org/W1970539797","https://openalex.org/W1970587745","https://openalex.org/W1980240972","https://openalex.org/W1995341919","https://openalex.org/W2009886994","https://openalex.org/W2014091871","https://openalex.org/W2022829874","https://openalex.org/W2025467801","https://openalex.org/W2025516544","https://openalex.org/W2031430465","https://openalex.org/W2032197740","https://openalex.org/W2040651276","https://openalex.org/W2048323334","https://openalex.org/W2051079568","https://openalex.org/W2054104481","https://openalex.org/W2054134274","https://openalex.org/W2055346541","https://openalex.org/W2057240004","https://openalex.org/W2057465926","https://openalex.org/W2064369971","https://openalex.org/W2064632620","https://openalex.org/W2065231869","https://openalex.org/W2070292595","https://openalex.org/W2076063520","https://openalex.org/W2083306695","https://openalex.org/W2085203692","https://openalex.org/W2095591299","https://openalex.org/W2098112833","https://openalex.org/W2099627502","https://openalex.org/W2100180510","https://openalex.org/W2101780399","https://openalex.org/W2107430507","https://openalex.org/W2107810558","https://openalex.org/W2107969613","https://openalex.org/W2108631315","https://openalex.org/W2111299528","https://openalex.org/W2112876374","https://openalex.org/W2112899648","https://openalex.org/W2115465752","https://openalex.org/W2117648153","https://openalex.org/W2117677814","https://openalex.org/W2119147938","https://openalex.org/W2120185818","https://openalex.org/W2121290756","https://openalex.org/W2121403985","https://openalex.org/W2122386818","https://openalex.org/W2125169487","https://openalex.org/W2126258474","https://openalex.org/W2127180025","https://openalex.org/W2130407302","https://openalex.org/W2130877547","https://openalex.org/W2133085584","https://openalex.org/W2135047781","https://openalex.org/W2137906383","https://openalex.org/W2138761088","https://openalex.org/W2141432878","https://openalex.org/W2143451736","https://openalex.org/W2145071552","https://openalex.org/W2148533576","https://openalex.org/W2149607873","https://openalex.org/W2153013418","https://openalex.org/W2153421476","https://openalex.org/W2156546571","https://openalex.org/W2157147780","https://openalex.org/W2164492816","https://openalex.org/W2164716567","https://openalex.org/W2188838890","https://openalex.org/W2327000313","https://openalex.org/W2497735908","https://openalex.org/W2736389602","https://openalex.org/W2913116394","https://openalex.org/W3103279136","https://openalex.org/W3142488006","https://openalex.org/W3182208082","https://openalex.org/W3203992401","https://openalex.org/W4238276956","https://openalex.org/W4243060796","https://openalex.org/W4245052796","https://openalex.org/W4256703508","https://openalex.org/W6656669145","https://openalex.org/W6677430067","https://openalex.org/W6682366425"],"related_works":["https://openalex.org/W1933211537","https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2102525122","https://openalex.org/W4245282135","https://openalex.org/W4306316843","https://openalex.org/W2130594209","https://openalex.org/W4300955944","https://openalex.org/W2170004886","https://openalex.org/W2036953450"],"abstract_inverted_index":{"During":[0],"the":[1,12,21,42,54,66,110,123,132,145,189,198,211,223,233,254,257,262,269,311,354,373,379,387,395,404,412,422,428,436,461,474,481],"last":[2],"decades,":[3],"human":[4],"beings":[5],"have":[6,276,456],"experienced":[7],"a":[8,120,137,272,323,337,471],"significant":[9,35],"enhancement":[10],"in":[11,17,122,128,197,222,287,298,449,470,480],"quality":[13],"of":[14,24,44,57,99,106,117,147,151,159,167,191,210,235,256,268,271,356,363,389,397,406,411,424,463,476],"life":[15],"thanks":[16],"large":[18],"part":[19],"to":[20,73,76,90,130,171,203,260,282,295,308,369,399],"fast":[22],"evolution":[23],"Integrated":[25],"Circuits":[26],"(IC).":[27],"This":[28],"unprecedented":[29],"technological":[30],"race,":[31],"along":[32],"with":[33,114,310],"its":[34,347,400],"economic":[36],"impact,":[37],"has":[38,62],"been":[39,63,457],"grounded":[40],"on":[41,179,188,213,217,315,386],"production":[43],"complex":[45,364],"processing":[46,279,331,365,478],"systems":[47,479],"from":[48,460],"highly":[49],"reliable":[50,153],"compounding":[51],"devices.":[52],"However,":[53],"fundamental":[55,91],"assumption":[56],"nearly":[58],"ideal":[59],"devices,":[60],"which":[61],"true":[64],"within":[65],"past":[67],"CMOS":[68],"technology":[69,83,483],"generations,":[70],"today":[71,144],"seems":[72],"be":[74,383],"coming":[75],"an":[77],"end.":[78],"In":[79,245,465],"fact,":[80],"as":[81,447,451],"MOSFET":[82],"scales":[84],"into":[85,243],"nanoscale":[86],"regime":[87],"it":[88,139],"approaches":[89],"physical":[92],"limits":[93],"and":[94,103,161,173,200,284,333,343,345,377,427,453],"starts":[95],"experiencing":[96],"higher":[97,104],"levels":[98,158],"variability,":[100],"performance":[101],"degradation,":[102],"rates":[105],"manufacturing":[107],"defects.":[108],"On":[109],"other":[111],"hand,":[112],"ICs":[113,391],"increasing":[115],"number":[116],"transistors":[118],"require":[119],"decrease":[121],"failure":[124],"rate":[125],"per":[126],"device":[127],"order":[129],"maintain":[131],"overall":[133,263],"chip":[134],"reliability.":[135,264,334],"As":[136],"result,":[138],"is":[140,170,186,241],"becoming":[141],"increasingly":[142],"important":[143],"development":[146],"circuit":[148],"architectures":[149,177,215,414],"capable":[150],"providing":[152,340],"computation":[154],"while":[155],"tolerating":[156],"high":[157],"variability":[160,221,283],"defect":[162],"rates.":[163],"The":[164],"main":[165],"objective":[166],"this":[168,246,466],"thesis":[169,467],"analyze":[172,344,378],"propose":[174,249,336,368],"new":[175,205],"fault-tolerant":[176,214],"based":[178,216],"redundancy":[180,192,218,236,357,371,398,439],"for":[181,339,435],"future":[182,288,390],"technologies.":[183],"Our":[184],"research":[185],"founded":[187],"principles":[190],"established":[193],"by":[194],"von":[195,226,432],"Neumann":[196,433],"1950s":[199],"extends":[201],"them":[202],"three":[204],"dimensions:":[206],"1.":[207],"Heterogeneity:":[208],"Most":[209,410],"works":[212],"assume":[219],"homogeneous":[220],"replicas":[224,240,270,318],"like":[225],"Neumann's":[227],"original":[228],"work.":[229],"Instead,":[230],"we":[231,248,291,302,319,325,352,393,468],"explore":[232,353],"possibilities":[234,355],"when":[237],"heterogeneity":[238],"between":[239,330],"taken":[242],"account.":[244],"sense,":[247],"compensating":[250],"mechanisms":[251],"that":[252,381],"select":[253],"weighting":[255],"redundant":[258,273,312,413],"information":[259],"maximize":[261],"2.":[265],"Asynchrony:":[266],"Each":[267],"system":[274,294],"may":[275,303],"associated":[277],"different":[278,305,328,360],"delays":[280],"due":[281],"degradation;":[285],"especially":[286],"nanotechnologies.":[289],"If":[290],"design":[292],"our":[293],"work":[296],"locally":[297],"asynchronous":[299],"mode":[300],"then":[301],"consider":[304],"voting":[306],"policies":[307],"deal":[309],"information.":[313],"Depending":[314],"how":[316],"many":[317],"collect":[320],"before":[321],"taking":[322],"decision":[324],"can":[326,382],"obtain":[327],"trade-off":[329],"delay":[332],"We":[335,367],"mechanism":[338],"these":[341],"facilities":[342],"simulate":[346],"operation.":[348],"3.":[349],"Hierarchy:":[350],"Finally,":[351],"applied":[358,434],"at":[359,440],"hierarchy":[361,375],"layers":[362,376],"systems.":[366],"distribute":[370],"across":[372],"various":[374],"benefits":[380],"obtained.":[384],"Drawing":[385],"scenario":[388],"technologies,":[392],"push":[394],"concept":[396],"fullest":[401],"expression":[402],"through":[403],"study":[405],"realistic":[407],"nano-device":[408],"architectures.":[409],"considered":[415],"so":[416],"far":[417],"do":[418],"not":[419],"face":[420],"properly":[421],"era":[423],"Terascale":[425],"Computing":[426],"nanotechnology":[429],"trends.":[430],"Since":[431],"first":[437],"time":[438],"electronic":[441],"circuits,":[442],"never":[443],"until":[444],"now":[445],"effects":[446],"common":[448],"nanoelectronics":[450],"degradation":[452],"interconnection":[454],"failures":[455],"treated":[458],"directly":[459],"standpoint":[462],"redundancy.":[464],"address":[469],"comprehensive":[472],"manner":[473],"reliability":[475],"digital":[477],"upcoming":[482],"generations.":[484]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2016-06-24T00:00:00"}