{"id":"https://openalex.org/W2789339265","doi":"https://doi.org/10.5220/0006656704460452","title":"FLASH: A New Key Structure Extraction used for Line or Crack Detection","display_name":"FLASH: A New Key Structure Extraction used for Line or Crack Detection","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2789339265","doi":"https://doi.org/10.5220/0006656704460452","mag":"2789339265"},"language":"en","primary_location":{"id":"doi:10.5220/0006656704460452","is_oa":false,"landing_page_url":"https://doi.org/10.5220/0006656704460452","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061192069","display_name":"Yannick Faula","orcid":null},"institutions":[{"id":"https://openalex.org/I100532134","display_name":"Universit\u00e9 Claude Bernard Lyon 1","ror":"https://ror.org/029brtt94","country_code":"FR","type":"education","lineage":["https://openalex.org/I100532134","https://openalex.org/I203339264"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Yannick Faula","raw_affiliation_strings":["Universit\u00e9 de Lyon, France"],"affiliations":[{"raw_affiliation_string":"Universit\u00e9 de Lyon, France","institution_ids":["https://openalex.org/I100532134"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015666141","display_name":"St\u00e9phane Bres","orcid":null},"institutions":[{"id":"https://openalex.org/I100532134","display_name":"Universit\u00e9 Claude Bernard Lyon 1","ror":"https://ror.org/029brtt94","country_code":"FR","type":"education","lineage":["https://openalex.org/I100532134","https://openalex.org/I203339264"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"St\u00e9phane Bres","raw_affiliation_strings":["Universit\u00e9 de Lyon, France"],"affiliations":[{"raw_affiliation_string":"Universit\u00e9 de Lyon, France","institution_ids":["https://openalex.org/I100532134"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027022729","display_name":"V\u00e9ronique \u00c9glin","orcid":"https://orcid.org/0000-0001-8738-2088"},"institutions":[{"id":"https://openalex.org/I100532134","display_name":"Universit\u00e9 Claude Bernard Lyon 1","ror":"https://ror.org/029brtt94","country_code":"FR","type":"education","lineage":["https://openalex.org/I100532134","https://openalex.org/I203339264"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"V\u00e9ronique Eglin","raw_affiliation_strings":["Universit\u00e9 de Lyon, France"],"affiliations":[{"raw_affiliation_string":"Universit\u00e9 de Lyon, France","institution_ids":["https://openalex.org/I100532134"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5061192069"],"corresponding_institution_ids":["https://openalex.org/I100532134"],"apc_list":null,"apc_paid":null,"fwci":0.4488,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.6419775,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"446","last_page":"452"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9882000088691711,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9745000004768372,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.6786471009254456},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5539518594741821},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.5359547734260559},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.5152652263641357},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4891064763069153},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.12040749192237854},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10627537965774536},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.10341525077819824},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09697726368904114},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08046028017997742},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.06295546889305115}],"concepts":[{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.6786471009254456},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5539518594741821},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.5359547734260559},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.5152652263641357},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4891064763069153},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.12040749192237854},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10627537965774536},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.10341525077819824},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09697726368904114},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08046028017997742},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06295546889305115},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.5220/0006656704460452","is_oa":false,"landing_page_url":"https://doi.org/10.5220/0006656704460452","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}