{"id":"https://openalex.org/W7138908959","doi":"https://doi.org/10.5220/0014330300004084","title":"Supervised Deep Feature-Based Industrial Defect Detection in Optical Lenses with Minimal Data","display_name":"Supervised Deep Feature-Based Industrial Defect Detection in Optical Lenses with Minimal Data","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7138908959","doi":"https://doi.org/10.5220/0014330300004084"},"language":null,"primary_location":{"id":"doi:10.5220/0014330300004084","is_oa":true,"landing_page_url":"https://doi.org/10.5220/0014330300004084","pdf_url":null,"source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 21st International Conference on Computer Vision Theory and Applications","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.5220/0014330300004084","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5130122983","display_name":"Tarek Zenati","orcid":null},"institutions":[{"id":"https://openalex.org/I4210108492","display_name":"EssilorLuxottica (France)","ror":"https://ror.org/01pj6sv40","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210108492"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Tarek Zenati","raw_affiliation_strings":["GLID, Industrial Vision, Computer Vision Scientist, EssilorLuxottica, Boulevard Ourdy, Creteil 94000, France"],"affiliations":[{"raw_affiliation_string":"GLID, Industrial Vision, Computer Vision Scientist, EssilorLuxottica, Boulevard Ourdy, Creteil 94000, France","institution_ids":["https://openalex.org/I4210108492"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5130122983"],"corresponding_institution_ids":["https://openalex.org/I4210108492"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.92562929,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"652","last_page":"660"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6287000179290771,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.6287000179290771,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.07519999891519547,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.03009999915957451,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.35339999198913574},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.31220000982284546},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.2513999938964844},{"id":"https://openalex.org/keywords/lens","display_name":"Lens (geology)","score":0.24709999561309814}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6105999946594238},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5631999969482422},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.508899986743927},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.35339999198913574},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.31220000982284546},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3111000061035156},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.2583000063896179},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.2513999938964844},{"id":"https://openalex.org/C15336307","wikidata":"https://www.wikidata.org/wiki/Q1766051","display_name":"Lens (geology)","level":2,"score":0.24709999561309814},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.23589999973773956}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.5220/0014330300004084","is_oa":true,"landing_page_url":"https://doi.org/10.5220/0014330300004084","pdf_url":null,"source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 21st International Conference on Computer Vision Theory and Applications","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.5220/0014330300004084","is_oa":true,"landing_page_url":"https://doi.org/10.5220/0014330300004084","pdf_url":null,"source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 21st International Conference on Computer Vision Theory and Applications","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-03-20T20:54:20.808490","created_date":"2026-03-20T00:00:00"}