{"id":"https://openalex.org/W4409639672","doi":"https://doi.org/10.5220/0013481700003928","title":"Cross-Version Defect Prediction: Does Excessive Train-Test Similarity Affect the Reliability of Evaluation?","display_name":"Cross-Version Defect Prediction: Does Excessive Train-Test Similarity Affect the Reliability of Evaluation?","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4409639672","doi":"https://doi.org/10.5220/0013481700003928"},"language":"en","primary_location":{"id":"doi:10.5220/0013481700003928","is_oa":true,"landing_page_url":"https://doi.org/10.5220/0013481700003928","pdf_url":null,"source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 20th International Conference on Evaluation of Novel Approaches to Software Engineering","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.5220/0013481700003928","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028618793","display_name":"Zsuzsanna Marian","orcid":"https://orcid.org/0000-0001-9006-0389"},"institutions":[{"id":"https://openalex.org/I3125347698","display_name":"Babe\u0219-Bolyai University","ror":"https://ror.org/02rmd1t30","country_code":"RO","type":"education","lineage":["https://openalex.org/I3125347698"]}],"countries":["RO"],"is_corresponding":true,"raw_author_name":"Zsuzsanna One\u021b-Marian","raw_affiliation_strings":["Faculty of Mathematics and Computer Science, Babe\u0219-Bolyai University, 400084, Cluj-Napoca, Romania"],"affiliations":[{"raw_affiliation_string":"Faculty of Mathematics and Computer Science, Babe\u0219-Bolyai University, 400084, Cluj-Napoca, Romania","institution_ids":["https://openalex.org/I3125347698"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5117235063","display_name":"Diana-Lucia Hotea","orcid":null},"institutions":[{"id":"https://openalex.org/I3125347698","display_name":"Babe\u0219-Bolyai University","ror":"https://ror.org/02rmd1t30","country_code":"RO","type":"education","lineage":["https://openalex.org/I3125347698"]}],"countries":["RO"],"is_corresponding":false,"raw_author_name":"Diana-Lucia Hotea","raw_affiliation_strings":["Faculty of Mathematics and Computer Science, Babe\u0219-Bolyai University, 400084, Cluj-Napoca, Romania"],"affiliations":[{"raw_affiliation_string":"Faculty of Mathematics and Computer Science, Babe\u0219-Bolyai University, 400084, Cluj-Napoca, Romania","institution_ids":["https://openalex.org/I3125347698"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5028618793"],"corresponding_institution_ids":["https://openalex.org/I3125347698"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12189545,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"304","last_page":"315"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7016198635101318},{"id":"https://openalex.org/keywords/affect","display_name":"Affect (linguistics)","score":0.6338446140289307},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6163408756256104},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6006930470466614},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.5917524695396423},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5250617861747742},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4295780062675476},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3946353495121002},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.35229969024658203},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16941392421722412},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.14082559943199158}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7016198635101318},{"id":"https://openalex.org/C2776035688","wikidata":"https://www.wikidata.org/wiki/Q1606558","display_name":"Affect (linguistics)","level":2,"score":0.6338446140289307},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6163408756256104},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6006930470466614},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.5917524695396423},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5250617861747742},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4295780062675476},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3946353495121002},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.35229969024658203},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16941392421722412},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.14082559943199158},{"id":"https://openalex.org/C46312422","wikidata":"https://www.wikidata.org/wiki/Q11024","display_name":"Communication","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.5220/0013481700003928","is_oa":true,"landing_page_url":"https://doi.org/10.5220/0013481700003928","pdf_url":null,"source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 20th International Conference on Evaluation of Novel Approaches to Software Engineering","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.5220/0013481700003928","is_oa":true,"landing_page_url":"https://doi.org/10.5220/0013481700003928","pdf_url":null,"source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 20th International Conference on Evaluation of Novel Approaches to Software Engineering","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W4404996554","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}