{"id":"https://openalex.org/W2921748306","doi":"https://doi.org/10.5220/0007344104210428","title":"Estimation of Correlation between Texture Features and Surface Parameters for Milled Metal Parts","display_name":"Estimation of Correlation between Texture Features and Surface Parameters for Milled Metal Parts","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2921748306","doi":"https://doi.org/10.5220/0007344104210428","mag":"2921748306"},"language":"en","primary_location":{"id":"doi:10.5220/0007344104210428","is_oa":true,"landing_page_url":"https://doi.org/10.5220/0007344104210428","pdf_url":null,"source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 8th International Conference on Pattern Recognition Applications and Methods","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.5220/0007344104210428","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056990389","display_name":"Konstantin Trambitckii","orcid":null},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Konstantin Trambitckii","raw_affiliation_strings":["Institute of Mechanical Engineering, Department of Quality Assurance and Industrial Image Processing, Ilmenau University of Technology, Gustav-Kirchhoff-Platz 2, Ilmenau and Germany, --- Select a Country ---"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Mechanical Engineering, Department of Quality Assurance and Industrial Image Processing, Ilmenau University of Technology, Gustav-Kirchhoff-Platz 2, Ilmenau and Germany, --- Select a Country ---","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076339762","display_name":"Katharina Anding","orcid":null},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Katharina Anding","raw_affiliation_strings":["Institute of Mechanical Engineering, Department of Quality Assurance and Industrial Image Processing, Ilmenau University of Technology, Gustav-Kirchhoff-Platz 2, Ilmenau and Germany, --- Select a Country ---"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Mechanical Engineering, Department of Quality Assurance and Industrial Image Processing, Ilmenau University of Technology, Gustav-Kirchhoff-Platz 2, Ilmenau and Germany, --- Select a Country ---","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043953472","display_name":"Lilli Haar","orcid":null},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Lilli Haar","raw_affiliation_strings":["Institute of Mechanical Engineering, Department of Quality Assurance and Industrial Image Processing, Ilmenau University of Technology, Gustav-Kirchhoff-Platz 2, Ilmenau and Germany, --- Select a Country ---"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Mechanical Engineering, Department of Quality Assurance and Industrial Image Processing, Ilmenau University of Technology, Gustav-Kirchhoff-Platz 2, Ilmenau and Germany, --- Select a Country ---","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003178241","display_name":"Gunther Notni","orcid":"https://orcid.org/0000-0001-7532-1560"},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Gunther Notni","raw_affiliation_strings":["Institute of Mechanical Engineering, Department of Quality Assurance and Industrial Image Processing, Ilmenau University of Technology, Gustav-Kirchhoff-Platz 2, Ilmenau and Germany, --- Select a Country ---"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Mechanical Engineering, Department of Quality Assurance and Industrial Image Processing, Ilmenau University of Technology, Gustav-Kirchhoff-Platz 2, Ilmenau and Germany, --- Select a Country ---","institution_ids":["https://openalex.org/I119449181"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I119449181"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04619012,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"421","last_page":"428"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9760000109672546,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9760000109672546,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9743000268936157,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9621999859809875,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/texture","display_name":"Texture (cosmology)","score":0.6559218764305115},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5430566072463989},{"id":"https://openalex.org/keywords/correlation","display_name":"Correlation","score":0.5002174377441406},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.48651427030563354},{"id":"https://openalex.org/keywords/metal","display_name":"Metal","score":0.43513089418411255},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.42144742608070374},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3843327462673187},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37528467178344727},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.27186352014541626},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22797685861587524},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.2218165397644043},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.09992969036102295}],"concepts":[{"id":"https://openalex.org/C2781195486","wikidata":"https://www.wikidata.org/wiki/Q289436","display_name":"Texture (cosmology)","level":3,"score":0.6559218764305115},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5430566072463989},{"id":"https://openalex.org/C117220453","wikidata":"https://www.wikidata.org/wiki/Q5172842","display_name":"Correlation","level":2,"score":0.5002174377441406},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48651427030563354},{"id":"https://openalex.org/C544153396","wikidata":"https://www.wikidata.org/wiki/Q11426","display_name":"Metal","level":2,"score":0.43513089418411255},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.42144742608070374},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3843327462673187},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37528467178344727},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.27186352014541626},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22797685861587524},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.2218165397644043},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.09992969036102295}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.5220/0007344104210428","is_oa":true,"landing_page_url":"https://doi.org/10.5220/0007344104210428","pdf_url":null,"source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 8th International Conference on Pattern Recognition Applications and Methods","raw_type":"proceedings-article"},{"id":"pmh:oai:www.db-thueringen.de:dbt_mods_00070125","is_oa":true,"landing_page_url":"https://www.db-thueringen.de/receive/dbt_mods_00070125","pdf_url":null,"source":{"id":"https://openalex.org/S4306400120","display_name":"Common Library Network (Der Gemeinsame Bibliotheksverbund)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210149878","host_organization_name":"Verbundzentrale des GBV","host_organization_lineage":["https://openalex.org/I4210149878"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"doi:10.5220/0007344104210428","is_oa":true,"landing_page_url":"https://doi.org/10.5220/0007344104210428","pdf_url":null,"source":null,"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 8th International Conference on Pattern Recognition Applications and Methods","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2364238915","https://openalex.org/W2096492911","https://openalex.org/W4221153518","https://openalex.org/W2562018983","https://openalex.org/W2050740970","https://openalex.org/W1506940452","https://openalex.org/W1966714942","https://openalex.org/W2094056275","https://openalex.org/W1755785340","https://openalex.org/W1974062486"],"abstract_inverted_index":{"Fast":[0],"developing":[1],"of":[2,9,24,44,55,71,80],"computer":[3,25],"technologies":[4],"led":[5],"to":[6,37],"vast":[7],"improvements":[8],"image":[10],"processing":[11],"systems":[12],"and":[13,26,62,89],"algorithms.":[14],"Nowadays":[15],"these":[16],"algorithms":[17],"are":[18],"widely":[19],"used":[20,36,108],"in":[21,64],"different":[22],"areas":[23],"machine":[27],"vision":[28],"systems.":[29],"In":[30],"this":[31],"research":[32],"texture":[33,73,87,103],"features":[34,74,88,104],"were":[35,75,97],"analyse":[38],"metal":[39],"surfaces":[40,96],"using":[41],"a":[42,78],"set":[43,70,79],"images":[45],"obtained":[46],"with":[47,50,66],"industrial":[48],"camera":[49],"macro":[51],"lens.":[52],"This":[53],"kind":[54],"contactless":[56],"surface":[57,81,111],"roughness":[58,91],"estimation":[59],"is":[60],"cheaper":[61],"quicker":[63],"comparison":[65],"traditional":[67],"methods.":[68],"A":[69],"27":[72],"calculated":[76],"for":[77,93,109],"images.":[82],"Correlation":[83],"coefficients":[84],"between":[85],"the":[86,94],"10":[90],"parameters":[92],"sample":[95],"estimated.":[98],"Obtained":[99],"results":[100],"showed":[101],"that":[102],"can":[105],"be":[106],"successfully":[107],"quick":[110],"quality":[112],"estimation.":[113]},"counts_by_year":[],"updated_date":"2026-08-01T09:00:35.917206","created_date":"2025-10-10T00:00:00"}