{"id":"https://openalex.org/W7165953815","doi":"https://doi.org/10.48550/arxiv.2606.25277","title":"An Integrated Hardware-Software Design for Low-Data Spatial Defect Detection in Robotic Visual Inspection with Hybrid Optoelectronic Neural Networks","display_name":"An Integrated Hardware-Software Design for Low-Data Spatial Defect Detection in Robotic Visual Inspection with Hybrid Optoelectronic Neural Networks","publication_year":2026,"publication_date":"2026-06-24","ids":{"openalex":"https://openalex.org/W7165953815","doi":"https://doi.org/10.48550/arxiv.2606.25277"},"language":null,"primary_location":{"id":"doi:10.48550/arxiv.2606.25277","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2606.25277","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Preprint"},"type":"preprint","indexed_in":["datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.48550/arxiv.2606.25277","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067817220","display_name":"Chaoqing Tang","orcid":"https://orcid.org/0000-0002-3749-947X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tang, Chaoqing","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5139317937","display_name":"Jiaxuan Li","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Li, Jiaxuan","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5139373311","display_name":"Huanze Zhuang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zhuang, Huanze","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5139305880","display_name":"Guiyun Tian","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tian, Guiyun","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5139311173","display_name":"Chao Wang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wang, Chao","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088718077","display_name":"Yihao Ouyang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ouyang, Yihao","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5139349896","display_name":"Wenzhong Liu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Liu, Wenzhong","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.40459999442100525,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.40459999442100525,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.058800000697374344,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.056299999356269836,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5853000283241272},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.460999995470047},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.45980000495910645},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.45419999957084656},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.396699994802475},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.39399999380111694},{"id":"https://openalex.org/keywords/visualization","display_name":"Visualization","score":0.3806999921798706},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.3693999946117401},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.34950000047683716}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6764000058174133},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5853000283241272},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5699999928474426},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.460999995470047},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.45980000495910645},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.45419999957084656},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.41819998621940613},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.396699994802475},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.39399999380111694},{"id":"https://openalex.org/C36464697","wikidata":"https://www.wikidata.org/wiki/Q451553","display_name":"Visualization","level":2,"score":0.3806999921798706},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.3693999946117401},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.34950000047683716},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.3440999984741211},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.3409000039100647},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3370000123977661},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3334999978542328},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.3321000039577484},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.3239000141620636},{"id":"https://openalex.org/C138236772","wikidata":"https://www.wikidata.org/wiki/Q25098575","display_name":"Edge device","level":3,"score":0.32190001010894775},{"id":"https://openalex.org/C19275194","wikidata":"https://www.wikidata.org/wiki/Q222903","display_name":"Multiplexing","level":2,"score":0.31520000100135803},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3003999888896942},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.298799991607666},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.2939000129699707},{"id":"https://openalex.org/C159620131","wikidata":"https://www.wikidata.org/wiki/Q1938983","display_name":"Spatial analysis","level":2,"score":0.2808000147342682},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.2791999876499176},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.27869999408721924},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.2646999955177307},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.2597000002861023},{"id":"https://openalex.org/C193415008","wikidata":"https://www.wikidata.org/wiki/Q639681","display_name":"Network architecture","level":2,"score":0.25940001010894775},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.2554999887943268}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.48550/arxiv.2606.25277","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2606.25277","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"Preprint"}],"best_oa_location":{"id":"doi:10.48550/arxiv.2606.25277","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2606.25277","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Preprint"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.45445048809051514}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"To":[0,57],"address":[1],"data":[2,59,170,199],"overload":[3],"and":[4,54,150,177],"inefficient":[5],"shape-level":[6,128],"annotation":[7,28],"in":[8],"robotic":[9],"visual":[10],"inspection,":[11],"this":[12],"paper":[13],"proposes":[14],"a":[15,31,35,41,64,117],"hardware-software":[16],"integrated":[17],"optoelectronic":[18,110],"architecture.":[19],"A":[20],"non-imaging,":[21],"low-data":[22,187],"paradigm":[23,188],"is":[24,124],"established":[25],"to":[26,80,93,126,159],"minimize":[27],"dependency.":[29],"First,":[30],"sensor-in-the-loop":[32],"strategy":[33,68],"reconfigures":[34],"Digital":[36],"Micromirror":[37],"Device":[38],"(DMD)":[39],"as":[40],"physical":[42],"optical":[43],"convolutional":[44],"layer,":[45],"enabling":[46],"photonic-domain":[47],"feature":[48],"extraction":[49],"that":[50],"unifies":[51],"sensing":[52,67],"hardware":[53],"processing":[55],"software.":[56],"suppress":[58],"volume":[60,171],"at":[61],"the":[62,91,105,109,139,162],"source,":[63],"block-based":[65],"compressed":[66],"encodes":[69],"spatial":[70],"information":[71],"into":[72],"low-dimensional":[73],"temporal":[74],"signals,":[75],"drastically":[76],"reducing":[77,169],"redundancy.":[78],"Subsequently,":[79],"bypass":[81],"laborious":[82],"manual":[83],"defect":[84,114,129,136],"shape":[85],"annotation,":[86],"natural":[87],"language":[88],"descriptions":[89],"guide":[90],"network":[92,112],"align":[94],"with":[95],"highly":[96],"generalizable":[97],"features":[98],"from":[99],"Contrastive":[100],"Language-Image":[101],"Pre-training":[102],"(CLIP),":[103],"steering":[104],"attention":[106],"maps":[107],"of":[108],"neural":[111],"toward":[113],"shapes.":[115],"Furthermore,":[116],"Localization":[118],"Accuracy":[119],"for":[120,174,182,193],"Attention":[121],"(LAA)":[122],"metric":[123],"proposed":[125,163],"quantify":[127],"localization":[130],"performance.":[131],"Experiments":[132],"on":[133],"transparent":[134],"material":[135],"detection":[137],"validate":[138],"system's":[140],"effectiveness.":[141],"Parametric":[142],"analysis":[143],"reveals":[144],"how":[145],"measurement":[146],"matrices,":[147],"compression":[148],"ratios,":[149],"block":[151],"sizes":[152],"affect":[153],"accuracy.":[154],"Results":[155],"show":[156],"that,":[157],"compared":[158],"traditional":[160],"imaging,":[161],"architecture":[164],"maintains":[165],"equivalent":[166],"accuracy":[167],"while":[168],"by":[172,180],"90%":[173],"Vision":[175],"Transformers":[176],"computational":[178],"workload":[179],"60%":[181],"Convolutional":[183],"Neural":[184],"Networks.":[185],"This":[186],"offers":[189],"an":[190],"efficient":[191],"solution":[192],"industrial":[194],"automation":[195],"scenarios":[196],"involving":[197],"massive":[198],"streams,":[200],"high":[201],"acquisition":[202],"costs,":[203],"or":[204],"constrained":[205],"edge":[206],"resources.":[207]},"counts_by_year":[],"updated_date":"2026-07-01T06:00:48.157686","created_date":"2026-06-26T00:00:00"}