{"id":"https://openalex.org/W7160507732","doi":"https://doi.org/10.48550/arxiv.2605.04213","title":"The Anatomy of Silent Data Corruption: GPU Error Pattern Study and Modeling Guidance","display_name":"The Anatomy of Silent Data Corruption: GPU Error Pattern Study and Modeling Guidance","publication_year":2026,"publication_date":"2026-05-05","ids":{"openalex":"https://openalex.org/W7160507732","doi":"https://doi.org/10.48550/arxiv.2605.04213"},"language":null,"primary_location":{"id":"doi:10.48550/arxiv.2605.04213","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2605.04213","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Preprint"},"type":"preprint","indexed_in":["datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.48550/arxiv.2605.04213","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5133592220","display_name":"Chung-Hsuan Tung","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tung, Chung-Hsuan","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110299873","display_name":"Yanxiang Huang","orcid":"https://orcid.org/0009-0003-2172-0074"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Huang, Yanxiang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5133592820","display_name":"Nirmal Saxena","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Saxena, Nirmal","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082186622","display_name":"P.P. Shirvani","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shirvani, Philip","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065625558","display_name":"Saurabh Hukerikar","orcid":"https://orcid.org/0000-0002-2612-2001"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hukerikar, Saurabh","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012983999","display_name":"Twinkle Jain","orcid":"https://orcid.org/0000-0001-9576-7391"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jain, Twinkle","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5135598412","display_name":"Abhishek Tyagi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tyagi, Abhishek","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5135596237","display_name":"Sanjay Gongalore","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Gongalore, Sanjay","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.6589000225067139,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.6589000225067139,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.1324000060558319,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.0689999982714653,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7024999856948853},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6620000004768372},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5665000081062317},{"id":"https://openalex.org/keywords/cuda","display_name":"CUDA","score":0.5555999875068665},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.5284000039100647},{"id":"https://openalex.org/keywords/language-change","display_name":"Language change","score":0.47200000286102295},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.3885999917984009},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.36579999327659607}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.734499990940094},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7024999856948853},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6620000004768372},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5665000081062317},{"id":"https://openalex.org/C2778119891","wikidata":"https://www.wikidata.org/wiki/Q477690","display_name":"CUDA","level":2,"score":0.5555999875068665},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.5284000039100647},{"id":"https://openalex.org/C2780027415","wikidata":"https://www.wikidata.org/wiki/Q524648","display_name":"Language change","level":2,"score":0.47200000286102295},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.3885999917984009},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.36579999327659607},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.36340001225471497},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34200000762939453},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33070001006126404},{"id":"https://openalex.org/C51632099","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Training set","level":2,"score":0.32100000977516174},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3012000024318695},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.30000001192092896},{"id":"https://openalex.org/C137293760","wikidata":"https://www.wikidata.org/wiki/Q3621696","display_name":"Language model","level":2,"score":0.29249998927116394},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.2754000127315521},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2734000086784363},{"id":"https://openalex.org/C137176749","wikidata":"https://www.wikidata.org/wiki/Q4105337","display_name":"Psychological resilience","level":2,"score":0.271699994802475},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.26179999113082886},{"id":"https://openalex.org/C50630238","wikidata":"https://www.wikidata.org/wiki/Q971505","display_name":"General-purpose computing on graphics processing units","level":3,"score":0.25290000438690186},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.25270000100135803},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.2526000142097473},{"id":"https://openalex.org/C2777211547","wikidata":"https://www.wikidata.org/wiki/Q17141490","display_name":"Training (meteorology)","level":2,"score":0.25189998745918274},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.25040000677108765}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.48550/arxiv.2605.04213","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2605.04213","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"Preprint"}],"best_oa_location":{"id":"doi:10.48550/arxiv.2605.04213","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2605.04213","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Preprint"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.8123668432235718}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Silent":[0],"data":[1],"corruption":[2,66,98],"(SDC)":[3],"threatens":[4],"the":[5],"reliability":[6],"of":[7,22,65,83,93,117],"large-scale":[8,38],"GPU":[9,60,119],"clusters":[10],"used":[11],"for":[12,80,114],"training":[13],"large":[14],"language":[15],"models,":[16],"yet":[17],"its":[18],"rarity":[19],"and":[20,70,96,109],"lack":[21],"explicit":[23],"error":[24],"signals":[25],"make":[26],"accurate":[27],"high-level":[28,106],"modeling":[29,108],"challenging.":[30],"To":[31],"address":[32],"this":[33],"gap,":[34],"we":[35],"conducted":[36],"a":[37,44],"gate-level":[39],"stuck-at":[40],"fault":[41,107,112],"injection":[42,113],"on":[43],"production-class":[45,118],"data-center":[46],"GPU,":[47],"consuming":[48],"over":[49],"three":[50],"million":[51],"simulator":[52],"hours":[53],"across":[54],"63":[55],"CUDA":[56],"micro-benchmarks.":[57],"We":[58],"extracted":[59],"SDC":[61,84],"characteristics":[62],"in":[63],"terms":[64],"types,":[67],"bit-flip":[68,94],"behavior,":[69],"warp-aligned":[71],"spatial":[72],"correlation.":[73],"Our":[74],"results":[75],"show":[76],"that":[77,86,97],"NaN/+INF/-INF":[78],"account":[79],"only":[81],"1.01%":[82],"outcomes,":[85],"single-bit":[87],"flips":[88],"constitute":[89],"less":[90],"than":[91],"40%":[92],"events,":[95],"addresses":[99],"exhibit":[100],"periodicity.":[101],"These":[102],"statistics":[103],"motivate":[104],"distribution-aware":[105],"realistic":[110],"software-based":[111],"resilience":[115],"evaluation":[116],"architectures.":[120]},"counts_by_year":[],"updated_date":"2026-07-01T06:00:48.157686","created_date":"2026-05-08T00:00:00"}