{"id":"https://openalex.org/W7128358282","doi":"https://doi.org/10.48550/arxiv.2602.06519","title":"Topography scanning as a part of process monitoring in power cable insulation process","display_name":"Topography scanning as a part of process monitoring in power cable insulation process","publication_year":2026,"publication_date":"2026-02-06","ids":{"openalex":"https://openalex.org/W7128358282","doi":"https://doi.org/10.48550/arxiv.2602.06519"},"language":null,"primary_location":{"id":"pmh:doi:10.48550/arxiv.2602.06519","is_oa":true,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4406922384","display_name":"Open MIND","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"publisher-specific-oa","license_id":"https://openalex.org/licenses/publisher-specific-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"},"type":"preprint","indexed_in":["datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":null,"any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049089652","display_name":"Janne Harjuhahto","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Harjuhahto, Janne","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5125423020","display_name":"Jaakko Harjuhahto","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Harjuhahto, Jaakko","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067351477","display_name":"Mikko Lahti","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Lahti, Mikko","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085521923","display_name":"Jussi Hanhirova","orcid":"https://orcid.org/0000-0002-2776-9405"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hanhirova, Jussi","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5036553401","display_name":"Bj\u00f6rn Sonerud","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sonerud, Bj\u00f6rn","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.22300000488758087,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.22300000488758087,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.09650000184774399,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.0625,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5437999963760376},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5264000296592712},{"id":"https://openalex.org/keywords/homogeneity","display_name":"Homogeneity (statistics)","score":0.4438999891281128},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.43050000071525574},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.4219000041484833},{"id":"https://openalex.org/keywords/data-processing","display_name":"Data processing","score":0.36880001425743103},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.3594000041484833},{"id":"https://openalex.org/keywords/power-cable","display_name":"Power cable","score":0.3578999936580658}],"concepts":[{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5437999963760376},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5264000296592712},{"id":"https://openalex.org/C142259097","wikidata":"https://www.wikidata.org/wiki/Q5891314","display_name":"Homogeneity (statistics)","level":2,"score":0.4438999891281128},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.43050000071525574},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.4219000041484833},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3978999853134155},{"id":"https://openalex.org/C138827492","wikidata":"https://www.wikidata.org/wiki/Q6661985","display_name":"Data processing","level":2,"score":0.36880001425743103},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.36820000410079956},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.3594000041484833},{"id":"https://openalex.org/C2777772068","wikidata":"https://www.wikidata.org/wiki/Q1939150","display_name":"Power cable","level":3,"score":0.3578999936580658},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35749998688697815},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.34380000829696655},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32339999079704285},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3165000081062317},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.3125999867916107},{"id":"https://openalex.org/C112118009","wikidata":"https://www.wikidata.org/wiki/Q4925872","display_name":"Data processing system","level":2,"score":0.3061999976634979},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.2791999876499176},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.2734000086784363},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.26930001378059387},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.26579999923706055},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.2621999979019165},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.26159998774528503},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.25999999046325684},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25870001316070557},{"id":"https://openalex.org/C3019493240","wikidata":"https://www.wikidata.org/wiki/Q94701573","display_name":"3d scanning","level":2,"score":0.25110000371932983}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:doi:10.48550/arxiv.2602.06519","is_oa":true,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4406922384","display_name":"Open MIND","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"publisher-specific-oa","license_id":"https://openalex.org/licenses/publisher-specific-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"},{"id":"doi:10.48550/arxiv.2602.06519","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2602.06519","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"Preprint"}],"best_oa_location":{"id":"pmh:doi:10.48550/arxiv.2602.06519","is_oa":true,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4406922384","display_name":"Open MIND","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"publisher-specific-oa","license_id":"https://openalex.org/licenses/publisher-specific-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2,25],"novel":[3],"topography":[4],"scanning":[5],"system":[6,60],"developed":[7,63],"to":[8,23],"XLPE":[9],"cable":[10],"core":[11],"monitoring.":[12],"Modern":[13],"measurement":[14,84],"technology":[15],"is":[16,47],"utilized":[17],"together":[18],"with":[19],"embedded":[20],"high-performance":[21],"computing":[22],"build":[24],"complete":[26],"and":[27,38,44],"detailed":[28],"3D":[29],"surface":[30,57,83,90],"map":[31],"of":[32,82,89],"the":[33],"insulated":[34],"core.":[35],"Cross":[36],"sectional":[37],"lengthwise":[39],"geometry":[40],"errors":[41],"are":[42,75],"studied,":[43],"melt":[45],"homogeneity":[46],"identified":[48],"as":[49],"one":[50],"major":[51],"factor":[52],"for":[53,78],"these":[54],"errors.":[55],"A":[56],"defect":[58],"detection":[59,88],"has":[61],"been":[62],"utilizing":[64],"deep":[65],"learning":[66],"methods.":[67],"Our":[68],"results":[69],"show":[70],"that":[71],"convolutional":[72],"neural":[73],"networks":[74],"well":[76],"suited":[77],"real":[79],"time":[80],"analysis":[81],"data":[85],"enabling":[86],"reliable":[87],"defects.":[91]},"counts_by_year":[],"updated_date":"2026-07-01T06:00:48.157686","created_date":"2026-02-10T00:00:00"}