{"id":"https://openalex.org/W4414536573","doi":"https://doi.org/10.48550/arxiv.2508.01786","title":"Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing","display_name":"Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing","publication_year":2025,"publication_date":"2025-08-03","ids":{"openalex":"https://openalex.org/W4414536573","doi":"https://doi.org/10.48550/arxiv.2508.01786"},"language":"en","primary_location":{"id":"pmh:oai:arXiv.org:2508.01786","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2508.01786","pdf_url":"https://arxiv.org/pdf/2508.01786","source":{"id":"https://openalex.org/S4393918464","display_name":"ArXiv.org","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"type":"preprint","indexed_in":["arxiv","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2508.01786","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036312663","display_name":"Subhasish Mitra","orcid":"https://orcid.org/0000-0002-5572-5194"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Mitra, Subhasish","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032073929","display_name":"Subho S. Banerjee","orcid":"https://orcid.org/0000-0001-7187-6569"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Banerjee, Subho","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087441769","display_name":"Martin Dixon","orcid":"https://orcid.org/0000-0001-5805-3699"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dixon, Martin","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001964650","display_name":"Rama Govindaraju","orcid":"https://orcid.org/0009-0008-3783-7150"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Govindaraju, Rama","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043226007","display_name":"Peter Hochschild","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hochschild, Peter","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028348696","display_name":"Eric X. Liu","orcid":"https://orcid.org/0009-0001-3980-2364"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Liu, Eric X.","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018121398","display_name":"B. Parthasarathy","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Parthasarathy, Bharath","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5011491987","display_name":"Parthasarathy Ranganathan","orcid":"https://orcid.org/0000-0002-9751-5902"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ranganathan, Parthasarathy","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5036312663"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14347","display_name":"Big Data and Digital Economy","score":0.7281000018119812,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14347","display_name":"Big Data and Digital Economy","score":0.7281000018119812,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12535","display_name":"Machine Learning and Data Classification","score":0.6632999777793884,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.617900013923645},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.44040000438690186},{"id":"https://openalex.org/keywords/order","display_name":"Order (exchange)","score":0.4189000129699707},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.39079999923706055},{"id":"https://openalex.org/keywords/language-change","display_name":"Language change","score":0.3635999858379364}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.617900013923645},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5519999861717224},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4781000018119812},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.44040000438690186},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4230000078678131},{"id":"https://openalex.org/C182306322","wikidata":"https://www.wikidata.org/wiki/Q1779371","display_name":"Order (exchange)","level":2,"score":0.4189000129699707},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.4065999984741211},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.39079999923706055},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.38019999861717224},{"id":"https://openalex.org/C2780027415","wikidata":"https://www.wikidata.org/wiki/Q524648","display_name":"Language change","level":2,"score":0.3635999858379364},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3343999981880188},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.32269999384880066},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.29019999504089355},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.25929999351501465}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:oai:arXiv.org:2508.01786","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2508.01786","pdf_url":"https://arxiv.org/pdf/2508.01786","source":{"id":"https://openalex.org/S4393918464","display_name":"ArXiv.org","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"doi:10.48550/arxiv.2508.01786","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2508.01786","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2508.01786","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2508.01786","pdf_url":"https://arxiv.org/pdf/2508.01786","source":{"id":"https://openalex.org/S4393918464","display_name":"ArXiv.org","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Too":[0],"many":[1,80],"defective":[2,63,81,91,106],"compute":[3,23],"chips":[4,64,82],"are":[5],"escaping":[6],"existing":[7,84],"manufacturing":[8,85],"tests":[9],"--":[10],"at":[11],"least":[12],"an":[13],"order":[14],"of":[15,62,90,101,116],"magnitude":[16],"more":[17],"than":[18],"industrial":[19,118],"targets":[20],"across":[21],"all":[22],"chip":[24],"types":[25],"in":[26],"data":[27,30],"centers.":[28],"Silent":[29],"corruptions":[31],"(SDCs)":[32],"caused":[33],"by":[34],"test":[35,57,95,119],"escapes,":[36],"when":[37],"left":[38],"unaddressed,":[39],"pose":[40],"a":[41,49],"major":[42],"threat":[43],"to":[44,97],"reliable":[45],"computing.":[46],"We":[47],"present":[48],"three-pronged":[50],"approach":[51],"outlining":[52],"future":[53],"directions":[54],"for":[55,74,104],"overcoming":[56],"escapes:":[58],"(a)":[59],"Quick":[60],"diagnosis":[61,71],"directly":[65],"from":[66],"system-level":[67],"incorrect":[68],"behaviors.":[69],"Such":[70],"is":[72],"critical":[73],"gaining":[75],"insights":[76],"into":[77],"why":[78],"so":[79],"escape":[83],"testing.":[86],"(b)":[87],"In-field":[88],"detection":[89],"chips.":[92,107],"(c)":[93],"New":[94],"experiments":[96,109,120],"understand":[98],"the":[99,112],"effectiveness":[100],"new":[102],"techniques":[103],"detecting":[105],"These":[108],"must":[110],"overcome":[111],"drawbacks":[113],"and":[114,121],"pitfalls":[115],"previous":[117],"case":[122],"studies.":[123]},"counts_by_year":[],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-10-10T00:00:00"}