{"id":"https://openalex.org/W4283320097","doi":"https://doi.org/10.48550/arxiv.2206.09999","title":"Understanding RowHammer Under Reduced Wordline Voltage: An Experimental Study Using Real DRAM Devices","display_name":"Understanding RowHammer Under Reduced Wordline Voltage: An Experimental Study Using Real DRAM Devices","publication_year":2022,"publication_date":"2022-06-20","ids":{"openalex":"https://openalex.org/W4283320097","doi":"https://doi.org/10.48550/arxiv.2206.09999"},"language":"en","primary_location":{"id":"pmh:oai:arXiv.org:2206.09999","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2206.09999","pdf_url":"https://arxiv.org/pdf/2206.09999","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"text"},"type":"preprint","indexed_in":["arxiv","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2206.09999","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001715701","display_name":"A. Giray Ya\u011fl\u0131k\u00e7\u0131","orcid":"https://orcid.org/0000-0002-9333-6077"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Ya\u011fl\u0131k\u00e7\u0131, A. Giray","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070892312","display_name":"Haocong Luo","orcid":"https://orcid.org/0009-0009-0849-8724"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Luo, Haocong","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038933889","display_name":"Geraldo F. de Oliviera","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"de Oliviera, Geraldo F.","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056716458","display_name":"Ataberk Olgun","orcid":"https://orcid.org/0000-0001-5333-5726"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Olgun, Ataberk","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102940753","display_name":"Minesh Patel","orcid":"https://orcid.org/0000-0002-7725-4792"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Patel, Minesh","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010929521","display_name":"Jisung Park","orcid":"https://orcid.org/0000-0002-1826-9003"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Park, Jisung","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032313427","display_name":"Hasan Hassan","orcid":"https://orcid.org/0000-0001-9766-007X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hassan, Hasan","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040743445","display_name":"Jeremie S. Kim","orcid":"https://orcid.org/0000-0001-6153-9008"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kim, Jeremie S.","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002441341","display_name":"Lois Orosa","orcid":"https://orcid.org/0000-0001-6773-6395"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Orosa, Lois","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5050695684","display_name":"Onur Mutlu","orcid":"https://orcid.org/0000-0002-0075-2312"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mutlu, Onur","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5001715701"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.9233157634735107},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5279825329780579},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5140451192855835},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.440170556306839},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.4378054440021515},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3573877215385437},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3573375344276428},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.30672699213027954},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2917236089706421},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.08198735117912292}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.9233157634735107},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5279825329780579},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5140451192855835},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.440170556306839},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.4378054440021515},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3573877215385437},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3573375344276428},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.30672699213027954},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2917236089706421},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.08198735117912292}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:oai:arXiv.org:2206.09999","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2206.09999","pdf_url":"https://arxiv.org/pdf/2206.09999","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"text"},{"id":"doi:10.48550/arxiv.2206.09999","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2206.09999","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2206.09999","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2206.09999","pdf_url":"https://arxiv.org/pdf/2206.09999","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320316785","display_name":"VMware","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4283320097.pdf","grobid_xml":"https://content.openalex.org/works/W4283320097.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W3120961607","https://openalex.org/W2098207691","https://openalex.org/W3148568549","https://openalex.org/W1648516568","https://openalex.org/W361036515","https://openalex.org/W2269474412","https://openalex.org/W4386903460","https://openalex.org/W4211178602","https://openalex.org/W2433923775","https://openalex.org/W2537599394"],"abstract_inverted_index":{"RowHammer":[0,58,64,100,120,135,164,182,202,267],"is":[1,71,91,115,145,258],"a":[2,11,20,57,95,113,116,161,181,227,259,264],"circuit-level":[3],"DRAM":[4,12,38,82,104,155,162,228,265,273],"vulnerability,":[5,121],"where":[6],"repeatedly":[7],"activating":[8],"and":[9,14,25,62,76,198,234],"precharging":[10],"row,":[13],"thus":[15],"alternating":[16],"the":[17,49,63,99,109,127,134,146,173,201,220,239],"voltage":[18,27,110,131],"of":[19,52,98,102,119,129,175,192,213,241,249],"row's":[21],"wordline":[22,114,130],"between":[23],"low":[24],"high":[26],"levels,":[28],"can":[29],"cause":[30],"bit":[31,59,65,183,203],"flips":[32],"in":[33,142],"physically":[34],"nearby":[35],"rows.":[36],"Recent":[37],"chips":[39,156,197],"are":[40],"more":[41],"vulnerable":[42],"to":[43,55,73,79,93,149,179,187,208,272],"RowHammer:":[44],"with":[45,189,210],"technology":[46],"node":[47],"scaling,":[48],"minimum":[50],"number":[51,174],"activate-precharge":[53,176],"cycles":[54,177],"induce":[56,180],"flip":[60,184],"reduces":[61,160],"error":[66,204],"rate":[67,205],"increases.":[68],"Therefore,":[69],"it":[70,90],"critical":[72],"develop":[74,94],"effective":[75],"scalable":[77],"approaches":[78],"protect":[80],"modern":[81,103],"systems":[83],"against":[84],"RowHammer.":[85],"To":[86],"enable":[87],"such":[88],"solutions,":[89],"essential":[92],"deeper":[96],"understanding":[97],"vulnerability":[101,268],"chips.":[105,218,252,274],"However,":[106],"even":[107],"though":[108],"toggling":[111],"on":[112,133,152],"key":[117],"determinant":[118],"no":[122],"prior":[123],"work":[124,138,148],"experimentally":[125,150],"demonstrates":[126],"effect":[128],"(VPP)":[132],"vulnerability.":[136,165],"Our":[137],"closes":[139],"this":[140],"gap":[141],"understanding.":[143],"This":[144],"first":[147],"demonstrate":[151],"272":[153,250],"real":[154],"that":[157,168,255],"lowering":[158,169],"VPP":[159,170,224,257],"chip's":[163,266],"We":[166,253],"show":[167],"1)":[171],"increases":[172],"needed":[178],"by":[185,206],"up":[186,207],"85.8%":[188],"an":[190,211],"average":[191,212],"7.4%":[193],"across":[194,215],"all":[195,216],"tested":[196,217,251],"2)":[199],"decreases":[200],"66.9%":[209],"15.2%":[214],"At":[219],"same":[221],"time,":[222],"reducing":[223,256,263],"marginally":[225],"worsens":[226],"cell's":[229],"access":[230],"latency,":[231],"charge":[232],"restoration,":[233],"data":[235],"retention":[236],"time":[237],"within":[238],"guardbands":[240],"system-level":[242],"nominal":[243],"timing":[244],"parameters":[245],"for":[246,262],"208":[247],"out":[248],"conclude":[254],"promising":[260],"strategy":[261],"without":[269],"requiring":[270],"modifications":[271]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":5}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}