{"id":"https://openalex.org/W1993854166","doi":"https://doi.org/10.4018/jiit.2010070102","title":"A Fuzzy-Neural Approach with Collaboration Mechanisms for Semiconductor Yield Forecasting","display_name":"A Fuzzy-Neural Approach with Collaboration Mechanisms for Semiconductor Yield Forecasting","publication_year":2010,"publication_date":"2010-07-01","ids":{"openalex":"https://openalex.org/W1993854166","doi":"https://doi.org/10.4018/jiit.2010070102","mag":"1993854166"},"language":"en","primary_location":{"id":"doi:10.4018/jiit.2010070102","is_oa":false,"landing_page_url":"https://doi.org/10.4018/jiit.2010070102","pdf_url":null,"source":{"id":"https://openalex.org/S116626079","display_name":"International Journal of Intelligent Information Technologies","issn_l":"1548-3657","issn":["1548-3657","1548-3665"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320424","host_organization_name":"IGI Global","host_organization_lineage":["https://openalex.org/P4310320424"],"host_organization_lineage_names":["IGI Global"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Intelligent Information Technologies","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037831741","display_name":"Toly Chen","orcid":"https://orcid.org/0000-0002-5608-5176"},"institutions":[{"id":"https://openalex.org/I4880106","display_name":"Feng Chia University","ror":"https://ror.org/05vhczg54","country_code":"TW","type":"education","lineage":["https://openalex.org/I4880106"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Toly Chen","raw_affiliation_strings":["Feng Chia University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Feng Chia University, Taiwan","institution_ids":["https://openalex.org/I4880106"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5037831741"],"corresponding_institution_ids":["https://openalex.org/I4880106"],"apc_list":null,"apc_paid":null,"fwci":4.84,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.94021603,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"6","issue":"3","first_page":"17","last_page":"33"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9869999885559082,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9869999885559082,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9781000018119812,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10820","display_name":"Fuzzy Logic and Control Systems","score":0.9628999829292297,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.8073365688323975},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7616606950759888},{"id":"https://openalex.org/keywords/factory","display_name":"Factory (object-oriented programming)","score":0.7068615555763245},{"id":"https://openalex.org/keywords/fuzzy-logic","display_name":"Fuzzy logic","score":0.5919017791748047},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.5872264504432678},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.553180456161499},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5494319200515747},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.43684399127960205},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.43340224027633667},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.3388858139514923},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08350586891174316},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08187317848205566}],"concepts":[{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.8073365688323975},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7616606950759888},{"id":"https://openalex.org/C40149104","wikidata":"https://www.wikidata.org/wiki/Q5620977","display_name":"Factory (object-oriented programming)","level":2,"score":0.7068615555763245},{"id":"https://openalex.org/C58166","wikidata":"https://www.wikidata.org/wiki/Q224821","display_name":"Fuzzy logic","level":2,"score":0.5919017791748047},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.5872264504432678},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.553180456161499},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5494319200515747},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.43684399127960205},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.43340224027633667},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.3388858139514923},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08350586891174316},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08187317848205566},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.4018/jiit.2010070102","is_oa":false,"landing_page_url":"https://doi.org/10.4018/jiit.2010070102","pdf_url":null,"source":{"id":"https://openalex.org/S116626079","display_name":"International Journal of Intelligent Information Technologies","issn_l":"1548-3657","issn":["1548-3657","1548-3665"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320424","host_organization_name":"IGI Global","host_organization_lineage":["https://openalex.org/P4310320424"],"host_organization_lineage_names":["IGI Global"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Intelligent Information Technologies","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:igg:jiit00:v:6:y:2010:i:3:p:17-33","is_oa":false,"landing_page_url":"https://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/jiit.2010070102","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5600000023841858,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W239841408","https://openalex.org/W1501144083","https://openalex.org/W1964057582","https://openalex.org/W1977305991","https://openalex.org/W1991964802","https://openalex.org/W1995157279","https://openalex.org/W2002235652","https://openalex.org/W2016678695","https://openalex.org/W2021909223","https://openalex.org/W2023948527","https://openalex.org/W2030894915","https://openalex.org/W2040083057","https://openalex.org/W2042789880","https://openalex.org/W2043213102","https://openalex.org/W2043643018","https://openalex.org/W2056611606","https://openalex.org/W2057055193","https://openalex.org/W2064215184","https://openalex.org/W2072479006","https://openalex.org/W2097001819","https://openalex.org/W2100027572","https://openalex.org/W2101784664","https://openalex.org/W2126369758","https://openalex.org/W2169044080","https://openalex.org/W2170120825","https://openalex.org/W3123407492"],"related_works":["https://openalex.org/W2013981730","https://openalex.org/W1571475181","https://openalex.org/W4321014120","https://openalex.org/W2129060773","https://openalex.org/W2017049928","https://openalex.org/W2384968155","https://openalex.org/W303715527","https://openalex.org/W2080254140","https://openalex.org/W2097417402","https://openalex.org/W2367557013"],"abstract_inverted_index":{"Yield":[0],"forecasting":[1,112],"is":[2,24,32],"critical":[3],"to":[4,52,59,73,93,98],"a":[5,18],"semiconductor":[6,15,110],"manufacturing":[7],"factory.":[8],"To":[9,82],"further":[10],"enhance":[11],"the":[12,54,61,67,70,75,84,87,101],"effectiveness":[13,85],"of":[14,63,77,86,109],"yield":[16,111],"forecasting,":[17],"fuzzy-neural":[19],"approach":[20,38],"with":[21],"collaboration":[22,42],"mechanisms":[23],"proposed":[25,30,88,102],"in":[26],"this":[27],"study.":[28],"The":[29,49],"methodology":[31,103],"modified":[33],"from":[34],"Chen":[35],"and":[36,46,107,115],"Lin\u2019s":[37],"by":[39,113],"incorporating":[40],"two":[41],"mechanisms:":[43],"favoring":[44],"mechanism":[45],"disfavoring":[47],"mechanism.":[48],"former":[50],"helps":[51],"achieve":[53],"consensus":[55],"among":[56],"multiple":[57],"experts":[58],"avoid":[60],"missing":[62],"actual":[64,80],"yield,":[65],"while":[66],"latter":[68],"shrinks":[69],"search":[71],"region":[72],"increase":[74],"probability":[76],"finding":[78],"out":[79],"yield.":[81],"evaluate":[83],"methodology,":[89],"it":[90],"was":[91],"applied":[92],"some":[94],"real":[95],"cases.":[96],"According":[97],"experimental":[99],"results,":[100],"improved":[104],"both":[105],"precision":[106],"accuracy":[108],"58%":[114],"35%,":[116],"respectively.":[117]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":4}],"updated_date":"2026-06-11T06:19:23.411458","created_date":"2025-10-10T00:00:00"}