{"id":"https://openalex.org/W3185577322","doi":"https://doi.org/10.4018/ijsppc.2021040102","title":"Low Power Restoration Circuits Reduce Swing Voltages of SRAM Cell With Improved Read and Write Margins","display_name":"Low Power Restoration Circuits Reduce Swing Voltages of SRAM Cell With Improved Read and Write Margins","publication_year":2021,"publication_date":"2021-04-01","ids":{"openalex":"https://openalex.org/W3185577322","doi":"https://doi.org/10.4018/ijsppc.2021040102","mag":"3185577322"},"language":"en","primary_location":{"id":"doi:10.4018/ijsppc.2021040102","is_oa":false,"landing_page_url":"https://doi.org/10.4018/ijsppc.2021040102","pdf_url":null,"source":{"id":"https://openalex.org/S4210204675","display_name":"International Journal of Security and Privacy in Pervasive Computing","issn_l":"2643-7937","issn":["2643-7937","2643-7945"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320424","host_organization_name":"IGI Global","host_organization_lineage":["https://openalex.org/P4310320424"],"host_organization_lineage_names":["IGI Global"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Security and Privacy in Pervasive Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035405247","display_name":"Vinod Kumar","orcid":"https://orcid.org/0000-0002-2939-1100"},"institutions":[{"id":"https://openalex.org/I863896202","display_name":"Delhi Technological University","ror":"https://ror.org/01ztcvt22","country_code":"IN","type":"education","lineage":["https://openalex.org/I863896202"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Vinod Kumar","raw_affiliation_strings":["Computer Science and Engineering, Delhi Technological University, India"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering, Delhi Technological University, India","institution_ids":["https://openalex.org/I863896202"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028359714","display_name":"Ram Murti Rawat","orcid":"https://orcid.org/0000-0001-7280-8779"},"institutions":[{"id":"https://openalex.org/I863896202","display_name":"Delhi Technological University","ror":"https://ror.org/01ztcvt22","country_code":"IN","type":"education","lineage":["https://openalex.org/I863896202"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ram Murti Rawat","raw_affiliation_strings":["Computer Science and Engineering, Delhi Technological University, India"],"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering, Delhi Technological University, India","institution_ids":["https://openalex.org/I863896202"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5035405247"],"corresponding_institution_ids":["https://openalex.org/I863896202"],"apc_list":null,"apc_paid":null,"fwci":0.1003,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42111753,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":"13","issue":"2","first_page":"16","last_page":"28"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8929139971733093},{"id":"https://openalex.org/keywords/cadence","display_name":"Cadence","score":0.7537625432014465},{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.6973100900650024},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6225012540817261},{"id":"https://openalex.org/keywords/swing","display_name":"Swing","score":0.6053828597068787},{"id":"https://openalex.org/keywords/noise-margin","display_name":"Noise margin","score":0.5531097650527954},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5293957591056824},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5195205807685852},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.44527676701545715},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43942901492118835},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.4117297828197479},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4056892395019531},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.32632237672805786},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.31408506631851196},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26345503330230713},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17355382442474365}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8929139971733093},{"id":"https://openalex.org/C2777125575","wikidata":"https://www.wikidata.org/wiki/Q14088448","display_name":"Cadence","level":2,"score":0.7537625432014465},{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.6973100900650024},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6225012540817261},{"id":"https://openalex.org/C65655974","wikidata":"https://www.wikidata.org/wiki/Q14867674","display_name":"Swing","level":2,"score":0.6053828597068787},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.5531097650527954},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5293957591056824},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5195205807685852},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.44527676701545715},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43942901492118835},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.4117297828197479},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4056892395019531},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.32632237672805786},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.31408506631851196},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26345503330230713},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17355382442474365},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.4018/ijsppc.2021040102","is_oa":false,"landing_page_url":"https://doi.org/10.4018/ijsppc.2021040102","pdf_url":null,"source":{"id":"https://openalex.org/S4210204675","display_name":"International Journal of Security and Privacy in Pervasive Computing","issn_l":"2643-7937","issn":["2643-7937","2643-7945"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320424","host_organization_name":"IGI Global","host_organization_lineage":["https://openalex.org/P4310320424"],"host_organization_lineage_names":["IGI Global"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Security and Privacy in Pervasive Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5799999833106995,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2002612140","https://openalex.org/W2131833150"],"related_works":["https://openalex.org/W2359519534","https://openalex.org/W2366324856","https://openalex.org/W2118528827","https://openalex.org/W2164440002","https://openalex.org/W1582224818","https://openalex.org/W2775062502","https://openalex.org/W3032966989","https://openalex.org/W2044270051","https://openalex.org/W4285609043","https://openalex.org/W2894151971"],"abstract_inverted_index":{"This":[0],"paper":[1],"examines":[2],"the":[3,7,48],"factors":[4],"that":[5],"affect":[6],"static":[8,13],"noise":[9],"margin":[10,71],"(SNM)":[11],"of":[12,25,60],"random":[14],"access":[15],"memories":[16],"which":[17,29],"focus":[18],"on":[19,47],"optimizing":[20],"read":[21,68],"and":[22,62,69],"write":[23,70],"operation":[24],"8T":[26,44,63],"SRAM":[27,34,45,64],"cell":[28,35],"is":[30,53,72],"better":[31],"than":[32],"6T":[33,61],"using":[36],"swing":[37],"restoration":[38],"for":[39,74],"dual":[40],"node":[41],"voltage.":[42],"New":[43],"technique":[46],"circuit":[49],"or":[50],"architecture":[51],"level":[52],"required.":[54],"In":[55],"this":[56],"paper,":[57],"comparative":[58],"analysis":[59],"cells":[65],"with":[66,77],"improved":[67],"done":[73],"130nm":[75],"technology":[76],"cadence":[78],"virtuoso":[79],"schematics":[80],"tool.":[81]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}