{"id":"https://openalex.org/W3046135141","doi":"https://doi.org/10.3906/elk-1910-22","title":"An efficient reliability simulation tool for lifetime-aware analog circuit synthesis","display_name":"An efficient reliability simulation tool for lifetime-aware analog circuit synthesis","publication_year":2020,"publication_date":"2020-03-28","ids":{"openalex":"https://openalex.org/W3046135141","doi":"https://doi.org/10.3906/elk-1910-22","mag":"3046135141"},"language":"en","primary_location":{"id":"doi:10.3906/elk-1910-22","is_oa":false,"landing_page_url":"https://doi.org/10.3906/elk-1910-22","pdf_url":null,"source":{"id":"https://openalex.org/S32837994","display_name":"TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES","issn_l":"1300-0632","issn":["1300-0632","1303-6203"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318422","host_organization_name":"Scientific and Technological Research Council of Turkey (TUBITAK)","host_organization_lineage":["https://openalex.org/P4310318422"],"host_organization_lineage_names":["Scientific and Technological Research Council of Turkey (TUBITAK)"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048055344","display_name":"Eng\u00edn Afacan","orcid":"https://orcid.org/0000-0002-1581-3894"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Engin AFACAN","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5048055344"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06700143,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"28","issue":"4","first_page":"2046","last_page":"2059"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bottleneck","display_name":"Bottleneck","score":0.6981339454650879},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6851562857627869},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6797745823860168},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5548195838928223},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5415804982185364},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.524442732334137},{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.5164311528205872},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46796637773513794},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4164239466190338},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.408552348613739},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3340645730495453},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3138190507888794},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2490268349647522},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.14852175116539001},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12481725215911865}],"concepts":[{"id":"https://openalex.org/C2780513914","wikidata":"https://www.wikidata.org/wiki/Q18210350","display_name":"Bottleneck","level":2,"score":0.6981339454650879},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6851562857627869},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6797745823860168},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5548195838928223},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5415804982185364},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.524442732334137},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.5164311528205872},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46796637773513794},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4164239466190338},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.408552348613739},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3340645730495453},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3138190507888794},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2490268349647522},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.14852175116539001},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12481725215911865},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3906/elk-1910-22","is_oa":false,"landing_page_url":"https://doi.org/10.3906/elk-1910-22","pdf_url":null,"source":{"id":"https://openalex.org/S32837994","display_name":"TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES","issn_l":"1300-0632","issn":["1300-0632","1303-6203"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318422","host_organization_name":"Scientific and Technological Research Council of Turkey (TUBITAK)","host_organization_lineage":["https://openalex.org/P4310318422"],"host_organization_lineage_names":["Scientific and Technological Research Council of Turkey (TUBITAK)"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.5600000023841858}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1657880117","https://openalex.org/W2595172197","https://openalex.org/W2127970246","https://openalex.org/W2084856301","https://openalex.org/W1001352512","https://openalex.org/W4382618745","https://openalex.org/W2885125400","https://openalex.org/W1989889224","https://openalex.org/W2040773997","https://openalex.org/W2332860651"],"abstract_inverted_index":{"Time-dependent":[0],"degradation":[1,36],"(aging)":[2],"has":[3],"become":[4],"more":[5],"severe":[6],"in":[7,69,85,100,130,217,256,265],"modern":[8],"CMOS":[9],"technologies.":[10],"Therefore,":[11],"it":[12,81],"is":[13,31,37,128,157,239],"highly":[14],"critical":[15],"to":[16,195,208,241,261],"capture":[17],"the":[18,35,43,50,53,56,77,101,107,132,148,152,155,166,179,196,199,203,243,246,257,262,266],"variation":[19],"effects":[20],"and":[21,52,114,220],"design":[22],"reliable":[23],"circuits":[24,185,227],"against":[25],"aging.":[26],"Simulation":[27],"of":[28,40,46,55,94,230,245],"time-dependent":[29],"variations":[30],"quite":[32],"complicated":[33],"since":[34],"a":[38,62,72,92,122,160,214,233,253],"function":[39],"time,":[41],"where":[42],"step":[44,64,74,111,124,133,168],"count":[45,65,75,112,125,134,169],"simulation":[47,145,175,197],"directly":[48],"affects":[49],"accuracy":[51,86,117],"efficiency":[54,78,244],"analysis.":[57],"Commercial":[58],"simulator":[59],"tools":[60],"use":[61],"constant":[63],"during":[66,110],"reliability":[67],"simulations,":[68],"which":[70,131],"choosing":[71],"large":[73],"degrades":[76],"whereas":[79],"keeping":[80],"small":[82],"may":[83],"result":[84],"problems.":[87,118],"To":[88,177],"overcome":[89],"this":[90,120],"bottleneck,":[91],"couple":[93],"different":[95],"approaches":[96],"have":[97,186],"been":[98,187],"proposed":[99,200,211,247],"literature.":[102,267],"Nevertheless,":[103],"they":[104],"suffer":[105],"from":[106],"initial":[108,204],"workload":[109,205],"determination":[113,126],"some":[115],"other":[116],"In":[119],"study,":[121],"two-level":[123],"approach":[127,201,212],"presented,":[129],"induced":[135],"estimation":[136],"error":[137,156],"can":[138,170,221],"be":[139,171,222],"promptly":[140],"determined":[141,172],"via":[142],"an":[143],"effective":[144],"strategy":[146],"at":[147],"first":[149],"level.":[150],"At":[151],"second":[153],"level,":[154],"fitted":[158],"into":[159],"saturated":[161],"power":[162],"law":[163],"model;":[164],"thus,":[165],"efficient":[167],"without":[173,228],"any":[174],"effort.":[176],"demonstrate":[178,242],"developed":[180,250],"tool,":[181],"two":[182],"case":[183],"study":[184],"designed":[188],"using":[189],"130":[190],"nm":[191],"technology":[192],"parameters.":[193],"According":[194],"results,":[198],"decreases":[202],"by":[206],"up":[207],"67%.":[209],"The":[210,249],"provides":[213,252],"remarkable":[215],"save":[216],"computation":[218,258],"time":[219,259],"used":[223],"for":[224],"all":[225],"analog":[226,235],"loss":[229],"generality.":[231],"Moreover,":[232],"reliability-aware":[234],"circuit":[236],"synthesis":[237],"tool":[238,251,264],"implemented":[240],"approach.":[248],"37%":[254],"improvement":[255],"compared":[260],"only":[263]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}