{"id":"https://openalex.org/W4410443521","doi":"https://doi.org/10.3390/sym17050775","title":"High Impedance Fault Line Detection Based on Current Traveling Wave Spectrum Symmetry Driving for New Distribution Network","display_name":"High Impedance Fault Line Detection Based on Current Traveling Wave Spectrum Symmetry Driving for New Distribution Network","publication_year":2025,"publication_date":"2025-05-16","ids":{"openalex":"https://openalex.org/W4410443521","doi":"https://doi.org/10.3390/sym17050775"},"language":"en","primary_location":{"id":"doi:10.3390/sym17050775","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym17050775","pdf_url":"https://www.mdpi.com/2073-8994/17/5/775/pdf?version=1747388975","source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/2073-8994/17/5/775/pdf?version=1747388975","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100412749","display_name":"Minfeng Xiao","orcid":"https://orcid.org/0000-0002-0507-7352"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Maner Xiao","raw_affiliation_strings":["School of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha 410114, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha 410114, China","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034336391","display_name":"Jupeng Zeng","orcid":"https://orcid.org/0000-0002-7593-5121"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jupeng Zeng","raw_affiliation_strings":["School of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha 410114, China"],"raw_orcid":"https://orcid.org/0000-0002-7593-5121","affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha 410114, China","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055977149","display_name":"Zehua Zhou","orcid":"https://orcid.org/0000-0002-8409-6307"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zehua Zhou","raw_affiliation_strings":["School of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha 410114, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha 410114, China","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100639008","display_name":"Qiming Zhang","orcid":"https://orcid.org/0000-0001-5195-4478"},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiming Zhang","raw_affiliation_strings":["School of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha 410114, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha 410114, China","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100671329","display_name":"Li Deng","orcid":"https://orcid.org/0000-0003-1527-0700"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Deng","raw_affiliation_strings":["School of Electrical and Electronic Engineering, North China Electric Power University, Beijing 102206, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, North China Electric Power University, Beijing 102206, China","institution_ids":["https://openalex.org/I153473198"]}]},{"author_position":"last","author":{"id":null,"display_name":"Feiyu Peng","orcid":null},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feiyu Peng","raw_affiliation_strings":["School of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha 410114, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Changsha University of Science and Technology, Changsha 410114, China","institution_ids":["https://openalex.org/I56934997"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5034336391"],"corresponding_institution_ids":["https://openalex.org/I56934997"],"apc_list":{"value":2000,"currency":"CHF","value_usd":2227},"apc_paid":{"value":2000,"currency":"CHF","value_usd":2227},"fwci":1.031,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.7389758,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"17","issue":"5","first_page":"775","last_page":"775"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9786999821662903,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6424655318260193},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5645318031311035},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.538103461265564},{"id":"https://openalex.org/keywords/symmetry","display_name":"Symmetry (geometry)","score":0.5266287922859192},{"id":"https://openalex.org/keywords/traveling-wave","display_name":"Traveling wave","score":0.5107986927032471},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5077715516090393},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.49844932556152344},{"id":"https://openalex.org/keywords/spectrum","display_name":"Spectrum (functional analysis)","score":0.4799071252346039},{"id":"https://openalex.org/keywords/high-impedance","display_name":"High impedance","score":0.4708934426307678},{"id":"https://openalex.org/keywords/distribution","display_name":"Distribution (mathematics)","score":0.4411761462688446},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4218827784061432},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41163045167922974},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3249076008796692},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2689266502857208},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2201642394065857},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.2087979018688202},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14458519220352173},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.10223475098609924},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.09430119395256042},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.08025467395782471}],"concepts":[{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6424655318260193},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5645318031311035},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.538103461265564},{"id":"https://openalex.org/C2779886137","wikidata":"https://www.wikidata.org/wiki/Q21030012","display_name":"Symmetry (geometry)","level":2,"score":0.5266287922859192},{"id":"https://openalex.org/C2988173416","wikidata":"https://www.wikidata.org/wiki/Q37172","display_name":"Traveling wave","level":2,"score":0.5107986927032471},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5077715516090393},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.49844932556152344},{"id":"https://openalex.org/C156778621","wikidata":"https://www.wikidata.org/wiki/Q1365748","display_name":"Spectrum (functional analysis)","level":2,"score":0.4799071252346039},{"id":"https://openalex.org/C174268685","wikidata":"https://www.wikidata.org/wiki/Q769127","display_name":"High impedance","level":3,"score":0.4708934426307678},{"id":"https://openalex.org/C110121322","wikidata":"https://www.wikidata.org/wiki/Q865811","display_name":"Distribution (mathematics)","level":2,"score":0.4411761462688446},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4218827784061432},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41163045167922974},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3249076008796692},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2689266502857208},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2201642394065857},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.2087979018688202},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14458519220352173},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10223475098609924},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.09430119395256042},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.08025467395782471},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3390/sym17050775","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym17050775","pdf_url":"https://www.mdpi.com/2073-8994/17/5/775/pdf?version=1747388975","source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.3390/sym17050775","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym17050775","pdf_url":"https://www.mdpi.com/2073-8994/17/5/775/pdf?version=1747388975","source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4410443521.pdf","grobid_xml":"https://content.openalex.org/works/W4410443521.grobid-xml"},"referenced_works_count":28,"referenced_works":["https://openalex.org/W1541786028","https://openalex.org/W2089070584","https://openalex.org/W2395167132","https://openalex.org/W2945075299","https://openalex.org/W2985089673","https://openalex.org/W3008699892","https://openalex.org/W3037681643","https://openalex.org/W3097665426","https://openalex.org/W3114677269","https://openalex.org/W3173217931","https://openalex.org/W3175164333","https://openalex.org/W3193180431","https://openalex.org/W4213311113","https://openalex.org/W4221034295","https://openalex.org/W4225014747","https://openalex.org/W4281480535","https://openalex.org/W4309179918","https://openalex.org/W4312684152","https://openalex.org/W4320713542","https://openalex.org/W4384010480","https://openalex.org/W4386006083","https://openalex.org/W4387132054","https://openalex.org/W4392679108","https://openalex.org/W4394615002","https://openalex.org/W4400583816","https://openalex.org/W4403888172","https://openalex.org/W4409573944","https://openalex.org/W6880071681"],"related_works":["https://openalex.org/W4283824105","https://openalex.org/W2004392033","https://openalex.org/W2123710183","https://openalex.org/W4206228631","https://openalex.org/W2179475672","https://openalex.org/W2351169659","https://openalex.org/W3135656270","https://openalex.org/W2296154764","https://openalex.org/W2545707526","https://openalex.org/W2093576948"],"abstract_inverted_index":{"Challenges":[0],"are":[1,49,69,136],"brought":[2],"to":[3,96,125],"high":[4],"impedance":[5],"fault":[6,16,99,172],"(HIF)":[7],"line":[8,100],"selection":[9],"in":[10,44,59],"traditional":[11],"distribution":[12],"networks":[13],"by":[14,25,34,51,138,148,159,179],"the":[15,35,57,77,108,114,118,153,160],"signals":[17],"with":[18,76,90,107,127],"short":[19],"windows":[20],"and":[21,56,62,66,82,113,142,175],"weak":[22,149],"characteristics":[23],"provided":[24],"new":[26,31,163],"energy":[27],"power":[28],"sources.":[29],"A":[30,71],"method":[32,112,122,144,169],"driven":[33],"symmetry":[36],"of":[37,79,88,120,130,155,162,167],"current":[38],"traveling":[39],"wave":[40],"spectrum":[41,140],"is":[42,74,94,123,145,177],"proposed":[43],"this":[45,121,143,168],"paper.":[46],"Frequency-domain":[47],"features":[48],"extracted":[50],"using":[52],"Pisarenko":[53],"spectral":[54],"decomposition,":[55],"differences":[58],"amplitude,":[60],"frequency,":[61],"polarity":[63],"between":[64],"faulted":[65],"healthy":[67],"feeders":[68],"analyzed.":[70],"similarity":[72],"matrix":[73],"constructed":[75],"help":[78],"Manhattan":[80],"distance,":[81],"an":[83,128],"improved":[84],"density-based":[85],"spatial":[86],"clustering":[87,93],"application":[89],"noise":[91],"(DBSCAN)":[92],"adopted":[95],"achieve":[97],"intelligent":[98],"selection.":[101],"Experimental":[102],"results":[103],"show":[104],"that":[105],"compared":[106],"steady":[109],"state":[110],"component":[111,116],"transient":[115],"method,":[117],"accuracy":[119,166],"increased":[124],"97.5%,":[126],"improvement":[129],"more":[131],"than":[132],"12.5%.":[133],"Quantitative":[134],"thresholds":[135],"replaced":[137],"qualitative":[139],"differences,":[141],"not":[146],"affected":[147],"signals,":[150],"thus":[151],"solving":[152],"problem":[154],"threshold":[156],"setting":[157],"caused":[158],"access":[161],"energy.":[164],"The":[165],"under":[170],"different":[171],"types,":[173],"phases,":[174],"resistances":[176],"verified":[178],"simulation,":[180],"ensuring":[181],"easy":[182],"engineering":[183],"implementation.":[184]},"counts_by_year":[{"year":2026,"cited_by_count":2}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}