{"id":"https://openalex.org/W4409338719","doi":"https://doi.org/10.3390/sym17040561","title":"Effective Enhancement for Printed Circuit Board Imaging in Near-Field Scanning Microwave Microscopy","display_name":"Effective Enhancement for Printed Circuit Board Imaging in Near-Field Scanning Microwave Microscopy","publication_year":2025,"publication_date":"2025-04-08","ids":{"openalex":"https://openalex.org/W4409338719","doi":"https://doi.org/10.3390/sym17040561"},"language":"en","primary_location":{"id":"doi:10.3390/sym17040561","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym17040561","pdf_url":"https://www.mdpi.com/2073-8994/17/4/561/pdf?version=1744091586","source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/2073-8994/17/4/561/pdf?version=1744091586","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000823508","display_name":"Tao Zhou","orcid":"https://orcid.org/0000-0002-5795-8012"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tao Zhou","raw_affiliation_strings":["School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102428628","display_name":"Quanxin Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Quanxin Zhou","raw_affiliation_strings":["School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100458893","display_name":"Hao Liu","orcid":"https://orcid.org/0000-0003-3769-4803"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Liu","raw_affiliation_strings":["School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100458893","display_name":"Hao Liu","orcid":"https://orcid.org/0000-0003-3769-4803"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hao Liu","raw_affiliation_strings":["School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085342780","display_name":"Haoyun Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoyun Liu","raw_affiliation_strings":["School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085342780","display_name":"Haoyun Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haoyun Liu","raw_affiliation_strings":["School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China","School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018851900","display_name":"Zhe Wu","orcid":"https://orcid.org/0000-0001-5552-4619"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhe Wu","raw_affiliation_strings":["School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China","School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"],"raw_orcid":"https://orcid.org/0000-0001-5552-4619","affiliations":[{"raw_affiliation_string":"School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100634850","display_name":"Jianlong Liu","orcid":"https://orcid.org/0000-0001-9756-9487"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianlong Liu","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"],"raw_orcid":"https://orcid.org/0000-0001-9756-9487","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025099170","display_name":"Yubin Gong","orcid":"https://orcid.org/0000-0003-3014-1309"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yubin Gong","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077616464","display_name":"Baoqing Zeng","orcid":"https://orcid.org/0000-0002-2377-5840"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baoqing Zeng","raw_affiliation_strings":["School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China"],"raw_orcid":"https://orcid.org/0000-0002-2377-5840","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5018851900","https://openalex.org/A5085342780","https://openalex.org/A5100458893"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":{"value":2000,"currency":"CHF","value_usd":2227},"apc_paid":{"value":2000,"currency":"CHF","value_usd":2227},"fwci":0.3265,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48622114,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"17","issue":"4","first_page":"561","last_page":"561"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.6396305561065674},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.617655873298645},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.5065373182296753},{"id":"https://openalex.org/keywords/microscopy","display_name":"Microscopy","score":0.5029129385948181},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4594458341598511},{"id":"https://openalex.org/keywords/microwave-imaging","display_name":"Microwave imaging","score":0.4537425935268402},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3173512816429138},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.223037451505661},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2197950780391693},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19234460592269897},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16632109880447388},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11511841416358948}],"concepts":[{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.6396305561065674},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.617655873298645},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.5065373182296753},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.5029129385948181},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4594458341598511},{"id":"https://openalex.org/C2779885931","wikidata":"https://www.wikidata.org/wiki/Q17010029","display_name":"Microwave imaging","level":3,"score":0.4537425935268402},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3173512816429138},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.223037451505661},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2197950780391693},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19234460592269897},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16632109880447388},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11511841416358948}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3390/sym17040561","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym17040561","pdf_url":"https://www.mdpi.com/2073-8994/17/4/561/pdf?version=1744091586","source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.3390/sym17040561","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym17040561","pdf_url":"https://www.mdpi.com/2073-8994/17/4/561/pdf?version=1744091586","source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1133666743","display_name":null,"funder_award_id":"202210614261","funder_id":"https://openalex.org/F4320322922","funder_display_name":"Department of Science and Technology of Sichuan Province"},{"id":"https://openalex.org/G2886274081","display_name":null,"funder_award_id":"61531010","funder_id":"https://openalex.org/F4320322922","funder_display_name":"Department of Science and Technology of Sichuan Province"},{"id":"https://openalex.org/G3970607251","display_name":null,"funder_award_id":"T2241002","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4246657205","display_name":null,"funder_award_id":"61921002","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4734380169","display_name":"\u5f84\u5411\u7535\u5b50\u6ce8\u5668\u4ef6\u7684\u57fa\u7840\u7406\u8bba\u4e0e\u5173\u952e\u6280\u672f\u7814\u7a76","funder_award_id":"61531010","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5820593353","display_name":null,"funder_award_id":"T2241002","funder_id":"https://openalex.org/F4320322922","funder_display_name":"Department of Science and Technology of Sichuan Province"},{"id":"https://openalex.org/G6198974112","display_name":null,"funder_award_id":"2020YJ0266","funder_id":"https://openalex.org/F4320322922","funder_display_name":"Department of Science and Technology of Sichuan Province"},{"id":"https://openalex.org/G7737920186","display_name":null,"funder_award_id":"61601101","funder_id":"https://openalex.org/F4320322922","funder_display_name":"Department of Science and Technology of Sichuan Province"},{"id":"https://openalex.org/G8009352552","display_name":null,"funder_award_id":"202310614343","funder_id":"https://openalex.org/F4320322922","funder_display_name":"Department of Science and Technology of Sichuan Province"},{"id":"https://openalex.org/G8364334958","display_name":null,"funder_award_id":"61921002","funder_id":"https://openalex.org/F4320322922","funder_display_name":"Department of Science and Technology of Sichuan Province"},{"id":"https://openalex.org/G8609040478","display_name":null,"funder_award_id":"61601101","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322922","display_name":"Department of Science and Technology of Sichuan Province","ror":"https://ror.org/04323m874"},{"id":"https://openalex.org/F4320323292","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4409338719.pdf","grobid_xml":"https://content.openalex.org/works/W4409338719.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W1976099926","https://openalex.org/W1993117353","https://openalex.org/W2045298997","https://openalex.org/W2046737606","https://openalex.org/W2060698442","https://openalex.org/W2083055718","https://openalex.org/W2095974491","https://openalex.org/W2156056291","https://openalex.org/W2794808212","https://openalex.org/W2991843344","https://openalex.org/W3015002992","https://openalex.org/W3106299849","https://openalex.org/W3111404230","https://openalex.org/W3129258791","https://openalex.org/W3129420947","https://openalex.org/W3144650180","https://openalex.org/W3176378302","https://openalex.org/W4223951199","https://openalex.org/W4313524407","https://openalex.org/W4321484057","https://openalex.org/W4385223256","https://openalex.org/W4386697801","https://openalex.org/W4388464390","https://openalex.org/W4400244262","https://openalex.org/W6797552854"],"related_works":["https://openalex.org/W4252608911","https://openalex.org/W2184913151","https://openalex.org/W2389426768","https://openalex.org/W3147987719","https://openalex.org/W2599361292","https://openalex.org/W2698654916","https://openalex.org/W2907188494","https://openalex.org/W3163908127","https://openalex.org/W4321016390","https://openalex.org/W2079569137"],"abstract_inverted_index":{"Near-field":[0],"microwave":[1,65],"microscopy":[2],"(NSMM)":[3],"is":[4,24],"a":[5,56,62,100,178],"promising":[6],"technique":[7],"for":[8,89,181],"the":[9,19,28,79,136,149,157],"non-destructive,":[10],"high-resolution":[11],"imaging":[12,69,120],"of":[13,103,111,130,161],"electrical":[14],"and":[15,49,84,107,159],"dielectric":[16],"properties":[17],"at":[18,71,99],"microscale.":[20],"However,":[21],"its":[22,38,169],"performance":[23,70],"highly":[25],"sensitive":[26],"to":[27,67,87,171],"probe-to-sample":[29],"distance,":[30],"often":[31],"requiring":[32],"extremely":[33],"close":[34],"proximity,":[35],"which":[36],"limits":[37],"practical":[39],"application":[40],"in":[41,45,163],"device":[42],"manufacturing,":[43],"especially":[44],"scenarios":[46,165],"involving":[47],"coatings":[48],"packaging.":[50],"In":[51],"this":[52],"study,":[53],"we":[54],"propose":[55],"distance":[57,102],"inversion":[58],"method":[59,77],"based":[60],"on":[61,135],"dual-port":[63],"symmetrical":[64],"probe":[66,82],"improve":[68],"larger,":[72],"safer":[73],"scanning":[74],"distances.":[75],"This":[76,152],"utilizes":[78],"correlation":[80],"between":[81],"height":[83],"resonant":[85],"frequency":[86],"compensate":[88],"distance-induced":[90],"signal":[91],"distortions.":[92],"The":[93,119,125,141],"experimental":[94],"results":[95],"demonstrate":[96],"that":[97],"even":[98],"probe\u2013sample":[101],"80":[104],"\u00b5m,":[105],"clear":[106],"distinguishable":[108],"NSMM":[109,162],"images":[110],"printed":[112],"circuit":[113],"boards":[114],"(PCBs)":[115],"can":[116],"be":[117],"obtained.":[118],"resolution":[121],"reached":[122],"13":[123],"\u00b5m.":[124],"defect":[126],"structure":[127],"with":[128],"dimensions":[129],"130":[131,133],"\u00d7":[132],"\u00b5m2":[134],"PCB":[137],"was":[138,144],"successfully":[139],"identified.":[140],"signal-to-noise":[142],"ratio":[143],"significantly":[145],"enhanced":[146],"after":[147],"applying":[148],"correction":[150],"method.":[151],"approach":[153],"not":[154],"only":[155],"improves":[156],"robustness":[158],"flexibility":[160],"industrial":[164],"but":[166],"also":[167],"extends":[168],"applicability":[170],"packaged":[172],"or":[173],"coated":[174],"electronic":[175],"devices,":[176],"offering":[177],"valuable":[179],"tool":[180],"advanced":[182],"non-destructive":[183],"testing.":[184]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-08-04T08:18:43.703281","created_date":"2025-10-10T00:00:00"}