{"id":"https://openalex.org/W4403242161","doi":"https://doi.org/10.3390/sym16101334","title":"Improving the Efficiency of Software Reliability Demonstration Testing by Introducing Testing Effectiveness","display_name":"Improving the Efficiency of Software Reliability Demonstration Testing by Introducing Testing Effectiveness","publication_year":2024,"publication_date":"2024-10-09","ids":{"openalex":"https://openalex.org/W4403242161","doi":"https://doi.org/10.3390/sym16101334"},"language":"en","primary_location":{"id":"doi:10.3390/sym16101334","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym16101334","pdf_url":null,"source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.3390/sym16101334","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100679714","display_name":"Qiuying Li","orcid":"https://orcid.org/0000-0002-8058-2500"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiuying Li","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China","Science & Technology on Reliability & Environmental Engineering Laboratory, Beijing 100191, China"],"raw_orcid":"https://orcid.org/0000-0002-8058-2500","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science & Technology on Reliability & Environmental Engineering Laboratory, Beijing 100191, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101505892","display_name":"Limeng Zhang","orcid":"https://orcid.org/0000-0002-1133-1759"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Limeng Zhang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China","Science & Technology on Reliability & Environmental Engineering Laboratory, Beijing 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science & Technology on Reliability & Environmental Engineering Laboratory, Beijing 100191, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5115591842","display_name":"Shuo Liu","orcid":"https://orcid.org/0000-0002-2512-7388"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shuo Liu","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China","Science & Technology on Reliability & Environmental Engineering Laboratory, Beijing 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science & Technology on Reliability & Environmental Engineering Laboratory, Beijing 100191, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5115591842"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":2000,"currency":"CHF","value_usd":2165},"apc_paid":{"value":2000,"currency":"CHF","value_usd":2165},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17714672,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"16","issue":"10","first_page":"1334","last_page":"1334"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6980534791946411},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6832261085510254},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.6135927438735962},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.5912423133850098},{"id":"https://openalex.org/keywords/regression-testing","display_name":"Regression testing","score":0.5663172006607056},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.48724427819252014},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4788755774497986},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4584604501724243},{"id":"https://openalex.org/keywords/random-testing","display_name":"Random testing","score":0.4520093500614166},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.3298787474632263},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.27245044708251953},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.26435911655426025},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.13844704627990723},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10578751564025879},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.08583518862724304},{"id":"https://openalex.org/keywords/regression-analysis","display_name":"Regression analysis","score":0.07286667823791504}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6980534791946411},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6832261085510254},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.6135927438735962},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.5912423133850098},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.5663172006607056},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.48724427819252014},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4788755774497986},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4584604501724243},{"id":"https://openalex.org/C106159264","wikidata":"https://www.wikidata.org/wiki/Q17146789","display_name":"Random testing","level":4,"score":0.4520093500614166},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.3298787474632263},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.27245044708251953},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.26435911655426025},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.13844704627990723},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10578751564025879},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.08583518862724304},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.07286667823791504},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.3390/sym16101334","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym16101334","pdf_url":null,"source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:0b0f65172eb14daca19adbdf117d2859","is_oa":false,"landing_page_url":"https://doaj.org/article/0b0f65172eb14daca19adbdf117d2859","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Symmetry, Vol 16, Iss 10, p 1334 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.3390/sym16101334","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym16101334","pdf_url":null,"source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":50,"referenced_works":["https://openalex.org/W1511504355","https://openalex.org/W1602882525","https://openalex.org/W1655474135","https://openalex.org/W1695950540","https://openalex.org/W1898869903","https://openalex.org/W1975620021","https://openalex.org/W2016413021","https://openalex.org/W2017707647","https://openalex.org/W2024338073","https://openalex.org/W2028536280","https://openalex.org/W2039041370","https://openalex.org/W2041104244","https://openalex.org/W2045893161","https://openalex.org/W2049695835","https://openalex.org/W2079588072","https://openalex.org/W2091611336","https://openalex.org/W2099855131","https://openalex.org/W2108557864","https://openalex.org/W2112687552","https://openalex.org/W2114754355","https://openalex.org/W2117735030","https://openalex.org/W2124300773","https://openalex.org/W2134691366","https://openalex.org/W2136646228","https://openalex.org/W2139220632","https://openalex.org/W2142812175","https://openalex.org/W2148338793","https://openalex.org/W2148815373","https://openalex.org/W2149270280","https://openalex.org/W2149568346","https://openalex.org/W2150076056","https://openalex.org/W2153701080","https://openalex.org/W2155391976","https://openalex.org/W2157755550","https://openalex.org/W2164122575","https://openalex.org/W2164501290","https://openalex.org/W2170680109","https://openalex.org/W2332281174","https://openalex.org/W2503122096","https://openalex.org/W2549666874","https://openalex.org/W2744524032","https://openalex.org/W2790825170","https://openalex.org/W3149134903","https://openalex.org/W4386385088","https://openalex.org/W6630802735","https://openalex.org/W6639732231","https://openalex.org/W6684281647","https://openalex.org/W6702604850","https://openalex.org/W6991092881","https://openalex.org/W7038906009"],"related_works":["https://openalex.org/W2179621094","https://openalex.org/W1978406750","https://openalex.org/W2028796071","https://openalex.org/W2018145554","https://openalex.org/W2054959879","https://openalex.org/W3134448717","https://openalex.org/W2243231242","https://openalex.org/W2052414005","https://openalex.org/W2187337904","https://openalex.org/W2795302276"],"abstract_inverted_index":{"For":[0],"highly":[1],"reliable":[2],"software":[3,20,37,58,131,154],"systems,":[4],"it":[5],"is":[6,97,101],"expensive,":[7],"time":[8],"consuming,":[9],"or":[10,39],"even":[11],"infeasible":[12],"to":[13,113],"perform":[14],"reliability":[15,21],"testing":[16,23,48],"via":[17],"a":[18],"conventional":[19],"demonstration":[22],"(SRDT)":[24],"plan.":[25],"Moreover,":[26],"in":[27],"the":[28,32,36,47,55,85,109,119,138,160,170,176,186,199,205,210,215,218],"traditional":[29],"SRDT":[30,96],"approach,":[31],"various":[33],"characteristics":[34],"of":[35,57,117,121,164,189,201,217],"system":[38],"test":[40,89,93,110,202,206,211],"sets":[41],"are":[42,135],"not":[43],"considered":[44],"when":[45],"making":[46],"schemes.":[49],"Some":[50],"studies":[51],"have":[52,74],"focused":[53],"on":[54,60,84,175],"effect":[56],"testability":[59],"SRDT,":[61],"but":[62],"only":[63],"limited":[64],"situations":[65],"were":[66],"discussed,":[67],"and":[68,71,92,123,132,147,155,162,172,191,204,213],"many":[69],"theoretical":[70],"practical":[72],"problems":[73],"been":[75],"left":[76],"unresolved.":[77],"In":[78],"this":[79,194],"paper,":[80],"an":[81],"extended":[82],"study":[83],"quantitative":[86],"relation":[87],"between":[88],"effectiveness":[90],"(TE)":[91],"effort":[94],"for":[95,108],"proposed.":[98],"Theoretical":[99],"derivation":[100],"put":[102],"forward":[103],"by":[104],"performing":[105],"statistical":[106],"analysis":[107],"suite":[111],"according":[112],"TE.":[114],"The":[115,180],"combinations":[116],"all":[118,169],"cases":[120,203],"zero-failure":[122,146],"revealed":[124],"nonzero":[125,148],"failure,":[126,149],"as":[127,129,150,152],"well":[128,151],"discrete-type":[130,153],"continuous-type":[133,156],"software,":[134,157],"studied":[136],"with":[137],"corresponding":[139],"failure":[140],"probability":[141],"models":[142,171],"constructed.":[143],"That":[144],"is,":[145],"respectively,":[158],"constitute":[159],"symmetry":[161],"asymmetry":[163],"SRDT.":[165,219],"Finally,":[166],"we":[167],"illustrated":[168],"performed":[173],"applications":[174],"Siemens":[177],"program":[178],"suite.":[179],"experimental":[181],"results":[182],"show":[183],"that":[184],"within":[185],"same":[187],"limitation":[188],"requirements":[190],"confidence":[192],"levels,":[193],"approach":[195],"can":[196],"effectively":[197],"reduce":[198],"number":[200],"duration,":[207],"i.e.,":[208],"accelerate":[209],"process":[212],"improve":[214],"efficiency":[216]},"counts_by_year":[],"updated_date":"2026-06-14T06:11:07.267592","created_date":"2025-10-10T00:00:00"}