{"id":"https://openalex.org/W2913495039","doi":"https://doi.org/10.3390/sym11020228","title":"Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm","display_name":"Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm","publication_year":2019,"publication_date":"2019-02-14","ids":{"openalex":"https://openalex.org/W2913495039","doi":"https://doi.org/10.3390/sym11020228","mag":"2913495039"},"language":"en","primary_location":{"id":"doi:10.3390/sym11020228","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym11020228","pdf_url":"https://www.mdpi.com/2073-8994/11/2/228/pdf?version=1550152314","source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/2073-8994/11/2/228/pdf?version=1550152314","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100398663","display_name":"Ling Wang","orcid":"https://orcid.org/0000-0001-9296-2503"},"institutions":[{"id":"https://openalex.org/I4750791","display_name":"Henan Agricultural University","ror":"https://ror.org/04eq83d71","country_code":"CN","type":"education","lineage":["https://openalex.org/I4750791"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ling Wang","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou 450002, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou 450002, China","institution_ids":["https://openalex.org/I4750791"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102138917","display_name":"Dongfang Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159156","display_name":"System Equipment (China)","ror":"https://ror.org/04m2bcn74","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210159156"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongfang Zhou","raw_affiliation_strings":["Department of Communication, National Digital Switching System Engineering and Technology R&D Center (NDSC), Zhengzhou 450002, China"],"affiliations":[{"raw_affiliation_string":"Department of Communication, National Digital Switching System Engineering and Technology R&D Center (NDSC), Zhengzhou 450002, China","institution_ids":["https://openalex.org/I4210159156"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100681241","display_name":"Hui Tian","orcid":"https://orcid.org/0000-0002-9683-8830"},"institutions":[{"id":"https://openalex.org/I4750791","display_name":"Henan Agricultural University","ror":"https://ror.org/04eq83d71","country_code":"CN","type":"education","lineage":["https://openalex.org/I4750791"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Tian","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou 450002, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou 450002, China","institution_ids":["https://openalex.org/I4750791"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100732538","display_name":"Hao Zhang","orcid":"https://orcid.org/0000-0002-7600-3967"},"institutions":[{"id":"https://openalex.org/I4750791","display_name":"Henan Agricultural University","ror":"https://ror.org/04eq83d71","country_code":"CN","type":"education","lineage":["https://openalex.org/I4750791"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Zhang","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou 450002, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou 450002, China","institution_ids":["https://openalex.org/I4750791"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101423831","display_name":"Wei Zhang","orcid":"https://orcid.org/0000-0001-6496-849X"},"institutions":[{"id":"https://openalex.org/I4750791","display_name":"Henan Agricultural University","ror":"https://ror.org/04eq83d71","country_code":"CN","type":"education","lineage":["https://openalex.org/I4750791"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei Zhang","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou 450002, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Henan Agricultural University, Zhengzhou 450002, China","institution_ids":["https://openalex.org/I4750791"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101423831"],"corresponding_institution_ids":["https://openalex.org/I4750791"],"apc_list":{"value":2000,"currency":"CHF","value_usd":2165},"apc_paid":{"value":2000,"currency":"CHF","value_usd":2165},"fwci":0.8445,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.73329908,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"11","issue":"2","first_page":"228","last_page":"228"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7300243377685547},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6815059185028076},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5909152030944824},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5346537828445435},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4895985722541809},{"id":"https://openalex.org/keywords/linear-discriminant-analysis","display_name":"Linear discriminant analysis","score":0.4797195792198181},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.47675785422325134},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.4764288365840912},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4434754550457001},{"id":"https://openalex.org/keywords/dimensionality-reduction","display_name":"Dimensionality reduction","score":0.44301486015319824},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.32230329513549805},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2850160002708435},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12033900618553162}],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7300243377685547},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6815059185028076},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5909152030944824},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5346537828445435},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4895985722541809},{"id":"https://openalex.org/C69738355","wikidata":"https://www.wikidata.org/wiki/Q1228929","display_name":"Linear discriminant analysis","level":2,"score":0.4797195792198181},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.47675785422325134},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.4764288365840912},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4434754550457001},{"id":"https://openalex.org/C70518039","wikidata":"https://www.wikidata.org/wiki/Q16000077","display_name":"Dimensionality reduction","level":2,"score":0.44301486015319824},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.32230329513549805},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2850160002708435},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12033900618553162},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.3390/sym11020228","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym11020228","pdf_url":"https://www.mdpi.com/2073-8994/11/2/228/pdf?version=1550152314","source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:54c5afc19aa444faa5e45d1c2c934b29","is_oa":true,"landing_page_url":"https://doaj.org/article/54c5afc19aa444faa5e45d1c2c934b29","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Symmetry, Vol 11, Iss 2, p 228 (2019)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/2073-8994/11/2/228/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/sym11020228","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Symmetry","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/sym11020228","is_oa":true,"landing_page_url":"https://doi.org/10.3390/sym11020228","pdf_url":"https://www.mdpi.com/2073-8994/11/2/228/pdf?version=1550152314","source":{"id":"https://openalex.org/S190787756","display_name":"Symmetry","issn_l":"2073-8994","issn":["2073-8994"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Symmetry","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.6499999761581421,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[{"id":"https://openalex.org/G2639082701","display_name":null,"funder_award_id":"2017M612399","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W2913495039.pdf"},"referenced_works_count":45,"referenced_works":["https://openalex.org/W589445293","https://openalex.org/W757863028","https://openalex.org/W1520812622","https://openalex.org/W1969204685","https://openalex.org/W1991519797","https://openalex.org/W1998979050","https://openalex.org/W2012751811","https://openalex.org/W2041044195","https://openalex.org/W2048679005","https://openalex.org/W2064659950","https://openalex.org/W2101550795","https://openalex.org/W2109531142","https://openalex.org/W2130422497","https://openalex.org/W2163773198","https://openalex.org/W2174631459","https://openalex.org/W2220767823","https://openalex.org/W2261059368","https://openalex.org/W2287029277","https://openalex.org/W2293118840","https://openalex.org/W2313771561","https://openalex.org/W2324336313","https://openalex.org/W2334500951","https://openalex.org/W2334675410","https://openalex.org/W2343408121","https://openalex.org/W2387808928","https://openalex.org/W2415351794","https://openalex.org/W2460311319","https://openalex.org/W2460988051","https://openalex.org/W2474843360","https://openalex.org/W2525089770","https://openalex.org/W2526918565","https://openalex.org/W2533378455","https://openalex.org/W2591855335","https://openalex.org/W2604523962","https://openalex.org/W2616803684","https://openalex.org/W2706378466","https://openalex.org/W2748384712","https://openalex.org/W2757268890","https://openalex.org/W2766126204","https://openalex.org/W2885715656","https://openalex.org/W3014771378","https://openalex.org/W6676189307","https://openalex.org/W6727398805","https://openalex.org/W6740165902","https://openalex.org/W7042475777"],"related_works":["https://openalex.org/W4402452563","https://openalex.org/W2114217318","https://openalex.org/W2794812819","https://openalex.org/W2587881214","https://openalex.org/W3104072235","https://openalex.org/W3036945320","https://openalex.org/W2370263288","https://openalex.org/W2169311637","https://openalex.org/W2395040056","https://openalex.org/W2052339338"],"abstract_inverted_index":{"The":[0],"parametric":[1,27,42,96],"fault":[2,52,77,84,97,110],"diagnosis":[3,111,124],"of":[4,26,95,104,138],"analog":[5],"circuits":[6],"is":[7],"very":[8],"crucial":[9],"for":[10,76,99],"condition-based":[11],"maintenance":[12],"(CBM)":[13],"in":[14,29,92],"prognosis":[15],"and":[16,68,107,118],"health":[17],"management.":[18],"In":[19,79],"order":[20],"to":[21,39,50,61],"improve":[22],"the":[23,41,63,80,83,102,105,109,123,130,136,139],"diagnostic":[24],"rate":[25,125],"faults":[28],"engineering":[30],"applications,":[31],"a":[32,54,69,93],"semi-supervised":[33,70,115,119],"machine":[34],"learning":[35],"algorithm":[36,58,73],"was":[37,48,59,74,126],"used":[38,49],"classify":[40],"fault.":[43],"A":[44],"lifting":[45],"wavelet":[46],"transform":[47],"extract":[51],"features,":[53],"local":[55],"preserving":[56],"mapping":[57],"adopted":[60],"optimize":[62],"Fisher":[64],"linear":[65],"discriminant":[66],"analysis,":[67],"cooperative":[71],"training":[72,90,132],"utilized":[75],"classification.":[78],"proposed":[81],"method,":[82],"values":[85],"were":[86,121],"randomly":[87],"selected":[88],"as":[89],"samples":[91],"range":[94],"intervals,":[98],"both":[100],"optimizing":[101],"generalization":[103],"model":[106,133],"improving":[108],"rate.":[112],"Furthermore,":[113],"after":[114],"dimensionality":[116],"reduction":[117],"classification":[120],"applied,":[122],"slightly":[127],"higher":[128],"than":[129],"existing":[131],"by":[134],"fixing":[135],"value":[137],"analyzed":[140],"component.":[141]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}