{"id":"https://openalex.org/W4401698600","doi":"https://doi.org/10.3390/s24165356","title":"A Review on Soft Error Correcting Techniques of Aerospace-Grade Static RAM-Based Field-Programmable Gate Arrays","display_name":"A Review on Soft Error Correcting Techniques of Aerospace-Grade Static RAM-Based Field-Programmable Gate Arrays","publication_year":2024,"publication_date":"2024-08-19","ids":{"openalex":"https://openalex.org/W4401698600","doi":"https://doi.org/10.3390/s24165356","pmid":"https://pubmed.ncbi.nlm.nih.gov/39205051"},"language":"en","primary_location":{"id":"doi:10.3390/s24165356","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s24165356","pdf_url":"https://www.mdpi.com/1424-8220/24/16/5356/pdf?version=1724076285","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"review","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/24/16/5356/pdf?version=1724076285","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111295288","display_name":"Weihang Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Weihang Wang","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing 100076, China"],"raw_orcid":"https://orcid.org/0009-0004-6819-7222","affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102831628","display_name":"Xuewu Li","orcid":"https://orcid.org/0000-0003-1542-2292"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuewu Li","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing 100076, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100671215","display_name":"Lei Chen","orcid":"https://orcid.org/0000-0001-9369-9524"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Lei Chen","raw_affiliation_strings":["China Academy of Aerospace Electronics Technology, Beijing 100094, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Academy of Aerospace Electronics Technology, Beijing 100094, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065935296","display_name":"Huabo Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huabo Sun","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing 100076, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100403369","display_name":"Fan Zhang","orcid":"https://orcid.org/0000-0001-5391-2749"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Zhang","raw_affiliation_strings":["Beijing Microelectronics Technology Institute, Beijing 100076, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Microelectronics Technology Institute, Beijing 100076, China","institution_ids":["https://openalex.org/I4210089056"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5111295288"],"corresponding_institution_ids":["https://openalex.org/I4210089056"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":1.0014,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.76022908,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"24","issue":"16","first_page":"5356","last_page":"5356"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8622499704360962},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8043065667152405},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6140956878662109},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5708397626876831},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.568134069442749},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.5659215450286865},{"id":"https://openalex.org/keywords/data-scrubbing","display_name":"Data scrubbing","score":0.4964635968208313},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4489261507987976},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3584221601486206},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29889431595802307},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2749061584472656}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8622499704360962},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8043065667152405},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6140956878662109},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5708397626876831},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.568134069442749},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.5659215450286865},{"id":"https://openalex.org/C89529581","wikidata":"https://www.wikidata.org/wiki/Q5227348","display_name":"Data scrubbing","level":2,"score":0.4964635968208313},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4489261507987976},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3584221601486206},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29889431595802307},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2749061584472656},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s24165356","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s24165356","pdf_url":"https://www.mdpi.com/1424-8220/24/16/5356/pdf?version=1724076285","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:39205051","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/39205051","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:11360524","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/11360524","pdf_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC11360524/pdf/sensors-24-05356.pdf","source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:84b24b672c454c2fa5b5c7308c0cb330","is_oa":true,"landing_page_url":"https://doaj.org/article/84b24b672c454c2fa5b5c7308c0cb330","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 24, Iss 16, p 5356 (2024)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/24/16/5356/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s24165356","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s24165356","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s24165356","pdf_url":"https://www.mdpi.com/1424-8220/24/16/5356/pdf?version=1724076285","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.4000000059604645,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4401698600.pdf"},"referenced_works_count":72,"referenced_works":["https://openalex.org/W142539823","https://openalex.org/W611078108","https://openalex.org/W1516804673","https://openalex.org/W1587379812","https://openalex.org/W1976110859","https://openalex.org/W1983942558","https://openalex.org/W1992442741","https://openalex.org/W1993957097","https://openalex.org/W1997144957","https://openalex.org/W1998136987","https://openalex.org/W2008171388","https://openalex.org/W2009950553","https://openalex.org/W2013784404","https://openalex.org/W2021391543","https://openalex.org/W2026478989","https://openalex.org/W2028687031","https://openalex.org/W2033589075","https://openalex.org/W2050044727","https://openalex.org/W2079513013","https://openalex.org/W2103437950","https://openalex.org/W2114402375","https://openalex.org/W2296343188","https://openalex.org/W2324943678","https://openalex.org/W2329594518","https://openalex.org/W2496512073","https://openalex.org/W2502765997","https://openalex.org/W2581231779","https://openalex.org/W2583713643","https://openalex.org/W2585421261","https://openalex.org/W2586365929","https://openalex.org/W2604787635","https://openalex.org/W2738431585","https://openalex.org/W2789631959","https://openalex.org/W2896009776","https://openalex.org/W2900567726","https://openalex.org/W2905392440","https://openalex.org/W2906063286","https://openalex.org/W2913560214","https://openalex.org/W2918353410","https://openalex.org/W2918836132","https://openalex.org/W2945718655","https://openalex.org/W2951677078","https://openalex.org/W2963819424","https://openalex.org/W2981551676","https://openalex.org/W3009465787","https://openalex.org/W3013914417","https://openalex.org/W3022655021","https://openalex.org/W3047786962","https://openalex.org/W3090364818","https://openalex.org/W3091774643","https://openalex.org/W3152574955","https://openalex.org/W3155878339","https://openalex.org/W3212480740","https://openalex.org/W4200293262","https://openalex.org/W4210642569","https://openalex.org/W4210877493","https://openalex.org/W4256210234","https://openalex.org/W4287849475","https://openalex.org/W4289655774","https://openalex.org/W4307273481","https://openalex.org/W4311839525","https://openalex.org/W4311839610","https://openalex.org/W4312263049","https://openalex.org/W4327522392","https://openalex.org/W4376866341","https://openalex.org/W4384009513","https://openalex.org/W4386646642","https://openalex.org/W4394769086","https://openalex.org/W6736533227","https://openalex.org/W6737351731","https://openalex.org/W6995486527","https://openalex.org/W7019542934"],"related_works":["https://openalex.org/W3144951481","https://openalex.org/W4290647047","https://openalex.org/W1500230652","https://openalex.org/W2061783171","https://openalex.org/W2363504003","https://openalex.org/W2066033226","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2612883256"],"abstract_inverted_index":{"Aerospace-grade":[0],"SRAM-based":[1,74,135],"field-programmable":[2],"gate":[3],"arrays":[4],"(FPGAs)":[5],"used":[6],"in":[7,21,67],"space":[8],"applications":[9],"are":[10,91],"highly":[11,132],"susceptible":[12],"to":[13,18],"single":[14],"event":[15],"effects,":[16],"leading":[17],"soft":[19,32,41,63,79,116],"errors":[20,33],"FPGAs.":[22,136],"Additionally,":[23],"as":[24],"FPGAs":[25,46],"scale":[26],"up,":[27],"the":[28,50,60,70,78,96,123,129],"difficulty":[29],"of":[30,62,73,83,125,131],"correcting":[31],"also":[34,100],"increases.":[35],"This":[36],"paper":[37],"proposes":[38],"that":[39],"performing":[40],"error":[42,64,80,117],"sensitivity":[43,81],"analysis":[44,82,97],"on":[45,95],"can":[47],"help":[48],"target":[49],"more":[51],"sensitive":[52],"areas":[53],"for":[54,77],"detection":[55],"and":[56,88,107],"correction,":[57],"thereby":[58],"improving":[59],"efficiency":[61],"repair.":[65],"Firstly,":[66],"accordance":[68],"with":[69],"dual-layer":[71],"architecture":[72],"FPGAs,":[75],"methods":[76],"FPGA":[84],"application":[85,103],"layer":[86,104],"resources":[87],"configuration":[89,108],"bitstreams":[90],"reviewed.":[92],"Subsequently,":[93],"based":[94],"results,":[98],"it":[99],"covers":[101],"corresponding":[102],"memory":[105],"scrubbing":[106,109],"techniques.":[110],"A":[111],"prospective":[112],"look":[113],"at":[114,122],"emerging":[115],"mitigation":[118],"technologies":[119],"is":[120],"discussed":[121],"end":[124],"this":[126],"review,":[127],"supporting":[128],"development":[130],"reliable":[133],"aerospace-grade":[134]},"counts_by_year":[{"year":2025,"cited_by_count":5}],"updated_date":"2026-03-11T06:11:40.159057","created_date":"2025-10-10T00:00:00"}