{"id":"https://openalex.org/W4399083530","doi":"https://doi.org/10.3390/s24113473","title":"Automatic PCB Sample Generation and Defect Detection Based on ControlNet and Swin Transformer","display_name":"Automatic PCB Sample Generation and Defect Detection Based on ControlNet and Swin Transformer","publication_year":2024,"publication_date":"2024-05-28","ids":{"openalex":"https://openalex.org/W4399083530","doi":"https://doi.org/10.3390/s24113473","pmid":"https://pubmed.ncbi.nlm.nih.gov/38894263"},"language":"en","primary_location":{"id":"doi:10.3390/s24113473","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s24113473","pdf_url":"https://www.mdpi.com/1424-8220/24/11/3473/pdf?version=1716888032","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/24/11/3473/pdf?version=1716888032","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007244577","display_name":"Yulong Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yulong Liu","raw_affiliation_strings":["School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China"],"raw_orcid":"https://orcid.org/0000-0002-9113-6143","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China","institution_ids":["https://openalex.org/I92178344"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021196481","display_name":"Hao Wu","orcid":"https://orcid.org/0000-0003-4537-2898"},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hao Wu","raw_affiliation_strings":["School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China"],"raw_orcid":"https://orcid.org/0000-0003-4537-2898","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China","institution_ids":["https://openalex.org/I92178344"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113053397","display_name":"Youzhi Xu","orcid":"https://orcid.org/0009-0006-5094-4079"},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Youzhi Xu","raw_affiliation_strings":["School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China","institution_ids":["https://openalex.org/I92178344"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100409018","display_name":"Xiaoming Liu","orcid":"https://orcid.org/0000-0001-5736-7282"},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoming Liu","raw_affiliation_strings":["School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China","institution_ids":["https://openalex.org/I92178344"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101557708","display_name":"Xiujuan Yu","orcid":"https://orcid.org/0000-0003-4428-3922"},"institutions":[{"id":"https://openalex.org/I92178344","display_name":"Anhui University of Technology","ror":"https://ror.org/02qdtrq21","country_code":"CN","type":"education","lineage":["https://openalex.org/I92178344"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiujuan Yu","raw_affiliation_strings":["School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China","institution_ids":["https://openalex.org/I92178344"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5021196481","https://openalex.org/A5101557708"],"corresponding_institution_ids":["https://openalex.org/I92178344"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":2.6645,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.90309249,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"24","issue":"11","first_page":"3473","last_page":"3473"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.5893611907958984},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.569003164768219},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5655593276023865},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.523267388343811},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.5090155601501465},{"id":"https://openalex.org/keywords/cascade","display_name":"Cascade","score":0.5073909163475037},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.47924211621284485},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4237106740474701},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2542600631713867},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1725420355796814},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07800936698913574}],"concepts":[{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.5893611907958984},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.569003164768219},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5655593276023865},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.523267388343811},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.5090155601501465},{"id":"https://openalex.org/C34146451","wikidata":"https://www.wikidata.org/wiki/Q5048094","display_name":"Cascade","level":2,"score":0.5073909163475037},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.47924211621284485},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4237106740474701},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2542600631713867},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1725420355796814},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07800936698913574},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s24113473","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s24113473","pdf_url":"https://www.mdpi.com/1424-8220/24/11/3473/pdf?version=1716888032","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:38894263","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/38894263","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:11175188","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/11175188","pdf_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC11175188/pdf/sensors-24-03473.pdf","source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:c3862188d9914a9e8dcc45189d8233d3","is_oa":true,"landing_page_url":"https://doaj.org/article/c3862188d9914a9e8dcc45189d8233d3","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 24, Iss 11, p 3473 (2024)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/24/11/3473/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s24113473","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s24113473","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s24113473","pdf_url":"https://www.mdpi.com/1424-8220/24/11/3473/pdf?version=1716888032","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4750255732","display_name":null,"funder_award_id":"KJ2021A0408","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"},{"id":"https://openalex.org/G7778601908","display_name":null,"funder_award_id":"2108085ME166","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"}],"funders":[{"id":"https://openalex.org/F4320334897","display_name":"Natural Science Foundation of Anhui Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4399083530.pdf"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W234388709","https://openalex.org/W639708223","https://openalex.org/W1903029394","https://openalex.org/W2110764733","https://openalex.org/W2241204461","https://openalex.org/W2417429787","https://openalex.org/W2543203490","https://openalex.org/W2565639579","https://openalex.org/W2962793481","https://openalex.org/W2963150697","https://openalex.org/W2964241181","https://openalex.org/W2985132266","https://openalex.org/W3036167779","https://openalex.org/W3096831136","https://openalex.org/W3138516171","https://openalex.org/W3146188393","https://openalex.org/W3160860842","https://openalex.org/W3162926177","https://openalex.org/W3170140136","https://openalex.org/W3187589338","https://openalex.org/W3195969653","https://openalex.org/W3212516020","https://openalex.org/W4312231279","https://openalex.org/W4312933868","https://openalex.org/W4313134080","https://openalex.org/W4320058983","https://openalex.org/W4321021623","https://openalex.org/W4389890827","https://openalex.org/W4390872797","https://openalex.org/W4390873054","https://openalex.org/W6687483927","https://openalex.org/W6779823529","https://openalex.org/W6795288823"],"related_works":["https://openalex.org/W2153719181","https://openalex.org/W1971748923","https://openalex.org/W1566155057","https://openalex.org/W2060986072","https://openalex.org/W2052574922","https://openalex.org/W64588465","https://openalex.org/W3120641340","https://openalex.org/W2117825986","https://openalex.org/W3134067061","https://openalex.org/W2079855347"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,67,92],"improve":[3,93],"the":[4,44,62,85,88,94,101,116,118,124,137,150,187,194],"efficiency":[5],"and":[6,33,61,71,108,160,183,193],"accuracy":[7],"of":[8,11,50,76,96,111,126,139,152],"multitarget":[9,166],"detection":[10,40,105,182],"soldering":[12],"defects":[13],"on":[14,43,115,168],"surface-mounted":[15],"components":[16,114,122],"in":[17,58,123,142],"Printed":[18],"Circuit":[19],"Board":[20],"(PCB)":[21],"fabrication,":[22],"we":[23,80],"propose":[24],"a":[25,38,130],"sample":[26,146],"generation":[27,75,151],"method":[28,41,48,119,141,156,185],"using":[29],"Stable":[30,68],"Diffusion":[31,69],"Model":[32,70],"ControlNet,":[34],"as":[35,37,84],"well":[36],"defect":[39,97,162,181],"based":[42],"Swin":[45,82],"Transformer.":[46],"The":[47,133,155,172],"consists":[49],"two":[51],"stages:":[52],"First,":[53],"high-definition":[54],"original":[55],"images":[56],"collected":[57],"industrial":[59],"production":[60],"corresponding":[63],"prompts":[64],"are":[65],"input":[66],"ControlNet":[72],"for":[73,103],"automatic":[74],"nonindependent":[77,145],"samples.":[78],"Subsequently,":[79],"integrate":[81],"Transformer":[83],"backbone":[86],"into":[87],"Cascade":[89],"Mask":[90],"R-CNN":[91],"quality":[95],"features":[98],"extracted":[99],"from":[100],"samples":[102],"accurate":[104],"box":[106],"localization":[107],"segmentation.":[109],"Instead":[110],"segmenting":[112],"individual":[113],"PCB,":[117],"inspects":[120],"all":[121],"field":[125],"view":[127],"simultaneously":[128],"over":[129],"larger":[131],"area.":[132],"experimental":[134],"results":[135],"demonstrate":[136],"effectiveness":[138],"our":[140,179],"scaling":[143],"up":[144],"datasets,":[147],"thereby":[148],"enabling":[149],"high-quality":[153],"datasets.":[154],"accurately":[157],"recognizes":[158],"targets":[159],"detects":[161],"types":[163],"when":[164],"performing":[165],"inspection":[167],"printed":[169],"circuit":[170],"boards.":[171],"analysis":[173],"against":[174],"other":[175],"models":[176],"shows":[177],"that":[178],"improved":[180],"segmentation":[184],"improves":[186],"Average":[188,196],"Recall":[189],"(AR)":[190],"by":[191,199],"2.8%":[192],"mean":[195],"Precision":[197],"(mAP)":[198],"1.9%.":[200]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2025-10-10T00:00:00"}