{"id":"https://openalex.org/W4388288798","doi":"https://doi.org/10.3390/s23218949","title":"Open-Air Testing of Dual-Comb Time-of-Flight Measurement","display_name":"Open-Air Testing of Dual-Comb Time-of-Flight Measurement","publication_year":2023,"publication_date":"2023-11-03","ids":{"openalex":"https://openalex.org/W4388288798","doi":"https://doi.org/10.3390/s23218949","pmid":"https://pubmed.ncbi.nlm.nih.gov/37960648"},"language":"en","primary_location":{"id":"doi:10.3390/s23218949","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23218949","pdf_url":"https://www.mdpi.com/1424-8220/23/21/8949/pdf?version=1698999796","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/23/21/8949/pdf?version=1698999796","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038857610","display_name":"Wooram Kim","orcid":"https://orcid.org/0000-0002-3925-3502"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wooram Kim","raw_affiliation_strings":["Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101419631","display_name":"Jaewon Yang","orcid":"https://orcid.org/0000-0001-5488-2289"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaewon Yang","raw_affiliation_strings":["Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018516387","display_name":"Jaeyoung Jang","orcid":"https://orcid.org/0009-0003-9874-2407"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeyoung Jang","raw_affiliation_strings":["Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0003-9874-2407","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030860188","display_name":"Jeong Seok Oh","orcid":"https://orcid.org/0000-0002-2013-9443"},"institutions":[{"id":"https://openalex.org/I4210111434","display_name":"Korea Institute of Machinery & Materials","ror":"https://ror.org/01qcq9d74","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I2801339556","https://openalex.org/I4210111434","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeong Seok Oh","raw_affiliation_strings":["Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-2013-9443","affiliations":[{"raw_affiliation_string":"Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea","institution_ids":["https://openalex.org/I4210111434"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019095045","display_name":"Seongheum Han","orcid":"https://orcid.org/0000-0001-9065-4611"},"institutions":[{"id":"https://openalex.org/I4210111434","display_name":"Korea Institute of Machinery & Materials","ror":"https://ror.org/01qcq9d74","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I2801339556","https://openalex.org/I4210111434","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seongheum Han","raw_affiliation_strings":["Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-9065-4611","affiliations":[{"raw_affiliation_string":"Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea","institution_ids":["https://openalex.org/I4210111434"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101860464","display_name":"Seungman Kim","orcid":"https://orcid.org/0000-0002-1254-2056"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]},{"id":"https://openalex.org/I4210111434","display_name":"Korea Institute of Machinery & Materials","ror":"https://ror.org/01qcq9d74","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I2801339556","https://openalex.org/I4210111434","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Seungman Kim","raw_affiliation_strings":["Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea","institution_ids":["https://openalex.org/I4210111434"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Seungman Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]},{"id":"https://openalex.org/I4210111434","display_name":"Korea Institute of Machinery & Materials","ror":"https://ror.org/01qcq9d74","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I2801339556","https://openalex.org/I4210111434","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungman Kim","raw_affiliation_strings":["Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea","institution_ids":["https://openalex.org/I4210111434"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053652009","display_name":"Heesuk Jang","orcid":"https://orcid.org/0000-0002-4601-5377"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Heesuk Jang","raw_affiliation_strings":["Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-4601-5377","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100440449","display_name":"Young\u2010Jin Kim","orcid":"https://orcid.org/0000-0002-4271-5771"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Young-Jin Kim","raw_affiliation_strings":["Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-4271-5771","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Seung-Woo Kim","orcid":"https://orcid.org/0000-0003-0235-1739"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]},{"id":"https://openalex.org/I4210111434","display_name":"Korea Institute of Machinery & Materials","ror":"https://ror.org/01qcq9d74","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I2801339556","https://openalex.org/I4210111434","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Seung-Woo Kim","raw_affiliation_strings":["Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0003-0235-1739","affiliations":[{"raw_affiliation_string":"Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea","institution_ids":["https://openalex.org/I4210111434"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":null,"display_name":"Seung-Woo Kim","orcid":"https://orcid.org/0000-0003-0235-1739"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]},{"id":"https://openalex.org/I4210111434","display_name":"Korea Institute of Machinery & Materials","ror":"https://ror.org/01qcq9d74","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I2801339556","https://openalex.org/I4210111434","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung-Woo Kim","raw_affiliation_strings":["Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0003-0235-1739","affiliations":[{"raw_affiliation_string":"Advanced Manufacturing Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Yuseong-gu, Daejeon 34103, Republic of Korea","institution_ids":["https://openalex.org/I4210111434"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Yuseong-gu, Daejeon 34141, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5101860464"],"corresponding_institution_ids":["https://openalex.org/I157485424","https://openalex.org/I4210111434"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2673},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2673},"fwci":0.8751,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.70722179,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"23","issue":"21","first_page":"8949","last_page":"8949"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10988","display_name":"Advanced Fiber Laser Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10988","display_name":"Advanced Fiber Laser Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.8396953344345093},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.8051074743270874},{"id":"https://openalex.org/keywords/repeatability","display_name":"Repeatability","score":0.5927554368972778},{"id":"https://openalex.org/keywords/allan-variance","display_name":"Allan variance","score":0.5893932580947876},{"id":"https://openalex.org/keywords/micrometer","display_name":"Micrometer","score":0.538813054561615},{"id":"https://openalex.org/keywords/flight-test","display_name":"Flight test","score":0.5275104641914368},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5022311210632324},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.4679775536060333},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.45979923009872437},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38749635219573975},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.38358810544013977},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.2700200080871582},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23247718811035156},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.18222349882125854},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13466596603393555},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1041240394115448},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.09298202395439148}],"concepts":[{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.8396953344345093},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.8051074743270874},{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.5927554368972778},{"id":"https://openalex.org/C5722023","wikidata":"https://www.wikidata.org/wiki/Q1440227","display_name":"Allan variance","level":3,"score":0.5893932580947876},{"id":"https://openalex.org/C171635847","wikidata":"https://www.wikidata.org/wiki/Q406983","display_name":"Micrometer","level":2,"score":0.538813054561615},{"id":"https://openalex.org/C2777943292","wikidata":"https://www.wikidata.org/wiki/Q3319996","display_name":"Flight test","level":2,"score":0.5275104641914368},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5022311210632324},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.4679775536060333},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.45979923009872437},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38749635219573975},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.38358810544013977},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.2700200080871582},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23247718811035156},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.18222349882125854},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13466596603393555},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1041240394115448},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.09298202395439148},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s23218949","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23218949","pdf_url":"https://www.mdpi.com/1424-8220/23/21/8949/pdf?version=1698999796","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:37960648","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/37960648","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:10649856","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/10649856","pdf_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC10649856/pdf/sensors-23-08949.pdf","source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:9a45fe488353481296ad4e6bbe8544a4","is_oa":true,"landing_page_url":"https://doaj.org/article/9a45fe488353481296ad4e6bbe8544a4","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 23, Iss 21, p 8949 (2023)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/23/21/8949/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s23218949","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s23218949","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23218949","pdf_url":"https://www.mdpi.com/1424-8220/23/21/8949/pdf?version=1698999796","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3378255996","display_name":null,"funder_award_id":"NRF-2012R1A3A1050386","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4388288798.pdf"},"referenced_works_count":51,"referenced_works":["https://openalex.org/W605325243","https://openalex.org/W1767571371","https://openalex.org/W1945596191","https://openalex.org/W1973231957","https://openalex.org/W1982461433","https://openalex.org/W1986841091","https://openalex.org/W1989038475","https://openalex.org/W1995196339","https://openalex.org/W2013290193","https://openalex.org/W2013688778","https://openalex.org/W2016429483","https://openalex.org/W2019674324","https://openalex.org/W2029034297","https://openalex.org/W2040086830","https://openalex.org/W2044039285","https://openalex.org/W2047099016","https://openalex.org/W2048466390","https://openalex.org/W2054714115","https://openalex.org/W2055415398","https://openalex.org/W2055485794","https://openalex.org/W2059174070","https://openalex.org/W2061779409","https://openalex.org/W2077394796","https://openalex.org/W2079291979","https://openalex.org/W2080990490","https://openalex.org/W2082108368","https://openalex.org/W2112390114","https://openalex.org/W2115744554","https://openalex.org/W2120057787","https://openalex.org/W2138266588","https://openalex.org/W2142101005","https://openalex.org/W2186439911","https://openalex.org/W2208805938","https://openalex.org/W2257092164","https://openalex.org/W2278314799","https://openalex.org/W2312669704","https://openalex.org/W2319947380","https://openalex.org/W2342937857","https://openalex.org/W2513536682","https://openalex.org/W2517788161","https://openalex.org/W2786466113","https://openalex.org/W2794005676","https://openalex.org/W2800273748","https://openalex.org/W2975956592","https://openalex.org/W3036824257","https://openalex.org/W3094991541","https://openalex.org/W3098540844","https://openalex.org/W6661963021","https://openalex.org/W6677629077","https://openalex.org/W6692320783","https://openalex.org/W6749611054"],"related_works":["https://openalex.org/W2783354812","https://openalex.org/W4384112194","https://openalex.org/W2103009189","https://openalex.org/W4312958259","https://openalex.org/W4308259661","https://openalex.org/W4390813131","https://openalex.org/W2349383066","https://openalex.org/W4328132048","https://openalex.org/W1969901537","https://openalex.org/W2909289417"],"abstract_inverted_index":{"We":[0],"configured":[1],"a":[2,50,56],"long-distance":[3],"ranging":[4,48],"apparatus":[5],"to":[6,20],"test":[7,36],"the":[8,21,30,79,90],"principle":[9],"of":[10,23,29,52,81,84,92],"dual-comb":[11,41],"time-of-flight":[12],"measurement":[13,31],"using":[14],"ultrashort":[15],"lasers.":[16],"Emphasis":[17],"was":[18,87],"given":[19],"evaluation":[22],"open-air":[24],"performance":[25],"quantitatively":[26],"in":[27,60,69],"terms":[28],"resolution":[32],"and":[33,101],"stability.":[34],"The":[35],"results":[37],"revealed":[38],"that":[39],"our":[40],"asynchronous":[42],"optical":[43],"pulse":[44],"sampling":[45],"permits":[46],"micrometer-resolved":[47],"with":[49,74,89],"repeatability":[51],"2.05":[53],"\u03bcm":[54],"over":[55],"648":[57],"m":[58],"distance":[59],"dry":[61],"weather":[62,72],"conditions.":[63],"Further":[64],"atmospheric":[65],"effects":[66],"were":[67],"evaluated":[68],"three":[70],"different":[71],"conditions":[73],"corresponding":[75],"Allan":[76],"deviations.":[77],"Finally,":[78],"capability":[80],"simultaneous":[82],"determination":[83],"multiple":[85],"targets":[86],"verified":[88],"potential":[91],"advanced":[93],"industrial":[94],"applications,":[95],"such":[96],"as":[97],"manufacturing,":[98],"surveying,":[99],"metrology,":[100],"geodesy.":[102]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}