{"id":"https://openalex.org/W4383368487","doi":"https://doi.org/10.3390/s23136170","title":"Design of Miniature Ultrawideband Active Magnetic Field Probe Using Integrated Design Idea","display_name":"Design of Miniature Ultrawideband Active Magnetic Field Probe Using Integrated Design Idea","publication_year":2023,"publication_date":"2023-07-05","ids":{"openalex":"https://openalex.org/W4383368487","doi":"https://doi.org/10.3390/s23136170","pmid":"https://pubmed.ncbi.nlm.nih.gov/37448019"},"language":"en","primary_location":{"id":"doi:10.3390/s23136170","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23136170","pdf_url":"https://www.mdpi.com/1424-8220/23/13/6170/pdf?version=1688564682","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/23/13/6170/pdf?version=1688564682","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101933746","display_name":"Yang Zhou","orcid":"https://orcid.org/0000-0001-5172-3290"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Zhou","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"raw_orcid":"https://orcid.org/0000-0001-5172-3290","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027985916","display_name":"Zhaowen Yan","orcid":"https://orcid.org/0000-0003-0994-7578"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhaowen Yan","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"raw_orcid":"https://orcid.org/0000-0003-0994-7578","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113668832","display_name":"Zhangqiang Ma","orcid":"https://orcid.org/0000-0003-1776-3525"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhangqiang Ma","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100362744","display_name":"Yang Zhao","orcid":"https://orcid.org/0000-0002-8452-8579"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Zhao","raw_affiliation_strings":["Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 102299, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 102299, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114804195","display_name":"Jie Gao","orcid":"https://orcid.org/0000-0003-1405-511X"},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Gao","raw_affiliation_strings":["Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 102299, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 102299, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113934147","display_name":"Ruiqi Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruiqi Cheng","raw_affiliation_strings":["Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 102299, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 102299, China","institution_ids":["https://openalex.org/I4210089056"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038666897","display_name":"Bao\u2010Cheng Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baocheng Huang","raw_affiliation_strings":["Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 102299, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of High-Reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 102299, China","institution_ids":["https://openalex.org/I4210089056"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5027985916"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.1266,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42037852,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"23","issue":"13","first_page":"6170","last_page":"6170"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flatness","display_name":"Flatness (cosmology)","score":0.6409692764282227},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5616114139556885},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5389794111251831},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.42849424481391907},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4236932098865509},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41975969076156616},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.40937483310699463},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40133994817733765},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3874042332172394},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.29470932483673096},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12596064805984497}],"concepts":[{"id":"https://openalex.org/C2778530986","wikidata":"https://www.wikidata.org/wiki/Q5457948","display_name":"Flatness (cosmology)","level":3,"score":0.6409692764282227},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5616114139556885},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5389794111251831},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.42849424481391907},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4236932098865509},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41975969076156616},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.40937483310699463},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40133994817733765},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3874042332172394},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.29470932483673096},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12596064805984497},{"id":"https://openalex.org/C26405456","wikidata":"https://www.wikidata.org/wiki/Q338","display_name":"Cosmology","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s23136170","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23136170","pdf_url":"https://www.mdpi.com/1424-8220/23/13/6170/pdf?version=1688564682","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:37448019","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/37448019","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:10347218","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/10347218","pdf_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC10347218/pdf/sensors-23-06170.pdf","source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:82b4b19075504b47b24d83ac5dcecb1d","is_oa":true,"landing_page_url":"https://doaj.org/article/82b4b19075504b47b24d83ac5dcecb1d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 23, Iss 13, p 6170 (2023)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/23/13/6170/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s23136170","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 23; Issue 13; Pages: 6170","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s23136170","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23136170","pdf_url":"https://www.mdpi.com/1424-8220/23/13/6170/pdf?version=1688564682","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4383368487.pdf"},"referenced_works_count":19,"referenced_works":["https://openalex.org/W2031329971","https://openalex.org/W2078831586","https://openalex.org/W2163170703","https://openalex.org/W2165141993","https://openalex.org/W2517518879","https://openalex.org/W2605245762","https://openalex.org/W2617451795","https://openalex.org/W2765097732","https://openalex.org/W2766466681","https://openalex.org/W2769982840","https://openalex.org/W2804675477","https://openalex.org/W2912766525","https://openalex.org/W2975452352","https://openalex.org/W3006018790","https://openalex.org/W3012459017","https://openalex.org/W3161603162","https://openalex.org/W4285230289","https://openalex.org/W6795084064","https://openalex.org/W6840185273"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2902546961","https://openalex.org/W2058676402","https://openalex.org/W2329285141","https://openalex.org/W4313653414","https://openalex.org/W2511685209","https://openalex.org/W2550267488","https://openalex.org/W2348494978","https://openalex.org/W3007127642","https://openalex.org/W2906074915"],"abstract_inverted_index":{"|":[0],"in":[1],"the":[2],"stable":[3],"working":[4],"bandwidth.":[5],"It":[6],"is":[7],"efficient":[8],"for":[9],"high-frequency":[10],"near-field":[11],"scanning.":[12]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}