{"id":"https://openalex.org/W4380686241","doi":"https://doi.org/10.3390/s23125542","title":"Improved Likelihood Probability in MIMO Systems Using One-Bit ADCs","display_name":"Improved Likelihood Probability in MIMO Systems Using One-Bit ADCs","publication_year":2023,"publication_date":"2023-06-13","ids":{"openalex":"https://openalex.org/W4380686241","doi":"https://doi.org/10.3390/s23125542","pmid":"https://pubmed.ncbi.nlm.nih.gov/37420711"},"language":"en","primary_location":{"id":"doi:10.3390/s23125542","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23125542","pdf_url":"https://www.mdpi.com/1424-8220/23/12/5542/pdf?version=1686654798","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/23/12/5542/pdf?version=1686654798","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030767009","display_name":"Tae-Kyoung Kim","orcid":"https://orcid.org/0000-0002-9629-7413"},"institutions":[{"id":"https://openalex.org/I12832649","display_name":"Gachon University","ror":"https://ror.org/03ryywt80","country_code":"KR","type":"education","lineage":["https://openalex.org/I12832649"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Tae-Kyoung Kim","raw_affiliation_strings":["Department of Electronic Engineering, Gachon University, Seongnam 13120, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-9629-7413","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gachon University, Seongnam 13120, Republic of Korea","institution_ids":["https://openalex.org/I12832649"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5030767009"],"corresponding_institution_ids":["https://openalex.org/I12832649"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2673},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2673},"fwci":0.2429,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.41452416,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"23","issue":"12","first_page":"5542","last_page":"5542"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10148","display_name":"Advanced MIMO Systems Optimization","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mimo","display_name":"MIMO","score":0.6175040602684021},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5196000933647156},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5016956329345703},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.49903368949890137},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.48849308490753174},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4811100363731384},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4808695912361145},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.48042941093444824},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.4764949679374695},{"id":"https://openalex.org/keywords/maximum-likelihood","display_name":"Maximum likelihood","score":0.4713945686817169},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3924205005168915},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.20145058631896973},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14850905537605286},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13668197393417358}],"concepts":[{"id":"https://openalex.org/C207987634","wikidata":"https://www.wikidata.org/wiki/Q176862","display_name":"MIMO","level":3,"score":0.6175040602684021},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5196000933647156},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5016956329345703},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.49903368949890137},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.48849308490753174},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4811100363731384},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4808695912361145},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.48042941093444824},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.4764949679374695},{"id":"https://openalex.org/C49781872","wikidata":"https://www.wikidata.org/wiki/Q1045555","display_name":"Maximum likelihood","level":2,"score":0.4713945686817169},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3924205005168915},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.20145058631896973},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14850905537605286},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13668197393417358},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C54197355","wikidata":"https://www.wikidata.org/wiki/Q5782992","display_name":"Beamforming","level":2,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D003198","descriptor_name":"Computer Simulation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D003198","descriptor_name":"Computer Simulation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D003198","descriptor_name":"Computer Simulation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D011336","descriptor_name":"Probability","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D011336","descriptor_name":"Probability","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D011336","descriptor_name":"Probability","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D015203","descriptor_name":"Reproducibility of Results","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true}],"locations_count":5,"locations":[{"id":"doi:10.3390/s23125542","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23125542","pdf_url":"https://www.mdpi.com/1424-8220/23/12/5542/pdf?version=1686654798","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:37420711","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/37420711","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:10301477","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/10301477","pdf_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC10301477/pdf/sensors-23-05542.pdf","source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:31b462f9afa5404ebe70e5f71db39cbe","is_oa":true,"landing_page_url":"https://doaj.org/article/31b462f9afa5404ebe70e5f71db39cbe","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 23, Iss 12, p 5542 (2023)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/23/12/5542/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s23125542","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 23; Issue 12; Pages: 5542","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s23125542","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23125542","pdf_url":"https://www.mdpi.com/1424-8220/23/12/5542/pdf?version=1686654798","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2048500490","display_name":null,"funder_award_id":"2021R1F1A1063273","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4380686241.pdf"},"referenced_works_count":38,"referenced_works":["https://openalex.org/W1560563382","https://openalex.org/W1763302039","https://openalex.org/W1776974347","https://openalex.org/W1980235469","https://openalex.org/W1982222550","https://openalex.org/W2016999686","https://openalex.org/W2134179788","https://openalex.org/W2158514137","https://openalex.org/W2195693430","https://openalex.org/W2262641688","https://openalex.org/W2526144952","https://openalex.org/W2533046718","https://openalex.org/W2605537711","https://openalex.org/W2771579582","https://openalex.org/W2781054684","https://openalex.org/W2789724270","https://openalex.org/W2789947301","https://openalex.org/W2794190039","https://openalex.org/W2807133510","https://openalex.org/W2890964800","https://openalex.org/W2903819812","https://openalex.org/W2964023610","https://openalex.org/W2964163499","https://openalex.org/W2964287687","https://openalex.org/W2991708646","https://openalex.org/W3009979476","https://openalex.org/W3104166565","https://openalex.org/W3143251189","https://openalex.org/W3149804497","https://openalex.org/W3185534328","https://openalex.org/W3198333195","https://openalex.org/W4200629284","https://openalex.org/W4250589301","https://openalex.org/W4282550881","https://openalex.org/W4285116427","https://openalex.org/W4285223646","https://openalex.org/W6793242725","https://openalex.org/W6839228419"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2102542442","https://openalex.org/W1986220761","https://openalex.org/W2070883797","https://openalex.org/W2042495646","https://openalex.org/W2132453830","https://openalex.org/W2100762899"],"abstract_inverted_index":{"This":[0,110],"study":[1],"considers":[2],"an":[3],"improved":[4],"likelihood":[5,32,49,55,72,122],"probability":[6,50],"in":[7,112],"multi-input":[8],"multi-output":[9],"(MIMO)":[10],"systems":[11,18],"using":[12,19,79],"one-bit":[13,20],"analog-to-digital":[14],"converters":[15],"(ADCs).":[16],"MIMO":[17],"ADCs":[21],"are":[22],"known":[23],"to":[24,45,62,98,107,116],"exhibit":[25],"from":[26],"performance":[27,113],"degradation":[28],"because":[29],"of":[30,94,104,120],"inaccurate":[31],"probabilities.":[33],"To":[34],"overcome":[35],"this":[36],"degradation,":[37],"the":[38,42,47,53,64,68,80,87,117,121],"proposed":[39,88],"method":[40,89],"leverages":[41],"detected":[43],"symbols":[44],"estimate":[46],"true":[48,69],"by":[51],"combining":[52],"initial":[54],"probability.":[56,123],"An":[57],"optimization":[58],"problem":[59],"is":[60,77,114],"formulated":[61],"minimize":[63],"mean-squared":[65],"error":[66,102],"between":[67],"and":[70,74],"combined":[71],"probabilities,":[73],"a":[75,91,100],"solution":[76],"derived":[78],"least-squares":[81],"method.":[82],"Simulation":[83],"results":[84],"show":[85],"that":[86],"obtains":[90],"signal-to-noise":[92],"gain":[93],"approximately":[95],"0.3":[96],"dB":[97],"achieve":[99],"frame":[101],"rate":[103],"10-1":[105],"compared":[106],"conventional":[108],"methods.":[109],"improvement":[111],"attributed":[115],"enhanced":[118],"reliability":[119]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}