{"id":"https://openalex.org/W4379230799","doi":"https://doi.org/10.3390/s23115299","title":"Attention Recurrent Neural Network-Based Severity Estimation Method for Early-Stage Fault Diagnosis in Robot Harness Cable","display_name":"Attention Recurrent Neural Network-Based Severity Estimation Method for Early-Stage Fault Diagnosis in Robot Harness Cable","publication_year":2023,"publication_date":"2023-06-02","ids":{"openalex":"https://openalex.org/W4379230799","doi":"https://doi.org/10.3390/s23115299","pmid":"https://pubmed.ncbi.nlm.nih.gov/37300026"},"language":"en","primary_location":{"id":"doi:10.3390/s23115299","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23115299","pdf_url":"https://www.mdpi.com/1424-8220/23/11/5299/pdf?version=1685710160","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/23/11/5299/pdf?version=1685710160","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070632634","display_name":"Heonkook Kim","orcid":"https://orcid.org/0000-0002-9230-4970"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Heonkook Kim","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020091208","display_name":"Hojin Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hojin Lee","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Seongyun Kim","orcid":"https://orcid.org/0000-0002-2117-9674"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seongyun Kim","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Seongyun Kim","orcid":"https://orcid.org/0000-0002-2117-9674"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Seongyun Kim","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Sang Woo Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang Woo Kim","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"last","author":{"id":null,"display_name":"Sang Woo Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sang Woo Kim","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang 37673, Republic of Korea","institution_ids":["https://openalex.org/I123900574"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I123900574"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":1.9343,"has_fulltext":true,"cited_by_count":15,"citation_normalized_percentile":{"value":0.86074513,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"23","issue":"11","first_page":"5299","last_page":"5299"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/downtime","display_name":"Downtime","score":0.7005823850631714},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.69534832239151},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.6015784740447998},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5128100514411926},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4963551163673401},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4932391047477722},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4839368462562561},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4568939208984375},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.43000197410583496},{"id":"https://openalex.org/keywords/novelty-detection","display_name":"Novelty detection","score":0.41836804151535034},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4028511047363281},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.3301313817501068},{"id":"https://openalex.org/keywords/novelty","display_name":"Novelty","score":0.2908344864845276},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22916454076766968},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08734932541847229}],"concepts":[{"id":"https://openalex.org/C180591934","wikidata":"https://www.wikidata.org/wiki/Q1253369","display_name":"Downtime","level":2,"score":0.7005823850631714},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.69534832239151},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.6015784740447998},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5128100514411926},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4963551163673401},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4932391047477722},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4839368462562561},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4568939208984375},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.43000197410583496},{"id":"https://openalex.org/C2778924833","wikidata":"https://www.wikidata.org/wiki/Q7064603","display_name":"Novelty detection","level":3,"score":0.41836804151535034},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4028511047363281},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3301313817501068},{"id":"https://openalex.org/C2778738651","wikidata":"https://www.wikidata.org/wiki/Q16546687","display_name":"Novelty","level":2,"score":0.2908344864845276},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22916454076766968},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08734932541847229},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C27206212","wikidata":"https://www.wikidata.org/wiki/Q34178","display_name":"Theology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D011340","descriptor_name":"Problem Solving","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D011340","descriptor_name":"Problem Solving","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012371","descriptor_name":"Robotics","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D012371","descriptor_name":"Robotics","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D016571","descriptor_name":"Neural Networks, Computer","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D016571","descriptor_name":"Neural Networks, Computer","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D042241","descriptor_name":"Early Diagnosis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D042241","descriptor_name":"Early Diagnosis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D057567","descriptor_name":"Memory, Long-Term","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D057567","descriptor_name":"Memory, Long-Term","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false}],"locations_count":4,"locations":[{"id":"doi:10.3390/s23115299","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23115299","pdf_url":"https://www.mdpi.com/1424-8220/23/11/5299/pdf?version=1685710160","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:37300026","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/37300026","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:10256089","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/10256089","pdf_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC10256089/pdf/sensors-23-05299.pdf","source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:d238e2c4dc7444ed8a5a9c4d9f567def","is_oa":true,"landing_page_url":"https://doaj.org/article/d238e2c4dc7444ed8a5a9c4d9f567def","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 23, Iss 11, p 5299 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.3390/s23115299","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23115299","pdf_url":"https://www.mdpi.com/1424-8220/23/11/5299/pdf?version=1685710160","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth","score":0.4300000071525574}],"awards":[{"id":"https://openalex.org/G1643700039","display_name":null,"funder_award_id":"2021M1A2A2043894","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G342704958","display_name":null,"funder_award_id":"funded","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4379230799.pdf"},"referenced_works_count":28,"referenced_works":["https://openalex.org/W1979704807","https://openalex.org/W2036730558","https://openalex.org/W2079735306","https://openalex.org/W2122646361","https://openalex.org/W2147818633","https://openalex.org/W2621614835","https://openalex.org/W2743138268","https://openalex.org/W2749370854","https://openalex.org/W2749700529","https://openalex.org/W2786088545","https://openalex.org/W2801991210","https://openalex.org/W2802955565","https://openalex.org/W2904457132","https://openalex.org/W2913934873","https://openalex.org/W2964199361","https://openalex.org/W2995944953","https://openalex.org/W2998097057","https://openalex.org/W3001161541","https://openalex.org/W3029307258","https://openalex.org/W3038419772","https://openalex.org/W3044129898","https://openalex.org/W3046638685","https://openalex.org/W3095946875","https://openalex.org/W3198608438","https://openalex.org/W3216886058","https://openalex.org/W4214864730","https://openalex.org/W6670297073","https://openalex.org/W6713134421"],"related_works":["https://openalex.org/W3148663848","https://openalex.org/W3186790058","https://openalex.org/W2024194466","https://openalex.org/W2051500795","https://openalex.org/W2566529656","https://openalex.org/W2163103195","https://openalex.org/W1978303825","https://openalex.org/W1974225921","https://openalex.org/W2390533148","https://openalex.org/W2386936363"],"abstract_inverted_index":{"Cable":[0],"is":[1,18,38,113,140,179],"crucial":[2,70],"to":[3,23,76,93,116,131],"the":[4,19,52,157,162,166,186],"control":[5],"and":[6,10,27,49,105,151,176],"instrumentation":[7],"of":[8,15,54,122,165],"machines":[9],"facilities.":[11],"Therefore,":[12],"early":[13],"diagnosis":[14,57,99],"cable":[16],"faults":[17,133],"most":[20],"effective":[21],"approach":[22],"prevent":[24],"system":[25],"downtime":[26],"maximize":[28],"productivity.":[29],"We":[30],"focused":[31,83],"on":[32,84,161],"a":[33,39,45,102,138,142],"\"soft":[34],"fault":[35,47,56,74,87,91,139,143,158,194],"state\",":[36],"which":[37,66],"transient":[40],"state":[41],"that":[42,185],"eventually":[43],"becomes":[44],"permanent":[46],"-open-circuit":[48],"short-circuit.":[50],"However,":[51],"issue":[53],"soft":[55,86,193],"has":[58],"not":[59,68],"been":[60],"considered":[61],"enough":[62],"in":[63],"previous":[64],"research,":[65],"could":[67],"provide":[69],"information,":[71],"such":[72,172],"as":[73,173],"severity,":[75],"support":[77],"maintenance.":[78],"In":[79],"this":[80],"study,":[81],"we":[82],"solving":[85],"problem":[88],"by":[89],"estimating":[90],"severity":[92,106,144,159],"diagnose":[94],"early-stage":[95],"faults.":[96],"The":[97,109,181],"proposed":[98,187],"method":[100,188],"comprised":[101],"novelty":[103,110],"detection":[104,111],"estimation":[107,145],"network.":[108],"part":[112],"specially":[114],"designed":[115],"deal":[117],"with":[118],"varying":[119],"operating":[120],"conditions":[121],"industrial":[123],"applications.":[124],"First,":[125],"an":[126],"autoencoder":[127],"calculates":[128],"anomaly":[129],"scores":[130],"detect":[132],"using":[134],"three-phase":[135],"currents.":[136],"If":[137],"detected,":[141],"network,":[146],"wherein":[147],"long":[148],"short-term":[149],"memory":[150],"attention":[152],"mechanisms":[153],"are":[154],"integrated,":[155],"estimates":[156],"based":[160],"time-dependent":[163],"information":[164],"input.":[167],"Accordingly,":[168],"no":[169],"additional":[170],"equipment,":[171],"voltage":[174],"sensors":[175],"signal":[177],"generators,":[178],"required.":[180],"conducted":[182],"experiments":[183],"demonstrated":[184],"successfully":[189],"distinguishes":[190],"seven":[191],"different":[192],"degrees.":[195]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1}],"updated_date":"2026-04-14T08:04:32.555800","created_date":"2025-10-10T00:00:00"}