{"id":"https://openalex.org/W4367627168","doi":"https://doi.org/10.3390/s23094395","title":"A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers","display_name":"A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers","publication_year":2023,"publication_date":"2023-04-29","ids":{"openalex":"https://openalex.org/W4367627168","doi":"https://doi.org/10.3390/s23094395","pmid":"https://pubmed.ncbi.nlm.nih.gov/37177599"},"language":"en","primary_location":{"id":"doi:10.3390/s23094395","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23094395","pdf_url":"https://www.mdpi.com/1424-8220/23/9/4395/pdf?version=1683186133","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/23/9/4395/pdf?version=1683186133","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091649872","display_name":"Moinul Shahidul Haque","orcid":"https://orcid.org/0000-0002-5115-7900"},"institutions":[{"id":"https://openalex.org/I4210146689","display_name":"Nexteer Automotive (United States)","ror":"https://ror.org/04fkpdv59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210146689"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Moinul Shahidul Haque","raw_affiliation_strings":["Nexteer Automotive Corp., Saginaw, MI 48601, USA"],"affiliations":[{"raw_affiliation_string":"Nexteer Automotive Corp., Saginaw, MI 48601, USA","institution_ids":["https://openalex.org/I4210146689"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100734788","display_name":"Md. Moniruzzaman","orcid":"https://orcid.org/0000-0002-9165-2228"},"institutions":[{"id":"https://openalex.org/I99041443","display_name":"Mississippi State University","ror":"https://ror.org/0432jq872","country_code":"US","type":"education","lineage":["https://openalex.org/I4210141039","https://openalex.org/I99041443"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Md Moniruzzaman","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Mississippi State University, Starkville, MS 39762, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Mississippi State University, Starkville, MS 39762, USA","institution_ids":["https://openalex.org/I99041443"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054845392","display_name":"Seungdeog Choi","orcid":"https://orcid.org/0000-0002-7549-6093"},"institutions":[{"id":"https://openalex.org/I99041443","display_name":"Mississippi State University","ror":"https://ror.org/0432jq872","country_code":"US","type":"education","lineage":["https://openalex.org/I4210141039","https://openalex.org/I99041443"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seungdeog Choi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Mississippi State University, Starkville, MS 39762, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Mississippi State University, Starkville, MS 39762, USA","institution_ids":["https://openalex.org/I99041443"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028771646","display_name":"Sangshin Kwak","orcid":"https://orcid.org/0000-0002-2890-906X"},"institutions":[{"id":"https://openalex.org/I67900169","display_name":"Chung-Ang University","ror":"https://ror.org/01r024a98","country_code":"KR","type":"education","lineage":["https://openalex.org/I67900169"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangshin Kwak","raw_affiliation_strings":["School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronics Engineering, Chung-Ang University, Seoul 06974, Republic of Korea","institution_ids":["https://openalex.org/I67900169"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076997383","display_name":"Ahmed H. Okilly","orcid":"https://orcid.org/0000-0003-2009-9004"},"institutions":[{"id":"https://openalex.org/I35886859","display_name":"Korea University of Technology and Education","ror":"https://ror.org/053nycv62","country_code":"KR","type":"education","lineage":["https://openalex.org/I35886859"]},{"id":"https://openalex.org/I91041137","display_name":"Assiut University","ror":"https://ror.org/01jaj8n65","country_code":"EG","type":"education","lineage":["https://openalex.org/I91041137"]}],"countries":["EG","KR"],"is_corresponding":false,"raw_author_name":"Ahmed H. Okilly","raw_affiliation_strings":["Electrical & Electronics and Communication Engineering Department, Koreatech University, Cheonan 31253, Republic of Korea","Electrical Engineering Department, Faculty of Engineering, Assiut University, Assiut 71516, Egypt"],"affiliations":[{"raw_affiliation_string":"Electrical & Electronics and Communication Engineering Department, Koreatech University, Cheonan 31253, Republic of Korea","institution_ids":["https://openalex.org/I35886859"]},{"raw_affiliation_string":"Electrical Engineering Department, Faculty of Engineering, Assiut University, Assiut 71516, Egypt","institution_ids":["https://openalex.org/I91041137"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056218990","display_name":"Jeihoon Baek","orcid":"https://orcid.org/0000-0002-1186-3739"},"institutions":[{"id":"https://openalex.org/I35886859","display_name":"Korea University of Technology and Education","ror":"https://ror.org/053nycv62","country_code":"KR","type":"education","lineage":["https://openalex.org/I35886859"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jeihoon Baek","raw_affiliation_strings":["Electrical & Electronics and Communication Engineering Department, Koreatech University, Cheonan 31253, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Electrical & Electronics and Communication Engineering Department, Koreatech University, Cheonan 31253, Republic of Korea","institution_ids":["https://openalex.org/I35886859"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5056218990"],"corresponding_institution_ids":["https://openalex.org/I35886859"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.9124,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.73415956,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"23","issue":"9","first_page":"4395","last_page":"4395"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cascode","display_name":"Cascode","score":0.9324135780334473},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7331578731536865},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5854136347770691},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5387538075447083},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43390464782714844},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.42087456583976746},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.4167454242706299},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3490805923938751},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24791839718818665},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2370137870311737},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.20881932973861694}],"concepts":[{"id":"https://openalex.org/C2775946640","wikidata":"https://www.wikidata.org/wiki/Q1735017","display_name":"Cascode","level":4,"score":0.9324135780334473},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7331578731536865},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5854136347770691},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5387538075447083},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43390464782714844},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.42087456583976746},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.4167454242706299},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3490805923938751},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24791839718818665},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2370137870311737},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.20881932973861694},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s23094395","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23094395","pdf_url":"https://www.mdpi.com/1424-8220/23/9/4395/pdf?version=1683186133","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:37177599","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/37177599","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:10181594","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/10181594","pdf_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC10181594/pdf/sensors-23-04395.pdf","source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:7ec182f3801b4d0da9ddd50c60cb299b","is_oa":true,"landing_page_url":"https://doaj.org/article/7ec182f3801b4d0da9ddd50c60cb299b","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 23, Iss 9, p 4395 (2023)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/23/9/4395/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s23094395","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 23; Issue 9; Pages: 4395","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s23094395","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23094395","pdf_url":"https://www.mdpi.com/1424-8220/23/9/4395/pdf?version=1683186133","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.49000000953674316,"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production"}],"awards":[{"id":"https://openalex.org/G6657893693","display_name":null,"funder_award_id":"RS-2022","funder_id":"https://openalex.org/F4320322010","funder_display_name":"Ministry of Land, Infrastructure and Transport"},{"id":"https://openalex.org/G6910053234","display_name":null,"funder_award_id":"RS-2022-00142883","funder_id":"https://openalex.org/F4320322010","funder_display_name":"Ministry of Land, Infrastructure and Transport"}],"funders":[{"id":"https://openalex.org/F4320322010","display_name":"Ministry of Land, Infrastructure and Transport","ror":"https://ror.org/04xt5aa77"}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4367627168.pdf"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W1593693275","https://openalex.org/W1674654697","https://openalex.org/W1920533799","https://openalex.org/W2003022769","https://openalex.org/W2047637548","https://openalex.org/W2051768553","https://openalex.org/W2108776657","https://openalex.org/W2120462245","https://openalex.org/W2174746507","https://openalex.org/W2604697518","https://openalex.org/W2810158474","https://openalex.org/W2898408906","https://openalex.org/W2904998470","https://openalex.org/W2907218999","https://openalex.org/W2907852467","https://openalex.org/W2945417497","https://openalex.org/W2949469347","https://openalex.org/W2953327508","https://openalex.org/W2990448731","https://openalex.org/W3005740240","https://openalex.org/W3012466011","https://openalex.org/W3014574086","https://openalex.org/W3034937808","https://openalex.org/W3035287210","https://openalex.org/W3180022330"],"related_works":["https://openalex.org/W3151946603","https://openalex.org/W2550131318","https://openalex.org/W2134296035","https://openalex.org/W2169286576","https://openalex.org/W2263974882","https://openalex.org/W2056288484","https://openalex.org/W3200517167","https://openalex.org/W4377088735","https://openalex.org/W2289624951","https://openalex.org/W2025040007"],"abstract_inverted_index":{"This":[0,112,146],"paper":[1],"proposes":[2],"a":[3,16,34,135,167],"novel,":[4],"degradation-sensitive,":[5],"adaptive":[6],"SST":[7,117,172],"controller":[8,99,113],"for":[9,50,94,108,141],"cascode":[10,142,170],"GaN-FETs.":[11],"Unlike":[12],"in":[13,73],"traditional":[14],"transformers,":[15],"semiconductor":[17],"switch's":[18,35],"degradation":[19,47,106,109],"and":[20,26,67,89,127],"failure":[21],"can":[22,68],"compromise":[23],"its":[24],"robustness":[25],"integrity.":[27],"It":[28],"is":[29,144,163],"vital":[30],"to":[31,38,41,60,71,118],"continuously":[32],"monitor":[33],"health":[36],"condition":[37],"adapt":[39],"it":[40],"mission-critical":[42],"applications.":[43],"The":[44,97],"current":[45],"state-of-the-art":[46],"monitoring":[48],"methods":[49,77],"power":[51],"electronics":[52],"systems":[53],"are":[54,90],"computationally":[55],"intensive,":[56],"have":[57],"limited":[58],"capacity":[59],"accurately":[61,153],"identify":[62],"the":[63,116,124,130,151,160],"severity":[64,110],"of":[65,86],"degradation,":[66],"be":[69],"challenging":[70],"implement":[72],"real":[74],"time.":[75],"These":[76],"primarily":[78],"focus":[79],"on":[80],"conducting":[81],"accelerated":[82,101],"life":[83,102],"testing":[84,103],"(ALT)":[85],"individual":[87],"switches":[88],"not":[91],"typically":[92],"implemented":[93],"online":[95],"monitoring.":[96],"proposed":[98,147,161],"uses":[100],"(ALT)-based":[104],"switch":[105,138,156],"mapping":[107],"assessment.":[111],"intelligently":[114],"derates":[115],"(1)":[119],"ensure":[120],"robust":[121],"operation":[122],"over":[123],"SST's":[125],"lifetime":[126],"(2)":[128],"achieve":[129],"optimal":[131],"degradation-sensitive":[132],"function.":[133],"Additionally,":[134],"fast":[136,148],"behavioral":[137],"loss":[139,152],"model":[140,149],"GaN-FETs":[143],"used.":[145],"estimates":[150],"without":[154],"proprietary":[155],"parasitic":[157],"information.":[158],"Finally,":[159],"method":[162],"experimentally":[164],"validated":[165],"using":[166],"5":[168],"kW":[169],"GaN-FET-based":[171],"platform.":[173]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}