{"id":"https://openalex.org/W4327738632","doi":"https://doi.org/10.3390/s23063212","title":"Adaptive Bitline Voltage Countermeasure for Neighbor Wordline Interference in 3D NAND Flash Memory-Based Sensors","display_name":"Adaptive Bitline Voltage Countermeasure for Neighbor Wordline Interference in 3D NAND Flash Memory-Based Sensors","publication_year":2023,"publication_date":"2023-03-17","ids":{"openalex":"https://openalex.org/W4327738632","doi":"https://doi.org/10.3390/s23063212","pmid":"https://pubmed.ncbi.nlm.nih.gov/36991921"},"language":"en","primary_location":{"id":"doi:10.3390/s23063212","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23063212","pdf_url":"https://www.mdpi.com/1424-8220/23/6/3212/pdf?version=1679041003","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/23/6/3212/pdf?version=1679041003","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112607059","display_name":"Hanshui Fan","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hanshui Fan","raw_affiliation_strings":["Institute of Microelectronic Material & Technology, School of Material Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronic Material & Technology, School of Material Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101429262","display_name":"Xuan Tian","orcid":"https://orcid.org/0000-0003-1966-2445"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xuan Tian","raw_affiliation_strings":["SanDisk Information Technology Co., Ltd., Shanghai 200241, China"],"affiliations":[{"raw_affiliation_string":"SanDisk Information Technology Co., Ltd., Shanghai 200241, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071824585","display_name":"Huiting Peng","orcid":"https://orcid.org/0009-0009-8017-955X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huiting Peng","raw_affiliation_strings":["Institute of Microelectronic Material & Technology, School of Material Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronic Material & Technology, School of Material Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102342089","display_name":"Yinfeng Shen","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinfeng Shen","raw_affiliation_strings":["Institute of Microelectronic Material & Technology, School of Material Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronic Material & Technology, School of Material Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112362965","display_name":"Liang Li","orcid":"https://orcid.org/0009-0007-2471-2255"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Liang Li","raw_affiliation_strings":["SanDisk Information Technology Co., Ltd., Shanghai 200241, China"],"affiliations":[{"raw_affiliation_string":"SanDisk Information Technology Co., Ltd., Shanghai 200241, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100351519","display_name":"Ming Li","orcid":"https://orcid.org/0000-0003-3053-2756"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Li","raw_affiliation_strings":["Institute of Microelectronic Material & Technology, School of Material Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronic Material & Technology, School of Material Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033482382","display_name":"Liming Gao","orcid":"https://orcid.org/0000-0002-4284-897X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Liming Gao","raw_affiliation_strings":["Institute of Microelectronic Material & Technology, School of Material Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronic Material & Technology, School of Material Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5033482382"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.5991,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.66467275,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"23","issue":"6","first_page":"3212","last_page":"3212"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9891999959945679,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9660999774932861,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.7824432253837585},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6058083772659302},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.6037721037864685},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.6011852622032166},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5648614168167114},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.517125129699707},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4765121042728424},{"id":"https://openalex.org/keywords/countermeasure","display_name":"Countermeasure","score":0.4432266652584076},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4406631886959076},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.4398173689842224},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.41325074434280396},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36499130725860596},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.35116398334503174},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25521421432495117},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21429166197776794},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.14232966303825378},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.10008677840232849},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08002594113349915}],"concepts":[{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.7824432253837585},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6058083772659302},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.6037721037864685},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.6011852622032166},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5648614168167114},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.517125129699707},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4765121042728424},{"id":"https://openalex.org/C21593369","wikidata":"https://www.wikidata.org/wiki/Q1032176","display_name":"Countermeasure","level":2,"score":0.4432266652584076},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4406631886959076},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.4398173689842224},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.41325074434280396},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36499130725860596},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.35116398334503174},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25521421432495117},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21429166197776794},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.14232966303825378},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.10008677840232849},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08002594113349915},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s23063212","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23063212","pdf_url":"https://www.mdpi.com/1424-8220/23/6/3212/pdf?version=1679041003","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:36991921","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/36991921","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:10051062","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/10051062","pdf_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC10051062/pdf/sensors-23-03212.pdf","source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:0481d6cca32d451f822793397f9fe891","is_oa":true,"landing_page_url":"https://doaj.org/article/0481d6cca32d451f822793397f9fe891","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 23, Iss 6, p 3212 (2023)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/23/6/3212/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s23063212","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 23; Issue 6; Pages: 3212","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s23063212","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23063212","pdf_url":"https://www.mdpi.com/1424-8220/23/6/3212/pdf?version=1679041003","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.6200000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4327738632.pdf"},"referenced_works_count":28,"referenced_works":["https://openalex.org/W1678622683","https://openalex.org/W2006052094","https://openalex.org/W2013217594","https://openalex.org/W2043909091","https://openalex.org/W2043978229","https://openalex.org/W2062443275","https://openalex.org/W2106673654","https://openalex.org/W2135288278","https://openalex.org/W2150042295","https://openalex.org/W2161518941","https://openalex.org/W2167088460","https://openalex.org/W2170078865","https://openalex.org/W2256144381","https://openalex.org/W2292839235","https://openalex.org/W2612789561","https://openalex.org/W2623907268","https://openalex.org/W2786008813","https://openalex.org/W2786994551","https://openalex.org/W2790432961","https://openalex.org/W2914469063","https://openalex.org/W2962844766","https://openalex.org/W3006330903","https://openalex.org/W3013579342","https://openalex.org/W3097408958","https://openalex.org/W3108684791","https://openalex.org/W3195338263","https://openalex.org/W3208749029","https://openalex.org/W6670289283"],"related_works":["https://openalex.org/W2354277217","https://openalex.org/W3097479263","https://openalex.org/W2375456104","https://openalex.org/W2366317867","https://openalex.org/W27380437","https://openalex.org/W2975816678","https://openalex.org/W2356868942","https://openalex.org/W2946515628","https://openalex.org/W2377021172","https://openalex.org/W2372896093"],"abstract_inverted_index":{"Three-dimensional":[0],"NAND":[1,162,194,209],"flash":[2,25],"memory":[3,163],"is":[4,148,158],"widely":[5],"used":[6],"in":[7,24,90,175,207],"sensor":[8],"systems":[9],"as":[10,27,219],"an":[11,154],"advanced":[12],"storage":[13,59],"medium":[14],"that":[15,130],"ensures":[16],"system":[17],"stability":[18],"through":[19,114],"fast":[20],"data":[21,41,58,224],"access.":[22],"However,":[23],"memory,":[26],"the":[28,35,40,70,88,101,115,138,143,169,183],"number":[29],"of":[30,57,117,171],"cell":[31],"bits":[32],"increases":[33],"and":[34,73,81,120,182,192,215],"process":[36],"pitch":[37],"keeps":[38],"scaling,":[39],"disturbance":[42],"becomes":[43],"more":[44],"serious,":[45],"especially":[46],"for":[47,78,160,204],"neighbor":[48],"wordline":[49],"interference":[50],"(NWI),":[51],"which":[52,147,165],"leads":[53],"to":[54,68,222],"a":[55,62,121,131,200,213,220],"deterioration":[56],"reliability.":[60,225],"Thus,":[61],"physical":[63,202],"device":[64,76,180],"model":[65,181,203],"was":[66],"constructed":[67],"investigate":[69],"NWI":[71,103,108,170],"mechanism":[72],"evaluate":[74],"critical":[75],"factors":[77],"this":[79,106],"long-standing":[80],"intractable":[82],"problem.":[83],"As":[84],"simulated":[85],"by":[86,137,151,190],"TCAD,":[87],"change":[89],"channel":[91,139],"potential":[92,118,140],"under":[93],"read":[94],"bias":[95],"conditions":[96],"presents":[97],"good":[98],"consistency":[99],"with":[100],"actual":[102],"performance.":[104],"Using":[105],"model,":[107],"generation":[109],"can":[110,141,166],"be":[111],"accurately":[112],"described":[113],"combination":[116],"superposition":[119],"local":[122,144],"drain-induced":[123],"barrier":[124],"lowering":[125],"(DIBL)":[126],"effect.":[127],"This":[128,197],"suggests":[129],"higher":[132],"bitline":[133],"voltage":[134,217],"(Vbl)":[135],"transmitted":[136],"restore":[142],"DIBL":[145],"effect,":[146],"ever":[149],"weakened":[150],"NWI.":[152],"Furthermore,":[153],"adaptive":[155,184],"Vbl":[156,185],"countermeasure":[157,221],"proposed":[159],"3D":[161,193,208],"arrays,":[164],"significantly":[167],"minimize":[168],"triple-level":[172],"cells":[173],"(TLC)":[174],"all":[176],"state":[177],"combinations.":[178],"The":[179],"scheme":[186,218],"were":[187],"successfully":[188],"verified":[189],"TCAD":[191],"chip":[195],"tests.":[196],"study":[198],"introduces":[199],"new":[201],"NWI-related":[205],"problems":[206],"flash,":[210],"while":[211],"providing":[212],"feasible":[214],"promising":[216],"optimize":[223]},"counts_by_year":[{"year":2024,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}