{"id":"https://openalex.org/W4319983611","doi":"https://doi.org/10.3390/s23041944","title":"The Estimated Temperature of the Semiconductor Diode Junction on the Basis of the Remote Thermographic Measurement","display_name":"The Estimated Temperature of the Semiconductor Diode Junction on the Basis of the Remote Thermographic Measurement","publication_year":2023,"publication_date":"2023-02-09","ids":{"openalex":"https://openalex.org/W4319983611","doi":"https://doi.org/10.3390/s23041944","pmid":"https://pubmed.ncbi.nlm.nih.gov/36850541"},"language":"en","primary_location":{"id":"doi:10.3390/s23041944","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23041944","pdf_url":"https://www.mdpi.com/1424-8220/23/4/1944/pdf?version=1675936170","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/23/4/1944/pdf?version=1675936170","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005636284","display_name":"Arkadiusz Hulewicz","orcid":"https://orcid.org/0000-0001-9342-7430"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Arkadiusz Hulewicz","raw_affiliation_strings":["Institute of Electrical Engineering and Electronics, Poznan University of Technology, Piotrowo 3A, 60-965 Poznan, Poland"],"raw_orcid":"https://orcid.org/0000-0001-9342-7430","affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering and Electronics, Poznan University of Technology, Piotrowo 3A, 60-965 Poznan, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034949633","display_name":"Krzysztof Dziarski","orcid":"https://orcid.org/0000-0002-7877-4116"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Krzysztof Dziarski","raw_affiliation_strings":["Institute of Electric Power Engineering, Poznan University of Technology, Piotrowo 3A, 60-965 Poznan, Poland"],"raw_orcid":"https://orcid.org/0000-0002-7877-4116","affiliations":[{"raw_affiliation_string":"Institute of Electric Power Engineering, Poznan University of Technology, Piotrowo 3A, 60-965 Poznan, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072990913","display_name":"Zbigniew Krawiecki","orcid":"https://orcid.org/0000-0001-5088-6768"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Zbigniew Krawiecki","raw_affiliation_strings":["Institute of Electrical Engineering and Electronics, Poznan University of Technology, Piotrowo 3A, 60-965 Poznan, Poland"],"raw_orcid":"https://orcid.org/0000-0001-5088-6768","affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering and Electronics, Poznan University of Technology, Piotrowo 3A, 60-965 Poznan, Poland","institution_ids":["https://openalex.org/I46597724"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5005636284"],"corresponding_institution_ids":["https://openalex.org/I46597724"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.3168,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.46627932,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"23","issue":"4","first_page":"1944","last_page":"1944"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.6843406558036804},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.6604495644569397},{"id":"https://openalex.org/keywords/junction-temperature","display_name":"Junction temperature","score":0.577090859413147},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5670307278633118},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.49750974774360657},{"id":"https://openalex.org/keywords/semiconductor-device","display_name":"Semiconductor device","score":0.4385581314563751},{"id":"https://openalex.org/keywords/basis","display_name":"Basis (linear algebra)","score":0.4326241910457611},{"id":"https://openalex.org/keywords/thermography","display_name":"Thermography","score":0.41854673624038696},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32690486311912537},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26022177934646606},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2146112024784088},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20173120498657227},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1966138780117035},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.1685257852077484},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.1635984480381012},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07378232479095459},{"id":"https://openalex.org/keywords/meteorology","display_name":"Meteorology","score":0.05856591463088989}],"concepts":[{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.6843406558036804},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.6604495644569397},{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.577090859413147},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5670307278633118},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49750974774360657},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.4385581314563751},{"id":"https://openalex.org/C12426560","wikidata":"https://www.wikidata.org/wiki/Q189569","display_name":"Basis (linear algebra)","level":2,"score":0.4326241910457611},{"id":"https://openalex.org/C2779222261","wikidata":"https://www.wikidata.org/wiki/Q624587","display_name":"Thermography","level":3,"score":0.41854673624038696},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32690486311912537},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26022177934646606},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2146112024784088},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20173120498657227},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1966138780117035},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.1685257852077484},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.1635984480381012},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07378232479095459},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.05856591463088989},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s23041944","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23041944","pdf_url":"https://www.mdpi.com/1424-8220/23/4/1944/pdf?version=1675936170","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:36850541","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/36850541","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:9968042","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/9968042","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:bdf68458b0364192ad6b0f53ea6a5ad7","is_oa":true,"landing_page_url":"https://doaj.org/article/bdf68458b0364192ad6b0f53ea6a5ad7","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 23, Iss 4, p 1944 (2023)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/23/4/1944/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s23041944","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s23041944","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s23041944","pdf_url":"https://www.mdpi.com/1424-8220/23/4/1944/pdf?version=1675936170","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4319983611.pdf"},"referenced_works_count":31,"referenced_works":["https://openalex.org/W1981555704","https://openalex.org/W1992992078","https://openalex.org/W2059572708","https://openalex.org/W2109894155","https://openalex.org/W2117288046","https://openalex.org/W2559664077","https://openalex.org/W2774100426","https://openalex.org/W2889642178","https://openalex.org/W2960805179","https://openalex.org/W3006365627","https://openalex.org/W3010270897","https://openalex.org/W3014063867","https://openalex.org/W3017314638","https://openalex.org/W3039409504","https://openalex.org/W3046837480","https://openalex.org/W3047029947","https://openalex.org/W3086176095","https://openalex.org/W3091891304","https://openalex.org/W3091912553","https://openalex.org/W3096341042","https://openalex.org/W3115197069","https://openalex.org/W3117180740","https://openalex.org/W3122931398","https://openalex.org/W3128254899","https://openalex.org/W3171952073","https://openalex.org/W3185523246","https://openalex.org/W3209280889","https://openalex.org/W3215293000","https://openalex.org/W4229842459","https://openalex.org/W4245164146","https://openalex.org/W4283323380"],"related_works":["https://openalex.org/W4200190098","https://openalex.org/W4390494820","https://openalex.org/W76687626","https://openalex.org/W810115978","https://openalex.org/W3105729397","https://openalex.org/W2061942174","https://openalex.org/W2131006338","https://openalex.org/W3049489559","https://openalex.org/W1480160333","https://openalex.org/W1765865763"],"abstract_inverted_index":{"The":[0,39,55,78],"value":[1],"of":[2,11,19,27,35,41,46,57,64,69,76,80,95,107,152,156,180,188],"a":[3,28],"semiconductor's":[4],"diode":[5,30,48,66,183,190],"temperature":[6,26,44,56,79,91,94,110,117,126,143,177,187],"determines":[7],"the":[8,20,24,33,42,47,52,58,65,74,81,84,89,93,100,105,114,125,134,138,141,148,153,157,161,176,181,186,189,196,201],"correct":[9],"operation":[10],"this":[12,167],"element":[13],"and":[14,160],"its":[15,108],"useful":[16],"lifetime.":[17],"One":[18],"methods":[21],"for":[22],"determining":[23],"die":[25,85,90,142,162,182],"semiconductor":[29],"is":[31,86,118,121,144,192,199],"through":[32],"use":[34],"indirect":[36],"thermographic":[37,43,109],"measurements.":[38],"accuracy":[40],"measurement":[45,111,178],"case":[49,67,139,191],"depends":[50,72],"on":[51,73],"prevailing":[53],"conditions.":[54],"mold":[59,96,158],"body":[60,97,159],"(the":[61],"black":[62],"part":[63],"made":[68],"epoxy":[70],"resin)":[71],"place":[75,82],"measurement.":[77],"above":[83,99,200],"closer":[87],"to":[88,133,172],"than":[92],"fragments":[98],"base":[101],"plate.":[102],"In":[103],"addition,":[104],"difficulty":[106],"increases":[112],"when":[113],"surface":[115],"whose":[116],"being":[119],"measured":[120,127,194],"in":[122,137],"motion.":[123],"Then,":[124],"by":[128],"thermography":[129],"may":[130,163],"not":[131,193],"apply":[132],"warmest":[135],"point":[136,197],"where":[140],"determined.":[145],"Information":[146],"about":[147],"difference":[149],"between":[150],"temperatures":[151],"different":[154],"parts":[155],"be":[164],"important.":[165],"For":[166],"reason,":[168],"it":[169],"was":[170],"decided":[171],"check":[173],"how":[174],"much":[175],"error":[179],"changes":[184],"if":[185],"at":[195],"that":[198],"die.":[202]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}