{"id":"https://openalex.org/W36559992","doi":"https://doi.org/10.3390/s22249624","title":"Channel card architecture for multimode board test systems","display_name":"Channel card architecture for multimode board test systems","publication_year":1984,"publication_date":"1984-10-16","ids":{"openalex":"https://openalex.org/W36559992","doi":"https://doi.org/10.3390/s22249624","mag":"36559992"},"language":"en","primary_location":{"id":"mag:36559992","is_oa":false,"landing_page_url":"https://dblp.uni-trier.de/db/conf/itc/itc1984.html#HoffmanW84","pdf_url":null,"source":{"id":"https://openalex.org/S4306420246","display_name":"International Test Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference","raw_type":null},"type":"article","indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089752587","display_name":"Mark S. Hoffman","orcid":null},"institutions":[{"id":"https://openalex.org/I22113271","display_name":"Teradyne (United States)","ror":"https://ror.org/02b00gr50","country_code":"US","type":"company","lineage":["https://openalex.org/I22113271"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mark S. Hoffman","raw_affiliation_strings":["Teradyne, Inc., Boston, MA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Teradyne, Inc., Boston, MA#TAB#","institution_ids":["https://openalex.org/I22113271"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015892496","display_name":"Joseph F. Wrinn","orcid":null},"institutions":[{"id":"https://openalex.org/I22113271","display_name":"Teradyne (United States)","ror":"https://ror.org/02b00gr50","country_code":"US","type":"company","lineage":["https://openalex.org/I22113271"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joseph F. Wrinn","raw_affiliation_strings":["Teradyne, Inc., Boston, MA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Teradyne, Inc., Boston, MA#TAB#","institution_ids":["https://openalex.org/I22113271"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5089752587"],"corresponding_institution_ids":["https://openalex.org/I22113271"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02923977,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"22","issue":"24","first_page":"589","last_page":"597"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9825999736785889,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9825999736785889,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11749","display_name":"Iterative Learning Control Systems","score":0.9700000286102295,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9039999842643738,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.7267411947250366},{"id":"https://openalex.org/keywords/multiplexing","display_name":"Multiplexing","score":0.7227107286453247},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6819874048233032},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.6061811447143555},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.5770683288574219},{"id":"https://openalex.org/keywords/variety","display_name":"Variety (cybernetics)","score":0.5304973125457764},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.46673473715782166},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.4235283434391022},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.4233451187610626},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.41805362701416016},{"id":"https://openalex.org/keywords/orthogonal-frequency-division-multiplexing","display_name":"Orthogonal frequency-division multiplexing","score":0.4116404056549072},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36899060010910034},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.30129116773605347},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.23003804683685303},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20767223834991455},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.08868902921676636}],"concepts":[{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.7267411947250366},{"id":"https://openalex.org/C19275194","wikidata":"https://www.wikidata.org/wiki/Q222903","display_name":"Multiplexing","level":2,"score":0.7227107286453247},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6819874048233032},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.6061811447143555},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.5770683288574219},{"id":"https://openalex.org/C136197465","wikidata":"https://www.wikidata.org/wiki/Q1729295","display_name":"Variety (cybernetics)","level":2,"score":0.5304973125457764},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.46673473715782166},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.4235283434391022},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.4233451187610626},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.41805362701416016},{"id":"https://openalex.org/C40409654","wikidata":"https://www.wikidata.org/wiki/Q375889","display_name":"Orthogonal frequency-division multiplexing","level":3,"score":0.4116404056549072},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36899060010910034},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.30129116773605347},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.23003804683685303},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20767223834991455},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.08868902921676636},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:36559992","is_oa":false,"landing_page_url":"https://dblp.uni-trier.de/db/conf/itc/itc1984.html#HoffmanW84","pdf_url":null,"source":{"id":"https://openalex.org/S4306420246","display_name":"International Test Conference","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Test Conference","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W189744450","https://openalex.org/W667881035"],"related_works":["https://openalex.org/W745993521","https://openalex.org/W2184744709","https://openalex.org/W2820988843","https://openalex.org/W1992349855","https://openalex.org/W2383002432","https://openalex.org/W2347402311","https://openalex.org/W2328296078","https://openalex.org/W2952604335","https://openalex.org/W2152463560","https://openalex.org/W1976188995","https://openalex.org/W2057709435","https://openalex.org/W1566054993","https://openalex.org/W2972401428","https://openalex.org/W2159929325","https://openalex.org/W2478764867","https://openalex.org/W2012011009","https://openalex.org/W1988916627","https://openalex.org/W608183168","https://openalex.org/W2182278485","https://openalex.org/W2968537988"],"abstract_inverted_index":{"The":[0,28,95,174],"implementation":[1,116],"of":[2,31,39,55,66,100,103,110,117,141,146,149,155,161,164,179,181,194],"temperature":[3,121],"sensors":[4],"represented":[5],"by":[6],"thermal":[7,47,50,61,151,156],"imaging":[8],"cameras":[9],"is":[10,15,34],"becoming":[11],"increasingly":[12],"rational.":[13],"It":[14],"playing":[16],"an":[17],"important":[18],"role":[19],"in":[20,24,43,106,128],"the":[21,32,37,40,53,56,59,84,135,138,144,153,159,162,165,169,177],"socio-economic":[22],"environment,":[23],"industry,":[25],"scientific-research":[26,96],"work.":[27],"main":[29],"objective":[30],"work":[33,97],"to":[35],"assess":[36],"quality":[38],"railway":[41,104,126,195],"vehicles":[42,105,127,196],"exploitation":[44],"and":[45,52,88,119,158,171],"their":[46,150],"insulation,":[48,152],"localise":[49],"bridges,":[51,157],"tightness":[54,160],"body":[57,163],"using":[58],"FLIR-E6390":[60],"inspection":[62],"camera.":[63],"An":[64],"integration":[65],"test":[67],"methods":[68],"(research":[69],"methods)":[70],"was":[71],"used":[72],"including":[73],"a":[74,79,129,198],"diagnostic":[75],"method":[76,87],"based":[77],"on":[78],"thermographic":[80],"study":[81,175],"integrated":[82],"with":[83],"system":[85,89,132],"approach":[86],"failure":[90],"mode":[91],"effects":[92],"analysis":[93],"(SFMEA).":[94],"included":[98],"studies":[99],"seven":[101],"types":[102,140],"exploitation.":[107],"A":[108],"number":[109],"conclusions":[111],"were":[112],"reached.":[113],"Specifically":[114],"providing":[115],"innovative":[118,188],"non-contact":[120],"distribution":[122],"monitoring":[123],"solutions":[124],"for":[125,190],"sustainability":[130],"development":[131],"transport.":[133],"Demonstrated":[134],"disparities":[136],"between":[137],"different":[139],"vehicles.":[142],"Next,":[143],"identification":[145],"critical":[147],"elements":[148],"location":[154],"rail":[166],"vehicles,":[167],"particularly":[168],"doors":[170],"inter-unit":[172],"connections.":[173],"covered":[176],"state":[178],"consumption":[180,193],"stationary":[182,191],"electricity":[183,192],"(for":[184],"non-traction":[185],"needs),":[186],"implementing":[187],"indicators":[189],"as":[197],"new":[199],"approach.":[200]},"counts_by_year":[],"updated_date":"2026-04-28T14:05:53.105641","created_date":"2016-06-24T00:00:00"}