{"id":"https://openalex.org/W4296047152","doi":"https://doi.org/10.3390/s22187000","title":"Discriminative Method for Crack Detection Signals in Balanced-Field Electromagnetic Technique Based on Amplitude-Phase Composite Figure","display_name":"Discriminative Method for Crack Detection Signals in Balanced-Field Electromagnetic Technique Based on Amplitude-Phase Composite Figure","publication_year":2022,"publication_date":"2022-09-15","ids":{"openalex":"https://openalex.org/W4296047152","doi":"https://doi.org/10.3390/s22187000","pmid":"https://pubmed.ncbi.nlm.nih.gov/36146351"},"language":"en","primary_location":{"id":"doi:10.3390/s22187000","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s22187000","pdf_url":"https://www.mdpi.com/1424-8220/22/18/7000/pdf?version=1663558720","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/22/18/7000/pdf?version=1663558720","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100775742","display_name":"Jiayin Li","orcid":"https://orcid.org/0000-0002-8969-7056"},"institutions":[{"id":"https://openalex.org/I157507598","display_name":"Shenyang University of Technology","ror":"https://ror.org/00d7f8730","country_code":"CN","type":"education","lineage":["https://openalex.org/I157507598"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiayin Li","raw_affiliation_strings":["School of Information Science and Engineering, Shenyang University of Technology, Shenyang 110870, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Engineering, Shenyang University of Technology, Shenyang 110870, China","institution_ids":["https://openalex.org/I157507598"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101797412","display_name":"Lijian Yang","orcid":"https://orcid.org/0000-0002-3126-2703"},"institutions":[{"id":"https://openalex.org/I157507598","display_name":"Shenyang University of Technology","ror":"https://ror.org/00d7f8730","country_code":"CN","type":"education","lineage":["https://openalex.org/I157507598"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijian Yang","raw_affiliation_strings":["School of Information Science and Engineering, Shenyang University of Technology, Shenyang 110870, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Engineering, Shenyang University of Technology, Shenyang 110870, China","institution_ids":["https://openalex.org/I157507598"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072094968","display_name":"Wenxue Zheng","orcid":"https://orcid.org/0000-0003-2345-8375"},"institutions":[{"id":"https://openalex.org/I157507598","display_name":"Shenyang University of Technology","ror":"https://ror.org/00d7f8730","country_code":"CN","type":"education","lineage":["https://openalex.org/I157507598"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wenxue Zheng","raw_affiliation_strings":["School of Information Science and Engineering, Shenyang University of Technology, Shenyang 110870, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Engineering, Shenyang University of Technology, Shenyang 110870, China","institution_ids":["https://openalex.org/I157507598"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100334255","display_name":"Bin Liu","orcid":"https://orcid.org/0000-0002-8278-1589"},"institutions":[{"id":"https://openalex.org/I157507598","display_name":"Shenyang University of Technology","ror":"https://ror.org/00d7f8730","country_code":"CN","type":"education","lineage":["https://openalex.org/I157507598"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Liu","raw_affiliation_strings":["School of Information Science and Engineering, Shenyang University of Technology, Shenyang 110870, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Engineering, Shenyang University of Technology, Shenyang 110870, China","institution_ids":["https://openalex.org/I157507598"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5072094968"],"corresponding_institution_ids":["https://openalex.org/I157507598"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.5971,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.61446312,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"22","issue":"18","first_page":"7000","last_page":"7000"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.695228099822998},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.638303279876709},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.6268824338912964},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5475398898124695},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.4599972665309906},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.42538517713546753},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3362559378147125},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2876816391944885},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.28615111112594604},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.273776113986969},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22270742058753967},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.21810844540596008},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16166594624519348}],"concepts":[{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.695228099822998},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.638303279876709},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.6268824338912964},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5475398898124695},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.4599972665309906},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.42538517713546753},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3362559378147125},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2876816391944885},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.28615111112594604},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.273776113986969},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22270742058753967},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.21810844540596008},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16166594624519348},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s22187000","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s22187000","pdf_url":"https://www.mdpi.com/1424-8220/22/18/7000/pdf?version=1663558720","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:36146351","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/36146351","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:1fb36c3f3d4d43a8b26fd68b5ca1f196","is_oa":true,"landing_page_url":"https://doaj.org/article/1fb36c3f3d4d43a8b26fd68b5ca1f196","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 22, Iss 18, p 7000 (2022)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/22/18/7000/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s22187000","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 22; Issue 18; Pages: 7000","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:9504523","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/9504523","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s22187000","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s22187000","pdf_url":"https://www.mdpi.com/1424-8220/22/18/7000/pdf?version=1663558720","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Reduced inequalities","score":0.6899999976158142,"id":"https://metadata.un.org/sdg/10"}],"awards":[{"id":"https://openalex.org/G738101653","display_name":"\u57fa\u4e8e\u7b2c\u4e00\u6027\u539f\u7406\u7ba1\u9053\u5f31\u78c1\u5e94\u529b\u5185\u68c0\u6d4b\u673a\u7406\u7814\u7a76","funder_award_id":"61871450","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4296047152.pdf","grobid_xml":"https://content.openalex.org/works/W4296047152.grobid-xml"},"referenced_works_count":34,"referenced_works":["https://openalex.org/W561046860","https://openalex.org/W2075947653","https://openalex.org/W2080672537","https://openalex.org/W2140536106","https://openalex.org/W2556157439","https://openalex.org/W2564343929","https://openalex.org/W2585774766","https://openalex.org/W2592033178","https://openalex.org/W2595750449","https://openalex.org/W2794859548","https://openalex.org/W2834981551","https://openalex.org/W2912684923","https://openalex.org/W2920134406","https://openalex.org/W2941321555","https://openalex.org/W2981480472","https://openalex.org/W2999989665","https://openalex.org/W3009009788","https://openalex.org/W3034087173","https://openalex.org/W3036162042","https://openalex.org/W3100670071","https://openalex.org/W3109164893","https://openalex.org/W3124493425","https://openalex.org/W3134109762","https://openalex.org/W3144688129","https://openalex.org/W3171244254","https://openalex.org/W3171738331","https://openalex.org/W3176487257","https://openalex.org/W3205825848","https://openalex.org/W3214803265","https://openalex.org/W4206939549","https://openalex.org/W4220691591","https://openalex.org/W4223413238","https://openalex.org/W4286462585","https://openalex.org/W6779325332"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2155789024","https://openalex.org/W2315668284","https://openalex.org/W3213608175","https://openalex.org/W2109491806","https://openalex.org/W2176409448","https://openalex.org/W2348795485","https://openalex.org/W2055945594","https://openalex.org/W3003855539","https://openalex.org/W2088275829"],"abstract_inverted_index":{"The":[0,60,93,120,129,157],"balanced-field":[1,261],"electromagnetic":[2,262],"technique":[3],"is":[4,180,197,212,224],"an":[5,56],"effective":[6],"in-line":[7],"inspection":[8],"method":[9,42,125,245],"for":[10],"pipeline":[11],"cracks.":[12],"To":[13],"address":[14],"the":[15,18,23,27,30,34,45,50,64,71,76,84,87,97,111,114,123,133,138,142,147,162,172,177,185,188,192,200,203,209,215,218,221,227,239,243,248,251,256,260],"problem":[16],"that":[17,132],"interference":[19],"signal":[20,48,53,66,89,101,136,139,165,179,195,223,258],"generated":[21,140],"by":[22,54,69,82,106,141],"tilt":[24],"jitter":[25,52,144,178,222],"of":[26,36,63,86,95,113,122,146,161,176,184,187,250,259],"sensor":[28,51,143],"during":[29],"detection":[31,47,65,88,135,164,194,257],"process":[32],"affects":[33],"judgment":[35],"cracks,":[37],"this":[38],"paper":[39],"proposes":[40],"a":[41,100,234],"to":[43,169,214,238],"differentiate":[44],"crack":[46,134,163,193,211],"from":[49,167],"using":[55,70,83,96],"amplitude-phase":[57,77,115,189],"composite":[58,78,116,190],"figure.":[59],"generation":[61],"principle":[62],"was":[67,80,104,126],"analyzed":[68],"mutual":[72],"inductance":[73],"model,":[74],"and":[75,110,137,153,171,205,208,229,232],"figure":[79,117],"constructed":[81],"components":[85],"after":[90],"quadrature":[91],"demodulation.":[92],"feasibility":[94],"phase":[98,158,173,252],"as":[99],"discrimination":[102],"feature":[103],"illustrated":[105],"finite":[107],"element":[108],"simulations,":[109],"characteristics":[112,186],"were":[118],"determined.":[119],"validity":[121],"proposed":[124,244],"verified":[127],"experimentally.":[128],"results":[130],"show":[131],"are":[145],"same":[148],"frequency":[149],"with":[150],"similar":[151],"waveforms":[152],"significantly":[154],"different":[155],"phases.":[156],"base":[159,174],"value":[160,175],"ranges":[166],"35\u00b0":[168],"55\u00b0,":[170],"\u22124\u00b0.":[181],"In":[182,241],"terms":[183],"figure,":[191],"distribution":[196],"symmetrical":[198],"about":[199],"origin":[201],"in":[202,226,255],"first":[204],"third":[206],"quadrants,":[207],"axial":[210],"closer":[213],"Y-axis":[216],"than":[217],"circumferential":[219],"crack;":[220],"distributed":[225],"second":[228],"fourth":[230],"quadrants":[231],"has":[233],"very":[235],"small":[236],"angle":[237],"X-axis.":[240],"addition,":[242],"effectively":[246],"weakens":[247],"observation":[249],"noise":[253],"region":[254],"technique.":[263]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2026-06-06T09:05:17.133730","created_date":"2025-10-10T00:00:00"}