{"id":"https://openalex.org/W4213054907","doi":"https://doi.org/10.3390/s22041563","title":"An Impedance Readout IC with Ratio-Based Measurement Techniques for Electrical Impedance Spectroscopy","display_name":"An Impedance Readout IC with Ratio-Based Measurement Techniques for Electrical Impedance Spectroscopy","publication_year":2022,"publication_date":"2022-02-17","ids":{"openalex":"https://openalex.org/W4213054907","doi":"https://doi.org/10.3390/s22041563","pmid":"https://pubmed.ncbi.nlm.nih.gov/35214475"},"language":"en","primary_location":{"id":"doi:10.3390/s22041563","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s22041563","pdf_url":"https://www.mdpi.com/1424-8220/22/4/1563/pdf?version=1645100945","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/22/4/1563/pdf?version=1645100945","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073113387","display_name":"Song-I Cheon","orcid":"https://orcid.org/0000-0002-8126-4387"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Song-I Cheon","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea"],"raw_orcid":"https://orcid.org/0000-0002-8126-4387","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059233111","display_name":"Soon-Jae Kweon","orcid":"https://orcid.org/0000-0003-2580-8543"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Soon-Jae Kweon","raw_affiliation_strings":["Division of Engineering, New York University Abu Dhabi, Abu Dhabi 129188, United Arab Emirates"],"raw_orcid":"https://orcid.org/0000-0003-2580-8543","affiliations":[{"raw_affiliation_string":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi 129188, United Arab Emirates","institution_ids":["https://openalex.org/I120250893"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106394757","display_name":"Young-In Kim","orcid":"https://orcid.org/0000-0003-4873-6095"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngin Kim","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070263848","display_name":"Jimin Koo","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jimin Koo","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034621834","display_name":"Sohmyung Ha","orcid":"https://orcid.org/0000-0003-3589-086X"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]},{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["AE","US"],"is_corresponding":true,"raw_author_name":"Sohmyung Ha","raw_affiliation_strings":["Division of Engineering, New York University Abu Dhabi, Abu Dhabi 129188, United Arab Emirates","Tandon School of Engineering, New York University, New York, NY 10003, USA"],"raw_orcid":"https://orcid.org/0000-0003-3589-086X","affiliations":[{"raw_affiliation_string":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi 129188, United Arab Emirates","institution_ids":["https://openalex.org/I120250893"]},{"raw_affiliation_string":"Tandon School of Engineering, New York University, New York, NY 10003, USA","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023245534","display_name":"Minkyu Je","orcid":"https://orcid.org/0000-0003-4580-2771"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Minkyu Je","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea"],"raw_orcid":"https://orcid.org/0000-0003-4580-2771","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5023245534","https://openalex.org/A5034621834"],"corresponding_institution_ids":["https://openalex.org/I120250893","https://openalex.org/I157485424","https://openalex.org/I57206974"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":1.4771,"has_fulltext":true,"cited_by_count":16,"citation_normalized_percentile":{"value":0.80983679,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"22","issue":"4","first_page":"1563","last_page":"1563"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11255","display_name":"Microfluidic and Bio-sensing Technologies","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6602891683578491},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.6027902364730835},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4980442523956299},{"id":"https://openalex.org/keywords/image-impedance","display_name":"Image impedance","score":0.47281375527381897},{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.4277699589729309},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4275825023651123},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3917808532714844},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32835739850997925},{"id":"https://openalex.org/keywords/input-impedance","display_name":"Input impedance","score":0.3074713349342346},{"id":"https://openalex.org/keywords/damping-factor","display_name":"Damping factor","score":0.2589389681816101},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1688135862350464},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.1366840898990631}],"concepts":[{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6602891683578491},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.6027902364730835},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4980442523956299},{"id":"https://openalex.org/C155065438","wikidata":"https://www.wikidata.org/wiki/Q6002234","display_name":"Image impedance","level":5,"score":0.47281375527381897},{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.4277699589729309},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4275825023651123},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3917808532714844},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32835739850997925},{"id":"https://openalex.org/C26262908","wikidata":"https://www.wikidata.org/wiki/Q1307489","display_name":"Input impedance","level":3,"score":0.3074713349342346},{"id":"https://openalex.org/C48427663","wikidata":"https://www.wikidata.org/wiki/Q1269719","display_name":"Damping factor","level":4,"score":0.2589389681816101},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1688135862350464},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.1366840898990631}],"mesh":[{"descriptor_ui":"D000669","descriptor_name":"Amplifiers, Electronic","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D000669","descriptor_name":"Amplifiers, Electronic","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D000669","descriptor_name":"Amplifiers, Electronic","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true}],"locations_count":5,"locations":[{"id":"doi:10.3390/s22041563","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s22041563","pdf_url":"https://www.mdpi.com/1424-8220/22/4/1563/pdf?version=1645100945","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:35214475","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/35214475","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:5576876cd69d4cdfba861c83b9737b0c","is_oa":true,"landing_page_url":"https://doaj.org/article/5576876cd69d4cdfba861c83b9737b0c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 22, Iss 4, p 1563 (2022)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/22/4/1563/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s22041563","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 22; Issue 4; Pages: 1563","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:8876594","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/8876594","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s22041563","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s22041563","pdf_url":"https://www.mdpi.com/1424-8220/22/4/1563/pdf?version=1645100945","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6000000238418579,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G319881950","display_name":null,"funder_award_id":"NRF-2020M3C1B8A01111568","funder_id":"https://openalex.org/F4320322030","funder_display_name":"Ministry of Science, ICT and Future Planning"},{"id":"https://openalex.org/G4267545148","display_name":null,"funder_award_id":"20011402","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"}],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320322030","display_name":"Ministry of Science, ICT and Future Planning","ror":"https://ror.org/032e49973"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4213054907.pdf","grobid_xml":"https://content.openalex.org/works/W4213054907.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W1967708187","https://openalex.org/W1995453310","https://openalex.org/W1998025986","https://openalex.org/W1999206401","https://openalex.org/W2005112949","https://openalex.org/W2062157129","https://openalex.org/W2074048544","https://openalex.org/W2074258298","https://openalex.org/W2078408951","https://openalex.org/W2082211146","https://openalex.org/W2083741777","https://openalex.org/W2090254314","https://openalex.org/W2110463228","https://openalex.org/W2117465127","https://openalex.org/W2122744929","https://openalex.org/W2128105014","https://openalex.org/W2147181724","https://openalex.org/W2155732501","https://openalex.org/W2158135075","https://openalex.org/W2164561324","https://openalex.org/W2288771232","https://openalex.org/W2581036445","https://openalex.org/W2599413837","https://openalex.org/W2759132708","https://openalex.org/W2761309853","https://openalex.org/W2795154090","https://openalex.org/W2950574594","https://openalex.org/W2958068914","https://openalex.org/W3007868482","https://openalex.org/W3013228742","https://openalex.org/W3038711735","https://openalex.org/W3045557652","https://openalex.org/W3097609090","https://openalex.org/W3121721037","https://openalex.org/W3159658309","https://openalex.org/W3163351223","https://openalex.org/W3192508967","https://openalex.org/W4200434461","https://openalex.org/W4225985951","https://openalex.org/W6836800265"],"related_works":["https://openalex.org/W4210809443","https://openalex.org/W3091913842","https://openalex.org/W4297786912","https://openalex.org/W4387426556","https://openalex.org/W1506355656","https://openalex.org/W4391216616","https://openalex.org/W2356432821","https://openalex.org/W4386577649","https://openalex.org/W2136855998","https://openalex.org/W1981255793"],"abstract_inverted_index":{"This":[0,63],"paper":[1],"presents":[2],"an":[3,109],"error-tolerant":[4],"and":[5,19,41,59,102,129,153,190,195],"power-efficient":[6],"impedance":[7,30,49,87],"measurement":[8,31,112],"scheme":[9],"for":[10,66,90,175],"bioimpedance":[11],"acquisition.":[12],"The":[13,43,167],"proposed":[14,127,168],"architecture":[15],"measures":[16],"the":[17,20,24,35,39,47,54,57,60,85,91,95,98,103,106,117,123,126,131,135,147,154,163,187],"magnitude":[18,40,58,111,189],"real":[21,61],"part":[22],"of":[23,46,125,134,180,193],"target":[25,48,86],"complex":[26],"impedance,":[27],"unlike":[28],"other":[29],"architectures":[32],"measuring":[33],"either":[34],"real/imaginary":[36],"components":[37],"or":[38],"phase.":[42],"phase":[44,69,191],"information":[45],"is":[50,80,114,149,157],"obtained":[51],"by":[52,94,138,151,159],"using":[53],"ratio":[55],"between":[56],"components.":[62],"can":[64],"allow":[65],"avoiding":[67],"direct":[68],"measurements,":[70],"which":[71],"require":[72],"fast,":[73],"power-hungry":[74],"circuit":[75,170],"blocks.":[76],"A":[77],"reference":[78,118],"resistor":[79,119],"connected":[81,115],"in":[82,97],"series":[83],"with":[84,186],"to":[88,116,120,143,162,183],"compensate":[89],"errors":[92,192],"caused":[93],"delay":[96],"sinusoidal":[99],"signal":[100],"generator":[101],"amplifier":[104],"at":[105],"front.":[107],"Moreover,":[108],"additional":[110],"path":[113],"cancel":[121],"out":[122],"nonlinearity":[124],"system":[128],"enhance":[130],"settling":[132,155],"speed":[133],"low-pass":[136],"filter":[137],"a":[139,176],"ratio-based":[140,145],"detection.":[141,166],"Thanks":[142],"this":[144],"detection,":[146],"accuracy":[148],"enhanced":[150],"30%,":[152],"time":[156],"improved":[158],"87.7%":[160],"compared":[161],"conventional":[164],"single-path":[165],"integrated":[169],"consumes":[171],"only":[172],"513":[173],"\u03bcW":[174],"wide":[177],"frequency":[178],"range":[179],"10":[181],"Hz":[182],"1":[184],"MHz,":[185],"maximum":[188],"0.3%":[194],"2.1\u00b0,":[196],"respectively.":[197]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":3}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}