{"id":"https://openalex.org/W4210678770","doi":"https://doi.org/10.3390/s22030933","title":"High-Responsivity, Low-Leakage Current, Ultra-Fast Terahertz Detectors Based on a GaN High-Electron-Mobility Transistor with Integrated Bowtie Antennas","display_name":"High-Responsivity, Low-Leakage Current, Ultra-Fast Terahertz Detectors Based on a GaN High-Electron-Mobility Transistor with Integrated Bowtie Antennas","publication_year":2022,"publication_date":"2022-01-25","ids":{"openalex":"https://openalex.org/W4210678770","doi":"https://doi.org/10.3390/s22030933","pmid":"https://pubmed.ncbi.nlm.nih.gov/35161680"},"language":"en","primary_location":{"id":"doi:10.3390/s22030933","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s22030933","pdf_url":"https://www.mdpi.com/1424-8220/22/3/933/pdf?version=1643120110","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/22/3/933/pdf?version=1643120110","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081378688","display_name":"Zhen Huang","orcid":"https://orcid.org/0000-0003-4581-1547"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Huang","raw_affiliation_strings":["Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China","College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing 100049, China","Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China"],"raw_orcid":"https://orcid.org/0000-0003-4581-1547","affiliations":[{"raw_affiliation_string":"Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100765554","display_name":"Wei Yan","orcid":"https://orcid.org/0000-0002-2598-075X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei Yan","raw_affiliation_strings":["Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100648859","display_name":"Zhaofeng Li","orcid":"https://orcid.org/0000-0001-5986-6456"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaofeng Li","raw_affiliation_strings":["Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China","Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China","School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China"],"raw_orcid":"https://orcid.org/0000-0001-5986-6456","affiliations":[{"raw_affiliation_string":"Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086256228","display_name":"Hui Dong","orcid":"https://orcid.org/0000-0002-6444-1134"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Dong","raw_affiliation_strings":["Department of Electronic Science and Technology, University of Science and Technology of China, Hefei 230026, China","Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Science and Technology, University of Science and Technology of China, Hefei 230026, China","institution_ids":["https://openalex.org/I126520041"]},{"raw_affiliation_string":"Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101678468","display_name":"Fuhua Yang","orcid":"https://orcid.org/0000-0002-9981-9387"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fuhua Yang","raw_affiliation_strings":["Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China","School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China","State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100382697","display_name":"Xiaodong Wang","orcid":"https://orcid.org/0000-0003-0426-1358"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210089056","display_name":"Beijing Microelectronics Technology Institute","ror":"https://ror.org/007y7ej30","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"id":"https://openalex.org/I4210150858","display_name":"Beijing Academy of Quantum Information Sciences","ror":"https://ror.org/04nqf9k60","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210150858"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaodong Wang","raw_affiliation_strings":["Beijing Academy of Quantum Information Science, Beijing 100193, China","Beijing Engineering Research Center of Semiconductor Micro-Nano Integrated Technology, Beijing 100083, China","Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China","Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China","School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China"],"raw_orcid":"https://orcid.org/0000-0003-0426-1358","affiliations":[{"raw_affiliation_string":"Beijing Academy of Quantum Information Science, Beijing 100193, China","institution_ids":["https://openalex.org/I4210150858"]},{"raw_affiliation_string":"Beijing Engineering Research Center of Semiconductor Micro-Nano Integrated Technology, Beijing 100083, China","institution_ids":["https://openalex.org/I4210089056"]},{"raw_affiliation_string":"Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]},{"raw_affiliation_string":"Engineering Research Center for Semiconductor Integrated Technology, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100765554"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":1.0602,"has_fulltext":true,"cited_by_count":13,"citation_normalized_percentile":{"value":0.74535328,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"22","issue":"3","first_page":"933","last_page":"933"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10295","display_name":"Plasmonic and Surface Plasmon Research","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/responsivity","display_name":"Responsivity","score":0.8891850113868713},{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.8245830535888672},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.7486384510993958},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7082417011260986},{"id":"https://openalex.org/keywords/noise-equivalent-power","display_name":"Noise-equivalent power","score":0.5887104272842407},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5865059494972229},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5660911202430725},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.49973487854003906},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46886876225471497},{"id":"https://openalex.org/keywords/broadband","display_name":"Broadband","score":0.4615824818611145},{"id":"https://openalex.org/keywords/photodetector","display_name":"Photodetector","score":0.4029102921485901},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.32522183656692505},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29118868708610535},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20009323954582214},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10224583745002747}],"concepts":[{"id":"https://openalex.org/C178889773","wikidata":"https://www.wikidata.org/wiki/Q7316011","display_name":"Responsivity","level":3,"score":0.8891850113868713},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.8245830535888672},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7486384510993958},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7082417011260986},{"id":"https://openalex.org/C123515950","wikidata":"https://www.wikidata.org/wiki/Q3257868","display_name":"Noise-equivalent power","level":4,"score":0.5887104272842407},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5865059494972229},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5660911202430725},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.49973487854003906},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46886876225471497},{"id":"https://openalex.org/C509933004","wikidata":"https://www.wikidata.org/wiki/Q194163","display_name":"Broadband","level":2,"score":0.4615824818611145},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.4029102921485901},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.32522183656692505},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29118868708610535},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20009323954582214},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10224583745002747},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s22030933","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s22030933","pdf_url":"https://www.mdpi.com/1424-8220/22/3/933/pdf?version=1643120110","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:35161680","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/35161680","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:32a2be90c1304f8199df3dd57a9364de","is_oa":true,"landing_page_url":"https://doaj.org/article/32a2be90c1304f8199df3dd57a9364de","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 22, Iss 3, p 933 (2022)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/22/3/933/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s22030933","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 22; Issue 3; Pages: 933","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:8840599","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/8840599","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s22030933","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s22030933","pdf_url":"https://www.mdpi.com/1424-8220/22/3/933/pdf?version=1643120110","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.8700000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G2999949222","display_name":"\u4fa7\u6805\u7ed3\u6784\u6c2e\u5316\u9553\u57fa\u9ad8\u7535\u5b50\u6676\u4f53\u7ba1\u592a\u8d6b\u5179\u63a2\u6d4b\u5668\u5171\u632f\u63a2\u6d4b\u7814\u7a76","funder_award_id":"61971395","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4210678770.pdf","grobid_xml":"https://content.openalex.org/works/W4210678770.grobid-xml"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W1966495759","https://openalex.org/W1968332835","https://openalex.org/W1978178179","https://openalex.org/W1980464099","https://openalex.org/W1995212043","https://openalex.org/W1998035917","https://openalex.org/W2019707250","https://openalex.org/W2026659041","https://openalex.org/W2036181195","https://openalex.org/W2041245232","https://openalex.org/W2042571102","https://openalex.org/W2082713168","https://openalex.org/W2102662922","https://openalex.org/W2184526687","https://openalex.org/W2321593177","https://openalex.org/W2557502861","https://openalex.org/W2558022987","https://openalex.org/W2735292717","https://openalex.org/W2792513188","https://openalex.org/W2795803136","https://openalex.org/W2805506259","https://openalex.org/W2884228776","https://openalex.org/W2952635860","https://openalex.org/W2981674690","https://openalex.org/W3098956413","https://openalex.org/W3153767313","https://openalex.org/W6730731192"],"related_works":["https://openalex.org/W1963751660","https://openalex.org/W2594066644","https://openalex.org/W1994956462","https://openalex.org/W2476130132","https://openalex.org/W3024370153","https://openalex.org/W3008624128","https://openalex.org/W4385333227","https://openalex.org/W2077051266","https://openalex.org/W2607235087","https://openalex.org/W2803149509"],"abstract_inverted_index":{"In":[0],"this":[1],"study,":[2],"we":[3],"fabricated":[4,36],"three":[5],"kinds":[6],"of":[7,46,54,75,120],"terahertz":[8],"detectors":[9],"with":[10,28,38,71],"different":[11],"leakage":[12,33,41],"currents":[13],"to":[14,87],"analyze":[15],"the":[16,23,29,32,39,81,91,114,118,121],"plateau-like":[17],"effect.":[18],"The":[19,35],"results":[20],"indicate":[21],"that":[22],"platform":[24],"becomes":[25],"increasingly":[26],"apparent":[27],"decrease":[30],"in":[31,113],"current.":[34],"device":[37,93],"lowest":[40],"current":[42],"shows":[43],"a":[44,72],"responsivity":[45,74],"4.9":[47],"kV/W":[48],"and":[49,68,80,100,110],"noise":[50],"equivalent":[51],"power":[52],"(NEP)":[53],"72":[55],"pW/Hz.":[56],"Further,":[57],"it":[58],"can":[59,84],"be":[60,85],"used":[61],"for":[62,108],"broadband":[63],"detection":[64,109,119],"between":[65],"215":[66],"GHz":[67,70,123],"232":[69],"voltage":[73],"more":[76],"than":[77],"3.4":[78],"kV/W,":[79],"response":[82],"time":[83],"up":[86],"8":[88],"ns.":[89],"Overall,":[90],"proposed":[92],"exhibits":[94],"high":[95],"sensitivity,":[96],"large":[97],"modulation":[98],"frequency,":[99],"fast":[101],"response,":[102],"which":[103],"indicates":[104],"its":[105],"excellent":[106],"potential":[107],"imaging":[111],"applications":[112],"THz":[115],"range,":[116],"including":[117],"220":[122],"atmospheric":[124],"window.":[125]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2022-02-08T00:00:00"}