{"id":"https://openalex.org/W3199871562","doi":"https://doi.org/10.3390/s21186111","title":"Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks","display_name":"Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks","publication_year":2021,"publication_date":"2021-09-12","ids":{"openalex":"https://openalex.org/W3199871562","doi":"https://doi.org/10.3390/s21186111","mag":"3199871562","pmid":"https://pubmed.ncbi.nlm.nih.gov/34577317"},"language":"en","primary_location":{"id":"doi:10.3390/s21186111","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s21186111","pdf_url":"https://www.mdpi.com/1424-8220/21/18/6111/pdf?version=1631588033","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/21/18/6111/pdf?version=1631588033","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100712406","display_name":"Sangjun Lee","orcid":"https://orcid.org/0000-0002-8687-8329"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangjun Lee","raw_affiliation_strings":["Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050063469","display_name":"Kyunghwan Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyunghwan Cho","raw_affiliation_strings":["Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100384996","display_name":"Jihye Kim","orcid":"https://orcid.org/0000-0002-5719-8180"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jihye Kim","raw_affiliation_strings":["Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106620184","display_name":"Jong-Ho Park","orcid":"https://orcid.org/0009-0003-8662-6839"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongho Park","raw_affiliation_strings":["Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080338996","display_name":"In\u2010Hwan Lee","orcid":"https://orcid.org/0000-0003-4566-9181"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Inhwan Lee","raw_affiliation_strings":["Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea"],"raw_orcid":"https://orcid.org/0000-0002-7093-2095","affiliations":[{"raw_affiliation_string":"Electrical and Electronic Engineering Department, Yonsei University, Seoul 03722, Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5068528309"],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2673},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2673},"fwci":0.1606,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.44874291,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"21","issue":"18","first_page":"6111","last_page":"6111"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.8165881633758545},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7039127349853516},{"id":"https://openalex.org/keywords/wireless-sensor-network","display_name":"Wireless sensor network","score":0.6217221617698669},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5630654692649841},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5331840515136719},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5236770510673523},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.5146637558937073},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.49700143933296204},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.48898422718048096},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4373904764652252},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.42441830039024353},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.41991832852363586},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4061519503593445},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.3648555874824524},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.35476744174957275},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.3500674366950989},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.2613280117511749},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2032088041305542},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.19629907608032227},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16883966326713562},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.1505395472049713},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1343541145324707},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07870990037918091}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.8165881633758545},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7039127349853516},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.6217221617698669},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5630654692649841},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5331840515136719},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5236770510673523},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5146637558937073},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.49700143933296204},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.48898422718048096},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4373904764652252},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.42441830039024353},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.41991832852363586},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4061519503593445},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.3648555874824524},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.35476744174957275},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.3500674366950989},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2613280117511749},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2032088041305542},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.19629907608032227},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16883966326713562},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.1505395472049713},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1343541145324707},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07870990037918091},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":6,"locations":[{"id":"doi:10.3390/s21186111","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s21186111","pdf_url":"https://www.mdpi.com/1424-8220/21/18/6111/pdf?version=1631588033","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:34577317","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/34577317","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:2fd04d4ed1c243cc98b8dfd68a0767c1","is_oa":true,"landing_page_url":"https://doaj.org/article/2fd04d4ed1c243cc98b8dfd68a0767c1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 21, Iss 18, p 6111 (2021)","raw_type":"article"},{"id":"pmh:oai:europepmc.org:7364187","is_oa":true,"landing_page_url":"http://europepmc.org/pmc/articles/PMC8472869","pdf_url":null,"source":{"id":"https://openalex.org/S4306400806","display_name":"Europe PMC (PubMed Central)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1303153112","host_organization_name":"European Bioinformatics Institute","host_organization_lineage":["https://openalex.org/I1303153112"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},{"id":"pmh:oai:mdpi.com:/1424-8220/21/18/6111/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s21186111","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 21; Issue 18; Pages: 6111","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:8472869","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/8472869","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s21186111","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s21186111","pdf_url":"https://www.mdpi.com/1424-8220/21/18/6111/pdf?version=1631588033","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8500000238418579,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G5021558696","display_name":null,"funder_award_id":"20012010","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"}],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320334879","display_name":"Korea Evaluation Institute of Industrial Technology","ror":"https://ror.org/03z9cwa38"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3199871562.pdf","grobid_xml":"https://content.openalex.org/works/W3199871562.grobid-xml"},"referenced_works_count":36,"referenced_works":["https://openalex.org/W1511008725","https://openalex.org/W1560389620","https://openalex.org/W2007995029","https://openalex.org/W2049632515","https://openalex.org/W2105182247","https://openalex.org/W2105897317","https://openalex.org/W2131261851","https://openalex.org/W2132733952","https://openalex.org/W2134329962","https://openalex.org/W2135627440","https://openalex.org/W2136567303","https://openalex.org/W2140341431","https://openalex.org/W2146893269","https://openalex.org/W2151265211","https://openalex.org/W2160621850","https://openalex.org/W2166163625","https://openalex.org/W2170530584","https://openalex.org/W2296084212","https://openalex.org/W2748946592","https://openalex.org/W2799517580","https://openalex.org/W2801807339","https://openalex.org/W2903023342","https://openalex.org/W2937630819","https://openalex.org/W2942997395","https://openalex.org/W2982291011","https://openalex.org/W3023540699","https://openalex.org/W3037906668","https://openalex.org/W3081296331","https://openalex.org/W3081763294","https://openalex.org/W3144240269","https://openalex.org/W3185796949","https://openalex.org/W6638566545","https://openalex.org/W6677347949","https://openalex.org/W6762126672","https://openalex.org/W6780754155","https://openalex.org/W6793078629"],"related_works":["https://openalex.org/W2789883751","https://openalex.org/W1581610324","https://openalex.org/W2408214455","https://openalex.org/W2129124567","https://openalex.org/W2543176856","https://openalex.org/W2075356617","https://openalex.org/W4248388540","https://openalex.org/W2364150359","https://openalex.org/W2150968905","https://openalex.org/W2060366923"],"abstract_inverted_index":{"Cryptographic":[0],"circuits":[1,36,169],"generally":[2],"are":[3],"used":[4,32],"for":[5,33],"applications":[6],"of":[7,56,61,78,167,188],"wireless":[8,171],"sensor":[9,172],"networks":[10,173],"to":[11,22,41,81,114,129,136],"ensure":[12,183],"security":[13,185],"and":[14,58,186],"must":[15],"be":[16],"tested":[17],"in":[18,37,73,127,170,190],"a":[19,27,74,87,92,105,122,148,153],"manufacturing":[20,39],"process":[21],"guarantee":[23],"their":[24],"quality.":[25],"Therefore,":[26,162],"scan":[28,46,66,107,109,124,133],"architecture":[29,76],"is":[30,70,112],"widely":[31,71],"testing":[34],"the":[35,38,54,59,65,144,165,179,184],"test":[40],"improve":[42],"testability.":[43],"However,":[44,90],"during":[45],"testing,":[47],"test-power":[48,177],"consumption":[49],"becomes":[50],"more":[51],"serious":[52],"as":[53],"number":[55],"transistors":[57],"complexity":[60],"chips":[62],"increase.":[63],"Hence,":[64],"chain":[67],"reordering":[68,111],"method":[69,120,146,181],"applied":[72],"low-power":[75],"because":[77],"its":[79],"ability":[80],"achieve":[82],"high":[83],"power":[84,94,150],"reduction":[85,95,151],"with":[86,152,159],"simple":[88],"architecture.":[89],"achieving":[91],"significant":[93,149,176],"without":[96],"excessive":[97],"computational":[98,156],"time":[99,157],"remains":[100],"challenging.":[101],"In":[102],"this":[103,116],"paper,":[104],"novel":[106],"correlation-aware":[108,125],"cluster":[110],"proposed":[113,119,145,180],"solve":[115],"problem.":[117],"The":[118,139],"uses":[121],"new":[123],"clustering":[126],"order":[128],"place":[130],"highly":[131],"correlated":[132],"cells":[134],"adjacent":[135],"each":[137],"other.":[138],"experimental":[140],"results":[141],"demonstrate":[142],"that":[143],"achieves":[147],"relatively":[154],"fast":[155],"compared":[158],"previous":[160],"methods.":[161],"by":[163],"improving":[164],"reliability":[166],"cryptography":[168],"(WSNs)":[174],"through":[175],"reduction,":[178],"can":[182],"integrity":[187],"information":[189],"WSNs.":[191]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}