{"id":"https://openalex.org/W3186516637","doi":"https://doi.org/10.3390/s21154968","title":"Printed Circuit Board Defect Detection Using Deep Learning via A Skip-Connected Convolutional Autoencoder","display_name":"Printed Circuit Board Defect Detection Using Deep Learning via A Skip-Connected Convolutional Autoencoder","publication_year":2021,"publication_date":"2021-07-21","ids":{"openalex":"https://openalex.org/W3186516637","doi":"https://doi.org/10.3390/s21154968","mag":"3186516637","pmid":"https://pubmed.ncbi.nlm.nih.gov/34372203"},"language":"en","primary_location":{"id":"doi:10.3390/s21154968","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s21154968","pdf_url":"https://www.mdpi.com/1424-8220/21/15/4968/pdf?version=1626922098","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/21/15/4968/pdf?version=1626922098","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101991949","display_name":"Jungsuk Kim","orcid":"https://orcid.org/0000-0001-5866-465X"},"institutions":[{"id":"https://openalex.org/I12832649","display_name":"Gachon University","ror":"https://ror.org/03ryywt80","country_code":"KR","type":"education","lineage":["https://openalex.org/I12832649"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jungsuk Kim","raw_affiliation_strings":["Department of Biomedical Engineering, Gachon University, 191 Hambakmoe-ro, Incheon 2199, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Biomedical Engineering, Gachon University, 191 Hambakmoe-ro, Incheon 2199, Korea","institution_ids":["https://openalex.org/I12832649"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034354443","display_name":"Jungbeom Ko","orcid":null},"institutions":[{"id":"https://openalex.org/I12832649","display_name":"Gachon University","ror":"https://ror.org/03ryywt80","country_code":"KR","type":"education","lineage":["https://openalex.org/I12832649"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jungbeom Ko","raw_affiliation_strings":["Department of Biomedical Engineering, Gachon University, 191 Hambakmoe-ro, Incheon 2199, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Biomedical Engineering, Gachon University, 191 Hambakmoe-ro, Incheon 2199, Korea","institution_ids":["https://openalex.org/I12832649"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101887930","display_name":"Hojong Choi","orcid":"https://orcid.org/0000-0003-1955-7696"},"institutions":[{"id":"https://openalex.org/I113409471","display_name":"Kumoh National Institute of Technology","ror":"https://ror.org/05dkjfz60","country_code":"KR","type":"education","lineage":["https://openalex.org/I113409471"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hojong Choi","raw_affiliation_strings":["Department of Medial IT Convergence Engineering, Kumoh National Institute of Technology, 350-27 Gum-daero, Gumi 39253, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Medial IT Convergence Engineering, Kumoh National Institute of Technology, 350-27 Gum-daero, Gumi 39253, Korea","institution_ids":["https://openalex.org/I113409471"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100601077","display_name":"Hyunchul Kim","orcid":"https://orcid.org/0000-0002-8006-9504"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hyunchul Kim","raw_affiliation_strings":["School of Information, University of California, Berkeley, 102 South Hall 4600, Berkeley, CA 94704, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information, University of California, Berkeley, 102 South Hall 4600, Berkeley, CA 94704, USA","institution_ids":["https://openalex.org/I95457486"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100601077","https://openalex.org/A5101887930"],"corresponding_institution_ids":["https://openalex.org/I113409471","https://openalex.org/I95457486"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":18.7416,"has_fulltext":true,"cited_by_count":170,"citation_normalized_percentile":{"value":0.99439757,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"21","issue":"15","first_page":"4968","last_page":"4968"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.9555493593215942},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.7549692988395691},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.739960253238678},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6354655027389526},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.6207156777381897},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5565640926361084},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.4627054035663605},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4245941936969757},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.40244877338409424},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34166380763053894}],"concepts":[{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.9555493593215942},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.7549692988395691},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.739960253238678},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6354655027389526},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.6207156777381897},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5565640926361084},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.4627054035663605},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4245941936969757},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.40244877338409424},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34166380763053894},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s21154968","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s21154968","pdf_url":"https://www.mdpi.com/1424-8220/21/15/4968/pdf?version=1626922098","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:34372203","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/34372203","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:c56f12810a2144efa67d6c124b93ce69","is_oa":true,"landing_page_url":"https://doaj.org/article/c56f12810a2144efa67d6c124b93ce69","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 21, Iss 15, p 4968 (2021)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/21/15/4968/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s21154968","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 21; Issue 15; Pages: 4968","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:8347834","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/8347834","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s21154968","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s21154968","pdf_url":"https://www.mdpi.com/1424-8220/21/15/4968/pdf?version=1626922098","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1693798433","display_name":null,"funder_award_id":"GCU-2018","funder_id":"https://openalex.org/F4320321366","funder_display_name":"Gachon University"},{"id":"https://openalex.org/G187964518","display_name":null,"funder_award_id":"NRF-2017M3A9E2056461","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G6244719143","display_name":null,"funder_award_id":"2017M3A9E2056461","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320321366","display_name":"Gachon University","ror":"https://ror.org/03ryywt80"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3186516637.pdf","grobid_xml":"https://content.openalex.org/works/W3186516637.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W1523493493","https://openalex.org/W1665214252","https://openalex.org/W1680797894","https://openalex.org/W1992764659","https://openalex.org/W2053724458","https://openalex.org/W2112796928","https://openalex.org/W2127979711","https://openalex.org/W2128001196","https://openalex.org/W2136655611","https://openalex.org/W2141125852","https://openalex.org/W2141832011","https://openalex.org/W2145094598","https://openalex.org/W2181834441","https://openalex.org/W2194775991","https://openalex.org/W2460034620","https://openalex.org/W2468676150","https://openalex.org/W2520164769","https://openalex.org/W2560020723","https://openalex.org/W2586451293","https://openalex.org/W2618530766","https://openalex.org/W2786088545","https://openalex.org/W2933801392","https://openalex.org/W2950237263","https://openalex.org/W2953260284","https://openalex.org/W2963802343","https://openalex.org/W2972372332","https://openalex.org/W2982207148","https://openalex.org/W2997574889","https://openalex.org/W3035311645","https://openalex.org/W6681096077"],"related_works":["https://openalex.org/W3013693939","https://openalex.org/W2566616303","https://openalex.org/W2669956259","https://openalex.org/W4249005693","https://openalex.org/W4392946183","https://openalex.org/W3088732000","https://openalex.org/W4226493464","https://openalex.org/W3133861977","https://openalex.org/W2951211570","https://openalex.org/W3103566983"],"abstract_inverted_index":{"As":[0],"technology":[1],"evolves,":[2],"more":[3],"components":[4],"are":[5],"integrated":[6],"into":[7],"printed":[8],"circuit":[9],"boards":[10],"(PCBs)":[11],"and":[12,141,181,195],"the":[13,28,36,44,56,67,72,114,119,129,134,139,145,156,189],"PCB":[14,30,97],"layout":[15],"increases.":[16],"Because":[17],"small":[18,77,140],"defects":[19],"on":[20,76,101],"signal":[21],"trace":[22],"can":[23],"cause":[24],"significant":[25,49],"damage":[26],"to":[27,43,54,112,132,154,179],"system,":[29],"surface":[31],"inspection":[32,57,98],"is":[33],"one":[34],"of":[35,46,177],"most":[37],"important":[38],"quality":[39],"control":[40],"processes.":[41],"Owing":[42],"limitations":[45],"manual":[47],"inspection,":[48],"efforts":[50],"have":[51],"been":[52,82],"made":[53],"automate":[55],"by":[58],"utilizing":[59],"high":[60],"resolution":[61],"CCD":[62],"or":[63],"CMOS":[64],"sensors.":[65],"Despite":[66],"advanced":[68,96],"sensor":[69],"technology,":[70],"setting":[71],"pass/fail":[73],"criteria":[74],"based":[75,100],"failure":[78],"samples":[79],"has":[80],"always":[81],"challenging":[83],"in":[84,144],"traditional":[85],"machine":[86],"vision":[87],"approaches.":[88],"To":[89,137],"overcome":[90,138],"these":[91],"problems,":[92],"we":[93,149],"propose":[94],"an":[95],"system":[99],"a":[102,165,174,182],"skip-connected":[103],"convolutional":[104],"autoencoder.":[105],"The":[106,122,160],"deep":[107],"autoencoder":[108,168],"model":[109,157,169],"was":[110],"trained":[111],"decode":[113],"original":[115],"non-defect":[116,196],"images":[117,124],"from":[118],"defect":[120,135,194],"images.":[121,197],"decoded":[123],"were":[125],"then":[126],"compared":[127],"with":[128,173],"input":[130],"image":[131,152],"identify":[133],"location.":[136],"imbalanced":[142],"dataset":[143],"early":[146],"manufacturing":[147],"stage,":[148],"applied":[150],"appropriate":[151],"augmentation":[153],"improve":[155],"training":[158],"performance.":[159],"experimental":[161],"results":[162],"reveal":[163],"that":[164],"simple":[166],"unsupervised":[167],"delivers":[170],"promising":[171],"performance,":[172],"detection":[175],"rate":[176,185],"up":[178],"98%":[180],"false":[183],"pass":[184],"below":[186],"1.7%":[187],"for":[188],"test":[190],"data,":[191],"containing":[192],"3900":[193]},"counts_by_year":[{"year":2026,"cited_by_count":11},{"year":2025,"cited_by_count":35},{"year":2024,"cited_by_count":41},{"year":2023,"cited_by_count":56},{"year":2022,"cited_by_count":23},{"year":2021,"cited_by_count":4}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}