{"id":"https://openalex.org/W3127014291","doi":"https://doi.org/10.3390/s21041103","title":"Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level","display_name":"Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level","publication_year":2021,"publication_date":"2021-02-05","ids":{"openalex":"https://openalex.org/W3127014291","doi":"https://doi.org/10.3390/s21041103","mag":"3127014291","pmid":"https://pubmed.ncbi.nlm.nih.gov/33562598"},"language":"en","primary_location":{"id":"doi:10.3390/s21041103","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s21041103","pdf_url":"https://www.mdpi.com/1424-8220/21/4/1103/pdf?version=1612754293","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","datacite","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/21/4/1103/pdf?version=1612754293","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110560542","display_name":"Yassir Arezki","orcid":null},"institutions":[{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]},{"id":"https://openalex.org/I39804081","display_name":"Sorbonne Universit\u00e9","ror":"https://ror.org/02en5vm52","country_code":"FR","type":"education","lineage":["https://openalex.org/I39804081"]},{"id":"https://openalex.org/I4210091279","display_name":"Universit\u00e9 Sorbonne Paris Nord","ror":"https://ror.org/0199hds37","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210091279"]},{"id":"https://openalex.org/I4210107682","display_name":"Laboratoire National de M\u00e9trologie et d'Essais","ror":"https://ror.org/01ph39d13","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210107682"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Yassir Arezki","raw_affiliation_strings":["Laboratoire Commun de M\u00e9trologie (LCM), Laboratoire National de M\u00e9trologie et d\u2019Essais (LNE), 1 Rue Gaston Boissier, 75015 Paris, France","Universit\u00e9 Paris-Saclay, Universit\u00e9 Sorbonne Paris Nord, ENS Paris-Saclay, LURPA, 91190 Gif-sur-Yvette, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire Commun de M\u00e9trologie (LCM), Laboratoire National de M\u00e9trologie et d\u2019Essais (LNE), 1 Rue Gaston Boissier, 75015 Paris, France","institution_ids":["https://openalex.org/I4210107682"]},{"raw_affiliation_string":"Universit\u00e9 Paris-Saclay, Universit\u00e9 Sorbonne Paris Nord, ENS Paris-Saclay, LURPA, 91190 Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I277688954","https://openalex.org/I39804081","https://openalex.org/I4210091279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027011883","display_name":"Rong Su","orcid":"https://orcid.org/0000-0003-0776-3716"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Rong Su","raw_affiliation_strings":["Manufacturing Metrology Team, Faculty of Engineering, University of Nottingham (UNOTT), Nottingham NG8 1BB, UK"],"raw_orcid":"https://orcid.org/0000-0003-0776-3716","affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, Faculty of Engineering, University of Nottingham (UNOTT), Nottingham NG8 1BB, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011966922","display_name":"Ville Heikkinen","orcid":"https://orcid.org/0000-0002-9208-5501"},"institutions":[{"id":"https://openalex.org/I133698016","display_name":"National metrology institute VTT MIKES","ror":"https://ror.org/0398a1r53","country_code":"FI","type":"facility","lineage":["https://openalex.org/I133698016","https://openalex.org/I4210089493","https://openalex.org/I87653560"]},{"id":"https://openalex.org/I87653560","display_name":"VTT Technical Research Centre of Finland","ror":"https://ror.org/04b181w54","country_code":"FI","type":"nonprofit","lineage":["https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Ville Heikkinen","raw_affiliation_strings":["VTT Technical Research Centre of Finland Ltd., Centre for Metrology MIKES, Tekniikantie 1, 02150 Espoo, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VTT Technical Research Centre of Finland Ltd., Centre for Metrology MIKES, Tekniikantie 1, 02150 Espoo, Finland","institution_ids":["https://openalex.org/I87653560","https://openalex.org/I133698016"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075909689","display_name":"Fran\u00e7ois Leprete","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fran\u00e7ois Leprete","raw_affiliation_strings":["THALES LAS France, Etablissement de Saint Heand, Boulevard Ravel de Malval, 42570 Saint Heand, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"THALES LAS France, Etablissement de Saint Heand, Boulevard Ravel de Malval, 42570 Saint Heand, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063304919","display_name":"Pavel Posta","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111736","display_name":"Czech Academy of Sciences, Institute of Plasma Physics","ror":"https://ror.org/01h494015","country_code":"CZ","type":"facility","lineage":["https://openalex.org/I202391551","https://openalex.org/I4210111736"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Pavel Posta","raw_affiliation_strings":["TOPTEC, Institute of Plasma Physics of the Czech Academy of Sciences, Za Slovankou 1782/3, 182 00 Praha, Czech Republic"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TOPTEC, Institute of Plasma Physics of the Czech Academy of Sciences, Za Slovankou 1782/3, 182 00 Praha, Czech Republic","institution_ids":["https://openalex.org/I4210111736"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067370828","display_name":"Youichi Bitou","orcid":"https://orcid.org/0000-0002-5742-2779"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Youichi Bitou","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba, Ibaraki 305-8563, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba, Ibaraki 305-8563, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016227331","display_name":"Christian Schober","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Schober","raw_affiliation_strings":["Institute of Applied Optics (ITO), University Stuttgart, Pfaffenwaldring 9, 70569 Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Applied Optics (ITO), University Stuttgart, Pfaffenwaldring 9, 70569 Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103216666","display_name":"Charyar Mehdi-Souzani","orcid":"https://orcid.org/0000-0003-3049-2176"},"institutions":[{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]},{"id":"https://openalex.org/I39804081","display_name":"Sorbonne Universit\u00e9","ror":"https://ror.org/02en5vm52","country_code":"FR","type":"education","lineage":["https://openalex.org/I39804081"]},{"id":"https://openalex.org/I4210091279","display_name":"Universit\u00e9 Sorbonne Paris Nord","ror":"https://ror.org/0199hds37","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210091279"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Charyar Mehdi-Souzani","raw_affiliation_strings":["Universit\u00e9 Paris-Saclay, Universit\u00e9 Sorbonne Paris Nord, ENS Paris-Saclay, LURPA, 91190 Gif-sur-Yvette, France"],"raw_orcid":"https://orcid.org/0000-0003-3049-2176","affiliations":[{"raw_affiliation_string":"Universit\u00e9 Paris-Saclay, Universit\u00e9 Sorbonne Paris Nord, ENS Paris-Saclay, LURPA, 91190 Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I277688954","https://openalex.org/I39804081","https://openalex.org/I4210091279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056573273","display_name":"Bandar Alzahrani","orcid":"https://orcid.org/0000-0003-3095-3403"},"institutions":[{"id":"https://openalex.org/I142608572","display_name":"Prince Sattam Bin Abdulaziz University","ror":"https://ror.org/04jt46d36","country_code":"SA","type":"education","lineage":["https://openalex.org/I142608572"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Bandar Abdulrahman Mohammed Alzahrani","raw_affiliation_strings":["Department of Mechanical Engineering, College of Engineering, Prince Sattam bin Abdulaziz University (PSAU), Alkharj 16273, Saudi Arabia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, College of Engineering, Prince Sattam bin Abdulaziz University (PSAU), Alkharj 16273, Saudi Arabia","institution_ids":["https://openalex.org/I142608572"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089552026","display_name":"Xiangchao Zhang","orcid":"https://orcid.org/0000-0003-3809-1262"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangchao Zhang","raw_affiliation_strings":["Shanghai Engineering Centre of Ultra-Precision Optical Manufacturing, Fudan University, Shanghai 200438, China"],"raw_orcid":"https://orcid.org/0000-0003-3809-1262","affiliations":[{"raw_affiliation_string":"Shanghai Engineering Centre of Ultra-Precision Optical Manufacturing, Fudan University, Shanghai 200438, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019281875","display_name":"Yohan Kondo","orcid":"https://orcid.org/0000-0002-7905-1817"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yohan Kondo","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba, Ibaraki 305-8563, Japan"],"raw_orcid":"https://orcid.org/0000-0002-7905-1817","affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba, Ibaraki 305-8563, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110651961","display_name":"Christof Pru\u00df","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christof Pruss","raw_affiliation_strings":["Institute of Applied Optics (ITO), University Stuttgart, Pfaffenwaldring 9, 70569 Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Applied Optics (ITO), University Stuttgart, Pfaffenwaldring 9, 70569 Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109149920","display_name":"V\u00edt L\u00e9dl","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111736","display_name":"Czech Academy of Sciences, Institute of Plasma Physics","ror":"https://ror.org/01h494015","country_code":"CZ","type":"facility","lineage":["https://openalex.org/I202391551","https://openalex.org/I4210111736"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Vit Ledl","raw_affiliation_strings":["TOPTEC, Institute of Plasma Physics of the Czech Academy of Sciences, Za Slovankou 1782/3, 182 00 Praha, Czech Republic"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TOPTEC, Institute of Plasma Physics of the Czech Academy of Sciences, Za Slovankou 1782/3, 182 00 Praha, Czech Republic","institution_ids":["https://openalex.org/I4210111736"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081028166","display_name":"Nabil Anwer","orcid":"https://orcid.org/0000-0002-0771-4685"},"institutions":[{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]},{"id":"https://openalex.org/I39804081","display_name":"Sorbonne Universit\u00e9","ror":"https://ror.org/02en5vm52","country_code":"FR","type":"education","lineage":["https://openalex.org/I39804081"]},{"id":"https://openalex.org/I4210091279","display_name":"Universit\u00e9 Sorbonne Paris Nord","ror":"https://ror.org/0199hds37","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210091279"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Nabil Anwer","raw_affiliation_strings":["Universit\u00e9 Paris-Saclay, Universit\u00e9 Sorbonne Paris Nord, ENS Paris-Saclay, LURPA, 91190 Gif-sur-Yvette, France"],"raw_orcid":"https://orcid.org/0000-0002-0771-4685","affiliations":[{"raw_affiliation_string":"Universit\u00e9 Paris-Saclay, Universit\u00e9 Sorbonne Paris Nord, ENS Paris-Saclay, LURPA, 91190 Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I277688954","https://openalex.org/I39804081","https://openalex.org/I4210091279"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112539366","display_name":"Mohamed Lamjed Bouazizi","orcid":null},"institutions":[{"id":"https://openalex.org/I142608572","display_name":"Prince Sattam Bin Abdulaziz University","ror":"https://ror.org/04jt46d36","country_code":"SA","type":"education","lineage":["https://openalex.org/I142608572"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Mohamed Lamjed Bouazizi","raw_affiliation_strings":["Department of Mechanical Engineering, College of Engineering, Prince Sattam bin Abdulaziz University (PSAU), Alkharj 16273, Saudi Arabia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, College of Engineering, Prince Sattam bin Abdulaziz University (PSAU), Alkharj 16273, Saudi Arabia","institution_ids":["https://openalex.org/I142608572"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002204160","display_name":"Richard Leach","orcid":"https://orcid.org/0000-0001-5777-067X"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Richard Leach","raw_affiliation_strings":["Manufacturing Metrology Team, Faculty of Engineering, University of Nottingham (UNOTT), Nottingham NG8 1BB, UK"],"raw_orcid":"https://orcid.org/0000-0001-5777-067X","affiliations":[{"raw_affiliation_string":"Manufacturing Metrology Team, Faculty of Engineering, University of Nottingham (UNOTT), Nottingham NG8 1BB, UK","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107502846","display_name":"Hichem Nouira","orcid":null},"institutions":[{"id":"https://openalex.org/I4210107682","display_name":"Laboratoire National de M\u00e9trologie et d'Essais","ror":"https://ror.org/01ph39d13","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210107682"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Hichem Nouira","raw_affiliation_strings":["Laboratoire Commun de M\u00e9trologie (LCM), Laboratoire National de M\u00e9trologie et d\u2019Essais (LNE), 1 Rue Gaston Boissier, 75015 Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire Commun de M\u00e9trologie (LCM), Laboratoire National de M\u00e9trologie et d\u2019Essais (LNE), 1 Rue Gaston Boissier, 75015 Paris, France","institution_ids":["https://openalex.org/I4210107682"]}]}],"institutions":[],"countries_distinct_count":8,"institutions_distinct_count":17,"corresponding_author_ids":["https://openalex.org/A5103216666","https://openalex.org/A5107502846"],"corresponding_institution_ids":["https://openalex.org/I277688954","https://openalex.org/I39804081","https://openalex.org/I4210091279","https://openalex.org/I4210107682"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.4507,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.5709731,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"21","issue":"4","first_page":"1103","last_page":"1103"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.8307483792304993},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6361392140388489},{"id":"https://openalex.org/keywords/magnetorheological-fluid","display_name":"Magnetorheological fluid","score":0.5248439311981201},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5179554224014282},{"id":"https://openalex.org/keywords/reference-data","display_name":"Reference data","score":0.4432043135166168},{"id":"https://openalex.org/keywords/nanometre","display_name":"Nanometre","score":0.4402269721031189},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4281778335571289},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.4247605502605438},{"id":"https://openalex.org/keywords/dimensional-metrology","display_name":"Dimensional metrology","score":0.4137100577354431},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.33357828855514526},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.321744441986084},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2684948742389679},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16490957140922546},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16447359323501587},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.1320514678955078},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.1063656210899353}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.8307483792304993},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6361392140388489},{"id":"https://openalex.org/C108619579","wikidata":"https://www.wikidata.org/wiki/Q902419","display_name":"Magnetorheological fluid","level":3,"score":0.5248439311981201},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5179554224014282},{"id":"https://openalex.org/C60478076","wikidata":"https://www.wikidata.org/wiki/Q3036835","display_name":"Reference data","level":2,"score":0.4432043135166168},{"id":"https://openalex.org/C77066764","wikidata":"https://www.wikidata.org/wiki/Q178674","display_name":"Nanometre","level":2,"score":0.4402269721031189},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4281778335571289},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.4247605502605438},{"id":"https://openalex.org/C165880335","wikidata":"https://www.wikidata.org/wiki/Q5277273","display_name":"Dimensional metrology","level":3,"score":0.4137100577354431},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.33357828855514526},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.321744441986084},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2684948742389679},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16490957140922546},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16447359323501587},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.1320514678955078},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.1063656210899353},{"id":"https://openalex.org/C140096630","wikidata":"https://www.wikidata.org/wiki/Q3423628","display_name":"Damper","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":7,"locations":[{"id":"doi:10.3390/s21041103","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s21041103","pdf_url":"https://www.mdpi.com/1424-8220/21/4/1103/pdf?version=1612754293","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:33562598","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/33562598","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:5e208ae826204d198959010b0780b38d","is_oa":true,"landing_page_url":"https://doaj.org/article/5e208ae826204d198959010b0780b38d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 21, Iss 4, p 1103 (2021)","raw_type":"article"},{"id":"pmh:oai:elib.uni-stuttgart.de:11682/12675","is_oa":true,"landing_page_url":"http://elib.uni-stuttgart.de/handle/11682/12675","pdf_url":null,"source":{"id":"https://openalex.org/S4306401556","display_name":"OPUS Publication Server of the University of Stuttgart (University of Stuttgart)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I100066346","host_organization_name":"University of Stuttgart","host_organization_lineage":["https://openalex.org/I100066346"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/21/4/1103/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s21041103","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 21; Issue 4; Pages: 1103","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:7915810","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7915810","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"},{"id":"doi:10.18419/opus-12656","is_oa":true,"landing_page_url":"https://doi.org/10.18419/opus-12656","pdf_url":null,"source":{"id":"https://openalex.org/S7407052998","display_name":"Universit\u00e4tsbibliothek Stuttgart","issn_l":null,"issn":[],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"doi:10.3390/s21041103","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s21041103","pdf_url":"https://www.mdpi.com/1424-8220/21/4/1103/pdf?version=1612754293","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5400000214576721,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W3127014291.pdf"},"referenced_works_count":42,"referenced_works":["https://openalex.org/W251092679","https://openalex.org/W1543762787","https://openalex.org/W1551071722","https://openalex.org/W1559103798","https://openalex.org/W1975208057","https://openalex.org/W1999824588","https://openalex.org/W2002840911","https://openalex.org/W2009518030","https://openalex.org/W2009541891","https://openalex.org/W2019173256","https://openalex.org/W2028349249","https://openalex.org/W2033141509","https://openalex.org/W2041030550","https://openalex.org/W2056073287","https://openalex.org/W2063739041","https://openalex.org/W2064992568","https://openalex.org/W2081490189","https://openalex.org/W2095326562","https://openalex.org/W2099341239","https://openalex.org/W2109470070","https://openalex.org/W2120665922","https://openalex.org/W2135556708","https://openalex.org/W2138610981","https://openalex.org/W2152105500","https://openalex.org/W2182010021","https://openalex.org/W2196123997","https://openalex.org/W2247084992","https://openalex.org/W2461336584","https://openalex.org/W2468763601","https://openalex.org/W2507048138","https://openalex.org/W2738584418","https://openalex.org/W2792914867","https://openalex.org/W2804153618","https://openalex.org/W2897429876","https://openalex.org/W2946896160","https://openalex.org/W2973049993","https://openalex.org/W2982425664","https://openalex.org/W2984687466","https://openalex.org/W6650529700","https://openalex.org/W6719138704","https://openalex.org/W6769667060","https://openalex.org/W6769735866"],"related_works":["https://openalex.org/W2061967405","https://openalex.org/W2392646414","https://openalex.org/W2008976958","https://openalex.org/W4248596843","https://openalex.org/W2155564425","https://openalex.org/W2082858021","https://openalex.org/W2022123040","https://openalex.org/W3088900111","https://openalex.org/W1553022279","https://openalex.org/W2602154734"],"abstract_inverted_index":{"The":[0,24],"design":[1],"of":[2,15,19,32,60,63,89,96,105],"innovative":[3],"reference":[4,77,108],"aspheric":[5],"and":[6,17,34,55,114],"freeform":[7,35,115],"optical":[8,36,116],"elements":[9],"was":[10,99],"investigated":[11],"with":[12,118],"the":[13,58,74,87,94,103],"aim":[14],"calibration":[16],"verification":[18,25],"ultra-high":[20],"accurate":[21],"measurement":[22,65],"systems.":[23],"is":[26],"dedicated":[27],"to":[28,85],"form":[29,90],"error":[30],"analysis":[31],"aspherical":[33,113],"surfaces":[37,117],"based":[38],"on":[39],"minimum":[40,78],"zone":[41,79],"fitting.":[42],"Two":[43],"thermo-invariant":[44],"material":[45],"measures":[46],"were":[47,71],"designed,":[48],"manufactured":[49],"using":[50,73],"a":[51,61,106],"magnetorheological":[52],"finishing":[53],"process":[54],"selected":[56],"for":[57,112],"evaluation":[59],"number":[62],"ultra-high-precision":[64],"machines.":[66],"All":[67],"collected":[68],"data":[69],"sets":[70],"analysed":[72],"implemented":[75],"robust":[76],"(Hybrid":[80],"Trust":[81],"Region)":[82],"fitting":[83],"algorithm":[84],"extract":[86],"values":[88],"error.":[91],"Agreement":[92],"among":[93],"results":[95],"several":[97],"partners":[98],"observed,":[100],"which":[101],"demonstrates":[102],"establishment":[104],"traceable":[107],"full":[109],"metrology":[110],"chain":[111],"small":[119],"amplitudes.":[120]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2026-05-22T06:13:13.366637","created_date":"2025-10-10T00:00:00"}