{"id":"https://openalex.org/W3091128192","doi":"https://doi.org/10.3390/s20195593","title":"A Study of Defect Detection Techniques for Metallographic Images","display_name":"A Study of Defect Detection Techniques for Metallographic Images","publication_year":2020,"publication_date":"2020-09-29","ids":{"openalex":"https://openalex.org/W3091128192","doi":"https://doi.org/10.3390/s20195593","mag":"3091128192","pmid":"https://pubmed.ncbi.nlm.nih.gov/33003553"},"language":"en","primary_location":{"id":"doi:10.3390/s20195593","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20195593","pdf_url":"https://www.mdpi.com/1424-8220/20/19/5593/pdf?version=1601383010","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/20/19/5593/pdf?version=1601383010","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082147010","display_name":"Wei-Hung Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I70522481","display_name":"National Changhua University of Education","ror":"https://ror.org/005gkfa10","country_code":"TW","type":"education","lineage":["https://openalex.org/I70522481"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wei-Hung Wu","raw_affiliation_strings":["Department of Mechatoronics Engineering, National Changhua University of Education, Changhua City 50007, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechatoronics Engineering, National Changhua University of Education, Changhua City 50007, Taiwan","institution_ids":["https://openalex.org/I70522481"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026755052","display_name":"Jen-Chun Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I4387154394","display_name":"National Kaohsiung University of Science and Technology","ror":"https://ror.org/00hfj7g70","country_code":null,"type":"education","lineage":["https://openalex.org/I4387154394"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Jen-Chun Lee","raw_affiliation_strings":["Department of Telecommunication Engineering, National Kaohsiung University of Science and Technology, Kaohsiung City 80778, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Telecommunication Engineering, National Kaohsiung University of Science and Technology, Kaohsiung City 80778, Taiwan","institution_ids":["https://openalex.org/I4387154394"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103168197","display_name":"Yiming Wang","orcid":"https://orcid.org/0000-0002-7753-0881"},"institutions":[{"id":"https://openalex.org/I70522481","display_name":"National Changhua University of Education","ror":"https://ror.org/005gkfa10","country_code":"TW","type":"education","lineage":["https://openalex.org/I70522481"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Ming Wang","raw_affiliation_strings":["Department of Mechatoronics Engineering, National Changhua University of Education, Changhua City 50007, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechatoronics Engineering, National Changhua University of Education, Changhua City 50007, Taiwan","institution_ids":["https://openalex.org/I70522481"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5026755052"],"corresponding_institution_ids":["https://openalex.org/I4387154394"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":1.9876,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.88709167,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"20","issue":"19","first_page":"5593","last_page":"5593"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metallography","display_name":"Metallography","score":0.8160130977630615},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.7389881610870361},{"id":"https://openalex.org/keywords/residual-neural-network","display_name":"Residual neural network","score":0.6869888305664062},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.601671040058136},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5788734555244446},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.517466127872467},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.4633140563964844},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.44307512044906616},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4366452693939209},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.4353688061237335},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4182494580745697},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.40621381998062134},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3129953444004059},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.18582004308700562},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1256713569164276}],"concepts":[{"id":"https://openalex.org/C2776631189","wikidata":"https://www.wikidata.org/wiki/Q1128169","display_name":"Metallography","level":3,"score":0.8160130977630615},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.7389881610870361},{"id":"https://openalex.org/C2944601119","wikidata":"https://www.wikidata.org/wiki/Q43744058","display_name":"Residual neural network","level":3,"score":0.6869888305664062},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.601671040058136},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5788734555244446},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.517466127872467},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.4633140563964844},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.44307512044906616},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4366452693939209},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.4353688061237335},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4182494580745697},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.40621381998062134},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3129953444004059},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.18582004308700562},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1256713569164276},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s20195593","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20195593","pdf_url":"https://www.mdpi.com/1424-8220/20/19/5593/pdf?version=1601383010","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:33003553","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/33003553","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:fae647f6bc734b0888a7233a893ba78c","is_oa":true,"landing_page_url":"https://doaj.org/article/fae647f6bc734b0888a7233a893ba78c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 20, Iss 19, p 5593 (2020)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/20/19/5593/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s20195593","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 20; Issue 19; Pages: 5593","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:7583772","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7583772","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s20195593","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20195593","pdf_url":"https://www.mdpi.com/1424-8220/20/19/5593/pdf?version=1601383010","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W3091128192.pdf"},"referenced_works_count":32,"referenced_works":["https://openalex.org/W1483870316","https://openalex.org/W1536680647","https://openalex.org/W1973723034","https://openalex.org/W2003801571","https://openalex.org/W2008186275","https://openalex.org/W2031489346","https://openalex.org/W2039923577","https://openalex.org/W2088049833","https://openalex.org/W2102605133","https://openalex.org/W2163605009","https://openalex.org/W2176950688","https://openalex.org/W2193145675","https://openalex.org/W2194775991","https://openalex.org/W2286929393","https://openalex.org/W2565639579","https://openalex.org/W2570343428","https://openalex.org/W2613718673","https://openalex.org/W2794284562","https://openalex.org/W2895340641","https://openalex.org/W2951849131","https://openalex.org/W2954996726","https://openalex.org/W2963073398","https://openalex.org/W2963150697","https://openalex.org/W2963840672","https://openalex.org/W2972006294","https://openalex.org/W2998017713","https://openalex.org/W3018757597","https://openalex.org/W3021905174","https://openalex.org/W3036411632","https://openalex.org/W3106250896","https://openalex.org/W3176923149","https://openalex.org/W6687483927"],"related_works":["https://openalex.org/W3196952692","https://openalex.org/W4226493464","https://openalex.org/W4312417841","https://openalex.org/W2984708981","https://openalex.org/W3193565141","https://openalex.org/W3133861977","https://openalex.org/W2755231872","https://openalex.org/W4300939921","https://openalex.org/W4383097772","https://openalex.org/W2951211570"],"abstract_inverted_index":{"Metallography":[0],"is":[1,33,68,77,168],"the":[2,5,56,63,98,129,139,155],"study":[3],"of":[4,7,59,66,100,142,144,161],"structure":[6],"metals":[8],"and":[9,45,73],"alloys.":[10],"Metallographic":[11],"analysis":[12,117],"can":[13],"be":[14],"regarded":[15],"as":[16,49,185],"a":[17,24,41,79,109,120,174,178],"detection":[18,65,141,184],"tool":[19],"to":[20,28,36,43,54,91],"assist":[21],"in":[22,81,94,102,164],"identifying":[23],"metal":[25],"or":[26,51,53],"alloy,":[27],"evaluate":[29],"whether":[30],"an":[31,159,186],"alloy":[32],"processed":[34],"correctly,":[35],"inspect":[37],"multiple":[38],"phases":[39],"within":[40],"material,":[42],"locate":[44],"characterize":[46],"imperfections":[47],"such":[48],"voids":[50],"impurities,":[52],"find":[55],"damaged":[57],"areas":[58],"metallographic":[60,116,189],"images.":[61],"However,":[62],"defect":[64,183],"metallography":[67],"evaluated":[69],"by":[70,134],"human":[71],"experts,":[72],"its":[74],"automatic":[75,182],"identification":[76],"still":[78],"challenge":[80],"almost":[82],"every":[83],"real":[84],"solution.":[85],"Deep":[86],"learning":[87],"has":[88],"been":[89],"applied":[90],"different":[92],"problems":[93],"computer":[95],"vision":[96],"since":[97],"proposal":[99],"AlexNet":[101],"2012.":[103],"In":[104],"this":[105],"study,":[106],"we":[107,176],"propose":[108,177],"novel":[110,179],"convolutional":[111],"neural":[112,123],"network":[113,124],"architecture":[114],"for":[115,138,181,188],"based":[118],"on":[119],"modified":[121,130],"residual":[122],"(ResNet).":[125],"Multi-scale":[126],"ResNet":[127],"(M-ResNet),":[128],"method,":[131],"improves":[132],"efficiency":[133],"utilizing":[135],"multi-scale":[136],"operations":[137],"accurate":[140],"objects":[143],"various":[145],"sizes,":[146],"especially":[147],"small":[148],"objects.":[149],"The":[150],"experimental":[151],"results":[152],"show":[153],"that":[154],"proposed":[156],"method":[157],"yields":[158],"accuracy":[160],"85.7%":[162],"(mAP)":[163],"recognition":[165],"performance,":[166],"which":[167],"higher":[169],"than":[170],"existing":[171],"methods.":[172],"As":[173],"consequence,":[175],"system":[180],"application":[187],"analysis.":[190]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2}],"updated_date":"2026-05-22T06:13:13.366637","created_date":"2025-10-10T00:00:00"}