{"id":"https://openalex.org/W3024062782","doi":"https://doi.org/10.3390/s20102751","title":"Performance Optimization of FD-SOI Hall Sensors Via 3D TCAD Simulations","display_name":"Performance Optimization of FD-SOI Hall Sensors Via 3D TCAD Simulations","publication_year":2020,"publication_date":"2020-05-12","ids":{"openalex":"https://openalex.org/W3024062782","doi":"https://doi.org/10.3390/s20102751","mag":"3024062782","pmid":"https://pubmed.ncbi.nlm.nih.gov/32408540"},"language":"en","primary_location":{"id":"doi:10.3390/s20102751","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20102751","pdf_url":"https://www.mdpi.com/1424-8220/20/10/2751/pdf","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/20/10/2751/pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024462624","display_name":"Linjie Fan","orcid":"https://orcid.org/0000-0001-9634-0277"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linjie Fan","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China","School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069723560","display_name":"Jinshun Bi","orcid":"https://orcid.org/0000-0003-0114-0040"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jinshun Bi","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China","School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076713293","display_name":"Kai Xi","orcid":"https://orcid.org/0000-0002-3092-906X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Xi","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034257723","display_name":"Sandip Majumdar","orcid":null},"institutions":[{"id":"https://openalex.org/I94349332","display_name":"Serampore College","ror":"https://ror.org/04kn1c182","country_code":"IN","type":"education","lineage":["https://openalex.org/I106542073","https://openalex.org/I4210118834","https://openalex.org/I94349332"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sandip Majumdar","raw_affiliation_strings":["Department of Physics, Serampore Girls\u2019 College, Hooghly 712201, India","Department of Physics, Serampore Girls' College, Hooghly 712201, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Serampore Girls\u2019 College, Hooghly 712201, India","institution_ids":["https://openalex.org/I94349332"]},{"raw_affiliation_string":"Department of Physics, Serampore Girls' College, Hooghly 712201, India","institution_ids":["https://openalex.org/I94349332"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023885825","display_name":"Bo Li","orcid":"https://orcid.org/0000-0003-4905-2744"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Li","raw_affiliation_strings":["Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5069723560"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210119392","https://openalex.org/I4210165038"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.3122,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.56194425,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"20","issue":"10","first_page":"2751","last_page":"2751"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.780126690864563},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.7472951412200928},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6501844525337219},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5868399143218994},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5762245655059814},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5756667852401733},{"id":"https://openalex.org/keywords/input-offset-voltage","display_name":"Input offset voltage","score":0.555950403213501},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5461952090263367},{"id":"https://openalex.org/keywords/hall-effect-sensor","display_name":"Hall effect sensor","score":0.5028090476989746},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.49845123291015625},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.48692429065704346},{"id":"https://openalex.org/keywords/hall-effect","display_name":"Hall effect","score":0.48222148418426514},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44963663816452026},{"id":"https://openalex.org/keywords/optimal-design","display_name":"Optimal design","score":0.4321939945220947},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.41099289059638977},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.3904663324356079},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30703774094581604},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.25270164012908936},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.21141347289085388},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.16333293914794922}],"concepts":[{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.780126690864563},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.7472951412200928},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6501844525337219},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5868399143218994},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5762245655059814},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5756667852401733},{"id":"https://openalex.org/C63651839","wikidata":"https://www.wikidata.org/wiki/Q478566","display_name":"Input offset voltage","level":5,"score":0.555950403213501},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5461952090263367},{"id":"https://openalex.org/C107637996","wikidata":"https://www.wikidata.org/wiki/Q1431247","display_name":"Hall effect sensor","level":3,"score":0.5028090476989746},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.49845123291015625},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.48692429065704346},{"id":"https://openalex.org/C134112204","wikidata":"https://www.wikidata.org/wiki/Q10656","display_name":"Hall effect","level":3,"score":0.48222148418426514},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44963663816452026},{"id":"https://openalex.org/C186394612","wikidata":"https://www.wikidata.org/wiki/Q7098942","display_name":"Optimal design","level":2,"score":0.4321939945220947},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.41099289059638977},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.3904663324356079},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30703774094581604},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.25270164012908936},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.21141347289085388},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.16333293914794922},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.0},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s20102751","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20102751","pdf_url":"https://www.mdpi.com/1424-8220/20/10/2751/pdf","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:32408540","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/32408540","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:cefcb3fe9d1d4f978e9a7d92b5910398","is_oa":true,"landing_page_url":"https://doaj.org/article/cefcb3fe9d1d4f978e9a7d92b5910398","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 20, Iss 10, p 2751 (2020)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/20/10/2751/","is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/s20102751","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:7294431","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7294431","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s20102751","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20102751","pdf_url":"https://www.mdpi.com/1424-8220/20/10/2751/pdf","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2892157575","display_name":null,"funder_award_id":"2014101","funder_id":"https://openalex.org/F4320322847","funder_display_name":"Youth Innovation Promotion Association of the Chinese Academy of Sciences"},{"id":"https://openalex.org/G4614118622","display_name":null,"funder_award_id":"61704188","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5436789878","display_name":"\u5148\u8fdb\u975e\u6613\u5931\u6027\u5b58\u50a8\u5668\u8f90\u7167\u6548\u5e94\u4e0e\u52a0\u56fa\u6280\u672f\u57fa\u7840\u7814\u7a76","funder_award_id":"61634008","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8975001727","display_name":null,"funder_award_id":"61634008 and 61704188","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322847","display_name":"Youth Innovation Promotion Association of the Chinese Academy of Sciences","ror":"https://ror.org/031141b54"},{"id":"https://openalex.org/F4320335892","display_name":"Youth Innovation Promotion Association","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3024062782.pdf","grobid_xml":"https://content.openalex.org/works/W3024062782.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W11593175","https://openalex.org/W1539322292","https://openalex.org/W1992154389","https://openalex.org/W2018067393","https://openalex.org/W2019714160","https://openalex.org/W2023858409","https://openalex.org/W2031236483","https://openalex.org/W2070853820","https://openalex.org/W2078228615","https://openalex.org/W2079847947","https://openalex.org/W2099267231","https://openalex.org/W2116275715","https://openalex.org/W2128132132","https://openalex.org/W2135591779","https://openalex.org/W2150296129","https://openalex.org/W2281111190","https://openalex.org/W2490765418","https://openalex.org/W2605017006","https://openalex.org/W2906863219","https://openalex.org/W3204451125","https://openalex.org/W4243374555","https://openalex.org/W4298132033","https://openalex.org/W6600442565","https://openalex.org/W6680304348","https://openalex.org/W6801877232"],"related_works":["https://openalex.org/W3162919010","https://openalex.org/W2622830326","https://openalex.org/W2151516162","https://openalex.org/W2906319801","https://openalex.org/W2126706605","https://openalex.org/W2370291732","https://openalex.org/W2007447343","https://openalex.org/W1979220576","https://openalex.org/W2981436745","https://openalex.org/W2106084719"],"abstract_inverted_index":{"This":[0],"work":[1],"investigates":[2],"the":[3,20,39,42,58,61,76,84,90],"behavior":[4],"of":[5,41,57,66,72,79,86],"fully":[6],"depleted":[7],"silicon-on-insulator":[8],"(FD-SOI)":[9],"Hall":[10,43,126],"sensors":[11],"with":[12,34],"an":[13,70],"emphasis":[14],"on":[15,96],"their":[16,124],"physical":[17],"parameters,":[18],"namely":[19],"aspect":[21],"ratio,":[22],"doping":[23],"concentration,":[24],"and":[25,49,69,93,101,105],"thicknesses.":[26],"Via":[27],"3D-technology":[28],"computer":[29],"aided":[30],"design":[31,107],"(TCAD)":[32],"simulations":[33],"a":[35,64],"galvanomagnetic":[36],"transport":[37],"model,":[38],"performances":[40],"voltage,":[44,48,95],"sensitivity,":[45],"efficiency,":[46],"offset":[47],"temperature":[50],"characteristics":[51],"are":[52,98,109,112],"evaluated.":[53],"The":[54],"optimal":[55],"structure":[56,104],"sensor":[59,127],"in":[60],"simulation":[62],"has":[63],"sensitivity":[65],"86.5":[67],"mV/T":[68],"efficiency":[71],"218.9":[73],"V/WT":[74],"at":[75],"bias":[77,106],"voltage":[78,92],"5":[80],"V.":[81],"In":[82],"addition,":[83],"effects":[85],"bias,":[87],"such":[88],"as":[89,111],"gate":[91],"substrate":[94],"performance":[97],"also":[99],"simulated":[100],"analyzed.":[102],"Optimal":[103],"rules":[108],"proposed,":[110],"some":[113],"adjustable":[114],"trade-offs":[115],"that":[116],"can":[117],"be":[118],"chosen":[119],"by":[120],"designers":[121],"to":[122],"meet":[123],"own":[125],"requirements.":[128]},"counts_by_year":[{"year":2024,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-06T09:05:17.133730","created_date":"2025-10-10T00:00:00"}