{"id":"https://openalex.org/W3013270813","doi":"https://doi.org/10.3390/s20071916","title":"Extremely Sensitive Microwave Sensor for Evaluation of Dielectric Characteristics of Low-Permittivity Materials","display_name":"Extremely Sensitive Microwave Sensor for Evaluation of Dielectric Characteristics of Low-Permittivity Materials","publication_year":2020,"publication_date":"2020-03-30","ids":{"openalex":"https://openalex.org/W3013270813","doi":"https://doi.org/10.3390/s20071916","mag":"3013270813","pmid":"https://pubmed.ncbi.nlm.nih.gov/32235529"},"language":"en","primary_location":{"id":"doi:10.3390/s20071916","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20071916","pdf_url":"https://www.mdpi.com/1424-8220/20/7/1916/pdf?version=1585567249","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/20/7/1916/pdf?version=1585567249","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016179369","display_name":"Tanveer Ul Haq","orcid":"https://orcid.org/0000-0002-8327-583X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tanveerul Haq","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"raw_orcid":"https://orcid.org/0000-0002-8327-583X","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061585999","display_name":"Cunjun Ruan","orcid":"https://orcid.org/0000-0002-5248-9333"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Cunjun Ruan","raw_affiliation_strings":["Beijing Key Laboratory for Microwave Sensing and Security Applications, Beihang University, Beijing 100191, China","School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"raw_orcid":"https://orcid.org/0000-0002-5248-9333","affiliations":[{"raw_affiliation_string":"Beijing Key Laboratory for Microwave Sensing and Security Applications, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101814516","display_name":"Xingyun Zhang","orcid":"https://orcid.org/0000-0002-8567-4949"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingyun Zhang","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004864601","display_name":"Shahid Ullah","orcid":"https://orcid.org/0000-0003-2718-8915"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shahid Ullah","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"raw_orcid":"https://orcid.org/0000-0003-2718-8915","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072737067","display_name":"Ayesha Kosar Fahad","orcid":"https://orcid.org/0000-0003-1409-8910"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ayesha Kosar Fahad","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"raw_orcid":"https://orcid.org/0000-0003-1409-8910","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030053520","display_name":"Wenlong He","orcid":"https://orcid.org/0000-0001-7018-0527"},"institutions":[{"id":"https://openalex.org/I180726961","display_name":"Shenzhen University","ror":"https://ror.org/01vy4gh70","country_code":"CN","type":"education","lineage":["https://openalex.org/I180726961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenlong He","raw_affiliation_strings":["College of Electronics and Information Engineering, Shenzhen University, Guangdong 518060, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics and Information Engineering, Shenzhen University, Guangdong 518060, China","institution_ids":["https://openalex.org/I180726961"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5061585999"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":2.7044,"has_fulltext":true,"cited_by_count":48,"citation_normalized_percentile":{"value":0.90539971,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"20","issue":"7","first_page":"1916","last_page":"1916"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.8257090449333191},{"id":"https://openalex.org/keywords/relative-permittivity","display_name":"Relative permittivity","score":0.7466747760772705},{"id":"https://openalex.org/keywords/dissipation-factor","display_name":"Dissipation factor","score":0.7191571593284607},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.706606388092041},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6536178588867188},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6480858325958252},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6009108424186707},{"id":"https://openalex.org/keywords/resonator","display_name":"Resonator","score":0.5466204285621643},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4771920442581177},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4039546251296997},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36879080533981323},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2014889419078827},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15194788575172424},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14660251140594482},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12100163102149963}],"concepts":[{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.8257090449333191},{"id":"https://openalex.org/C13760523","wikidata":"https://www.wikidata.org/wiki/Q4027242","display_name":"Relative permittivity","level":4,"score":0.7466747760772705},{"id":"https://openalex.org/C97274863","wikidata":"https://www.wikidata.org/wiki/Q1040795","display_name":"Dissipation factor","level":3,"score":0.7191571593284607},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.706606388092041},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6536178588867188},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6480858325958252},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6009108424186707},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.5466204285621643},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4771920442581177},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4039546251296997},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36879080533981323},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2014889419078827},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15194788575172424},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14660251140594482},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12100163102149963}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s20071916","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20071916","pdf_url":"https://www.mdpi.com/1424-8220/20/7/1916/pdf?version=1585567249","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:32235529","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/32235529","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:52b533f19e6245e4b91a73d6c5d754e2","is_oa":true,"landing_page_url":"https://doaj.org/article/52b533f19e6245e4b91a73d6c5d754e2","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 20, Iss 7, p 1916 (2020)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/20/7/1916/","is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/s20071916","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:7180479","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7180479","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s20071916","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20071916","pdf_url":"https://www.mdpi.com/1424-8220/20/7/1916/pdf?version=1585567249","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.7699999809265137,"display_name":"Peace, Justice and strong institutions"}],"awards":[{"id":"https://openalex.org/G2244799429","display_name":null,"funder_award_id":"61831001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3300895607","display_name":null,"funder_award_id":"ZG226S1821","funder_id":"https://openalex.org/F4320321125","funder_display_name":"Beihang University"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321125","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3013270813.pdf","grobid_xml":"https://content.openalex.org/works/W3013270813.grobid-xml"},"referenced_works_count":74,"referenced_works":["https://openalex.org/W1931085413","https://openalex.org/W1968746124","https://openalex.org/W1974607369","https://openalex.org/W1975845146","https://openalex.org/W1979746976","https://openalex.org/W1984671961","https://openalex.org/W1990245077","https://openalex.org/W1994502784","https://openalex.org/W2000859483","https://openalex.org/W2005296435","https://openalex.org/W2020584972","https://openalex.org/W2021448065","https://openalex.org/W2022230754","https://openalex.org/W2032480839","https://openalex.org/W2039840110","https://openalex.org/W2043278477","https://openalex.org/W2043951736","https://openalex.org/W2053529493","https://openalex.org/W2072189409","https://openalex.org/W2075584783","https://openalex.org/W2077411079","https://openalex.org/W2082717903","https://openalex.org/W2082999677","https://openalex.org/W2087324415","https://openalex.org/W2089809063","https://openalex.org/W2096285815","https://openalex.org/W2099436494","https://openalex.org/W2106424517","https://openalex.org/W2106891651","https://openalex.org/W2107599280","https://openalex.org/W2122187449","https://openalex.org/W2130572767","https://openalex.org/W2134476848","https://openalex.org/W2136405402","https://openalex.org/W2140757045","https://openalex.org/W2148020016","https://openalex.org/W2206637095","https://openalex.org/W2244166548","https://openalex.org/W2323935702","https://openalex.org/W2334559666","https://openalex.org/W2461687343","https://openalex.org/W2527990793","https://openalex.org/W2549372462","https://openalex.org/W2554984571","https://openalex.org/W2564397779","https://openalex.org/W2574666340","https://openalex.org/W2608488100","https://openalex.org/W2608979634","https://openalex.org/W2611711780","https://openalex.org/W2616249061","https://openalex.org/W2626209400","https://openalex.org/W2734734924","https://openalex.org/W2742138939","https://openalex.org/W2751632613","https://openalex.org/W2752911626","https://openalex.org/W2757770544","https://openalex.org/W2781981284","https://openalex.org/W2790673685","https://openalex.org/W2796356582","https://openalex.org/W2803213393","https://openalex.org/W2895018648","https://openalex.org/W2897245098","https://openalex.org/W2906693286","https://openalex.org/W2914624221","https://openalex.org/W2942540697","https://openalex.org/W2969463398","https://openalex.org/W2971196704","https://openalex.org/W2981755621","https://openalex.org/W2983676951","https://openalex.org/W3104455115","https://openalex.org/W4301358636","https://openalex.org/W6663667142","https://openalex.org/W6679444751","https://openalex.org/W6679959391"],"related_works":["https://openalex.org/W2107320019","https://openalex.org/W4391114742","https://openalex.org/W2905363763","https://openalex.org/W2377615134","https://openalex.org/W2715167416","https://openalex.org/W3091232865","https://openalex.org/W2014243933","https://openalex.org/W2313079490","https://openalex.org/W4238822153","https://openalex.org/W2333849723"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"an":[3,28],"extremely":[4],"sensitive":[5],"microwave":[6],"sensor":[7,145],"is":[8,27,124],"designed":[9],"based":[10],"on":[11,72],"a":[12,42],"complementary":[13],"symmetric":[14],"S":[15],"shaped":[16],"resonator":[17],"(CSSSR)":[18],"to":[19,91,103,114,147],"evaluate":[20],"dielectric":[21,61],"characteristics":[22],"of":[23,45,54,66,79,109,142],"low-permittivity":[24,89],"material.":[25],"CSSSR":[26],"artificial":[29],"structure":[30],"with":[31,149],"strong":[32],"and":[33,41,62,76,121],"enhanced":[34],"electromagnetic":[35],"fields,":[36],"which":[37],"provides":[38,98],"high":[39],"sensitivity":[40,100],"new":[43],"degree":[44],"freedom":[46],"in":[47,138],"sensing.":[48],"Electromagnetic":[49],"simulation":[50],"elucidates":[51],"the":[52,67,73,80,93,106,136,139,143,150],"effect":[53],"real":[55,58],"relative":[56,59,107],"permittivity,":[57],"permeability,":[60],"magnetic":[63],"loss":[64],"tangents":[65],"material":[68],"under":[69],"test":[70],"(MUT)":[71],"resonance":[74,140],"frequency":[75,141],"notch":[77],"depth":[78],"sensor.":[81],"Experiments":[82],"are":[83],"performed":[84],"at":[85],"room":[86],"temperature":[87],"using":[88],"materials":[90],"verify":[92],"concept.":[94],"The":[95,116,128],"proposed":[96],"design":[97],"differential":[99],"between":[101,119],"102%":[102],"95%":[104],"as":[105],"permittivity":[108],"MUT":[110],"varies":[111],"from":[112],"2.1":[113],"3.":[115],"percentage":[117],"error":[118],"simulated":[120],"measured":[122],"results":[123],"less":[125],"than":[126],"0.5%.":[127],"transcendental":[129],"equation":[130],"has":[131],"been":[132],"established":[133],"by":[134],"measuring":[135],"change":[137],"fabricated":[144],"due":[146],"interaction":[148],"MUT.":[151]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":13},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":2}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}