{"id":"https://openalex.org/W2998589288","doi":"https://doi.org/10.3390/s20010171","title":"A Radiation-Hardened SAR ADC with Delay-Based Dual Feedback Flip-Flops for Sensor Readout Systems","display_name":"A Radiation-Hardened SAR ADC with Delay-Based Dual Feedback Flip-Flops for Sensor Readout Systems","publication_year":2019,"publication_date":"2019-12-27","ids":{"openalex":"https://openalex.org/W2998589288","doi":"https://doi.org/10.3390/s20010171","mag":"2998589288","pmid":"https://pubmed.ncbi.nlm.nih.gov/31892184"},"language":"en","primary_location":{"id":"doi:10.3390/s20010171","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20010171","pdf_url":"https://www.mdpi.com/1424-8220/20/1/171/pdf?version=1577441596","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/20/1/171/pdf?version=1577441596","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090140273","display_name":"Duckhoon Ro","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Duckhoon Ro","raw_affiliation_strings":["School of Electrical Engineering, Korea University, Seoul 02841, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul 02841, Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068462353","display_name":"Changhong Min","orcid":null},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changhong Min","raw_affiliation_strings":["Department of Electronic Engineering, Kyung Hee University, Yongin 17104, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kyung Hee University, Yongin 17104, Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000312879","display_name":"Myounggon Kang","orcid":"https://orcid.org/0000-0003-4132-0038"},"institutions":[{"id":"https://openalex.org/I119575151","display_name":"Korea National University of Transportation","ror":"https://ror.org/03qqbe534","country_code":"KR","type":"education","lineage":["https://openalex.org/I119575151"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Myounggon Kang","raw_affiliation_strings":["Department of Electronics Engineering, Korea National University of Transportation, Chungju 27469, Korea"],"raw_orcid":"https://orcid.org/0000-0003-4132-0038","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Korea National University of Transportation, Chungju 27469, Korea","institution_ids":["https://openalex.org/I119575151"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045028723","display_name":"Ik\u2010Joon Chang","orcid":"https://orcid.org/0000-0002-8871-8695"},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Ik Joon Chang","raw_affiliation_strings":["Department of Electronic Engineering, Kyung Hee University, Yongin 17104, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kyung Hee University, Yongin 17104, Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042373004","display_name":"Hyung\u2010Min Lee","orcid":"https://orcid.org/0000-0003-1191-3553"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hyung-Min Lee","raw_affiliation_strings":["School of Electrical Engineering, Korea University, Seoul 02841, Korea"],"raw_orcid":"https://orcid.org/0000-0003-1191-3553","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul 02841, Korea","institution_ids":["https://openalex.org/I197347611"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5042373004","https://openalex.org/A5045028723"],"corresponding_institution_ids":["https://openalex.org/I197347611","https://openalex.org/I35928602"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":1.0896,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.78933578,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"20","issue":"1","first_page":"171","last_page":"171"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5255614519119263},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.520825982093811},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.5047057867050171},{"id":"https://openalex.org/keywords/flops","display_name":"FLOPS","score":0.49749234318733215},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.462721049785614},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.4494301676750183},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.44735419750213623},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.42199212312698364},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.384705126285553},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3701620101928711},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3276529908180237},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15659862756729126}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5255614519119263},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.520825982093811},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.5047057867050171},{"id":"https://openalex.org/C3826847","wikidata":"https://www.wikidata.org/wiki/Q188768","display_name":"FLOPS","level":2,"score":0.49749234318733215},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.462721049785614},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.4494301676750183},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.44735419750213623},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.42199212312698364},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.384705126285553},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3701620101928711},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3276529908180237},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15659862756729126},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s20010171","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20010171","pdf_url":"https://www.mdpi.com/1424-8220/20/1/171/pdf?version=1577441596","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:31892184","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/31892184","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:5b74179f81504eadb4c46479dd0855f1","is_oa":true,"landing_page_url":"https://doaj.org/article/5b74179f81504eadb4c46479dd0855f1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 20, Iss 1, p 171 (2019)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/20/1/171/","is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/s20010171","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:6983195","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6983195","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s20010171","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s20010171","pdf_url":"https://www.mdpi.com/1424-8220/20/1/171/pdf?version=1577441596","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7799999713897705}],"awards":[{"id":"https://openalex.org/G3499345320","display_name":null,"funder_award_id":"NRF-2017M1A7A1A01016260","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2998589288.pdf"},"referenced_works_count":19,"referenced_works":["https://openalex.org/W1596360820","https://openalex.org/W2018604238","https://openalex.org/W2033542075","https://openalex.org/W2048444403","https://openalex.org/W2053330176","https://openalex.org/W2059214545","https://openalex.org/W2064131881","https://openalex.org/W2126248298","https://openalex.org/W2131280230","https://openalex.org/W2141068710","https://openalex.org/W2148327955","https://openalex.org/W2150156165","https://openalex.org/W2542395084","https://openalex.org/W2737640031","https://openalex.org/W2759976478","https://openalex.org/W2903881955","https://openalex.org/W4231501498","https://openalex.org/W4238482881","https://openalex.org/W6679411331"],"related_works":["https://openalex.org/W1490775144","https://openalex.org/W1629214335","https://openalex.org/W2139254480","https://openalex.org/W1966923901","https://openalex.org/W4401308369","https://openalex.org/W2333137665","https://openalex.org/W1979972974","https://openalex.org/W2099245758","https://openalex.org/W2100150400","https://openalex.org/W4296887773"],"abstract_inverted_index":{"For":[0],"stable":[1],"and":[2,16,23,38,69,83,108,127,151,165],"effective":[3],"control":[4],"of":[5,60],"the":[6,58,61,97,139],"sensor":[7,10,62],"system,":[8],"analog":[9],"signals":[11],"such":[12,31,47],"as":[13,32,42,44,48],"temperature,":[14],"pressure,":[15],"electromagnetic":[17],"fields":[18],"should":[19],"be":[20],"accurately":[21],"measured":[22,132],"converted":[24],"to":[25,95,162],"digital":[26],"bits.":[27],"However,":[28],"radiation":[29,54,81,101,129,135,160,166],"environments,":[30],"space,":[33],"flight,":[34],"nuclear":[35,39],"power":[36],"plants,":[37],"fusion":[40],"reactors,":[41],"well":[43],"high-reliability":[45],"applications,":[46],"automotive":[49],"semiconductor":[50],"systems,":[51],"suffer":[52],"from":[53],"effects":[55,111,161],"that":[56],"degrade":[57],"performance":[59],"readout":[63],"system":[64,71,98],"including":[65,103],"analog-to-digital":[66],"converters":[67],"(ADCs)":[68],"cause":[70],"malfunctions.":[72],"This":[73],"paper":[74],"investigates":[75],"an":[76],"optimal":[77],"ADC":[78,89,143],"structure":[79],"in":[80,133],"environments":[82],"proposes":[84],"a":[85],"successive-":[86],"approximation-register":[87],"(SAR)":[88],"using":[90,118],"delay-based":[91,145],"double":[92],"feedback":[93,147],"flip-flops":[94,148],"enhance":[96],"tolerance":[99,130],"against":[100],"effects,":[102],"total":[104],"ionizing":[105],"dose":[106],"(TID)":[107],"single":[109],"event":[110],"(SEE).":[112],"The":[113],"proposed":[114,140],"flip-flop":[115],"was":[116,131,149],"fabricated":[117],"130":[119],"nm":[120],"complementary":[121],"metal-oxide-semiconductor":[122],"(CMOS)":[123],"silicon-on-insulator":[124],"(SOI)":[125],"process,":[126],"its":[128],"actual":[134],"test":[136],"facilities.":[137],"Also,":[138],"radiation-hardened":[141],"SAR":[142],"with":[144],"dual":[146],"designed":[150],"verified":[152],"by":[153],"utilizing":[154],"compact":[155],"transistor":[156],"models,":[157],"which":[158],"reflect":[159],"CMOS":[163],"parameters,":[164],"simulator":[167],"computer":[168],"aided":[169],"design":[170],"(CAD)":[171],"tools.":[172]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":3}],"updated_date":"2026-05-22T06:13:13.366637","created_date":"2025-10-10T00:00:00"}