{"id":"https://openalex.org/W2979846342","doi":"https://doi.org/10.3390/s19204409","title":"Modeling and Optimal Design for a High Stability 2D Optoelectronic Angle Sensor","display_name":"Modeling and Optimal Design for a High Stability 2D Optoelectronic Angle Sensor","publication_year":2019,"publication_date":"2019-10-11","ids":{"openalex":"https://openalex.org/W2979846342","doi":"https://doi.org/10.3390/s19204409","mag":"2979846342","pmid":"https://pubmed.ncbi.nlm.nih.gov/31614653"},"language":"en","primary_location":{"id":"doi:10.3390/s19204409","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19204409","pdf_url":"https://www.mdpi.com/1424-8220/19/20/4409/pdf?version=1571806240","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/19/20/4409/pdf?version=1571806240","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082857475","display_name":"Zhenying Cheng","orcid":"https://orcid.org/0000-0002-0043-5528"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenying Cheng","raw_affiliation_strings":["School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091544825","display_name":"Liying Liu","orcid":"https://orcid.org/0000-0001-5981-6993"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liying Liu","raw_affiliation_strings":["School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101526037","display_name":"Peng Xu","orcid":"https://orcid.org/0000-0003-4391-1608"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Xu","raw_affiliation_strings":["School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100750027","display_name":"Ruijun Li","orcid":"https://orcid.org/0000-0002-3743-6567"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ruijun Li","raw_affiliation_strings":["School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China"],"raw_orcid":"https://orcid.org/0000-0002-3743-6567","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015424182","display_name":"Kuang\u2013Chao Fan","orcid":"https://orcid.org/0000-0003-1320-9412"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]},{"id":"https://openalex.org/I27357992","display_name":"Dalian University of Technology","ror":"https://ror.org/023hj5876","country_code":"CN","type":"education","lineage":["https://openalex.org/I27357992"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kuang-Chao Fan","raw_affiliation_strings":["School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China","School of Mechanical Engineering, Dalian University of Technology, Dalian 116024, China"],"raw_orcid":"https://orcid.org/0000-0003-1320-9412","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Mechanical Engineering, Dalian University of Technology, Dalian 116024, China","institution_ids":["https://openalex.org/I27357992"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100687742","display_name":"Hongli Li","orcid":"https://orcid.org/0000-0002-7612-4080"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongli Li","raw_affiliation_strings":["School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103773583","display_name":"Yongqing Wei","orcid":null},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongqing Wei","raw_affiliation_strings":["School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100750027"],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.4316,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.61385945,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"19","issue":"20","first_page":"4409","last_page":"4409"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14163","display_name":"Astronomical Observations and Instrumentation","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.7526971697807312},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6814725995063782},{"id":"https://openalex.org/keywords/optimal-design","display_name":"Optimal design","score":0.6393854022026062},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.6352781057357788},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.552024245262146},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.5057170391082764},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4874001145362854},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.46477511525154114},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46441739797592163},{"id":"https://openalex.org/keywords/thermal-stability","display_name":"Thermal stability","score":0.4507564902305603},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3333090841770172},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32618170976638794},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.32463401556015015},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.31559425592422485},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26246339082717896},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.2264062464237213},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15441685914993286},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07615441083908081}],"concepts":[{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.7526971697807312},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6814725995063782},{"id":"https://openalex.org/C186394612","wikidata":"https://www.wikidata.org/wiki/Q7098942","display_name":"Optimal design","level":2,"score":0.6393854022026062},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.6352781057357788},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.552024245262146},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.5057170391082764},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4874001145362854},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.46477511525154114},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46441739797592163},{"id":"https://openalex.org/C59061564","wikidata":"https://www.wikidata.org/wiki/Q7783071","display_name":"Thermal stability","level":2,"score":0.4507564902305603},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3333090841770172},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32618170976638794},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.32463401556015015},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.31559425592422485},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26246339082717896},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.2264062464237213},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15441685914993286},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07615441083908081},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s19204409","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19204409","pdf_url":"https://www.mdpi.com/1424-8220/19/20/4409/pdf?version=1571806240","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:31614653","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/31614653","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:d3c0214e159649be8576d3868a97d82b","is_oa":true,"landing_page_url":"https://doaj.org/article/d3c0214e159649be8576d3868a97d82b","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 19, Iss 20, p 4409 (2019)","raw_type":"article"},{"id":"pmh:oai:europepmc.org:5826639","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6832309","pdf_url":null,"source":{"id":"https://openalex.org/S4306400806","display_name":"Europe PMC (PubMed Central)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1303153112","host_organization_name":"European Bioinformatics Institute","host_organization_lineage":["https://openalex.org/I1303153112"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Text"},{"id":"pmh:oai:mdpi.com:/1424-8220/19/20/4409/","is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/s19204409","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s19204409","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19204409","pdf_url":"https://www.mdpi.com/1424-8220/19/20/4409/pdf?version=1571806240","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.4399999976158142,"id":"https://metadata.un.org/sdg/15","display_name":"Life in Land"}],"awards":[{"id":"https://openalex.org/G1739824541","display_name":null,"funder_award_id":"51805136","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2979846342.pdf"},"referenced_works_count":20,"referenced_works":["https://openalex.org/W1019218592","https://openalex.org/W1137452330","https://openalex.org/W1973285042","https://openalex.org/W2003787521","https://openalex.org/W2032918888","https://openalex.org/W2035229699","https://openalex.org/W2057964791","https://openalex.org/W2094384655","https://openalex.org/W2114246683","https://openalex.org/W2121583446","https://openalex.org/W2268072277","https://openalex.org/W2302195436","https://openalex.org/W2335187996","https://openalex.org/W2355286166","https://openalex.org/W2394065318","https://openalex.org/W2736415917","https://openalex.org/W2740039005","https://openalex.org/W2772432706","https://openalex.org/W2809569971","https://openalex.org/W6742355874"],"related_works":["https://openalex.org/W2378757965","https://openalex.org/W4224903346","https://openalex.org/W1593262897","https://openalex.org/W2372869593","https://openalex.org/W2384194537","https://openalex.org/W2031011156","https://openalex.org/W1991935520","https://openalex.org/W2368745429","https://openalex.org/W2067940999","https://openalex.org/W2381722214"],"abstract_inverted_index":{"The":[0,23,41,78],"structural":[1,45],"deformations":[2,46],"caused":[3,43],"by":[4,44,72,127],"environmental":[5],"changes":[6],"in":[7,38],"temperature,":[8],"vibration,":[9],"and":[10,25,54,67,76,90,104,137,143,162],"other":[11,155],"factors":[12],"are":[13],"harmful":[14],"to":[15,65,150],"the":[16,48,94,102,117,120,135,152],"stability":[17,24,118,153],"of":[18,29,47,80,96,119,154],"high":[19],"precision":[20],"measurement":[21],"equipment.":[22],"optimal":[26,138],"design":[27,139],"method":[28,140],"a":[30,55,115],"2D":[31],"optoelectronic":[32],"angle":[33,49,106,122],"sensor":[34,50,123],"have":[35,108],"been":[36,52,60,109,125],"investigated":[37],"this":[39],"study.":[40],"drift":[42,56],"has":[51,59,124],"studied":[53],"error":[57,73],"model":[58],"achieved.":[61],"Key":[62],"components":[63,82],"sensitive":[64],"thermal":[66],"vibrational":[68],"effects":[69],"were":[70,83],"identified":[71],"sensitivity":[74],"analysis":[75,88],"simulation.":[77],"mounts":[79],"key":[81],"analyzed":[84],"using":[85],"finite":[86],"element":[87],"software":[89],"optimized":[91,105,121],"based":[92],"on":[93],"concept":[95],"symmetric":[97],"structures.":[98,163],"Stability":[99],"experiments":[100],"for":[101,112],"original":[103],"sensors":[107,156],"carried":[110],"out":[111],"contrast.":[113],"As":[114],"result,":[116],"improved":[126],"more":[128,159],"than":[129],"63%.":[130],"It":[131],"is":[132,141],"verified":[133],"that":[134],"modeling":[136],"effective":[142],"low-cost,":[144],"which":[145],"can":[146],"also":[147],"be":[148],"applied":[149],"improve":[151],"with":[157],"much":[158],"complex":[160],"principles":[161]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-05-22T06:13:13.366637","created_date":"2025-10-10T00:00:00"}