{"id":"https://openalex.org/W2942351919","doi":"https://doi.org/10.3390/s19091995","title":"FPGA-Based Degradation and Reliability Monitor for Underground Cables","display_name":"FPGA-Based Degradation and Reliability Monitor for Underground Cables","publication_year":2019,"publication_date":"2019-04-28","ids":{"openalex":"https://openalex.org/W2942351919","doi":"https://doi.org/10.3390/s19091995","mag":"2942351919","pmid":"https://pubmed.ncbi.nlm.nih.gov/31035420"},"language":"en","primary_location":{"id":"doi:10.3390/s19091995","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19091995","pdf_url":"https://www.mdpi.com/1424-8220/19/9/1995/pdf?version=1557108021","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/19/9/1995/pdf?version=1557108021","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085988276","display_name":"Unai Garro","orcid":"https://orcid.org/0000-0002-2266-4583"},"institutions":[{"id":"https://openalex.org/I162361429","display_name":"Mondragon Unibertsitatea","ror":"https://ror.org/00wvqgd19","country_code":"ES","type":"education","lineage":["https://openalex.org/I162361429"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Unai Garro","raw_affiliation_strings":["Faculty of Engineering, Mondragon Unibertsitatea, 20500 Arrasate - Mondragon, Spain"],"raw_orcid":"https://orcid.org/0000-0002-2266-4583","affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Mondragon Unibertsitatea, 20500 Arrasate - Mondragon, Spain","institution_ids":["https://openalex.org/I162361429"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014364937","display_name":"E\u00f1aut Muxika","orcid":"https://orcid.org/0000-0003-4896-3191"},"institutions":[{"id":"https://openalex.org/I162361429","display_name":"Mondragon Unibertsitatea","ror":"https://ror.org/00wvqgd19","country_code":"ES","type":"education","lineage":["https://openalex.org/I162361429"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"E\u00f1aut Muxika","raw_affiliation_strings":["Faculty of Engineering, Mondragon Unibertsitatea, 20500 Arrasate - Mondragon, Spain"],"raw_orcid":"https://orcid.org/0000-0003-4896-3191","affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Mondragon Unibertsitatea, 20500 Arrasate - Mondragon, Spain","institution_ids":["https://openalex.org/I162361429"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101835988","display_name":"Jose Ignacio Aizpurua","orcid":"https://orcid.org/0000-0002-8653-6011"},"institutions":[{"id":"https://openalex.org/I181647926","display_name":"University of Strathclyde","ror":"https://ror.org/00n3w3b69","country_code":"GB","type":"education","lineage":["https://openalex.org/I181647926"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Jose Ignacio Aizpurua","raw_affiliation_strings":["Faculty of Engineering, University of Strathclyde, Glasgow G11XW, UK"],"raw_orcid":"https://orcid.org/0000-0002-8653-6011","affiliations":[{"raw_affiliation_string":"Faculty of Engineering, University of Strathclyde, Glasgow G11XW, UK","institution_ids":["https://openalex.org/I181647926"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057301585","display_name":"Mikel Mendicute","orcid":"https://orcid.org/0000-0002-2728-8978"},"institutions":[{"id":"https://openalex.org/I162361429","display_name":"Mondragon Unibertsitatea","ror":"https://ror.org/00wvqgd19","country_code":"ES","type":"education","lineage":["https://openalex.org/I162361429"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Mikel Mendicute","raw_affiliation_strings":["Faculty of Engineering, Mondragon Unibertsitatea, 20500 Arrasate - Mondragon, Spain"],"raw_orcid":"https://orcid.org/0000-0002-2728-8978","affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Mondragon Unibertsitatea, 20500 Arrasate - Mondragon, Spain","institution_ids":["https://openalex.org/I162361429"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5085988276"],"corresponding_institution_ids":["https://openalex.org/I162361429"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02857946,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"19","issue":"9","first_page":"1995","last_page":"1995"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8019567131996155},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7937648296356201},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7221955060958862},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6119976043701172},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5193772912025452},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.4434424936771393},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4421398937702179},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3863254189491272},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33017754554748535},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.23466399312019348}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8019567131996155},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7937648296356201},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7221955060958862},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6119976043701172},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5193772912025452},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.4434424936771393},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4421398937702179},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3863254189491272},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33017754554748535},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.23466399312019348},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":7,"locations":[{"id":"doi:10.3390/s19091995","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19091995","pdf_url":"https://www.mdpi.com/1424-8220/19/9/1995/pdf?version=1557108021","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:31035420","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/31035420","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:strathprints.strath.ac.uk:67959","is_oa":false,"landing_page_url":"https://strathprints.strath.ac.uk/view/author/1024637.html>","pdf_url":null,"source":{"id":"https://openalex.org/S4306402226","display_name":"Strathprints: The University of Strathclyde institutional repository (University of Strathclyde)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I181647926","host_organization_name":"University of Strathclyde","host_organization_lineage":["https://openalex.org/I181647926"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"},{"id":"pmh:oai:ebiltegia.mondragon.edu:20.500.11984/1219","is_oa":true,"landing_page_url":"https://katalogoa.mondragon.edu/janium-bin/janium_login_opac.pl?find&ficha_no=150870","pdf_url":null,"source":{"id":"https://openalex.org/S4377196532","display_name":"eRepository Mondragon University (Mondragon University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I162361429","host_organization_name":"Mondragon Unibertsitatea","host_organization_lineage":["https://openalex.org/I162361429"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors Vol. 19. N\u00ba 9. 28 April, 2019","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:doaj.org/article:967811adeaf5405ca5934fec3b89617c","is_oa":true,"landing_page_url":"https://doaj.org/article/967811adeaf5405ca5934fec3b89617c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 19, Iss 9, p 1995 (2019)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/19/9/1995/","is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/s19091995","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:6539336","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6539336","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s19091995","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19091995","pdf_url":"https://www.mdpi.com/1424-8220/19/9/1995/pdf?version=1557108021","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2942351919.pdf","grobid_xml":"https://content.openalex.org/works/W2942351919.grobid-xml"},"referenced_works_count":48,"referenced_works":["https://openalex.org/W60609245","https://openalex.org/W1485650462","https://openalex.org/W1590348499","https://openalex.org/W1965931954","https://openalex.org/W1967174394","https://openalex.org/W1996583965","https://openalex.org/W2001518303","https://openalex.org/W2011596031","https://openalex.org/W2024681446","https://openalex.org/W2038127923","https://openalex.org/W2048798966","https://openalex.org/W2060171394","https://openalex.org/W2061920694","https://openalex.org/W2066155451","https://openalex.org/W2072980547","https://openalex.org/W2083041835","https://openalex.org/W2097734117","https://openalex.org/W2099420588","https://openalex.org/W2100462968","https://openalex.org/W2104102443","https://openalex.org/W2130592820","https://openalex.org/W2134788745","https://openalex.org/W2140494556","https://openalex.org/W2149973132","https://openalex.org/W2150807165","https://openalex.org/W2153103889","https://openalex.org/W2164843621","https://openalex.org/W2166843196","https://openalex.org/W2245340339","https://openalex.org/W2279976069","https://openalex.org/W2343663165","https://openalex.org/W2528841625","https://openalex.org/W2530513829","https://openalex.org/W2541002483","https://openalex.org/W2542636223","https://openalex.org/W2561352551","https://openalex.org/W2563522164","https://openalex.org/W2606649257","https://openalex.org/W2610557515","https://openalex.org/W2752734004","https://openalex.org/W2764773857","https://openalex.org/W2781549786","https://openalex.org/W2782898538","https://openalex.org/W4239432576","https://openalex.org/W4293174100","https://openalex.org/W6662740498","https://openalex.org/W6680826990","https://openalex.org/W6736792470"],"related_works":["https://openalex.org/W2096844293","https://openalex.org/W1815542355","https://openalex.org/W2363944576","https://openalex.org/W2152540334","https://openalex.org/W2351041855","https://openalex.org/W2570254841","https://openalex.org/W2742986847","https://openalex.org/W2370255709","https://openalex.org/W2025257136","https://openalex.org/W2363620142"],"abstract_inverted_index":{"The":[0,56],"online":[1],"RUL":[2,47],"estimation":[3],"of":[4,21,112,122],"underground":[5,113],"cables":[6],"and":[7,25,50,70,106,109,119],"their":[8],"reliability":[9,110],"analysis":[10,111],"requires":[11,58],"obtaining":[12],"the":[13,42,54,82,104,120,126,134],"cable":[14,128],"failure":[15],"time":[16],"probability":[17],"distribution.":[18],"MC":[19,117],"simulations":[20,77],"complex":[22,87],"thermal":[23,83],"heating":[24],"electro-thermal":[26],"degradation":[27,108],"models":[28,84],"can":[29],"be":[30,39,89],"employed":[31],"for":[32,53,78,103],"this":[33],"analysis,":[34,80],"but":[35,81],"uncertainties":[36,124],"need":[37],"to":[38,44,88],"considered":[40],"in":[41,92],"simulations,":[43],"produce":[45],"accurate":[46],"expectation":[48],"values":[49],"confidence":[51],"margins":[52],"results.":[55,135],"process":[57],"performing":[59],"large":[60],"simulation":[61],"sets,":[62],"based":[63,115],"on":[64,116,125],"past":[65],"temperature":[66],"or":[67],"load":[68,72,123],"measurements":[69],"future":[71],"predictions.":[73],"FPGA":[74,98],"permit":[75],"accelerating":[76],"live":[79],"involved":[85],"are":[86],"directly":[90],"implemented":[91],"hardware":[93],"logic.":[94],"A":[95],"new":[96],"standalone":[97],"architecture":[99],"has":[100,130],"been":[101,131],"proposed":[102],"fast":[105],"on-site":[107],"cables,":[114],"simulation,":[118],"effect":[121],"predicted":[127],"EOL":[129],"analyzed":[132],"from":[133]},"counts_by_year":[],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}