{"id":"https://openalex.org/W2928792003","doi":"https://doi.org/10.3390/s19071585","title":"Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology","display_name":"Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology","publication_year":2019,"publication_date":"2019-04-02","ids":{"openalex":"https://openalex.org/W2928792003","doi":"https://doi.org/10.3390/s19071585","mag":"2928792003","pmid":"https://pubmed.ncbi.nlm.nih.gov/30986913"},"language":"en","primary_location":{"id":"doi:10.3390/s19071585","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19071585","pdf_url":"https://www.mdpi.com/1424-8220/19/7/1585/pdf?version=1554184462","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/19/7/1585/pdf?version=1554184462","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102875618","display_name":"Chien\u2010Ping Wang","orcid":"https://orcid.org/0000-0003-2495-9868"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chien-Ping Wang","raw_affiliation_strings":["Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081561953","display_name":"Ying\u2010Chun Shen","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ying-Chun Shen","raw_affiliation_strings":["Institute of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022117950","display_name":"Peng-Chun Liou","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Peng-Chun Liou","raw_affiliation_strings":["Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012327097","display_name":"Yu\u2010Lun Chueh","orcid":"https://orcid.org/0000-0002-0155-9987"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Lun Chueh","raw_affiliation_strings":["Institute of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108829163","display_name":"Yue\u2010Der Chih","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yue-Der Chih","raw_affiliation_strings":["Design Technology Division, Taiwan Semiconductor Manufacturing Company, Hsinchu 30075, Taiwan"],"affiliations":[{"raw_affiliation_string":"Design Technology Division, Taiwan Semiconductor Manufacturing Company, Hsinchu 30075, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081987422","display_name":"Jonathan Chang","orcid":"https://orcid.org/0000-0002-3811-1254"},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jonathan Chang","raw_affiliation_strings":["Design Technology Division, Taiwan Semiconductor Manufacturing Company, Hsinchu 30075, Taiwan"],"affiliations":[{"raw_affiliation_string":"Design Technology Division, Taiwan Semiconductor Manufacturing Company, Hsinchu 30075, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110178054","display_name":"Chrong-Jung Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chrong-Jung Lin","raw_affiliation_strings":["Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085948014","display_name":"Ya\u2010Chin King","orcid":"https://orcid.org/0000-0003-4065-0350"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Ya-Chin King","raw_affiliation_strings":["Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5085948014"],"corresponding_institution_ids":["https://openalex.org/I25846049"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.8127,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.69123041,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"19","issue":"7","first_page":"1585","last_page":"1585"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8164224028587341},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6295753717422485},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6138389110565186},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5860627293586731},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.49908900260925293},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4687725901603699},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4403790235519409},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4349743127822876},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.42299896478652954},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.4109494984149933},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38767021894454956},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3717596232891083},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.33061426877975464},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3240051865577698},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18672508001327515}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8164224028587341},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6295753717422485},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6138389110565186},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5860627293586731},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.49908900260925293},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4687725901603699},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4403790235519409},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4349743127822876},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.42299896478652954},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.4109494984149933},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38767021894454956},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3717596232891083},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33061426877975464},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3240051865577698},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18672508001327515},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s19071585","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19071585","pdf_url":"https://www.mdpi.com/1424-8220/19/7/1585/pdf?version=1554184462","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:30986913","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/30986913","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:12a619bad49648739dc27454b38064fe","is_oa":true,"landing_page_url":"https://doaj.org/article/12a619bad49648739dc27454b38064fe","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 19, Iss 7, p 1585 (2019)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/19/7/1585/","is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/s19071585","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:6480048","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6480048","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s19071585","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19071585","pdf_url":"https://www.mdpi.com/1424-8220/19/7/1585/pdf?version=1554184462","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2928792003.pdf","grobid_xml":"https://content.openalex.org/works/W2928792003.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W1556716983","https://openalex.org/W1588624208","https://openalex.org/W1867480679","https://openalex.org/W1922818205","https://openalex.org/W1967181037","https://openalex.org/W1971207325","https://openalex.org/W1976143019","https://openalex.org/W1992232702","https://openalex.org/W2005946052","https://openalex.org/W2008956716","https://openalex.org/W2014118019","https://openalex.org/W2017347340","https://openalex.org/W2022690372","https://openalex.org/W2032168109","https://openalex.org/W2067445283","https://openalex.org/W2084537804","https://openalex.org/W2112611349","https://openalex.org/W2113670572","https://openalex.org/W2116199021","https://openalex.org/W2124187419","https://openalex.org/W2221608923","https://openalex.org/W2249799267","https://openalex.org/W2362386426","https://openalex.org/W2490765418","https://openalex.org/W2530664656","https://openalex.org/W2558483145","https://openalex.org/W2616854758","https://openalex.org/W2650439411","https://openalex.org/W2731711719","https://openalex.org/W2782360760","https://openalex.org/W2787266975","https://openalex.org/W2811280859","https://openalex.org/W2900514596","https://openalex.org/W2901802155","https://openalex.org/W2904073837","https://openalex.org/W2913913221","https://openalex.org/W3081744366","https://openalex.org/W3125392325","https://openalex.org/W6738286982","https://openalex.org/W6782287029"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W1965493748","https://openalex.org/W2004664178","https://openalex.org/W2995582362","https://openalex.org/W1992709339","https://openalex.org/W2501578203","https://openalex.org/W2113108952","https://openalex.org/W2040773997"],"abstract_inverted_index":{"In":[0,86],"this":[1,75],"work,":[2],"we":[3],"present":[4],"a":[5,44],"novel":[6],"pH":[7],"sensor":[8,27,54],"using":[9],"efficient":[10],"laterally":[11],"coupled":[12],"structure":[13],"enabled":[14],"by":[15],"Complementary":[16],"Metal-Oxide":[17],"Semiconductor":[18],"(CMOS)":[19],"Fin":[20],"Field-Effect":[21],"Transistor":[22],"(FinFET)":[23],"processes.":[24],"This":[25],"new":[26,76],"features":[28],"adjustable":[29],"sensitivity,":[30],"wide":[31],"sensing":[32,35,99,112],"range,":[33],"multi-pad":[34],"capability":[36],"and":[37,48,65,81,110],"compatibility":[38],"to":[39,57,95],"advanced":[40],"CMOS":[41],"technologies.":[42],"With":[43],"self-balanced":[45],"readout":[46],"scheme":[47,92],"proposed":[49,53,98],"corresponding":[50],"circuit,":[51],"the":[52,72,78,97,102],"is":[55,93],"found":[56],"be":[58],"easily":[59],"embedded":[60,89],"into":[61,67],"integrated":[62],"circuits":[63],"(ICs)":[64],"expanded":[66],"sensors":[68],"array.":[69],"To":[70],"ensure":[71],"robustness":[73],"of":[74],"device,":[77],"transient":[79],"response":[80],"noise":[82],"analysis":[83],"are":[84],"performed.":[85],"addition,":[87],"an":[88],"calibration":[90],"operation":[91],"implemented":[94],"prevent":[96],"device":[100],"from":[101,105],"background":[103],"offset":[104],"process":[106],"variation,":[107],"providing":[108],"reliable":[109],"stable":[111],"results.":[113]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}