{"id":"https://openalex.org/W2920016200","doi":"https://doi.org/10.3390/s19051074","title":"On-Line Laser Triangulation Scanner for Wood Logs Surface Geometry Measurement","display_name":"On-Line Laser Triangulation Scanner for Wood Logs Surface Geometry Measurement","publication_year":2019,"publication_date":"2019-03-02","ids":{"openalex":"https://openalex.org/W2920016200","doi":"https://doi.org/10.3390/s19051074","mag":"2920016200"},"language":"en","primary_location":{"id":"doi:10.3390/s19051074","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19051074","pdf_url":"https://www.mdpi.com/1424-8220/19/5/1074/pdf?version=1551781221","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/19/5/1074/pdf?version=1551781221","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019867337","display_name":"Piotr Sieka\u0144ski","orcid":"https://orcid.org/0000-0001-9101-4608"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Piotr Sieka\u0144ski","raw_affiliation_strings":["Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland"],"affiliations":[{"raw_affiliation_string":"Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020365545","display_name":"Krzysztof Magda","orcid":null},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Krzysztof Magda","raw_affiliation_strings":["Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland"],"affiliations":[{"raw_affiliation_string":"Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005898187","display_name":"Krzysztof Malowany","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Krzysztof Malowany","raw_affiliation_strings":["KSM Vision Sp. z o.o., 9/117 Soko\u0142owska St., 01-142 Warsaw, Poland"],"affiliations":[{"raw_affiliation_string":"KSM Vision Sp. z o.o., 9/117 Soko\u0142owska St., 01-142 Warsaw, Poland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085239361","display_name":"Jan Rutkiewicz","orcid":null},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Jan Rutkiewicz","raw_affiliation_strings":["Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland"],"affiliations":[{"raw_affiliation_string":"Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021250633","display_name":"Adam Styk","orcid":"https://orcid.org/0000-0001-6181-9560"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Adam Styk","raw_affiliation_strings":["Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland"],"affiliations":[{"raw_affiliation_string":"Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001637694","display_name":"Jakub Krzes\u0142owski","orcid":null},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Jakub Krzes\u0142owski","raw_affiliation_strings":["Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland"],"affiliations":[{"raw_affiliation_string":"Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083518284","display_name":"Tomasz Kowaluk","orcid":"https://orcid.org/0000-0002-3510-274X"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Tomasz Kowaluk","raw_affiliation_strings":["Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland"],"affiliations":[{"raw_affiliation_string":"Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, 8 \u015aw. A. Boboli St., 02-525 Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007020654","display_name":"A. Zag\u00f3rski","orcid":"https://orcid.org/0000-0001-7279-8371"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Andrzej Zag\u00f3rski","raw_affiliation_strings":["Faculty of Materials Science and Engineering, Warsaw University of Technology, 141 Wo\u0142oska St., 02-507 Warszawa, Poland"],"affiliations":[{"raw_affiliation_string":"Faculty of Materials Science and Engineering, Warsaw University of Technology, 141 Wo\u0142oska St., 02-507 Warszawa, Poland","institution_ids":["https://openalex.org/I108403487"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5019867337"],"corresponding_institution_ids":["https://openalex.org/I108403487"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":8.0697,"has_fulltext":true,"cited_by_count":31,"citation_normalized_percentile":{"value":0.9719834,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"19","issue":"5","first_page":"1074","last_page":"1074"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11164","display_name":"Remote Sensing and LiDAR Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.8274183869361877},{"id":"https://openalex.org/keywords/triangulation","display_name":"Triangulation","score":0.7803654670715332},{"id":"https://openalex.org/keywords/laser-scanning","display_name":"Laser scanning","score":0.7009148001670837},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5686448216438293},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5499750971794128},{"id":"https://openalex.org/keywords/wood-processing","display_name":"Wood processing","score":0.49037718772888184},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.46979817748069763},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.433439701795578},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38515761494636536},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.3590184450149536},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.3009238839149475},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.2814791202545166},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.262223482131958},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.26124900579452515},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.23808884620666504},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11095279455184937},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10986950993537903}],"concepts":[{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.8274183869361877},{"id":"https://openalex.org/C135981907","wikidata":"https://www.wikidata.org/wiki/Q188056","display_name":"Triangulation","level":2,"score":0.7803654670715332},{"id":"https://openalex.org/C141349535","wikidata":"https://www.wikidata.org/wiki/Q1361664","display_name":"Laser scanning","level":3,"score":0.7009148001670837},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5686448216438293},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5499750971794128},{"id":"https://openalex.org/C2776752069","wikidata":"https://www.wikidata.org/wiki/Q1609891","display_name":"Wood processing","level":2,"score":0.49037718772888184},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.46979817748069763},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.433439701795578},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38515761494636536},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3590184450149536},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.3009238839149475},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.2814791202545166},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.262223482131958},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.26124900579452515},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.23808884620666504},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11095279455184937},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10986950993537903},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.3390/s19051074","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19051074","pdf_url":"https://www.mdpi.com/1424-8220/19/5/1074/pdf?version=1551781221","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:247bebec60c94282a906fac49a82679e","is_oa":true,"landing_page_url":"https://doaj.org/article/247bebec60c94282a906fac49a82679e","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 19, Iss 5, p 1074 (2019)","raw_type":"article"},{"id":"pmh:oai:europepmc.org:5445594","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/6427530","pdf_url":null,"source":{"id":"https://openalex.org/S4306400806","display_name":"Europe PMC (PubMed Central)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1303153112","host_organization_name":"European Bioinformatics Institute","host_organization_lineage":["https://openalex.org/I1303153112"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Text"},{"id":"pmh:oai:mdpi.com:/1424-8220/19/5/1074/","is_oa":true,"landing_page_url":"http://dx.doi.org/10.3390/s19051074","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s19051074","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s19051074","pdf_url":"https://www.mdpi.com/1424-8220/19/5/1074/pdf?version=1551781221","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3492409896","display_name":null,"funder_award_id":"/298950/1/NCBR/2016","funder_id":"https://openalex.org/F4320335039","funder_display_name":"Narodowe Centrum Bada\u0144 i Rozwoju"},{"id":"https://openalex.org/G4121061748","display_name":null,"funder_award_id":"BIOSTRATEG2/298950/1/NCBR/2016","funder_id":"https://openalex.org/F4320335039","funder_display_name":"Narodowe Centrum Bada\u0144 i Rozwoju"}],"funders":[{"id":"https://openalex.org/F4320335039","display_name":"Narodowe Centrum Bada\u0144 i Rozwoju","ror":"https://ror.org/05pwfyy15"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2920016200.pdf","grobid_xml":"https://content.openalex.org/works/W2920016200.grobid-xml"},"referenced_works_count":51,"referenced_works":["https://openalex.org/W74840124","https://openalex.org/W1508960934","https://openalex.org/W1592029221","https://openalex.org/W1964370383","https://openalex.org/W1964664689","https://openalex.org/W1994349244","https://openalex.org/W2005750530","https://openalex.org/W2008706659","https://openalex.org/W2010063424","https://openalex.org/W2015581663","https://openalex.org/W2017981229","https://openalex.org/W2027254180","https://openalex.org/W2036273537","https://openalex.org/W2038643807","https://openalex.org/W2039542802","https://openalex.org/W2041880392","https://openalex.org/W2044230059","https://openalex.org/W2050121615","https://openalex.org/W2057206408","https://openalex.org/W2064381770","https://openalex.org/W2075146713","https://openalex.org/W2088207212","https://openalex.org/W2108159976","https://openalex.org/W2119460517","https://openalex.org/W2124386111","https://openalex.org/W2129201358","https://openalex.org/W2129404737","https://openalex.org/W2148163819","https://openalex.org/W2154425432","https://openalex.org/W2167536595","https://openalex.org/W2167667767","https://openalex.org/W2257660580","https://openalex.org/W2411172580","https://openalex.org/W2503292054","https://openalex.org/W2523858999","https://openalex.org/W2602927467","https://openalex.org/W3020867216","https://openalex.org/W4232908003","https://openalex.org/W4234737492","https://openalex.org/W4297900622","https://openalex.org/W4300639136","https://openalex.org/W4385482704","https://openalex.org/W6603044468","https://openalex.org/W6630486035","https://openalex.org/W6672652082","https://openalex.org/W6721345681","https://openalex.org/W6724616590","https://openalex.org/W6726919327","https://openalex.org/W6814673881","https://openalex.org/W6844570869","https://openalex.org/W6855796137"],"related_works":["https://openalex.org/W897367340","https://openalex.org/W2946859545","https://openalex.org/W2056469872","https://openalex.org/W4252521546","https://openalex.org/W2183753145","https://openalex.org/W1486212407","https://openalex.org/W2055985996","https://openalex.org/W1976712134","https://openalex.org/W2374999813","https://openalex.org/W2374342360"],"abstract_inverted_index":{"The":[0,13,48,97],"paper":[1,80],"presents":[2],"the":[3,32,42,56,62,67,82,116],"automated":[4],"on-line":[5],"system":[6,14,49,91],"for":[7],"wood":[8,27,70,110],"logs":[9,28,65,111],"3D":[10,99],"geometry":[11,101],"scanning.":[12],"consists":[15],"of":[16,55,64,69,85,102,108],"6":[17],"laser":[18],"triangulation":[19],"scanners":[20],"and":[21,41,93,104],"is":[22,118],"able":[23],"to":[24,38,45,60],"scan":[25],"full":[26,88,98],"which":[29],"can":[30],"have":[31],"diameter":[33],"ranging":[34],"from":[35],"250":[36],"mm":[37,40],"500":[39],"length":[43],"up":[44],"4000":[46],"mm.":[47],"was":[50],"developed":[51],"as":[52],"a":[53],"part":[54],"BIOSTRATEG":[57],"project":[58],"aiming":[59],"optimize":[61],"cutting":[63,114],"in":[66,76],"process":[68],"planks":[71],"manufacturing":[72],"by":[73],"intelligent":[74],"positioning":[75],"sawmill":[77],"operation.":[78],"This":[79],"illustrates":[81],"detailed":[83],"description":[84],"scanner":[86],"construction,":[87],"measurement":[89],"process,":[90],"calibration":[92],"data":[94],"processing":[95],"schemes.":[96],"surface":[100],"products":[103],"their":[105],"applied":[106],"portion":[107],"selected":[109],"formed":[112],"after":[113],"out":[115],"cant":[117],"also":[119],"demonstrated.":[120]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}