{"id":"https://openalex.org/W2768975951","doi":"https://doi.org/10.3390/s17122721","title":"A Method for Measurement of Nonlinearity of Laser Interferometer Based on Optical Frequency Tuning","display_name":"A Method for Measurement of Nonlinearity of Laser Interferometer Based on Optical Frequency Tuning","publication_year":2017,"publication_date":"2017-11-24","ids":{"openalex":"https://openalex.org/W2768975951","doi":"https://doi.org/10.3390/s17122721","mag":"2768975951","pmid":"https://pubmed.ncbi.nlm.nih.gov/29186774"},"language":"en","primary_location":{"id":"doi:10.3390/s17122721","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s17122721","pdf_url":"https://www.mdpi.com/1424-8220/17/12/2721/pdf?version=1511604075","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/17/12/2721/pdf?version=1511604075","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108138757","display_name":"Zhenyu Zhu","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]},{"id":"https://openalex.org/I4387154772","display_name":"Changcheng Institute of Metrology & Measurement","ror":"https://ror.org/045yf3k41","country_code":null,"type":"government","lineage":["https://openalex.org/I4387154772"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhenyu Zhu","raw_affiliation_strings":["Changcheng Institute of Metrology & Measurement, Beijing, 100095, China","College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changcheng Institute of Metrology & Measurement, Beijing, 100095, China","institution_ids":["https://openalex.org/I4387154772"]},{"raw_affiliation_string":"College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101929051","display_name":"Xing Fu","orcid":"https://orcid.org/0000-0001-6794-1268"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Fu","raw_affiliation_strings":["College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086799333","display_name":"Dongmei Ren","orcid":null},"institutions":[{"id":"https://openalex.org/I4387154772","display_name":"Changcheng Institute of Metrology & Measurement","ror":"https://ror.org/045yf3k41","country_code":null,"type":"government","lineage":["https://openalex.org/I4387154772"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongmei Ren","raw_affiliation_strings":["Changcheng Institute of Metrology & Measurement, Beijing, 100095, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changcheng Institute of Metrology & Measurement, Beijing, 100095, China","institution_ids":["https://openalex.org/I4387154772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101594184","display_name":"Yu Wan","orcid":"https://orcid.org/0000-0002-8222-7502"},"institutions":[{"id":"https://openalex.org/I4387154772","display_name":"Changcheng Institute of Metrology & Measurement","ror":"https://ror.org/045yf3k41","country_code":null,"type":"government","lineage":["https://openalex.org/I4387154772"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Wan","raw_affiliation_strings":["Changcheng Institute of Metrology & Measurement, Beijing, 100095, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changcheng Institute of Metrology & Measurement, Beijing, 100095, China","institution_ids":["https://openalex.org/I4387154772"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064064496","display_name":"Ji Wang","orcid":"https://orcid.org/0000-0002-4361-8885"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ji Wang","raw_affiliation_strings":["College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5108138757"],"corresponding_institution_ids":["https://openalex.org/I162868743","https://openalex.org/I4387154772"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":0.6103,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.69758234,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"17","issue":"12","first_page":"2721","last_page":"2721"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.9038553237915039},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.7185966968536377},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.7094345092773438},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.6619196534156799},{"id":"https://openalex.org/keywords/repeatability","display_name":"Repeatability","score":0.5748234391212463},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5390417575836182},{"id":"https://openalex.org/keywords/accuracy-and-precision","display_name":"Accuracy and precision","score":0.5085533857345581},{"id":"https://openalex.org/keywords/interferometric-visibility","display_name":"Interferometric visibility","score":0.48233410716056824},{"id":"https://openalex.org/keywords/optical-path-length","display_name":"Optical path length","score":0.47808408737182617},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4745945632457733},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.460102915763855},{"id":"https://openalex.org/keywords/astronomical-interferometer","display_name":"Astronomical interferometer","score":0.4404744505882263},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.43241679668426514},{"id":"https://openalex.org/keywords/intensity-interferometer","display_name":"Intensity interferometer","score":0.43239152431488037},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.14642629027366638},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10400012135505676},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09580355882644653}],"concepts":[{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.9038553237915039},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7185966968536377},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.7094345092773438},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.6619196534156799},{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.5748234391212463},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5390417575836182},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.5085533857345581},{"id":"https://openalex.org/C95418871","wikidata":"https://www.wikidata.org/wiki/Q1666046","display_name":"Interferometric visibility","level":4,"score":0.48233410716056824},{"id":"https://openalex.org/C22783969","wikidata":"https://www.wikidata.org/wiki/Q1475329","display_name":"Optical path length","level":2,"score":0.47808408737182617},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4745945632457733},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.460102915763855},{"id":"https://openalex.org/C23576306","wikidata":"https://www.wikidata.org/wiki/Q17004698","display_name":"Astronomical interferometer","level":3,"score":0.4404744505882263},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.43241679668426514},{"id":"https://openalex.org/C184454961","wikidata":"https://www.wikidata.org/wiki/Q468962","display_name":"Intensity interferometer","level":4,"score":0.43239152431488037},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.14642629027366638},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10400012135505676},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09580355882644653},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s17122721","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s17122721","pdf_url":"https://www.mdpi.com/1424-8220/17/12/2721/pdf?version=1511604075","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:29186774","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/29186774","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:f8fb321d39a84004a042f5cc4f8cf63f","is_oa":true,"landing_page_url":"https://doaj.org/article/f8fb321d39a84004a042f5cc4f8cf63f","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 17, Iss 12, p 2721 (2017)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/17/12/2721/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s17122721","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 17; Issue 12; Pages: 2721","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:5750799","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/5750799","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s17122721","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s17122721","pdf_url":"https://www.mdpi.com/1424-8220/17/12/2721/pdf?version=1511604075","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.44999998807907104,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W2768975951.pdf"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W1828680797","https://openalex.org/W1965834495","https://openalex.org/W1967793991","https://openalex.org/W1977004163","https://openalex.org/W1985188007","https://openalex.org/W1988734170","https://openalex.org/W1989325291","https://openalex.org/W1989890132","https://openalex.org/W1991522545","https://openalex.org/W2000886280","https://openalex.org/W2015901623","https://openalex.org/W2021750527","https://openalex.org/W2029012601","https://openalex.org/W2032918888","https://openalex.org/W2033987233","https://openalex.org/W2040853983","https://openalex.org/W2042693342","https://openalex.org/W2053614027","https://openalex.org/W2056978718","https://openalex.org/W2057855018","https://openalex.org/W2072588726","https://openalex.org/W2075693964","https://openalex.org/W2084384988","https://openalex.org/W2086653916","https://openalex.org/W2745929523"],"related_works":["https://openalex.org/W2004307733","https://openalex.org/W2887954484","https://openalex.org/W2038355113","https://openalex.org/W2124683499","https://openalex.org/W2082847856","https://openalex.org/W1679165700","https://openalex.org/W1986788177","https://openalex.org/W2091190485","https://openalex.org/W2982722339","https://openalex.org/W1273508664"],"abstract_inverted_index":{"A":[0],"method":[1,24,103,154],"for":[2],"measuring":[3],"the":[4,28,38,43,49,55,61,79,82,91,97,116,123,132,143],"nonlinearity":[5,44,80,121,146],"of":[6,22,31,45,81,122,145],"laser":[7,39,62,73,133],"interferometer":[8,46,56,83],"using":[9],"optical":[10,98],"frequency":[11,40,63,134],"tuning":[12,37],"technique":[13],"is":[14,25,75,84,104,148],"presented":[15],"in":[16],"this":[17,23,102,136],"paper.":[18],"The":[19,120],"basic":[20],"principle":[21],"to":[26,57,95,107,158],"make":[27],"fractional":[29,50],"part":[30],"an":[32],"interference":[33],"fringe":[34,51],"change":[35,52],"by":[36,47,54,130],"and":[41,78,109,168],"determining":[42],"comparing":[48],"measured":[53,129],"that":[58,142],"calculated":[59],"from":[60],"change.":[64],"An":[65],"experimental":[66],"interferometric":[67,125],"system":[68],"with":[69,135],"a":[70,112],"wavelength":[71],"tunable":[72],"source":[74],"set":[76],"up":[77],"measured.":[85],"Since":[86],"it":[87],"does":[88],"not":[89],"require":[90],"precise":[92],"displacement":[93,169],"mechanism":[94],"produce":[96],"path":[99],"difference":[100],"change,":[101],"more":[105],"convenient":[106],"use":[108],"may":[110],"achieve":[111],"higher":[113],"accuracy":[114],"than":[115,150],"conventional":[117],"measurement":[118,147,167],"methods.":[119],"arbitrary":[124],"phase":[126],"can":[127,155],"be":[128,156],"changing":[131],"method.":[137],"Experiments":[138],"results":[139],"have":[140],"shown":[141],"repeatability":[144],"less":[149],"0.2":[151],"nm.":[152],"This":[153],"applied":[157],"interferometry-based":[159],"high":[160],"precision":[161],"dimensional":[162],"measurements,":[163],"such":[164],"as":[165],"coordinate":[166],"sensor":[170],"calibration.":[171]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2026-05-22T06:13:13.366637","created_date":"2025-10-10T00:00:00"}