{"id":"https://openalex.org/W2402154575","doi":"https://doi.org/10.3390/s16050742","title":"A Novel Transient Fault Current Sensor Based on the PCB Rogowski Coil for Overhead Transmission Lines","display_name":"A Novel Transient Fault Current Sensor Based on the PCB Rogowski Coil for Overhead Transmission Lines","publication_year":2016,"publication_date":"2016-05-21","ids":{"openalex":"https://openalex.org/W2402154575","doi":"https://doi.org/10.3390/s16050742","mag":"2402154575","pmid":"https://pubmed.ncbi.nlm.nih.gov/27213402"},"language":"en","primary_location":{"id":"doi:10.3390/s16050742","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s16050742","pdf_url":"https://www.mdpi.com/1424-8220/16/5/742/pdf?version=1463825596","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/16/5/742/pdf?version=1463825596","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100613443","display_name":"Yadong Liu","orcid":"https://orcid.org/0000-0002-7921-6757"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yadong Liu","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002391709","display_name":"Xiaolei Xie","orcid":"https://orcid.org/0000-0002-5133-9712"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaolei Xie","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102099218","display_name":"Yue Hu","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Hu","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102854152","display_name":"Yong Qian","orcid":"https://orcid.org/0000-0003-2133-6200"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yong Qian","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111959438","display_name":"Gehao Sheng","orcid":"https://orcid.org/0000-0002-9454-5284"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gehao Sheng","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038426348","display_name":"Xiuchen Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiuchen Jiang","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100613443"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":2.4948,"has_fulltext":true,"cited_by_count":37,"citation_normalized_percentile":{"value":0.898722,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"16","issue":"5","first_page":"742","last_page":"742"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rogowski-coil","display_name":"Rogowski coil","score":0.991219162940979},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.697979748249054},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6574052572250366},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6473328471183777},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.6109631657600403},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5957769155502319},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5893332958221436},{"id":"https://openalex.org/keywords/transmission-line","display_name":"Transmission line","score":0.5846250653266907},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5657544732093811},{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.5262174606323242},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.5135231614112854},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46734482049942017},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.45225149393081665},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.21571871638298035}],"concepts":[{"id":"https://openalex.org/C56057290","wikidata":"https://www.wikidata.org/wiki/Q2117622","display_name":"Rogowski coil","level":3,"score":0.991219162940979},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.697979748249054},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6574052572250366},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6473328471183777},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.6109631657600403},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5957769155502319},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5893332958221436},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.5846250653266907},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5657544732093811},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.5262174606323242},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.5135231614112854},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46734482049942017},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.45225149393081665},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.21571871638298035},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s16050742","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s16050742","pdf_url":"https://www.mdpi.com/1424-8220/16/5/742/pdf?version=1463825596","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:27213402","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/27213402","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:889052c31f834784a4ea600a290eb80d","is_oa":true,"landing_page_url":"https://doaj.org/article/889052c31f834784a4ea600a290eb80d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 16, Iss 5, p 742 (2016)","raw_type":"article"},{"id":"pmh:oai:europepmc.org:3848398","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/4883433","pdf_url":null,"source":{"id":"https://openalex.org/S4306400806","display_name":"Europe PMC (PubMed Central)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1303153112","host_organization_name":"European Bioinformatics Institute","host_organization_lineage":["https://openalex.org/I1303153112"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Text"},{"id":"pmh:oai:mdpi.com:/1424-8220/16/5/742/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s16050742","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 16; Issue 5; Pages: 742","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s16050742","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s16050742","pdf_url":"https://www.mdpi.com/1424-8220/16/5/742/pdf?version=1463825596","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5031524797","display_name":null,"funder_award_id":"51307109","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326707","display_name":"State Grid Corporation of China","ror":"https://ror.org/05twwhs70"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2402154575.pdf","grobid_xml":"https://content.openalex.org/works/W2402154575.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W1639194462","https://openalex.org/W1989445820","https://openalex.org/W1992195780","https://openalex.org/W1998359278","https://openalex.org/W2020039082","https://openalex.org/W2023496182","https://openalex.org/W2048406376","https://openalex.org/W2053452383","https://openalex.org/W2062671272","https://openalex.org/W2063752327","https://openalex.org/W2129890926","https://openalex.org/W2137387517","https://openalex.org/W2187284813","https://openalex.org/W2187829640","https://openalex.org/W2292225241","https://openalex.org/W2296077479","https://openalex.org/W2318080671","https://openalex.org/W2325169970","https://openalex.org/W2331785231","https://openalex.org/W2342598427","https://openalex.org/W2359749417","https://openalex.org/W6686729123","https://openalex.org/W6704756915"],"related_works":["https://openalex.org/W2392046298","https://openalex.org/W2044763680","https://openalex.org/W2356794752","https://openalex.org/W2375132654","https://openalex.org/W2005255172","https://openalex.org/W2389454874","https://openalex.org/W1973001906","https://openalex.org/W2392010306","https://openalex.org/W2376115192","https://openalex.org/W4285539176"],"abstract_inverted_index":{"The":[0,44],"accurate":[1],"detection":[2,17,35],"of":[3,15,36,47,85,100],"high-frequency":[4],"transient":[5,37],"fault":[6,38],"currents":[7,39],"in":[8,40,109,158],"overhead":[9,41,52],"transmission":[10,42,53],"lines":[11],"is":[12,55,64,77,115],"the":[13,34,48,51,58,61,80,86,118],"basis":[14],"malfunction":[16],"and":[18,57,66,82,103,122,143],"diagnosis.":[19],"This":[20],"paper":[21],"proposes":[22],"a":[23,68,97,128,136],"novel":[24],"differential":[25,69,107],"winding":[26,70],"printed":[27,71],"circuit":[28,72],"board":[29,73],"(PCB)":[30,74],"Rogowski":[31,75,138],"coil":[32,76,88,139],"for":[33,60],"lines.":[43],"interference":[45,62],"mechanism":[46],"sensor":[49],"surrounding":[50],"line":[54,84],"analyzed":[56],"guideline":[59],"elimination":[63],"obtained,":[65],"then":[67],"proposed,":[78],"where":[79],"branch":[81],"return":[83],"PCB":[87,137],"were":[89],"designed":[90],"to":[91,145,154],"be":[92,155],"strictly":[93],"symmetrical":[94],"by":[95],"using":[96],"joining":[98],"structure":[99],"two":[101],"semi-rings":[102],"collinear":[104],"twisted":[105],"pair":[106],"windings":[108],"each":[110],"semi-ring.":[111],"A":[112],"serial":[113],"test":[114],"conducted,":[116],"including":[117],"frequency":[119],"response,":[120],"linearity,":[121],"anti-interference":[123],"performance":[124],"as":[125,127],"well":[126],"comparison":[129],"with":[130],"commercial":[131],"sensors.":[132],"Results":[133],"show":[134],"that":[135],"has":[140],"good":[141],"linearity":[142],"resistance":[144],"various":[146],"external":[147],"magnetic":[148],"field":[149],"interferences,":[150],"thus":[151],"enabling":[152],"it":[153],"widely":[156],"applied":[157],"fault-current-collecting":[159],"devices.":[160]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":2}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}