{"id":"https://openalex.org/W2317032106","doi":"https://doi.org/10.3390/s16040513","title":"A High Performance Torque Sensor for Milling Based on a Piezoresistive MEMS Strain Gauge","display_name":"A High Performance Torque Sensor for Milling Based on a Piezoresistive MEMS Strain Gauge","publication_year":2016,"publication_date":"2016-04-09","ids":{"openalex":"https://openalex.org/W2317032106","doi":"https://doi.org/10.3390/s16040513","mag":"2317032106","pmid":"https://pubmed.ncbi.nlm.nih.gov/27070620"},"language":"en","primary_location":{"id":"doi:10.3390/s16040513","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s16040513","pdf_url":"https://www.mdpi.com/1424-8220/16/4/513/pdf?version=1460194079","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/16/4/513/pdf?version=1460194079","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043086744","display_name":"Yafei Qin","orcid":"https://orcid.org/0000-0002-6586-2774"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yafei Qin","raw_affiliation_strings":["The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","The State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101785682","display_name":"Yulong Zhao","orcid":"https://orcid.org/0000-0003-2922-1037"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yulong Zhao","raw_affiliation_strings":["The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","The State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101785682","display_name":"Yulong Zhao","orcid":"https://orcid.org/0000-0003-2922-1037"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yulong Zhao","raw_affiliation_strings":["The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","The State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101492286","display_name":"Yingxue Li","orcid":"https://orcid.org/0000-0002-1709-810X"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingxue Li","raw_affiliation_strings":["The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","The State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101967524","display_name":"You Zhao","orcid":"https://orcid.org/0000-0002-7187-9089"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"You Zhao","raw_affiliation_strings":["The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","The State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, No. 28, Xianning West Road, Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101967524","display_name":"You Zhao","orcid":"https://orcid.org/0000-0002-7187-9089"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"You Zhao","raw_affiliation_strings":["The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100396070","display_name":"Peng Wang","orcid":"https://orcid.org/0000-0002-7828-2189"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Wang","raw_affiliation_strings":["The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The State Key Laboratory for Manufacturing Systems Engineering, Xi\u2019an Jiaotong University, No. 28, Xianning West Road, Xi\u2019an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5101785682","https://openalex.org/A5101967524"],"corresponding_institution_ids":["https://openalex.org/I87445476"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2673},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2673},"fwci":2.0558,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.85000916,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"16","issue":"4","first_page":"513","last_page":"513"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wheatstone-bridge","display_name":"Wheatstone bridge","score":0.8361399173736572},{"id":"https://openalex.org/keywords/strain-gauge","display_name":"Strain gauge","score":0.799386739730835},{"id":"https://openalex.org/keywords/piezoresistive-effect","display_name":"Piezoresistive effect","score":0.7853294610977173},{"id":"https://openalex.org/keywords/torque","display_name":"Torque","score":0.6697009205818176},{"id":"https://openalex.org/keywords/machining","display_name":"Machining","score":0.6667159199714661},{"id":"https://openalex.org/keywords/dynamometer","display_name":"Dynamometer","score":0.5402829647064209},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5370216965675354},{"id":"https://openalex.org/keywords/natural-frequency","display_name":"Natural frequency","score":0.5094571709632874},{"id":"https://openalex.org/keywords/microelectromechanical-systems","display_name":"Microelectromechanical systems","score":0.4826567769050598},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4634304940700531},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4620939791202545},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.4552527666091919},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.40778958797454834},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3890579342842102},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.38460105657577515},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.2536802291870117},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24191904067993164},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.13658025860786438},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13507696986198425},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.11506769061088562},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.09394988417625427}],"concepts":[{"id":"https://openalex.org/C104713690","wikidata":"https://www.wikidata.org/wiki/Q245133","display_name":"Wheatstone bridge","level":4,"score":0.8361399173736572},{"id":"https://openalex.org/C60584519","wikidata":"https://www.wikidata.org/wiki/Q610723","display_name":"Strain gauge","level":2,"score":0.799386739730835},{"id":"https://openalex.org/C198490522","wikidata":"https://www.wikidata.org/wiki/Q1932915","display_name":"Piezoresistive effect","level":2,"score":0.7853294610977173},{"id":"https://openalex.org/C144171764","wikidata":"https://www.wikidata.org/wiki/Q48103","display_name":"Torque","level":2,"score":0.6697009205818176},{"id":"https://openalex.org/C523214423","wikidata":"https://www.wikidata.org/wiki/Q192047","display_name":"Machining","level":2,"score":0.6667159199714661},{"id":"https://openalex.org/C102284421","wikidata":"https://www.wikidata.org/wiki/Q11223329","display_name":"Dynamometer","level":2,"score":0.5402829647064209},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5370216965675354},{"id":"https://openalex.org/C78736273","wikidata":"https://www.wikidata.org/wiki/Q946764","display_name":"Natural frequency","level":3,"score":0.5094571709632874},{"id":"https://openalex.org/C37977207","wikidata":"https://www.wikidata.org/wiki/Q175561","display_name":"Microelectromechanical systems","level":2,"score":0.4826567769050598},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4634304940700531},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4620939791202545},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.4552527666091919},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.40778958797454834},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3890579342842102},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38460105657577515},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.2536802291870117},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24191904067993164},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.13658025860786438},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13507696986198425},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.11506769061088562},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.09394988417625427},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/s16040513","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s16040513","pdf_url":"https://www.mdpi.com/1424-8220/16/4/513/pdf?version=1460194079","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:27070620","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/27070620","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:7d2ed760523f4166bf4a70900e6b7d04","is_oa":true,"landing_page_url":"https://doaj.org/article/7d2ed760523f4166bf4a70900e6b7d04","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 16, Iss 4, p 513 (2016)","raw_type":"article"},{"id":"pmh:oai:mdpi.com:/1424-8220/16/4/513/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s16040513","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 16; Issue 4; Pages: 513","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:4851027","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/4851027","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s16040513","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s16040513","pdf_url":"https://www.mdpi.com/1424-8220/16/4/513/pdf?version=1460194079","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2317032106.pdf"},"referenced_works_count":19,"referenced_works":["https://openalex.org/W1981746084","https://openalex.org/W1991171487","https://openalex.org/W2009642504","https://openalex.org/W2014221868","https://openalex.org/W2025763323","https://openalex.org/W2027922649","https://openalex.org/W2045386669","https://openalex.org/W2045875778","https://openalex.org/W2048128314","https://openalex.org/W2048913425","https://openalex.org/W2049086124","https://openalex.org/W2061484790","https://openalex.org/W2082328063","https://openalex.org/W2098594124","https://openalex.org/W2103728084","https://openalex.org/W2106420830","https://openalex.org/W2109941887","https://openalex.org/W2132090587","https://openalex.org/W6665578658"],"related_works":["https://openalex.org/W2323653612","https://openalex.org/W2278574869","https://openalex.org/W3119258731","https://openalex.org/W2378386980","https://openalex.org/W4205398706","https://openalex.org/W935415627","https://openalex.org/W2010805979","https://openalex.org/W1998975346","https://openalex.org/W2110357888","https://openalex.org/W2122551138"],"abstract_inverted_index":{"In":[0],"high":[1,4,20,34,37,175],"speed":[2,176],"and":[3,36,52,78,91,117,191],"precision":[5],"machining":[6,14,137,177],"applications,":[7],"it":[8,26],"is":[9,27,41,68,109,128,172,189],"important":[10],"to":[11,18,29,43,71,130,153],"monitor":[12],"the":[13,49,73,99,102,106,132,145,162,185,195],"process":[15],"in":[16,121],"order":[17],"ensure":[19],"product":[21],"quality.":[22],"For":[23],"this":[24],"purpose,":[25],"essential":[28],"develop":[30],"a":[31,55,88,92,122],"dynamometer":[32],"with":[33],"sensitivity":[35,77,146],"natural":[38,79,163],"frequency":[39,164],"which":[40,127,171],"suited":[42],"these":[44],"conditions.":[45],"This":[46],"paper":[47],"describes":[48],"design,":[50],"calibration":[51,141],"performance":[53],"of":[54,87,101,147,165],"milling":[56,196],"torque":[57,83,134,148,166,187],"sensor":[58,84,149,167,188],"based":[59],"on":[60,98],"piezoresistive":[61,93],"MEMS":[62,94],"strain.":[63],"A":[64,156],"detailed":[65],"design":[66],"study":[67],"carried":[69],"out":[70],"optimize":[72],"two":[74],"mutually-contradictory":[75],"indicators":[76],"frequency.":[80],"The":[81,111,179],"developed":[82,186],"principally":[85],"consists":[86],"thin-walled":[89],"cylinder,":[90],"strain":[95,108,112],"gauge":[96,113],"bonded":[97],"surface":[100],"sensing":[103],"element":[104],"where":[105],"shear":[107],"maximum.":[110],"includes":[114],"eight":[115],"piezoresistances":[116],"four":[118],"are":[119],"connected":[120],"full":[123],"Wheatstone":[124],"circuit":[125],"bridge,":[126],"used":[129],"measure":[131],"applied":[133],"force":[135],"during":[136],"procedures.":[138],"Experimental":[139],"static":[140],"results":[142,182],"show":[143],"that":[144,161,184],"has":[150],"been":[151],"improved":[152],"0.13":[154],"mv/Nm.":[155],"modal":[157],"impact":[158],"test":[159,181],"indicates":[160],"reaches":[168],"1216":[169],"Hz,":[170],"suitable":[173],"for":[174,193],"processes.":[178],"dynamic":[180],"indicate":[183],"stable":[190],"practical":[192],"monitoring":[194],"process.":[197]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":2}],"updated_date":"2026-07-28T07:46:37.118299","created_date":"2025-10-10T00:00:00"}