{"id":"https://openalex.org/W1985627985","doi":"https://doi.org/10.3390/s130708679","title":"LMD Method and Multi-Class RWSVM of Fault Diagnosis for Rotating Machinery Using Condition Monitoring Information","display_name":"LMD Method and Multi-Class RWSVM of Fault Diagnosis for Rotating Machinery Using Condition Monitoring Information","publication_year":2013,"publication_date":"2013-07-05","ids":{"openalex":"https://openalex.org/W1985627985","doi":"https://doi.org/10.3390/s130708679","mag":"1985627985","pmid":"https://pubmed.ncbi.nlm.nih.gov/23881133"},"language":"en","primary_location":{"id":"doi:10.3390/s130708679","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s130708679","pdf_url":"https://www.mdpi.com/1424-8220/13/7/8679/pdf?version=1403329598","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1424-8220/13/7/8679/pdf?version=1403329598","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100628019","display_name":"Zhiwen Liu","orcid":"https://orcid.org/0000-0002-0743-4237"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiwen Liu","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University,  Xi'an 710049, China","State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University,  Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100779843","display_name":"Xuefeng Chen","orcid":"https://orcid.org/0000-0002-0130-3172"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xuefeng Chen","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University,  Xi'an 710049, China","State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University,  Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103407942","display_name":"Zhengjia He","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengjia He","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University,  Xi'an 710049, China","State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University,  Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110269299","display_name":"Zhongjie Shen","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongjie Shen","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University,  Xi'an 710049, China","State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University,  Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100779843"],"corresponding_institution_ids":["https://openalex.org/I87445476"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2598},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2598},"fwci":4.014,"has_fulltext":true,"cited_by_count":27,"citation_normalized_percentile":{"value":0.93251432,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"13","issue":"7","first_page":"8679","last_page":"8694"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.7006636261940002},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6568048596382141},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.6106030941009521},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5992222428321838},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5326112508773804},{"id":"https://openalex.org/keywords/statistic","display_name":"Statistic","score":0.5293501019477844},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.5098282694816589},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.46319669485092163},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.4452704191207886},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4443695545196533},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.43076157569885254},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.42143043875694275},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4131163954734802},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3634181022644043},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.3228142261505127},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11271688342094421},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09393700957298279},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08744001388549805}],"concepts":[{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.7006636261940002},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6568048596382141},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.6106030941009521},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5992222428321838},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5326112508773804},{"id":"https://openalex.org/C89128539","wikidata":"https://www.wikidata.org/wiki/Q1949963","display_name":"Statistic","level":2,"score":0.5293501019477844},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.5098282694816589},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.46319669485092163},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.4452704191207886},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4443695545196533},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.43076157569885254},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.42143043875694275},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4131163954734802},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3634181022644043},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3228142261505127},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11271688342094421},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09393700957298279},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08744001388549805},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":6,"locations":[{"id":"doi:10.3390/s130708679","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s130708679","pdf_url":"https://www.mdpi.com/1424-8220/13/7/8679/pdf?version=1403329598","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},{"id":"pmid:23881133","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/23881133","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:doaj.org/article:95ccd8e2a7e0445888ae4c1022228fb3","is_oa":true,"landing_page_url":"https://doaj.org/article/95ccd8e2a7e0445888ae4c1022228fb3","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors, Vol 13, Iss 7, Pp 8679-8694 (2013)","raw_type":"article"},{"id":"pmh:oai:europepmc.org:2755145","is_oa":true,"landing_page_url":"http://europepmc.org/articles/PMC3758617","pdf_url":null,"source":{"id":"https://openalex.org/S4306400806","display_name":"Europe PMC (PubMed Central)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1303153112","host_organization_name":"European Bioinformatics Institute","host_organization_lineage":["https://openalex.org/I1303153112"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},{"id":"pmh:oai:mdpi.com:/1424-8220/13/7/8679/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/s130708679","pdf_url":null,"source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors; Volume 13; Issue 7; Pages: 8679-8694","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:3758617","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/3758617","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Sensors (Basel)","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/s130708679","is_oa":true,"landing_page_url":"https://doi.org/10.3390/s130708679","pdf_url":"https://www.mdpi.com/1424-8220/13/7/8679/pdf?version=1403329598","source":{"id":"https://openalex.org/S101949793","display_name":"Sensors","issn_l":"1424-8220","issn":["1424-8220"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3232580847","display_name":null,"funder_award_id":"51175401","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4523724969","display_name":null,"funder_award_id":"20120201110028","funder_id":"https://openalex.org/F4320336024","funder_display_name":"Specialized Research Fund for the Doctoral Program of Higher Education of China"},{"id":"https://openalex.org/G8153091582","display_name":null,"funder_award_id":"20120201110028","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8958344482","display_name":null,"funder_award_id":"51225501","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320336024","display_name":"Specialized Research Fund for the Doctoral Program of Higher Education of China","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1985627985.pdf","grobid_xml":"https://content.openalex.org/works/W1985627985.grobid-xml"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W740415","https://openalex.org/W1502069036","https://openalex.org/W1939376635","https://openalex.org/W1963557245","https://openalex.org/W1969494221","https://openalex.org/W1979770028","https://openalex.org/W1985140457","https://openalex.org/W1986280275","https://openalex.org/W1989006121","https://openalex.org/W1996525967","https://openalex.org/W2000086911","https://openalex.org/W2005934359","https://openalex.org/W2007200746","https://openalex.org/W2007221293","https://openalex.org/W2014158063","https://openalex.org/W2028586143","https://openalex.org/W2031423206","https://openalex.org/W2035165861","https://openalex.org/W2042031583","https://openalex.org/W2042934440","https://openalex.org/W2073758406","https://openalex.org/W2074724805","https://openalex.org/W2080985846","https://openalex.org/W2082233060","https://openalex.org/W2083520984","https://openalex.org/W2109943925","https://openalex.org/W2110270859","https://openalex.org/W2110652811","https://openalex.org/W2128584444","https://openalex.org/W2134502076","https://openalex.org/W2140554090","https://openalex.org/W2142877443","https://openalex.org/W2156909104","https://openalex.org/W2384995325","https://openalex.org/W4230674625","https://openalex.org/W4312960235","https://openalex.org/W6645142513","https://openalex.org/W6678834386","https://openalex.org/W6680903042"],"related_works":["https://openalex.org/W2090763504","https://openalex.org/W2359776416","https://openalex.org/W2382174632","https://openalex.org/W2129959498","https://openalex.org/W2784060934","https://openalex.org/W2353788488","https://openalex.org/W2902714807","https://openalex.org/W148178222","https://openalex.org/W2537489131","https://openalex.org/W1996858460"],"abstract_inverted_index":{"Timely":[0],"and":[1,5,22,38,70,125,127],"accurate":[2],"condition":[3],"monitoring":[4],"fault":[6,84,122],"diagnosis":[7],"of":[8,19,113],"rotating":[9,51,62,103,120],"machinery":[10,52,63,104,121],"are":[11,64,74,79,94],"very":[12],"important":[13],"to":[14,49,81,100],"maintain":[15],"a":[16,28,97],"high":[17],"degree":[18],"availability,":[20],"reliability":[21],"operational":[23],"safety.":[24],"This":[25],"paper":[26],"presents":[27],"novel":[29],"intelligent":[30],"method":[31,69,117],"based":[32,132],"on":[33,133],"local":[34],"mean":[35],"decomposition":[36],"(LMD)":[37],"multi-class":[39,98],"reproducing":[40],"wavelet":[41],"support":[42],"vector":[43],"machines":[44],"(RWSVM),":[45],"which":[46],"is":[47],"applied":[48],"diagnose":[50],"faults.":[53],"First,":[54],"the":[55,61,67,88,102,111,114,134],"sensor-based":[56],"vibration":[57],"signals":[58],"measured":[59],"from":[60,87],"preprocessed":[65],"by":[66],"LMD":[68],"product":[71],"functions":[72],"(PFs)":[73],"produced.":[75],"Second,":[76],"statistic":[77],"features":[78,93],"extracted":[80],"acquire":[82],"more":[83],"characteristic":[85],"information":[86],"sensitive":[89],"PF.":[90],"Finally,":[91],"these":[92],"fed":[95],"into":[96],"RWSVM":[99,116],"identify":[101],"health":[105],"conditions.":[106],"The":[107],"experimental":[108],"results":[109],"validate":[110],"effectiveness":[112],"proposed":[115],"in":[118],"identifying":[119],"patterns":[123],"accurately":[124],"effectively":[126],"its":[128],"superiority":[129],"over":[130],"that":[131],"general":[135],"SVM.":[136]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}