{"id":"https://openalex.org/W4399750254","doi":"https://doi.org/10.3390/rs16122171","title":"Research on Calculation Method of On-Orbit Instrumental Line Shape Function for the Greenhouse Gases Monitoring Instrument on the GaoFen-5B Satellite","display_name":"Research on Calculation Method of On-Orbit Instrumental Line Shape Function for the Greenhouse Gases Monitoring Instrument on the GaoFen-5B Satellite","publication_year":2024,"publication_date":"2024-06-15","ids":{"openalex":"https://openalex.org/W4399750254","doi":"https://doi.org/10.3390/rs16122171"},"language":"en","primary_location":{"id":"doi:10.3390/rs16122171","is_oa":true,"landing_page_url":"https://doi.org/10.3390/rs16122171","pdf_url":"https://www.mdpi.com/2072-4292/16/12/2171/pdf?version=1718439607","source":{"id":"https://openalex.org/S43295729","display_name":"Remote Sensing","issn_l":"2072-4292","issn":["2072-4292"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Remote Sensing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/2072-4292/16/12/2171/pdf?version=1718439607","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077390890","display_name":"Yunfei Han","orcid":"https://orcid.org/0009-0008-7047-4224"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210134251","display_name":"Anhui Institute of Optics and Fine Mechanics","ror":"https://ror.org/03bzbv419","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunfei Han","raw_affiliation_strings":["Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"],"affiliations":[{"raw_affiliation_string":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I4210134251","https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088321136","display_name":"Hailiang Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I4210134251","display_name":"Anhui Institute of Optics and Fine Mechanics","ror":"https://ror.org/03bzbv419","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"]},{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hailiang Shi","raw_affiliation_strings":["Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"],"affiliations":[{"raw_affiliation_string":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I4210134251","https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104102181","display_name":"Haiyan Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210134251","display_name":"Anhui Institute of Optics and Fine Mechanics","ror":"https://ror.org/03bzbv419","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiyan Luo","raw_affiliation_strings":["Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"],"affiliations":[{"raw_affiliation_string":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I4210134251","https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016771969","display_name":"Zhiwei Li","orcid":"https://orcid.org/0000-0001-7505-5899"},"institutions":[{"id":"https://openalex.org/I4210134251","display_name":"Anhui Institute of Optics and Fine Mechanics","ror":"https://ror.org/03bzbv419","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiwei Li","raw_affiliation_strings":["Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"],"affiliations":[{"raw_affiliation_string":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I4210134251","https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006295497","display_name":"Hanhan Ye","orcid":"https://orcid.org/0000-0002-5253-5344"},"institutions":[{"id":"https://openalex.org/I4210134251","display_name":"Anhui Institute of Optics and Fine Mechanics","ror":"https://ror.org/03bzbv419","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hanhan Ye","raw_affiliation_strings":["Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"],"affiliations":[{"raw_affiliation_string":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I4210134251","https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100692539","display_name":"Chao Li","orcid":"https://orcid.org/0000-0001-8852-8448"},"institutions":[{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210134251","display_name":"Anhui Institute of Optics and Fine Mechanics","ror":"https://ror.org/03bzbv419","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"]},{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Li","raw_affiliation_strings":["Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"],"affiliations":[{"raw_affiliation_string":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I4210134251","https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048160571","display_name":"Yi Ding","orcid":"https://orcid.org/0000-0002-8563-7160"},"institutions":[{"id":"https://openalex.org/I4210134251","display_name":"Anhui Institute of Optics and Fine Mechanics","ror":"https://ror.org/03bzbv419","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"]},{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Ding","raw_affiliation_strings":["Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"],"affiliations":[{"raw_affiliation_string":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I4210134251","https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070150715","display_name":"Shichao Wu","orcid":"https://orcid.org/0000-0002-1652-4437"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I4210134251","display_name":"Anhui Institute of Optics and Fine Mechanics","ror":"https://ror.org/03bzbv419","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shichao Wu","raw_affiliation_strings":["Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China"],"affiliations":[{"raw_affiliation_string":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I4210134251","https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100667367","display_name":"Xianhua Wang","orcid":"https://orcid.org/0000-0002-1415-8285"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210134251","display_name":"Anhui Institute of Optics and Fine Mechanics","ror":"https://ror.org/03bzbv419","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianhua Wang","raw_affiliation_strings":["Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"],"affiliations":[{"raw_affiliation_string":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I4210134251","https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101398340","display_name":"Wei Xiong","orcid":"https://orcid.org/0000-0001-8679-6086"},"institutions":[{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210134251","display_name":"Anhui Institute of Optics and Fine Mechanics","ror":"https://ror.org/03bzbv419","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Xiong","raw_affiliation_strings":["Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China"],"affiliations":[{"raw_affiliation_string":"Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I4210134251","https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Key Laboratory of Optical Calibration and Characterization, Chinese Academy of Sciences, Hefei 230031, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I19820366"]},{"raw_affiliation_string":"School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5104165861","display_name":"Chenhui Hou","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chenhui Hou","raw_affiliation_strings":["China Siwei Surveying and Mapping Technology Co., Ltd., Beijing 100086, China"],"affiliations":[{"raw_affiliation_string":"China Siwei Surveying and Mapping Technology Co., Ltd., Beijing 100086, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5088321136"],"corresponding_institution_ids":["https://openalex.org/I126520041","https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210134251"],"apc_list":{"value":2500,"currency":"CHF","value_usd":2707},"apc_paid":{"value":2500,"currency":"CHF","value_usd":2707},"fwci":0.2177,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.47184382,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"16","issue":"12","first_page":"2171","last_page":"2171"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12120","display_name":"Air Quality Monitoring and Forecasting","score":0.8870000243186951,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12120","display_name":"Air Quality Monitoring and Forecasting","score":0.8870000243186951,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14249","display_name":"Water Quality Monitoring and Analysis","score":0.8639000058174133,"subfield":{"id":"https://openalex.org/subfields/2311","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10075","display_name":"Atmospheric chemistry and aerosols","score":0.8222000002861023,"subfield":{"id":"https://openalex.org/subfields/1902","display_name":"Atmospheric Science"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/satellite","display_name":"Satellite","score":0.7330074906349182},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.6160876154899597},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.5913900136947632},{"id":"https://openalex.org/keywords/meteorology","display_name":"Meteorology","score":0.3458503484725952},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.202467679977417},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.15697699785232544},{"id":"https://openalex.org/keywords/astronomy","display_name":"Astronomy","score":0.14271515607833862}],"concepts":[{"id":"https://openalex.org/C19269812","wikidata":"https://www.wikidata.org/wiki/Q26540","display_name":"Satellite","level":2,"score":0.7330074906349182},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.6160876154899597},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.5913900136947632},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.3458503484725952},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.202467679977417},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.15697699785232544},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.14271515607833862}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.3390/rs16122171","is_oa":true,"landing_page_url":"https://doi.org/10.3390/rs16122171","pdf_url":"https://www.mdpi.com/2072-4292/16/12/2171/pdf?version=1718439607","source":{"id":"https://openalex.org/S43295729","display_name":"Remote Sensing","issn_l":"2072-4292","issn":["2072-4292"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Remote Sensing","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:ba5ce669bdea4203a85209df1a5ecb8b","is_oa":true,"landing_page_url":"https://doaj.org/article/ba5ce669bdea4203a85209df1a5ecb8b","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Remote Sensing, Vol 16, Iss 12, p 2171 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.3390/rs16122171","is_oa":true,"landing_page_url":"https://doi.org/10.3390/rs16122171","pdf_url":"https://www.mdpi.com/2072-4292/16/12/2171/pdf?version=1718439607","source":{"id":"https://openalex.org/S43295729","display_name":"Remote Sensing","issn_l":"2072-4292","issn":["2072-4292"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Remote Sensing","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4399750254.pdf"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W1965121024","https://openalex.org/W1967033708","https://openalex.org/W1971051032","https://openalex.org/W1974105424","https://openalex.org/W1976336996","https://openalex.org/W1994405035","https://openalex.org/W1995533832","https://openalex.org/W2000131066","https://openalex.org/W2008184302","https://openalex.org/W2033655941","https://openalex.org/W2033774997","https://openalex.org/W2050553313","https://openalex.org/W2054572075","https://openalex.org/W2071548781","https://openalex.org/W2085765714","https://openalex.org/W2088540031","https://openalex.org/W2106952103","https://openalex.org/W2116516476","https://openalex.org/W2124260922","https://openalex.org/W2149261924","https://openalex.org/W2329981522","https://openalex.org/W2332590014","https://openalex.org/W2333589474","https://openalex.org/W2349248548","https://openalex.org/W2439353607","https://openalex.org/W2465592141","https://openalex.org/W2551322402","https://openalex.org/W2606459961","https://openalex.org/W2759563488","https://openalex.org/W3133980599","https://openalex.org/W3180234195","https://openalex.org/W3198059701","https://openalex.org/W4200599926","https://openalex.org/W4232381487","https://openalex.org/W4312175172","https://openalex.org/W4380879811","https://openalex.org/W6677439481","https://openalex.org/W6705237078","https://openalex.org/W6718280757"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2121524756","https://openalex.org/W782553550","https://openalex.org/W1987967678","https://openalex.org/W2013329914","https://openalex.org/W2392383081","https://openalex.org/W1618102658","https://openalex.org/W4205376403","https://openalex.org/W2331410275","https://openalex.org/W2002340745"],"abstract_inverted_index":{"The":[0,32,180],"Greenhouse":[1],"Gases":[2],"Monitoring":[3],"Instrument":[4],"is":[5,37,142,148,166],"based":[6],"on":[7],"the":[8,18,40,45,48,57,62,68,79,84,99,102,116,121,130,138,144,155,162,173,185,191,196,205,216],"spectroscopic":[9],"principle":[10],"of":[11,20,39,47,61,73,86,101,129,193,220,231],"spatial":[12,75],"heterodyne":[13,76],"spectroscopy":[14],"technology":[15],"and":[16,27,50,82,97,110,157,176,218],"has":[17],"characteristics":[19,100],"no":[21],"moving":[22],"parts,":[23],"a":[24,28,53,74,93,211,221],"hyperspectral":[25],"resolution,":[26],"large":[29],"luminous":[30],"flux.":[31],"instrumental":[33,69,103,131,139,186,198,223],"line":[34,70,104,132,140,187,199,224],"shape":[35,71,105,133,188,200,225],"function":[36,72,134,141,189],"one":[38],"most":[41],"important":[42],"parameters":[43],"characterizing":[44],"features":[46],"instrument,":[49],"it":[51],"plays":[52],"vital":[54],"role":[55],"in":[56,120,195,204,233],"system":[58],"error":[59,135],"analysis":[60],"instrument\u2019s":[63],"measurements.":[64],"To":[65],"accurately":[66],"obtain":[67],"spectrometer":[77],"during":[78],"on-orbit":[80],"period":[81],"improve":[83],"accuracy":[85],"gas":[87],"concentration":[88],"retrieval,":[89],"this":[90],"study":[91,114,209],"develops":[92],"method":[94],"to":[95,125,152,170,202],"model":[96],"characterize":[98],"function,":[106,226],"including":[107],"modulation":[108],"loss":[109],"phase":[111],"error.":[112],"This":[113,208],"employs":[115],"solar":[117,159],"calibration":[118],"spectrum":[119],"1.568\u20131.583":[122],"\u03bcm":[123],"bands":[124],"conduct":[126],"iterative":[127],"calculations":[128],"model.":[136],"After":[137],"updated,":[143],"average":[145,163],"relative":[146,164],"deviation":[147,165],"reduced":[149,167],"from":[150,168],"1.83%":[151],"0.756%":[153],"between":[154,172],"theoretical":[156,177],"measured":[158],"spectra.":[160,179],"Additionally,":[161],"7.049%":[169],"2.106%":[171],"GMI":[174],"nadir":[175,178],"findings":[181],"demonstrate":[182],"that":[183],"updating":[184],"mitigates":[190],"impact":[192],"variations":[194],"spectrometer\u2019s":[197,222],"due":[201],"alterations":[203],"orbital":[206],"environment.":[207],"offers":[210],"dependable":[212],"reference":[213],"for":[214],"both":[215],"enhancement":[217],"oversight":[219],"along":[227],"with":[228],"an":[229],"investigation":[230],"shifts":[232],"instrument":[234],"parameters.":[235]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}