{"id":"https://openalex.org/W4411186348","doi":"https://doi.org/10.3390/jimaging11060190","title":"Insulator Surface Defect Detection Method Based on Graph Feature Diffusion Distillation","display_name":"Insulator Surface Defect Detection Method Based on Graph Feature Diffusion Distillation","publication_year":2025,"publication_date":"2025-06-10","ids":{"openalex":"https://openalex.org/W4411186348","doi":"https://doi.org/10.3390/jimaging11060190","pmid":"https://pubmed.ncbi.nlm.nih.gov/40558789"},"language":"en","primary_location":{"id":"doi:10.3390/jimaging11060190","is_oa":true,"landing_page_url":"https://doi.org/10.3390/jimaging11060190","pdf_url":"https://www.mdpi.com/2313-433X/11/6/190/pdf?version=1749544042","source":{"id":"https://openalex.org/S2736465063","display_name":"Journal of Imaging","issn_l":"2313-433X","issn":["2313-433X"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/2313-433X/11/6/190/pdf?version=1749544042","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103629914","display_name":"Shucai Li","orcid":null},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shucai Li","raw_affiliation_strings":["State Grid Shanxi Electric Power Company Lvliang Power Supply Company, Lvliang 033000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Shanxi Electric Power Company Lvliang Power Supply Company, Lvliang 033000, China","institution_ids":["https://openalex.org/I17442442"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058155913","display_name":"Zhang Na","orcid":"https://orcid.org/0000-0002-5893-1946"},"institutions":[{"id":"https://openalex.org/I4392738159","display_name":"State Grid Shanxi Electric Power Company Electric Power Research Institute","ror":"https://ror.org/05vs9t239","country_code":null,"type":"facility","lineage":["https://openalex.org/I4392738159"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Na Zhang","raw_affiliation_strings":["State Grid Shanxi Electric Power Company Electric Power Research Institute, Taiyuan 030001, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Shanxi Electric Power Company Electric Power Research Institute, Taiyuan 030001, China","institution_ids":["https://openalex.org/I4392738159"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106603456","display_name":"Gang Yang","orcid":"https://orcid.org/0000-0003-0774-0418"},"institutions":[{"id":"https://openalex.org/I4392738159","display_name":"State Grid Shanxi Electric Power Company Electric Power Research Institute","ror":"https://ror.org/05vs9t239","country_code":null,"type":"facility","lineage":["https://openalex.org/I4392738159"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Gang Yang","raw_affiliation_strings":["State Grid Shanxi Electric Power Company Electric Power Research Institute, Taiyuan 030001, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Shanxi Electric Power Company Electric Power Research Institute, Taiyuan 030001, China","institution_ids":["https://openalex.org/I4392738159"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yannong Hou","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yannong Hou","raw_affiliation_strings":["State Grid Shanxi Electric Power Company Ultra High Voltage Substation Branch, Taiyuan 030021, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Shanxi Electric Power Company Ultra High Voltage Substation Branch, Taiyuan 030021, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102773325","display_name":"Xingzhong Zhang","orcid":"https://orcid.org/0000-0001-5657-3252"},"institutions":[{"id":"https://openalex.org/I9086337","display_name":"Taiyuan University of Technology","ror":"https://ror.org/03kv08d37","country_code":"CN","type":"education","lineage":["https://openalex.org/I9086337"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingzhong Zhang","raw_affiliation_strings":["School of Software, Taiyuan University of Technology, Taiyuan 030001, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Software, Taiyuan University of Technology, Taiyuan 030001, China","institution_ids":["https://openalex.org/I9086337"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5106603456"],"corresponding_institution_ids":["https://openalex.org/I4392738159"],"apc_list":{"value":1600,"currency":"CHF","value_usd":1782},"apc_paid":{"value":1600,"currency":"CHF","value_usd":1782},"fwci":0.6028,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.68663551,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"11","issue":"6","first_page":"190","last_page":"190"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9804999828338623,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9613000154495239,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7206190824508667},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5661672949790955},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.5426455140113831},{"id":"https://openalex.org/keywords/distillation","display_name":"Distillation","score":0.5204730033874512},{"id":"https://openalex.org/keywords/insulator","display_name":"Insulator (electricity)","score":0.5129520297050476},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.45243293046951294},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4368559420108795},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2854674756526947},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2289121150970459},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.2028358280658722},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.14240232110023499},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.10904210805892944}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7206190824508667},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5661672949790955},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.5426455140113831},{"id":"https://openalex.org/C204030448","wikidata":"https://www.wikidata.org/wiki/Q101017","display_name":"Distillation","level":2,"score":0.5204730033874512},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.5129520297050476},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45243293046951294},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4368559420108795},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2854674756526947},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2289121150970459},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.2028358280658722},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.14240232110023499},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.10904210805892944},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.3390/jimaging11060190","is_oa":true,"landing_page_url":"https://doi.org/10.3390/jimaging11060190","pdf_url":"https://www.mdpi.com/2313-433X/11/6/190/pdf?version=1749544042","source":{"id":"https://openalex.org/S2736465063","display_name":"Journal of Imaging","issn_l":"2313-433X","issn":["2313-433X"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Imaging","raw_type":"journal-article"},{"id":"pmid:40558789","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/40558789","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of imaging","raw_type":null},{"id":"pmh:oai:doaj.org/article:e421c5f880b24905b97f8f872ce1b937","is_oa":true,"landing_page_url":"https://doaj.org/article/e421c5f880b24905b97f8f872ce1b937","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Imaging, Vol 11, Iss 6, p 190 (2025)","raw_type":"article"},{"id":"pmh:oai:pubmedcentral.nih.gov:12193816","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/12193816","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"J Imaging","raw_type":"Text"}],"best_oa_location":{"id":"doi:10.3390/jimaging11060190","is_oa":true,"landing_page_url":"https://doi.org/10.3390/jimaging11060190","pdf_url":"https://www.mdpi.com/2313-433X/11/6/190/pdf?version=1749544042","source":{"id":"https://openalex.org/S2736465063","display_name":"Journal of Imaging","issn_l":"2313-433X","issn":["2313-433X"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Imaging","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320335967","display_name":"Science and Technology Project of State Grid","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4411186348.pdf","grobid_xml":"https://content.openalex.org/works/W4411186348.grobid-xml"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W2026498605","https://openalex.org/W2187089797","https://openalex.org/W2599354622","https://openalex.org/W2618530766","https://openalex.org/W2809705434","https://openalex.org/W2948982773","https://openalex.org/W2963420686","https://openalex.org/W3016774250","https://openalex.org/W3034986516","https://openalex.org/W3101017490","https://openalex.org/W3147184966","https://openalex.org/W3169077988","https://openalex.org/W3169651898","https://openalex.org/W3208797540","https://openalex.org/W4221139436","https://openalex.org/W4221140561","https://openalex.org/W4281643792","https://openalex.org/W4281711400","https://openalex.org/W4283331368","https://openalex.org/W4285147180","https://openalex.org/W4293519058","https://openalex.org/W4375861276","https://openalex.org/W4385370866","https://openalex.org/W4386075837","https://openalex.org/W4393048857","https://openalex.org/W4394938927","https://openalex.org/W4396666813","https://openalex.org/W4399788529","https://openalex.org/W4402832433","https://openalex.org/W4406561591","https://openalex.org/W4408824249","https://openalex.org/W6838461383","https://openalex.org/W6864726490"],"related_works":["https://openalex.org/W3026162553","https://openalex.org/W2544488502","https://openalex.org/W2344382886","https://openalex.org/W2581053080","https://openalex.org/W19111321","https://openalex.org/W2412887479","https://openalex.org/W32245304","https://openalex.org/W2953684491","https://openalex.org/W4285338581","https://openalex.org/W2768175398"],"abstract_inverted_index":{"Aiming":[0],"at":[1],"the":[2,10,55,70,79,86,104,121],"difficulties":[3],"of":[4,6,12,145],"scarcity":[5],"defect":[7,26,148],"samples":[8],"on":[9,30],"surface":[11,147],"power":[13],"insulators,":[14],"irregular":[15],"morphology":[16],"and":[17,85,97,113,129,149],"insufficient":[18],"pixel-level":[19],"localization":[20],"accuracy,":[21],"this":[22],"paper":[23],"proposes":[24],"a":[25,45,139],"detection":[27],"method":[28,137],"based":[29],"graph":[31,50],"feature":[32,38,51,57,82],"diffusion":[33,71],"distillation":[34,72],"named":[35],"GFDD.":[36],"The":[37,136],"bias":[39],"problem":[40],"is":[41,60,74,91,117],"alleviated":[42],"by":[43,93],"constructing":[44],"dual-division":[46],"teachers":[47],"architecture":[48],"with":[49],"consistency":[52],"constraints,":[53],"while":[54],"cross-layer":[56],"fusion":[58],"module":[59],"utilized":[61],"to":[62,67,76],"dynamically":[63],"aggregate":[64],"multi-scale":[65],"information":[66],"reduce":[68],"redundancy;":[69],"mechanism":[73],"designed":[75],"break":[77],"through":[78,100],"traditional":[80],"single-layer":[81],"transfer":[83],"limitation,":[84],"global":[87],"context":[88],"modeling":[89],"capability":[90],"enhanced":[92],"fusing":[94],"deep":[95],"semantics":[96],"shallow":[98],"details":[99],"channel":[101],"attention.":[102],"In":[103],"self-built":[105],"dataset,":[106],"GFDD":[107],"achieves":[108],"96.6%":[109],"Pi.AUROC,":[110],"97.7%":[111],"Im.AUROC":[112],"95.1%":[114],"F1-score,":[115],"which":[116],"2.4-3.2%":[118],"higher":[119],"than":[120],"existing":[122],"optimal":[123],"methods;":[124],"it":[125],"maintains":[126],"excellent":[127],"generalization":[128],"robustness":[130],"in":[131],"multiple":[132],"public":[133],"dataset":[134],"tests.":[135],"provides":[138],"high-precision":[140],"solution":[141],"for":[142],"automated":[143],"inspection":[144],"insulator":[146],"has":[150],"certain":[151],"engineering":[152],"value.":[153]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}