{"id":"https://openalex.org/W2790140344","doi":"https://doi.org/10.3390/e20030164","title":"Uncertainty Evaluation in Multistage Assembly Process Based on Enhanced OOPN","display_name":"Uncertainty Evaluation in Multistage Assembly Process Based on Enhanced OOPN","publication_year":2018,"publication_date":"2018-03-04","ids":{"openalex":"https://openalex.org/W2790140344","doi":"https://doi.org/10.3390/e20030164","mag":"2790140344","pmid":"https://pubmed.ncbi.nlm.nih.gov/33265255"},"language":"en","primary_location":{"id":"doi:10.3390/e20030164","is_oa":true,"landing_page_url":"https://doi.org/10.3390/e20030164","pdf_url":"https://www.mdpi.com/1099-4300/20/3/164/pdf?version=1520506661","source":{"id":"https://openalex.org/S195231649","display_name":"Entropy","issn_l":"1099-4300","issn":["1099-4300"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Entropy","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj","pubmed"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/1099-4300/20/3/164/pdf?version=1520506661","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069592688","display_name":"Yubing Huang","orcid":"https://orcid.org/0000-0002-5879-4785"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yubing Huang","raw_affiliation_strings":["School of Reliability and System Engineering, Beihang University, Beijing 100000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and System Engineering, Beihang University, Beijing 100000, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081209439","display_name":"Wei Dai","orcid":"https://orcid.org/0000-0002-7376-6977"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei Dai","raw_affiliation_strings":["School of Reliability and System Engineering, Beihang University, Beijing 100000, China"],"raw_orcid":"https://orcid.org/0000-0002-7376-6977","affiliations":[{"raw_affiliation_string":"School of Reliability and System Engineering, Beihang University, Beijing 100000, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017125967","display_name":"Weiping Mou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120442","display_name":"AVIC Optronics (China)","ror":"https://ror.org/0338ntq56","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210120442"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiping Mou","raw_affiliation_strings":["Quality Department, Luoyang Optoelectro Technology Development Center, Luoyang 471000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Quality Department, Luoyang Optoelectro Technology Development Center, Luoyang 471000, China","institution_ids":["https://openalex.org/I4210120442"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028345316","display_name":"Yu Zhao","orcid":"https://orcid.org/0000-0003-4198-6251"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Zhao","raw_affiliation_strings":["School of Reliability and System Engineering, Beihang University, Beijing 100000, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and System Engineering, Beihang University, Beijing 100000, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5081209439"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":2000,"currency":"CHF","value_usd":2227},"apc_paid":{"value":2000,"currency":"CHF","value_usd":2227},"fwci":0.429,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.70216398,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"20","issue":"3","first_page":"164","last_page":"164"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11729","display_name":"Product Development and Customization","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6252577900886536},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6031813025474548},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.5673774480819702},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.542209267616272},{"id":"https://openalex.org/keywords/entropy","display_name":"Entropy (arrow of time)","score":0.5299913287162781},{"id":"https://openalex.org/keywords/work-in-process","display_name":"Work in process","score":0.46483632922172546},{"id":"https://openalex.org/keywords/petri-net","display_name":"Petri net","score":0.4432182013988495},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36621978878974915},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.31509578227996826},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2544988691806793},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18919962644577026},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1387532353401184},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10511207580566406}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6252577900886536},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6031813025474548},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.5673774480819702},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.542209267616272},{"id":"https://openalex.org/C106301342","wikidata":"https://www.wikidata.org/wiki/Q4117933","display_name":"Entropy (arrow of time)","level":2,"score":0.5299913287162781},{"id":"https://openalex.org/C174998907","wikidata":"https://www.wikidata.org/wiki/Q357662","display_name":"Work in process","level":2,"score":0.46483632922172546},{"id":"https://openalex.org/C38677869","wikidata":"https://www.wikidata.org/wiki/Q724168","display_name":"Petri net","level":2,"score":0.4432182013988495},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36621978878974915},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.31509578227996826},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2544988691806793},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18919962644577026},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1387532353401184},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10511207580566406},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.3390/e20030164","is_oa":true,"landing_page_url":"https://doi.org/10.3390/e20030164","pdf_url":"https://www.mdpi.com/1099-4300/20/3/164/pdf?version=1520506661","source":{"id":"https://openalex.org/S195231649","display_name":"Entropy","issn_l":"1099-4300","issn":["1099-4300"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Entropy","raw_type":"journal-article"},{"id":"pmid:33265255","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/33265255","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Entropy (Basel, Switzerland)","raw_type":null},{"id":"pmh:oai:mdpi.com:/1099-4300/20/3/164/","is_oa":true,"landing_page_url":"https://dx.doi.org/10.3390/e20030164","pdf_url":"https://dx.doi.org/10.3390/e20030164","source":{"id":"https://openalex.org/S4306400947","display_name":"MDPI (MDPI AG)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097602","host_organization_name":"Multidisciplinary Digital Publishing Institute (Switzerland)","host_organization_lineage":["https://openalex.org/I4210097602"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Entropy; Volume 20; Issue 3; Pages: 164","raw_type":"Text"},{"id":"pmh:oai:pubmedcentral.nih.gov:7512679","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7512679","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Entropy (Basel)","raw_type":"Text"},{"id":"pmh:oai:doaj.org/article:a63390e2a7984825bcdcec69b1f313b6","is_oa":true,"landing_page_url":"https://doaj.org/article/a63390e2a7984825bcdcec69b1f313b6","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Entropy, Vol 20, Iss 3, p 164 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.3390/e20030164","is_oa":true,"landing_page_url":"https://doi.org/10.3390/e20030164","pdf_url":"https://www.mdpi.com/1099-4300/20/3/164/pdf?version=1520506661","source":{"id":"https://openalex.org/S195231649","display_name":"Entropy","issn_l":"1099-4300","issn":["1099-4300"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Entropy","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320323970","display_name":"Ministry of Industry and Information Technology of the People's Republic of China","ror":"https://ror.org/0385nmy68"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2790140344.pdf","grobid_xml":"https://content.openalex.org/works/W2790140344.grobid-xml"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W1500822559","https://openalex.org/W1902293252","https://openalex.org/W1983190950","https://openalex.org/W1986987267","https://openalex.org/W1996294890","https://openalex.org/W2002896504","https://openalex.org/W2021663150","https://openalex.org/W2031502991","https://openalex.org/W2050249319","https://openalex.org/W2062973846","https://openalex.org/W2118654828","https://openalex.org/W2127861000","https://openalex.org/W2130663563","https://openalex.org/W2262578874","https://openalex.org/W2346095864","https://openalex.org/W2351898642","https://openalex.org/W2386486073","https://openalex.org/W2406109771","https://openalex.org/W2479993875","https://openalex.org/W2611966095","https://openalex.org/W2620766383","https://openalex.org/W2624411180","https://openalex.org/W2761157760","https://openalex.org/W3037256966","https://openalex.org/W3102420213","https://openalex.org/W6685629678","https://openalex.org/W7005313089"],"related_works":["https://openalex.org/W1551257573","https://openalex.org/W4230983483","https://openalex.org/W1980200158","https://openalex.org/W2132799268","https://openalex.org/W2154794415","https://openalex.org/W2379651310","https://openalex.org/W2113019827","https://openalex.org/W1541249122","https://openalex.org/W2413828414","https://openalex.org/W2367222340"],"abstract_inverted_index":{"This":[0],"study":[1],"investigated":[2],"the":[3,6,11,19,29,43,47,76,79,83,92,95,104,115,124,136,140,145,148,152,166,169,176,180,183,186,190,193,197,209],"uncertainty":[4,37,77,87,105,146,184],"of":[5,13,16,49,68,78,94,106,110,168,182,185,192,199,211],"multistage":[7],"assembly":[8,21,44,84,153,170,177,187,194,203],"process":[9,45,126,154,178,204],"from":[10],"viewpoint":[12],"a":[14,61,107,158,200],"stream":[15],"defects":[17],"in":[18,70,81,151],"product":[20,202],"process.":[22,35,85,117,138,171,195],"The":[23,66,86,118],"vulnerable":[24,149],"spots":[25,150],"were":[26,31,155],"analyzed":[27,175,206],"and":[28,157,189],"fluctuations":[30],"controlled":[32],"during":[33],"this":[34,173,212],"An":[36],"evaluation":[38],"model":[39,80,120],"was":[40,72,88,162,205],"developed":[41],"for":[42],"on":[46,179],"basis":[48,181],"an":[50],"object-oriented":[51],"Petri":[52],"net":[53],"(OOPN)":[54],"by":[55],"replacing":[56],"its":[57,128],"transition":[58],"function":[59],"with":[60,144],"fitted":[62],"defect":[63],"changing":[64],"function.":[65],"definition":[67],"entropy":[69,93],"physics":[71],"applied":[73],"to":[74,102,123,135,164,207],"characterize":[75],"evaluating":[82],"then":[89],"measured":[90],"as":[91,112,114],"semi-Markov":[96],"chain,":[97],"which":[98],"could":[99,121],"be":[100,132],"used":[101],"calculate":[103],"specific":[108],"subset":[109],"places,":[111],"well":[113],"entire":[116],"OOPN":[119],"correspond":[122],"Markov":[125,137],"because":[127],"reachable":[129],"token":[130],"can":[131],"directly":[133],"mapped":[134],"Using":[139],"steady-state":[141],"probability":[142],"combined":[143],"evaluation,":[147],"identified":[156],"scanning":[159],"test":[160,208],"program":[161],"proposed":[163],"improve":[165],"quality":[167],"Finally,":[172,196],"work":[174],"structure":[188],"variables":[191],"case":[198],"certain":[201],"advantages":[210],"method.":[213]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-08-11T07:18:39.950985","created_date":"2025-10-10T00:00:00"}