{"id":"https://openalex.org/W4381891583","doi":"https://doi.org/10.3233/jifs-223773","title":"Development of a real-time Printed Circuit board (PCB) visual inspection system using You Only Look Once (YOLO) and fuzzy logic algorithms","display_name":"Development of a real-time Printed Circuit board (PCB) visual inspection system using You Only Look Once (YOLO) and fuzzy logic algorithms","publication_year":2023,"publication_date":"2023-06-24","ids":{"openalex":"https://openalex.org/W4381891583","doi":"https://doi.org/10.3233/jifs-223773"},"language":"en","primary_location":{"id":"doi:10.3233/jifs-223773","is_oa":false,"landing_page_url":"https://doi.org/10.3233/jifs-223773","pdf_url":null,"source":{"id":"https://openalex.org/S179157397","display_name":"Journal of Intelligent & Fuzzy Systems","issn_l":"1064-1246","issn":["1064-1246","1875-8967"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318577","host_organization_name":"IOS Press","host_organization_lineage":["https://openalex.org/P4310318577"],"host_organization_lineage_names":["IOS Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent & Fuzzy Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065341799","display_name":"Xiaoyan Huo","orcid":"https://orcid.org/0000-0002-1632-6027"},"institutions":[{"id":"https://openalex.org/I4210110925","display_name":"Jiaozuo University","ror":"https://ror.org/024nbxn35","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210110925"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaoyan Huo","raw_affiliation_strings":["Information Construction and Management Center, Jiaozuo University, Jiaozuo, Henan, China"],"affiliations":[{"raw_affiliation_string":"Information Construction and Management Center, Jiaozuo University, Jiaozuo, Henan, China","institution_ids":["https://openalex.org/I4210110925"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5065341799"],"corresponding_institution_ids":["https://openalex.org/I4210110925"],"apc_list":null,"apc_paid":null,"fwci":1.2447,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.82027091,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"45","issue":"3","first_page":"4139","last_page":"4145"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.8120619058609009},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.7998327016830444},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.720333456993103},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6716094017028809},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6544113159179688},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.5916227698326111},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.5872446894645691},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.55134516954422},{"id":"https://openalex.org/keywords/electronic-component","display_name":"Electronic component","score":0.5185883045196533},{"id":"https://openalex.org/keywords/object-detection","display_name":"Object detection","score":0.48243388533592224},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.452495276927948},{"id":"https://openalex.org/keywords/fuzzy-logic","display_name":"Fuzzy logic","score":0.44803285598754883},{"id":"https://openalex.org/keywords/inspection-time","display_name":"Inspection time","score":0.44142022728919983},{"id":"https://openalex.org/keywords/smt-placement-equipment","display_name":"SMT placement equipment","score":0.4386243522167206},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.4299255311489105},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.37060195207595825},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.33289679884910583},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21078726649284363},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.19687265157699585}],"concepts":[{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.8120619058609009},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.7998327016830444},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.720333456993103},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6716094017028809},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6544113159179688},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.5916227698326111},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5872446894645691},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.55134516954422},{"id":"https://openalex.org/C81060104","wikidata":"https://www.wikidata.org/wiki/Q11653","display_name":"Electronic component","level":2,"score":0.5185883045196533},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.48243388533592224},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.452495276927948},{"id":"https://openalex.org/C58166","wikidata":"https://www.wikidata.org/wiki/Q224821","display_name":"Fuzzy logic","level":2,"score":0.44803285598754883},{"id":"https://openalex.org/C2780407802","wikidata":"https://www.wikidata.org/wiki/Q6146499","display_name":"Inspection time","level":2,"score":0.44142022728919983},{"id":"https://openalex.org/C17511633","wikidata":"https://www.wikidata.org/wiki/Q830694","display_name":"SMT placement equipment","level":3,"score":0.4386243522167206},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.4299255311489105},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.37060195207595825},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.33289679884910583},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21078726649284363},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.19687265157699585},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C90509273","wikidata":"https://www.wikidata.org/wiki/Q11012","display_name":"Robot","level":2,"score":0.0},{"id":"https://openalex.org/C138496976","wikidata":"https://www.wikidata.org/wiki/Q175002","display_name":"Developmental psychology","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3233/jifs-223773","is_oa":false,"landing_page_url":"https://doi.org/10.3233/jifs-223773","pdf_url":null,"source":{"id":"https://openalex.org/S179157397","display_name":"Journal of Intelligent & Fuzzy Systems","issn_l":"1064-1246","issn":["1064-1246","1875-8967"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318577","host_organization_name":"IOS Press","host_organization_lineage":["https://openalex.org/P4310318577"],"host_organization_lineage_names":["IOS Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent & Fuzzy Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W330808840","https://openalex.org/W1974597681","https://openalex.org/W2155589286","https://openalex.org/W2546370358","https://openalex.org/W2790166772","https://openalex.org/W3012159060","https://openalex.org/W3034713821","https://openalex.org/W3117946660","https://openalex.org/W3163646131","https://openalex.org/W3183414894","https://openalex.org/W3197711390","https://openalex.org/W3203234901","https://openalex.org/W4283797503","https://openalex.org/W4309463289","https://openalex.org/W6611441826","https://openalex.org/W6800688434","https://openalex.org/W6846980600"],"related_works":["https://openalex.org/W1979172994","https://openalex.org/W571879","https://openalex.org/W1560398276","https://openalex.org/W2120694107","https://openalex.org/W2474903254","https://openalex.org/W1995357856","https://openalex.org/W1643470837","https://openalex.org/W188655508","https://openalex.org/W2043284758","https://openalex.org/W2164520892"],"abstract_inverted_index":{"Automated":[0],"visual":[1,126],"inspection":[2,25,127],"on":[3,96,118,214],"PCB":[4,24,46,97,119,215],"boards":[5],"is":[6,16,47,73,81,104,129,157,167],"a":[7,124,198],"critical":[8],"process":[9,31],"in":[10,22,66,84,107],"electronic":[11],"industries.":[12],"Misalignment":[13],"component":[14,94,116,133,212],"detection":[15,95,117,213],"one":[17],"of":[18,45,70,139,150,159,210],"the":[19,23,29,90,112,148,187,193,204,208],"challenging":[20],"tasks":[21],"process.":[26],"Defects":[27],"during":[28],"production":[30],"might":[32],"include":[33],"missing":[34,93,115,211],"and":[35,141,152,161,175],"misaligned":[36],"components":[37,184,189],"as":[38,40],"well":[39],"poor":[41],"solder":[42],"connections.":[43],"Inspection":[44],"therefore":[48],"required":[49,106],"to":[50,62,74,88,110,169,192],"create":[51],"practically":[52],"defect-free":[53],"products.":[54],"There":[55],"are":[56,190],"various":[57],"methods":[58],"have":[59],"been":[60],"developed":[61,130],"perform":[63,89,111],"this":[64,71,122],"task":[65],"literature.":[67],"The":[68,135,144,154],"significance":[69],"research":[72],"propose":[75],"an":[76,100],"efficient":[77],"with":[78],"low-cost":[79,102],"system":[80,103,128,137,206],"still":[82,105],"require":[83],"small":[85],"scale":[86],"manufacturing":[87,109],"misalignment":[91,113,132],"or":[92,114],"boards.":[98,120,216],"However,":[99],"efficient,":[101],"small-scale":[108],"In":[121,163],"study,":[123],"real-time":[125],"for":[131,183],"detection.":[134,185],"proposed":[136,205],"consists":[138],"hardware":[140,145],"software":[142,155],"frameworks.":[143],"framework":[146,156],"involves":[147],"setup":[149],"devices":[151],"modules.":[153],"composed":[158],"pre-processing":[160],"post-processing.":[162],"pre-processing,":[164],"image":[165],"enhancement":[166],"applied":[168],"remove":[170],"noises":[171],"from":[172],"captured":[173],"images":[174],"You":[176],"Only":[177],"Look":[178],"Once":[179],"(YOLO)":[180],"object":[181],"detector":[182],"Subsequently,":[186],"detected":[188],"compared":[191],"corresponding":[194],"defined":[195],"pattern":[196],"using":[197],"template-matching":[199],"algorithm.":[200],"As":[201],"experimental":[202],"shown,":[203],"satisfies":[207],"requirement":[209]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}