{"id":"https://openalex.org/W4309216594","doi":"https://doi.org/10.3233/jifs-223093","title":"BOSF-SVM: A thermal image-based fault diagnosis method of circuit boards","display_name":"BOSF-SVM: A thermal image-based fault diagnosis method of circuit boards","publication_year":2022,"publication_date":"2022-11-15","ids":{"openalex":"https://openalex.org/W4309216594","doi":"https://doi.org/10.3233/jifs-223093"},"language":"en","primary_location":{"id":"doi:10.3233/jifs-223093","is_oa":false,"landing_page_url":"https://doi.org/10.3233/jifs-223093","pdf_url":null,"source":{"id":"https://openalex.org/S179157397","display_name":"Journal of Intelligent & Fuzzy Systems","issn_l":"1064-1246","issn":["1064-1246","1875-8967"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318577","host_organization_name":"IOS Press","host_organization_lineage":["https://openalex.org/P4310318577"],"host_organization_lineage_names":["IOS Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent & Fuzzy Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101883986","display_name":"Xudong Song","orcid":"https://orcid.org/0000-0002-4989-9091"},"institutions":[{"id":"https://openalex.org/I7350606","display_name":"Dalian Jiaotong University","ror":"https://ror.org/05gp45n31","country_code":"CN","type":"education","lineage":["https://openalex.org/I7350606"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xudong Song","raw_affiliation_strings":["School of Computer and Communication Engineering, Dalian Jiaotong University, Dalian, Liaoning, China"],"affiliations":[{"raw_affiliation_string":"School of Computer and Communication Engineering, Dalian Jiaotong University, Dalian, Liaoning, China","institution_ids":["https://openalex.org/I7350606"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065816618","display_name":"Xiaohui Wan","orcid":"https://orcid.org/0000-0001-7145-6097"},"institutions":[{"id":"https://openalex.org/I7350606","display_name":"Dalian Jiaotong University","ror":"https://ror.org/05gp45n31","country_code":"CN","type":"education","lineage":["https://openalex.org/I7350606"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaohui Wan","raw_affiliation_strings":["Software Institute, Dalian Jiaotong University, Dalian, Liaoning, China"],"affiliations":[{"raw_affiliation_string":"Software Institute, Dalian Jiaotong University, Dalian, Liaoning, China","institution_ids":["https://openalex.org/I7350606"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045664560","display_name":"Weiguo Yi","orcid":"https://orcid.org/0000-0003-1647-7041"},"institutions":[{"id":"https://openalex.org/I7350606","display_name":"Dalian Jiaotong University","ror":"https://ror.org/05gp45n31","country_code":"CN","type":"education","lineage":["https://openalex.org/I7350606"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiguo Yi","raw_affiliation_strings":["School of Computer and Communication Engineering, Dalian Jiaotong University, Dalian, Liaoning, China"],"affiliations":[{"raw_affiliation_string":"School of Computer and Communication Engineering, Dalian Jiaotong University, Dalian, Liaoning, China","institution_ids":["https://openalex.org/I7350606"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079834112","display_name":"Yunxian Cui","orcid":"https://orcid.org/0000-0002-9066-5000"},"institutions":[{"id":"https://openalex.org/I7350606","display_name":"Dalian Jiaotong University","ror":"https://ror.org/05gp45n31","country_code":"CN","type":"education","lineage":["https://openalex.org/I7350606"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunxian Cui","raw_affiliation_strings":["School of Mechanical Engineering, Dalian Jiaotong University, Dalian, Liaoning, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Dalian Jiaotong University, Dalian, Liaoning, China","institution_ids":["https://openalex.org/I7350606"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069875119","display_name":"Changxian Li","orcid":"https://orcid.org/0000-0002-2291-604X"},"institutions":[{"id":"https://openalex.org/I7350606","display_name":"Dalian Jiaotong University","ror":"https://ror.org/05gp45n31","country_code":"CN","type":"education","lineage":["https://openalex.org/I7350606"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Changxian Li","raw_affiliation_strings":["School of Automation and Electrical Engineering, Dalian Jiaotong University, Dalian, Liaoning, China"],"affiliations":[{"raw_affiliation_string":"School of Automation and Electrical Engineering, Dalian Jiaotong University, Dalian, Liaoning, China","institution_ids":["https://openalex.org/I7350606"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5069875119"],"corresponding_institution_ids":["https://openalex.org/I7350606"],"apc_list":null,"apc_paid":null,"fwci":0.4001,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.67856632,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"44","issue":"2","first_page":"2741","last_page":"2752"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9818000197410583,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.8215829730033875},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.723622739315033},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7100244760513306},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.6635763645172119},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.6232075691223145},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6224544048309326},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.5953825116157532},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5310037136077881},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.46561670303344727},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.4597032964229584},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.45739516615867615},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.32125580310821533},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.05366817116737366}],"concepts":[{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.8215829730033875},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.723622739315033},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7100244760513306},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.6635763645172119},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.6232075691223145},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6224544048309326},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.5953825116157532},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5310037136077881},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.46561670303344727},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.4597032964229584},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.45739516615867615},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.32125580310821533},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.05366817116737366},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3233/jifs-223093","is_oa":false,"landing_page_url":"https://doi.org/10.3233/jifs-223093","pdf_url":null,"source":{"id":"https://openalex.org/S179157397","display_name":"Journal of Intelligent & Fuzzy Systems","issn_l":"1064-1246","issn":["1064-1246","1875-8967"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310318577","host_organization_name":"IOS Press","host_organization_lineage":["https://openalex.org/P4310318577"],"host_organization_lineage_names":["IOS Press"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Intelligent & Fuzzy Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth","score":0.6800000071525574}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W2119605622","https://openalex.org/W2161969291","https://openalex.org/W2937647346","https://openalex.org/W2965643259","https://openalex.org/W2971524931","https://openalex.org/W2998037249","https://openalex.org/W3000301935","https://openalex.org/W3000835335","https://openalex.org/W3002656377","https://openalex.org/W3003581523","https://openalex.org/W3016016303","https://openalex.org/W3020889904","https://openalex.org/W3025516050","https://openalex.org/W3033573874","https://openalex.org/W3044668093","https://openalex.org/W3082481519","https://openalex.org/W3105645498","https://openalex.org/W3109234079","https://openalex.org/W3112086595","https://openalex.org/W3183283300","https://openalex.org/W3202788896","https://openalex.org/W4210407621","https://openalex.org/W4210510608","https://openalex.org/W4225934671","https://openalex.org/W4239510810"],"related_works":["https://openalex.org/W2336974148","https://openalex.org/W2126100045","https://openalex.org/W2345184372","https://openalex.org/W2381773606","https://openalex.org/W2008870648","https://openalex.org/W2734744645","https://openalex.org/W2153189372","https://openalex.org/W2187500075","https://openalex.org/W3197541072","https://openalex.org/W4309216594"],"abstract_inverted_index":{"In":[0,87],"recent":[1],"years,":[2],"the":[3,9,23,34,52,74,81,91,95,109,125,134,157,164],"lack":[4],"of":[5,11,26,73,124,149,168],"thermal":[6,12,30,146,165],"images":[7],"and":[8,20,41,106,170,173,179,186],"difficulty":[10],"feature":[13,62],"extraction":[14,63],"have":[15],"led":[16],"to":[17,89,113,132],"low":[18],"accuracy":[19],"efficiency":[21],"in":[22,162,183,189],"fault":[24,44,71,93,97,135,166],"diagnosis":[25,45],"circuit":[27,150],"boards":[28],"using":[29],"images.":[31],"To":[32],"address":[33],"problem,":[35],"this":[36],"paper":[37],"presents":[38],"a":[39,115],"simple":[40],"efficient":[42],"intelligent":[43],"method":[46,159],"combined":[47],"with":[48],"computer":[49],"vision,":[50],"namely":[51],"bag-of-SURF-features":[53],"support":[54],"vector":[55,117],"machine":[56],"(BOSF-SVM).":[57],"Firstly,":[58],"an":[59],"improved":[60],"BOF":[61],"based":[64],"on":[65,143],"SURF":[66],"is":[67,160,177],"proposed.":[68],"The":[69],"preliminary":[70,96],"features":[72,84,98,167],"abnormally":[75],"hot":[76],"components":[77,169],"are":[78,99,128,141],"extracted":[79],"by":[80,104],"speeded-up":[82],"robust":[83],"algorithm":[85],"(SURF).":[86],"order":[88],"extract":[90],"ultimate":[92],"features,":[94],"clustered":[100],"into":[101,108,130],"K":[102],"clusters":[103],"K-means":[105],"substituted":[107],"bag-of-features":[110],"model":[111],"(BOF)":[112],"generate":[114],"bag-of-SURF-feature":[116],"(BOSF)":[118],"for":[119],"each":[120],"image.":[121],"Then,":[122],"all":[123],"BOSF":[126],"vectors":[127],"fed":[129],"SVM":[131],"train":[133],"classification":[136],"model.":[137],"Finally,":[138],"extensive":[139],"experiments":[140],"conducted":[142],"two":[144],"homemade":[145],"image":[147],"datasets":[148],"board":[151],"faults.":[152],"Experimental":[153],"results":[154],"show":[155],"that":[156],"proposed":[158],"effective":[161],"extracting":[163],"reducing":[171],"misdiagnosis":[172],"underdiagnosis.":[174],"Also,":[175],"it":[176],"economical":[178],"fast,":[180],"facilitating":[181],"savings":[182],"labour":[184],"costs":[185],"computing":[187],"resources":[188],"industrial":[190],"production.":[191]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}